|
|
 |
| Àâòîðèçàöèÿ |
|
|
|
| Ïîèñê ïî óêàçàòåëÿì |
|
|
|
|
|
|
|
 |
|
|
|
| Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry |
|
|
|
| Ïðåäìåòíûé óêàçàòåëü |
Rate of counting, background 191
Rate of counting, estimation 192
Rate of counting, estimation 192
Rate of counting, Geiger counter, galvanometer measurement 201
Rate of counting, Geiger counter, galvanometer measurement 201
Rate of counting, platead curve relation to voltage 195—6
Rate of counting, plateau curve relation to voltage 195—196
Rate of counting, plateau curve relation to voltage 195—196
Rate of counting, proportional counter 201—204
Rate of counting, proportional counter 201—204
Rate of counting, pulsed X-ray tubes 225—226
Rate of counting, pulsed X-ray tubes 225—226
Rational indices, law 33—41
Rational indices, law 33—41
Raynor, G.V. 255 574 582 586 588 591 592
Raynor, G.V. 255, 574, 582, 586, 588, 591, 592
Reactors, nuclear 611
Reactors, nuclear 611
Read, H.S. 243
Read, H.S. 243
Reciprocal lattice 46—47
Reciprocal lattice 46—47
Reciprocal lattice, angular relation to Bravais lattice 486
Reciprocal lattice, angular relation to Bravais lattice 486
Reciprocal lattice, calculation of dimensions 353—358 359—365
Reciprocal lattice, calculation of dimensions 353—358, 359—365
Reciprocal lattice, number of powder lines 518—520
Reciprocal lattice, number of powder lines 518—520
Recording speed, Debye — Scherrer camera 109—111
Recording speed, Debye — Scherrer camera 109—111
Recording speed, Debye-Scherrer camera 109—11
Recording speed, flat-layer techniques 147
Recording speed, flat-layer techniques 147
Recovery time of counter 197
Recovery time of counter 197
Recrystallization textures of face-centred-cubic materials 470—474
Recrystallization textures of face-centred-cubic materials 470—474
Rectification of current for X-ray tubes 67
Rectification of current for X-ray tubes 67
Redmond, J.C. 229
Redmond, J.C. 229
Reduced unit cell 355—356
Reduced unit cell 355—356
Reeki, J. 265
Reeki, J. 265
Reerystallization textures of face-centred-cubic materials 470—4
Rees, W.J. 567
Rees, W.J. 567
Reflecting sphere 47
Reflecting sphere 47
Reflecting sphere, condition of reflexion 47 483—484
Reflecting sphere, condition of reflexion 47, 483—484
Reflexion see "Surface reflexion"
Reflexion broadening see "Breadth of powder lines"
Reflexion broadening see “Breadth of powder lines”
Reflexion monochromator 127—128
Reflexion monochromator 127—128
Reflexion see “Surface reflexion”
Refraction of X-ray beam, change of wavelength 368
Refraction of X-ray beam, change of wavelength 368
Refraction of X-ray beam, explanation of radial scatter 456
Refraction of X-ray beam, explanation of radial scatter 456
Refraction of X-ray beam, total reflexion 285 456
Refraction of X-ray beam, total reflexion 285, 456
Refractories 336 558—561
Refractories 336, 558—561
Refractories, aluminosilicate 567—568
Refractories, aluminosilicate 567—568
Refractories, basic 563—567
Refractories, basic 563—567
Refractories, silica 562—563
Refractories, silica 562—563
Regler, F. 456
Regler, F. 456
Regnstroem, G. 124 125
Regnstrom, G. 124, 125
Reichertz, P.P. 408
Reichertz, P.P. 408
Relative intensity, statistical relation to absolute intensity 54 404 see
Relative intensity, statistical relation to absolute intensity see also “Intensity of powder lines”, 54, 404
Resolution of overlapping reflexions 405—406 518—520 see
Resolution of overlapping reflexions see also “Overlapping powder lines”, 405—406, 518—520
Resolving power of camera, consideration with recording speed 110
Resolving power of camera, consideration with recording speed 110
Resolving power of camera, Debye — Scherrer camera 93—102 120—121
Resolving power of camera, Debye — Scherrer camera 93—102, 120—121
Resolving power of camera, Debye-Scherrer camera 93—102 120—1
Resolving power of camera, precision camera 93—102
Resolving power of camera, precision camera 93—102
Resolving power of camera, probability of line resolution 520
Resolving power of camera, probability of line resolution 520
Resolving power of camera, Seemann — Bohlin camera 124—125
Resolving power of camera, Seemann — Bohlin camera 124—125
Resolving power of camera, Seemann-Bohlin camera 124—5
Resolving power of monochromator 139
Resolving power of monochromator 139
Reynolds, D.H. 569
Reynolds, D.H. 569
Reynolds, P.W. 245 246 250 256 263 582
Reynolds, P.W. 245, 246, 250, 256, 263582
Rhodin, T.N. 300 305 311
Rhodin, T.N. 300, 305, 311
Rhombic system see "Orthorhombic system"
Rhombic system see “Orthorhombic system”
Rhombohedral lattice 30 31 39 52
Rhombohedral lattice 30, 31, 39, 52
Rhombohedral lattice, axial constants, calculation 41
Rhombohedral lattice, axial constants, calculation 41
Rhombohedral lattice, cell-dimension determination 349—350 375
Rhombohedral lattice, cell-dimension determination 349—350, 375
Rhombohedral lattice, indexing of crystal faces 35
Rhombohedral lattice, indexing of crystal faces 35
Rhombohedral lattice, lattice spacings, calculation 43
Rhombohedral lattice, lattice spacings, calculation 43
Richards, T.LI. 462—480
Richards, T.Ll. 462—480
Richardson, H.M. 558—573
Richardson, H.M. 558—573
Richer, G.C. 474
Richer, G.C. 474
Ridler, D.S. 211
Ridler, D.S. 211
Ridley, P. 161 171
Ridley, P. 161, 171
Rigby, G.R. 560 562 568
Rigby, G.R. 560, 562, 568
Riley, D.P. 71 101 119 139 140 141 202 204 232—241 247 263 372 373 421 430—453 644
Riley, D.P. 71, 101, 119, 139, 140, 141, 202, 204, 232—241, 247, 263, 372, 373, 421, 430—453 644
Rinn, H.W. 229 331 507 515
Rinn, H.W. 229, 331, 507, 515
Rinne, F. 567
Rinne, F. 567
Ritland, H.N. 235 239 240
Ritland, H.N. 235, 239, 240
Ritter, H.L. 115
Ritter, H.L. 115
Roberts, E.A.O'D. 576
Roberts, E.A.O'D. 578
Roberts, E.W. 575
Roberts, E.W. 575
Robertson, J.M. 404 520 633
Robertson, J.M. 404, 520, 633
Robinson, C. 556
Robinson, C. 556
Robinson, K. 166 561 562 592
Robinson, K. 166, 561, 562, 592
Rocksalt, monochromator use 122 129—130 137—138 140—141
Rocksalt, monochromator use 122, 129—130, 137—138, 140—141
Rodenhuis, K. 211
Rodenhuis, K. 211
| Roess, L.C. 448 449 452
Roess, L.C. 448, 449, 452
Rogers, D. 48 52
Rogers, D. 48, 52
Rogers, J. 580
Rogers, J. 580
Rogers, L.E.R. 114 370
Rogers, L.E.R. 114, 370
Rolled sheets, cell dimensions 363
Rolled sheets, cell dimensions 363
Rolled sheets, preferred-orientation study 298—299 316—321
Rolled sheets, preferred-orientation study 298—299, 316—321
Rolled sheets, rolling-texture theory 467—469
Rolled sheets, rolling-texture theory 467—469
Romanus, H. 211
Romanus, H. 211
Ronnebeck, H.R. 76
Ronnebeck, H.R. 76
Rooksby, H.P. 27—77 115 273 274 457 567 568 571 630
Rooksby, H.P. 27—77, 115, 273, 274, 457, 567, 568, 571, 630
Rosenthal, E. 560
Rosenthal, E. 560
Rosevear, F.B. 613
Rosevear, F.B. 515
Ross, P.A. 240
Ross, P.A. 240
Rossi, B.B. 204
Rossi, B.B. 204
Rotating sector 404 631—632
Rotating sector 404, 631—632
Rotating-target generator 62 70—72 279 292
Rotating-target generator 62, 70—72, 279, 292
Rotation of specimen see "Scanning"
Rotation of specimen see “Scanning”
Rotblat, J. 210
Rotblat, J. 210
Rothwell, P. 205
Rothwell, P. 205
Roussin, A.L. 570
Roussin, A.L. 570
Row line 27—29 35—36 46—47 360—362
Row line 27—29, 35—36, 46—47, 360—362
Rowden, E. 567
Rowden, E. 567
Rowlands, V.W. 583
Rowlands, V.W. 583
Rubber 533—534 546
Rubber 533—534, 546
Rubinson, W. 204
Rubinson, W. 204
Rudall, K.M. 550 556 557
Rudall, K.M. 550, 556, 557
Ruff, O. 242
Ruff, O. 242
Rundle, R.E. 614 616
Rundle, R.E. 614, 616
Ryschkewitsch, E. 668
Ryschkewitsch, E. 568
Sakisaka, Y. 143
Sakisaka, Y. 143
Sample see "Specimen"
Sample see “Specimen”
Sands, M. 213
Sands, M. 213
Saurer, H. 192
Saurer, H. 192
Savage, J. 231 261 343
Savage, J. 231, 261, 343
Sayle, E.A. 208 210
Sayle, E.A. 208, 210
Scaling circuits 210—213 224
Scaling circuits 210—213, 224
Scanning of diffraction pattern 210—211 218 227
Scanning of diffraction pattern 210—211, 218, 227
Scanning of diffraction pattern, double-crystal diffractometer 238—240
Scanning of diffraction pattern, double-crystal diffractometer 238—240
Scanning of larger area of specimen 166 619
Scanning of larger area of specimen 166, 619
Scanning of larger area of specimen, back-reflexion methods 133—134
Scanning of larger area of specimen, back-reflexion methods 183—184
Scanning of larger area of specimen, diffractometer 218—219
Scanning of larger area of specimen, diffractometer 218—219
Scanning of larger area of specimen, high-temperature methods 173 253 258 262
Scanning of larger area of specimen, high-temperature methods 173, 253, 258, 262
Scanning of larger area of specimen, preferred-orientation methods 310 315 321
Scanning of larger area of specimen, preferred-orientation methods 310, 315, 321
Scanning of larger area of specimen, radioactive materials 619
Scanning of larger area of specimen, radioactive materials 619
Scatter traps, focusing camera 124
Scatter traps, focusing camera 124
Scatter traps, high-temperature camera 257
Scatter traps, high-temperature camera 257
Scatter traps, microbeam techniques 279 284 287—290
Scatter traps, microbeam techniques 279, 284, 287—290
Scattering see "Air" "Amorphous "Background" "Camera" "Coherent" "Colloidal "Compton" "Gas" "Incident "Incoherent" "Liquids" "Monochromator" "Parasitic" "Radial" "Slit "Specimen" "Thermal"
Scattering factor, atomic 45 438—453 656—659
Scattering factor, atomic 45, 438—453, 656—659
Scattering see “Air, Amorphous solids, Background, Camera, Coherent, Colloidal material, Compton, Gas, Incident beam, Incoherent, Liquids, Monochromator, Parasitic, Radial, Slit system, Specimen Thermal”
Schaefer, K. 338 340
Schafer, K. 338, 340
Schdanow, H.S. 291 458
Schdanow, H.S. 291, 458
Scherrer constant 413—415
Scherrer constant 413—415
Scherrer, P. 145 400 533
Scherrer, P. 145, 400, 533
Schiff, L.I. 223
Schiff, L.I. 223
Schmid, E. 302
Schoening, F.R.L. 228, 427
Schossberger, F. 245, 246, 250
Schroid, E. 302
Schulman, J.H. 447 448
Schulman, J.H. 447, 448
Schulz, L.G. 175 231 318 319 320 569
Schulz, L.G. 175, 231, 318, 319, 320, 569
Schwartz, R.S. 273
Schwartz, R.S. 273
Scintillation counters 205—208
Scintillation counters 205—208
Scott, B.B. 269
Scott, B.B. 269
Scruttoh, R.F. 460
Seabury, R. 183
Seabury, R. 183
Sealed-off generators 59—62
Sealed-off generators 59—62
Sealed-off generators, counter work 209
Sealed-off generators, counter work 209
Sealed-off generators, focus 63
Sealed-off generators, focus 63
Sealed-off generators, merits 68
Sealed-off generators, merits 68
Sealed-off generators, mounting 64—68
Sealed-off generators, mounting 64—68
Sealed-off generators, moving target 70—72
Sealed-off generators, moving target 70—72
Seals, vacuum 71—72 171—172 252 256
Seals, vacuum 71—72, 171—172, 252, 256
Sears, J.E. 75
Sears, J.E. 75
Secondary extinction 54 143 399
Secondary extinction 54, 143, 399
Sector cassettes 553—554
Sector cassettes 553—554
Sector cassettes, back-reflexion cameras 173—174
Sector cassettes, back-reflexion cameras 173—174
Sedimentation of specimen 343 466
Sedimentation of specimen 343, 466
Seemann — Bohlin focusing camera 123—125
|
|
|
| Ðåêëàìà |
|
|
|
|
|
Î ïðîåêòå