Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry :: Электронная библиотека попечительского совета мехмата МГУ

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Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry

$Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry$

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Название: X-Ray Diffraction by Polycrystalline Materials. Physics in Industry

Авторы: Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.)

Аннотация:

For anyone WI10 has been concerned with X-ray analysis since its early days, it. is fascinating to see how the subject continues to grow and ramify. The present book is a striking illustration of this development. Although it deals with only one branch of crystal analysis, the study of polycrysta]line materials, it has been found desirable tQ invite some thirty experts to make their contributions in order that each aspect of the subject might be covered in an authoritative way. That it has been possible to weld contributions from so many authors into a coherent scheme is both a tribute to the editors and an excellent exalllple of that happy collaboration that has existed froITi the very beginning amongst X-ray crystallographers and continues so manifstly at the present time.

Язык:

Рубрика: Физика/

Статус предметного указателя: Готов указатель с номерами страниц

ed2k: ed2k stats

Издание: 1st edition

Год издания: 1955

Количество страниц: 725

Добавлена в каталог: 06.09.2009

Операции: Положить на полку | Скопировать ссылку для форума | Скопировать ID

Предметный указатель

Diffracted beam divergence 219—220
Diffracted beam intensity      45 54
Diffracted beam intensity 45, 54
Diffracted beam see also “Scattering”
Diffracted beam width      304
Diffracted beam width 304
Diffracted beam, amplitude      395
Diffracted beam, divergence      219—220
Diffracted beam, intensity      45 54
Diffracted beam, width      304
Diffraction broadening      148 409—429
Diffraction broadening 148, 409—429
Diffraction broadening, ceramic research      559
Diffraction broadening, ceramic research 559
Diffraction broadening, flat-layer methods      153—155 156—159 188
Diffraction broadening, flat-layer methods 153—155, 156—159, 188
Diffractometers for counter work      189—190
Diffractometers for counter work 189—190
Dimensions of lattice      see "Lattice parameters"
Dimensions of lattice see “Lattice parameters”
Direct Angstroem scale      74—75 502
Direct Angstrom scale      74—5 502
Direct Angstrom scale 74—75, 502
Direction in lattice $\langle hkl\rangle$       464 649
Direction in lattice <hkl>      464 649
Direction in lattice <hkl> 464, 649
Disorder scattering      437
Disorder scattering 437
Dispersed specimen      527
Dispersed specimen 527
Dispersion of reflexions, axial orientation      483—485 545
Dispersion of reflexions, axial orientation 483—485, 545
Distortion of crystal lattice, study of diffraction spots      415—416 459—460
Distortion of crystal lattice, study of diffraction spots 415—416, 459—460
Divergence of diffracted beam, counter diffractometers      219—220
Divergence of diffracted beam, counter diffractometers 219—220
Divergence of incident beam      see "Incident beam angular horizontal "Incident angular vertical
Divergence of incident beam see “Incident beam, angular range, horizontal divergence, vertical divergence”
Divergent incident beam, use back-reflexion method      182 184 390
Divergent incident beam, use back-reflexion method 182, 184, 390
Divergent incident beam, use flat-layer methods      148—50 166
Divergent incident beam, use flat-layer methods 148—150, 166
Divergent incident beam, use focusing methods      123—39 385
Divergent incident beam, use focusing methods 123—139, 385
Divergent incident beam, use microbeam methods      285 287
Divergent incident beam, use microbeam methods 285, 287
Divergent incident beam, use, back-reflexion method      182 184 390
Divergent incident beam, use, flat-layer methods      148—150 166
Divergent incident beam, use, focusing methods      123—139 385
Divergent incident beam, use, microbeam methods      285 287
Dobson, G.M.B.      77
Dobson, G.M.B. 77
Dolomite      565
Dolomite 565
Dolomite bricks      563 566
Dolomite bricks 563, 566
Dolomite thermal decomposition      561—2
Dolomite thermal decomposition 561—562
Dolomite, bricks      563 566
Dolomite, thermal decomposition      561—562
Domains, phase-related, in alloys      593 595
Domains, phase-related, in alloys 593, 595
Domains, within crystals      33
Domains, within crystals 33
Domains, within crystals, phase-related, in alloys      593 595
Donohue, J.      556
Donohue, J. 556
Dore, W.H.      533
Dore, W.H. 533
Dorn, J.E.      246
Dorn, J.E. 246
Double-coated film      see "Films double-coated"
Double-coated film see “Films, double-coated”
Double-crystal diffractometer      238—240
Double-crystal diffractometer 238—240
Douglas, A.M.B.      408 586—600 615
Douglas, A.M.B. 408, 586—600, 615
Dow Chemical index      330—332
Dow Chemical index 330—332
Drenck, K.      69
Drenck, K. 69
Dry batteries for Geiger counters      213
Dry batteries for Geiger counters 213
Dubinina, V.N.      515
Dubinina, V.N. 515
Ductility of metals      475—476
Ductility of metals 475—476
Dudding, B.P.      283
Dudding, B.P. 283
Dugdale, R.A.      617
Dugdale, R.A. 617
DuMond, J.W.M.      126 127 129 132 137 138 238 239 240 406 451 452 652 653
DuMond, J.W.M. 126, 127, 129, 132, 137, 138, 238, 239, 240, 406, 451, 452, 652, 653
Duwez, P. 568, 569
Dyson      141
Dyson 141
Earland, C.      534 553
Earland, C. 534, 553
Eastabrook, J.N.      155 226 228 372 393 410 419 420 429
Eastabrook, J.N. 155, 226, 228, 372, 393, 410, 419, 420, 429
Eberhard effect      634
Eberhard effect 634
Ebert, F.      242
Ebert, F. 242
Eccentricity of specimen      116—117 370
Eccentricity of specimen 116—117, 370
Eccentricity of specimen, effect on Bragg angle      373
Eccentricity of specimen, effect on Bragg angle 373
Eccentricity of specimen, effective diameter      112
Eccentricity of specimen, effective diameter 112
Eckling, K.      278 288
Eckling, K. 278, 288
Eden, C.G.      283
Eden, C.G. 283
Edmunds, G.      300 475
Edmunds, G. 300, 475
Edmunds, I.G.      366—394 407 429 593
Edmunds, I.G. 366—394, 407, 429, 593
Edwards, J.W.      245 248 250 254 255 263
Edwards, J.W. 245, 248, 250, 254, 255, 26
Edwards, O.S.      115 417 437 655
Edwards, O.S. 115, 417, 437, 655
Efficiency of X-ray counter      197—199
Efficiency of X-ray counter 197—199
Eggert, J.      627
Eggert, J. 627
Ehrenberg, W.      70 120 240 287
Ehrenberg, W. 70, 120, 240, 287
Eichholz, G.C.      211
Eichholz, G.C. 211
Ekstein, H. 93, 95, 367, 394, 455
Ekstein, M.G.      329 663
Ekstein, M.G. 329, 663
Ekstoin, H.      93 95 367 394 455
Elastic anisotropy      416 474—475 607—609
Elastic anisotropy 416, 474—475, 607—609
Elastic anisotropy, non-continuous diffraction rings      459—460
Elastic anisotropy, non-continuous diffraction rings 459—460
Elastic limit      606—607
Elastic limit 606—607
Elastically bent crystal reflectors      128—129 137—138
Elastically bent crystal reflectors 128—129, 137—138
Electrodes, counter      192
Electrodes, counter 192
Electrodes, gas tube      57—59
Electrodes, gas tube 57—59
Electrodes, vacuum tube      59—62
Electrodes, vacuum tube 59—62
Electron density      439 444—446
Electron density 439, 444—446

Electron density, equation      54
Electron density, equation 54
Electron density, evaluation for alloy structures      587
Electron density, evaluation for alloy structures 587
Electron microscope      514
Electron microscope 514
Electron microscope, mineralogical use      529—530
Electron microscope, mineralogical use 529—530
Electron microscope, structure determination      408
Electron microscope, structure determination 408
Electronic circuits, auxiliary to counters      204
Electronic circuits, auxiliary to counters 204
Electroplating of target      61
Electroplating of target 61
Ellefsen, O.      446
Ellefsen, O. 446
Elliott, A.      534 553 555 556
Elliott, A. 534, 553, 555, 556
Ellwood, E.C.      246 264
Ellwood, E.C. 246, 264
Elmore, W.C.      213
Elmore, W.C. 213
Emulsion on X-ray films      191—192 206 279 620
Emulsion on X-ray films 191—192, 206, 279, 620
Emulsion on X-ray films, absorption of X-ray quanta      627
Emulsion on X-ray films, absorption of X-ray quanta 627
Enanticmorphism      48
Enanticmorphism 48
End effects in counters      197 204
End effects in counters 197, 204
Energy levels, Brillouin zones      588—590
Energy levels, Brillouin zones 588—590
Eppstein, J.S.      212
Eppstein, J.S. 212
Equation to normal      41
Equation to normal 41
Equatorial reflexions of fibres, axial orientation      483—484
Equatorial reflexions of fibres, axial orientation 483—484
Equatorial reflexions of fibres, dispersion      545
Equatorial reflexions of fibres, dispersion 545
Equatorial reflexions of fibres, effect of tilt on angular spread      488—489
Equatorial reflexions of fibres, effect of tilt on angular spread 488—489
Equatorial reflexions of fibres, helical orientation      493—496
Equatorial reflexions of fibres, helical orientation 493—496
Equilibrium diagrams      see "Phase-equilibrium studies"
Equilibrium diagrams see “Phase-equilibrium studies”
Errors in film measuring      83—84 367—371 383
Errors in film measuring 83—84, 367—371, 383
Errors in lattice-parameter determination      367—368
Errors in lattice-parameter determination 367—368
Errors in lattice-parameter determination, absorption      373
Errors in lattice-parameter determination, absorption 373
Errors in lattice-parameter determination, back-reflexion camera, elimination by internal standards      390
Errors in lattice-parameter determination, back-reflexion camera, elimination by internal standards 390
Errors in lattice-parameter determination, back-reflexion camera, elimination by internal standards, equation adaption      388
Errors in lattice-parameter determination, back-reflexion camera, elimination by internal standards, equation adaption 388
Errors in lattice-parameter determination, back-reflexion camera, elimination by internal standards, subjective errors      387—388
Errors in lattice-parameter determination, back-reflexion camera, elimination by internal standards, subjective errors 387—388
Errors in lattice-parameter determination, back-reflexion camera, equation adaption      388
Errors in lattice-parameter determination, back-reflexion camera, subjective errors      387—8
Errors in lattice-parameter determination, beam penetration      388 391—392
Errors in lattice-parameter determination, beam penetration 388, 391—392
Errors in lattice-parameter determination, Debye — Scherrer camera, elimination by internal standards      378—380
Errors in lattice-parameter determination, Debye — Scherrer camera, elimination by internal standards 378—380
Errors in lattice-parameter determination, Debye — Scherrer camera, elimination by internal standards, equation adaption      376—378
Errors in lattice-parameter determination, Debye — Scherrer camera, elimination by internal standards, equation adaption 376—378
Errors in lattice-parameter determination, Debye — Scherrer camera, elimination by internal standards, extrapolation methods      370 373—378
Errors in lattice-parameter determination, Debye — Scherrer camera, elimination by internal standards, extrapolation methods 370, 373—378
Errors in lattice-parameter determination, Debye — Scherrer camera, elimination by internal standards, practical elimination      372—373
Errors in lattice-parameter determination, Debye — Scherrer camera, elimination by internal standards, practical elimination 372—373
Errors in lattice-parameter determination, Debye — Scherrer camera, elimination by internal standards, subjective errors      367—368 381
Errors in lattice-parameter determination, Debye — Scherrer camera, elimination by internal standards, subjective errors 367—368, 381
Errors in lattice-parameter determination, Debye-Scherrer camera, elimination by internal standards      378—80
Errors in lattice-parameter determination, Debye-Scherrer camera, equation adaption      376—8
Errors in lattice-parameter determination, Debye-Scherrer camera, extrapolation methods      370 373—8
Errors in lattice-parameter determination, Debye-Scherrer camera, practical elimination      372—3
Errors in lattice-parameter determination, Debye-Scherrer camera, subjective errors      367—8 381
Errors in lattice-parameter determination, diffractometer      392 394
Errors in lattice-parameter determination, diffractometer 392, 394
Errors in lattice-parameter determination, divergence of beam      373 385 390 392
Errors in lattice-parameter determination, divergence of beam 373, 385, 390, 392
Errors in lattice-parameter determination, film measurement      381 383
Errors in lattice-parameter determination, film measurement 381, 383
Errors in lattice-parameter determination, film shrinkage      369 383 388
Errors in lattice-parameter determination, film shrinkage 369, 383, 388
Errors in lattice-parameter determination, finite specimen height      371—372
Errors in lattice-parameter determination, finite specimen height 371—372
Errors in lattice-parameter determination, focusing camera, equation adaption      385—386
Errors in lattice-parameter determination, focusing camera, equation adaption 385—386
Errors in lattice-parameter determination, focusing camera, equation adaption, subjective errors      382—383
Errors in lattice-parameter determination, focusing camera, equation adaption, subjective errors 382—383
Errors in lattice-parameter determination, random      381
Errors in lattice-parameter determination, random 381
Errors in lattice-parameter determination, refraction      368
Errors in lattice-parameter determination, refraction 368
Errors in lattice-parameter determination, specimen displacement      373 385 392
Errors in lattice-parameter determination, specimen displacement 373, 385, 392
Errors in lattice-parameter determination, subjective errors      382—3
Errors in lattice-parameter determination, X-ray wavelengths      394 652—653
Errors in lattice-parameter determination, X-ray wavelengths 394, 652—653
Etch figures      48
Etch figures 48
Etching of specimens      114 298—299
Etching of specimens 114, 298—299
Etching of specimens, strain produced      602
Etching of specimens, strain produced 602
Evacuation of camera      118—119
Evacuation of camera 118—119
Evacuation of camera, high-temperature work      256
Evacuation of camera, high-temperature work 256
Evans, H.D.      207
Evans, H.D. 207
Evans, H.T.      663
Evans, H.T. 663
Evans, R.C.      142 143 144 342
Evans, R.C. 142, 143, 144, 342
Evans, R.D.      208 223
Evans, R.D. 208, 223
Ewald, P.P.      439
Ewald, P.P. 439
Ewell, L.A.      567
Ewell, L.A. 567
Expansion measurement      262—264
Expansion measurement 262—264
Exposure time      621—623
Exposure time 621—623
Exposure time, flat-layer methods      147
Exposure time, flat-layer methods 147
Exposure time, geometrical study      281—283
Exposure time, geometrical study 281—283
Exposure time, high-temperature requirements      252—253
Exposure time, high-temperature requirements 252—253
Exposure time, relation to film density      626—628
Exposure time, relation to film density 626—628
Exposure time, variation with camera radius      80 109—111
Exposure time, variation with camera radius 80, 109—111
Extinction primary      54 129 143 399
Extinction primary 54, 129, 143, 399
Extinction secondary      54 143 399
Extinction secondary 54, 143, 399
Extinction, primary      54 129 143 399
Extinction, secondary      54 143 399
Extrapolation methods of determining accurate lattice parameters      366 see
Extrapolation methods of determining accurate lattice parameters see also “Errors”, 366
Extrapolation methods of determining accurate lattice parameters, Debye — Scherrer camera, analytical treatment      376—378
Extrapolation methods of determining accurate lattice parameters, Debye — Scherrer camera, analytical treatment 376—378
Extrapolation methods of determining accurate lattice parameters, Debye — Scherrer camera, graphical treatment      370 373—375
Extrapolation methods of determining accurate lattice parameters, Debye — Scherrer camera, graphical treatment 370, 373—375
Extrapolation methods of determining accurate lattice parameters, Debye-Scherrer camera, analytical treatment      376—8
Extrapolation methods of determining accurate lattice parameters, Debye-Scherrer camera, graphical treatment      370 373—5

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