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Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry
Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry



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Íàçâàíèå: X-Ray Diffraction by Polycrystalline Materials. Physics in Industry

Àâòîðû: Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.)

Àííîòàöèÿ:

For anyone WI10 has been concerned with X-ray analysis since its early days, it. is fascinating to see how the subject continues to grow and ramify. The present book is a striking illustration of this development. Although it deals with only one branch of crystal analysis, the study of polycrysta]line materials, it has been found desirable tQ invite some thirty experts to make their contributions in order that each aspect of the subject might be covered in an authoritative way. That it has been possible to weld contributions from so many authors into a coherent scheme is both a tribute to the editors and an excellent exalllple of that happy collaboration that has existed froITi the very beginning amongst X-ray crystallographers and continues so manifstly at the present time.


ßçûê: en

Ðóáðèêà: Ôèçèêà/

Ñòàòóñ ïðåäìåòíîãî óêàçàòåëÿ: Ãîòîâ óêàçàòåëü ñ íîìåðàìè ñòðàíèö

ed2k: ed2k stats

Èçäàíèå: 1st edition

Ãîä èçäàíèÿ: 1955

Êîëè÷åñòâî ñòðàíèö: 725

Äîáàâëåíà â êàòàëîã: 06.09.2009

Îïåðàöèè: Ïîëîæèòü íà ïîëêó | Ñêîïèðîâàòü ññûëêó äëÿ ôîðóìà | Ñêîïèðîâàòü ID
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Ïðåäìåòíûé óêàçàòåëü
Extrapolation methods of determining accurate lattice parameters, diffractometer      392—393
Extrapolation methods of determining accurate lattice parameters, diffractometer 392—393      
Extrapolation methods of determining accurate lattice parameters, focusing camera      386—387
Extrapolation methods of determining accurate lattice parameters, focusing camera 386—387      
Extrapolation methods of determining accurate lattice parameters, functions of $\theta$, tables      642—645
Extrapolation methods of determining accurate lattice parameters, functions of $\theta$, tables 642—645
Extruded specimens      113—114
Extruded specimens 113—114      
Eyles, V.A.      528
Eyles, V.A. 528      
Face-centred-cubic metals deformation      464—6
Face-centred-cubic metals deformation 464—466      
Face-centred-cubic metals, deformation      464—466
Face-centred-cubic metals, elastic anisotropy      474—475 607—609
Face-centred-cubic metals, elastic anisotropy 474—475, 607—609      
Face-centred-cubic metals, recrystallization textures      470—474
Face-centred-cubic metals, recrystallization textures 470—474      
Face-centred-cubic metals, theory of rolling textures      467—469
Face-centred-cubic metals, theory of rolling textures 467—469      
Faces (hkl)      33—34 649
Faces (hkl) 33—34, 649      
Faessler, A.      139 141
Faessler, A. 139, 141      
Fagerberg, S.      128
Fagerberg, S. 128      
Fahey, J.J.      531
Fahey, J.J. 531      
Fankuchen, I.      139 142 144 230 235 239 265 273 284 290 310 449 515
Fankuchen, I. 139, 142, 144, 230, 235, 239, 265, 273, 284, 290, 310, 449, 515      
Farquhar, M.C.M.      375 588
Farquhar, M.C.M. 375, 588      
Farthing, A.C.      408
Farthing, A.C. 408      
Fats, identification      335 508—509
Fats, identification 335, 508—509      
Faulkner, D.W.      570
Faulkner, D.W. 570      
Faverjee, J.C.L.      567
Faverjee, J.C.L. 567      
Felspars      530 559 569
Felspars 530, 559, 569      
Fenton, A.G.      201
Fenton, A.G. 201      
Ferguson, R.H.      615
Ferguson, R.H. 515      
Fermi spheres      589—592
Fermi spheres 589—592      
Ferrite      343 598
Ferrite 343, 598      
Fessler, A.H. 570      
Fibre specimens      113
Fibre specimens 113      
Fibre specimens, cell-dimensions determination      358—361
Fibre specimens, cell-dimensions determination 358—361      
Fibre specimens, cellulose and derivatives      534—542
Fibre specimens, cellulose and derivatives 534—542      
Fibre specimens, high-temperature study      258
Fibre specimens, high-temperature study 258      
Fibre specimens, microbeam study      288—291
Fibre specimens, microbeam study 288—291      
Fibre specimens, preferred-orientation study      300 316—318
Fibre specimens, preferred-orientation study 300, 316—318      
Fibre specimens, protein      548—552 555—556
Fibre specimens, protein 548—552, 555—556      
Fibre specimens, synthetic      542—544 552—555
Fibre specimens, synthetic 542—544, 552—555      
Fibre specimens, tilted orientation      365 487—489
Fibre specimens, tilted orientation 365, 487—489      
Fibre texture, organic materials      482—489
Fibre texture, organic materials 482—489      
Fibre texture, polycrystalline metals      464—469
Fibre texture, polycrystalline metals 464—469      
Fibres for powder coating      115
Fibres for powder coating 115      
Fibres for powder coating, high-temperature cameras      259—260
Fibres for powder coating, high-temperature cameras 259—260      
Fiducial marks      83—84 369
Fiducial marks 83—84, 369      
Fiducial marks, back-reflexion camera      185
Fiducial marks, back-reflexion camera 185      
Fiducial marks, focusing camera      383
Fiducial marks, focusing camera 383      
Fiducial marks, high-temperature camera      257
Fiducial marks, high-temperature camera 257      
Field, M.      319
Field, M. 319      
Filament of X-ray tube      59—62 69 209
Filament of X-ray tube 59—62, 69, 209      
Filament of X-ray tube, contamination of beam      62
Filament of X-ray tube, contamination of beam 62      
Filer, L.J.      515
Filer, L.J. 515      
Film holder      see "Cassette"
Film holder see “Cassette”      
Film measurement      502
Film measurement 502      
Film measurement, accuracy      74 381 383
Film measurement, accuracy 74, 381, 383      
Film measurement, back-reflexion methods      181—182 186 387—388
Film measurement, back-reflexion methods 181—182, 186, 387—388      
Film shrinkage      368 630—631
Film shrinkage 368, 630—631      
Film shrinkage, back-reflexion camera      184—186 388
Film shrinkage, back-reflexion camera 184—186, 388      
Film shrinkage, cylindrical focusing camera      383
Film shrinkage, cylindrical focusing camera 383      
Film shrinkage, Debye — Scherrer camera      82—85 119 369—371
Film shrinkage, Debye — Scherrer camera 82—85, 119, 369—371      
Film shrinkage, Debye-Scherrer camera      82—5 119 369—71
Film-measuring rule      74
Film-measuring rule 74      
Film-mounting methods, Debye — Scherrer camera      81 85—86 116 369—371
Film-mounting methods, Debye — Scherrer camera 81, 85—86, 116, 369—371      
Film-mounting methods, Debye-Scherrer camera      81 85—6 116 369—71
Film-mounting methods, high-temperature cameras      246—249 257
Film-mounting methods, high-temperature cameras 246—249, 267      
Film-mounting methods, preferred-orientation cameras      301—302 311
Film-mounting methods, preferred-orientation cameras 301—302, 311      
films      186 191—192 620—634
Films 186, 191—192, 620—634      
Films double-coated, back-reflexion camera      179 388
Films double-coated, back-reflexion camera 179, 388      
Films double-coated, Debye — Scherrer camera 98      
Films double-coated, Debye-Scherrer camera      98
Films double-coated, focusing camera      182 384 633
Films double-coated, focusing camera 182, 384, 633      
Films double-coated, intensity measurement      404
Films double-coated, intensity measurement 404      
Films double-coated, removal of emulsion      384 633
Films double-coated, removal of emulsion 384, 633      
Films double-coated, unit density      191
Films double-coated, unit density 191      
Films single-coated, back-reflexion camera      179
Films single-coated, back-reflexion camera 179      
Films single-coated, focusing camera      182 384
Films single-coated, focusing camera 182, 384      
Films, characteristic curve      404 621—623
Films, characteristic curve 404, 621—623      
Films, choice      280
Films, choice 280      
Films, double-coated, back-reflexion camera      179 388
Films, double-coated, back-reflexion camera, Debye — Scherrer camera      98
Films, double-coated, back-reflexion camera, focusing camera      182 384 633
Films, double-coated, back-reflexion camera, intensity measurement      404
Films, double-coated, back-reflexion camera, removal of emulsion      384 633
Films, double-coated, back-reflexion camera, unit density      191
Films, single-coated, back-reflexion camera      179
Films, single-coated, back-reflexion camera, focusing camera      182 384
Filtered radiation      303 328
Filtered radiation 303, 328      
Finbak, C.      443
Finbak, C. 443      
Fine-focus tube      69—70
Fine-focus tube 69—70      
Fine-focus tube, focusing-camera designs      296
Fine-focus tube, focusing-camera designs 296      
Fine-focus tube, low-angle scattering study      240
Fine-focus tube, low-angle scattering study 240      
Fine-focus tube, use with flat-layer camera      167—168
Fine-focus tube, use with flat-layer camera 167—168      
Firth, E.M.      161
Firth, E.M. 161      
Fischer, R.B.      567
Fischer, R.B. 567      
Fish, H.      231
Fish, H. 231      
Fisk, H.G.      567
Fisk, H.G. 567      
Fixing of X-ray films      629—630
Fixing of X-ray films 629—630      
Flat-film cameras      see "Cameras flat-film"
Flat-film cameras see “Cameras, flat-film”      
Flat-layer cameras      162—175
Flat-layer cameras 162—175      
Flat-layer cameras, diffractometers      214—217
Flat-layer cameras, diffractometers 214—217      
Flat-layer cameras, multiple focusing      133—134
Flat-layer cameras, multiple focusing 133—134      
Flat-layer methods      145—175
Flat-layer methods 145—175      
Flat-layer methods, instrumental broadening      411
Flat-layer methods, instrumental broadening 411      
Flat-layer methods, line breadth      153—155 188
Flat-layer methods, line breadth 153—155, 188      
Flat-layer methods, preferred orientation      298—299
Flat-layer methods, preferred orientation 298—299      
Flat-layer methods, rotating specimen      155—159
Flat-layer methods, rotating specimen 155—159      
Flat-layer methods, stationary specimen      148—153
Flat-layer methods, stationary specimen 148—153      
Flat-plate cameras      see "Cameras flat-film"
Flat-plate cameras see “Cameras, flat-film”      
Flint, E.D.      571
Flint, E.D. 571      
Florida, C.D.      197 212
Florida, C.D. 197, 212      
Floyd, R.W.      375
Floyd, R.W. 375      
Fluorescent radiation      187 189 206 327 431—432 522
Fluorescent radiation 187, 189, 206, 327, 431—432, 522      
Fluorescent screens      118 165
Fluorescent screens 118, 165      
Fluorescent screens, scintillation-counter use      205
Fluorescent screens, scintillation-counter use 205      
Fluorite monochromator      122 137 139—41 143
Fluorite monochromator 122, 137, 139—141, 143      
Fluorite relation to plutonium fluorides      613
Fluorite relation to plutonium fluorides 613      
Fluorite, monochromator      122 137 139—141 143
Fluorite, relation to plutonium fluorides      613
Focal circle      127—128
Focal circle 127—128      
Focal circle, suitable dimensions      132
Focal circle, suitable dimensions 132      
Focal circle, X-ray source alignment      130—131
Focal circle, X-ray source alignment 130—131      
Focal spot      60
Focal spot 60      
Focal spot, movement on target      209—210
Focal spot, movement on target 209—210      
Focus of X-ray tube      57—58 60—62 215—217 234 279—280
Focus of X-ray tube 57—58, 60—62, 215—217, 234, 279—280      
Focus of X-ray tube, energy distribution      104—106
Focus of X-ray tube, energy distribution 104—106      
Focus of X-ray tube, moving-target generators      70—72
Focus of X-ray tube, moving-target generators 70—72      
Focus of X-ray tube, optimum size      283
Focus of X-ray tube, optimum size 283      
Focus of X-ray tube, variation of effective area      88
Focus of X-ray tube, variation of effective area 88      
Focused-line systems, asymmetric      133 138
Focused-line systems, asymmetric 133, 138      
Focused-line systems, carved crystals      127—128
Focused-line systems, curved crystals      127—8
Focused-line systems, curved crystals 127—128      
Focused-line systems, flat-layer methods      148—151
Focused-line systems, flat-layer methods 148—151      
Focused-line systems, ground, curved crystals      129—131
Focused-line systems, ground, curved crystals 129—131      
Focused-line systems, logarithmic spiral      134—135
Focused-line systems, logarithmic spiral 134—135      
Focused-line systems, multiple focusing camera      133—134
Focused-line systems, multiple focusing camera 133—134      
Focused-line systems, Soller slits      132—133
Focused-line systems, Soller slits 132—133      
Focused-point systems      135—137
Focused-point systems 135—137      
Focused-point systems, anastigmatic      238
Focused-point systems, anastigmatic 238      
Focusing cameras      see "Cameras focusing"
Focusing cameras see “Cameras, focusing”      
Focusing diffractometers      214—218 392
Focusing diffractometers 214—218, 392      
Focusing geometry, back-reflexion cameras      176—177
Focusing geometry, back-reflexion cameras 176—177      
Focusing geometry, diffractometers      126 214
Focusing geometry, diffractometers 126, 214      
Focusing methods, accurate lattice-parameter determinations      382—7 393—4
Focusing methods, accurate lattice-parameter determinations 382—387, 393—394      
Focusing methods, back-reflexion techniques      182—3 186
Focusing methods, back-reflexion techniques 182—183, 186      
Focusing methods, identification      506—7
Focusing methods, identification 506—507      
Focusing methods, metallurgical phase-boundary studies      579
Focusing methods, metallurgical phase-boundary studies 579      
Focusing monochromators      125—137 215—217 see
Focusing monochromators see also “Curved-crystal reflectors”, 125—137, 215—217      
Fog value of X-ray film      622 626
Fog value of X-ray film 622, 626      
Foote, F.      182 370 387
Foote, F. 182, 370, 387      
Foousing methods, accurate lattice-parameter determinations      382—387 393—394
Foousing methods, back-reflexion techniques      182—183 186
Foousing methods, identification      506—507
Foousing methods, metallurgical phase-boundary studies      579
Ford, W.F.      563 567
Ford, W.F. 563, 567      
Form {hkl}      34 639 649
Form {hkl} 34, 639, 649      
Fosslor, A.H.      570
Foster, W.R.      560 567
Foster, W.R. 560, 567      
Fourier syntheses in transition metal alloys      592
Fourier syntheses in transition metal alloys 592      
Fourier transform application to alloys      595
Fourier transform application to alloys 595      
Fourier transform formulae      54 439—41
Fourier transform formulae 54, 439—441      
Fourier transform line broadening      425—6
Fourier transform line broadening 425—426      
Fourier transform, application to alloys      595
Fourier transform, formulae      54 439—441
Fourier transform, line broadening      425—426
Fourier-analysis method of separating line-broadening components      425—426
Fourier-analysis method of separating line-broadening components 425—426      
Fourier-analysis method of separating line-broadening components, coefficients      429
Fourier-analysis method of separating line-broadening components, coefficients 429      
Fourier-analysis method of separating line-broadening components, intrinsic broadening      428—429
Fourier-analysis method of separating line-broadening components, intrinsic broadening 428—429      
Fournet, G.      237 239 441 443 447 448 452 453
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