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| Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry |
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| Ïðåäìåòíûé óêàçàòåëü |
Cobalt radiation 328 367
Cobalt radiation 328, 367
Cobalt radiation, counter gas for 198—199
Cobalt radiation, counter gas for 198—199
Cobalt radiation, penetration into metal 603—604
Cobalt radiation, penetration into metal 603—604
Cochran, W. 226 375 553 555 656
Cochran, W. 226, 375, 553, 555, 656
Cockroft, A.L. 204 522
Cockroft, A.L. 204, 522
Cohen, E.R. 138 652 653
Cohen, E.R. 138, 652, 653
Cohen, M. 338
Cohen, M. 338
Cohen, M.U. 376 377 379 386
Cohen, M.U. 376, 377, 379, 386
Coherent scattering 431 438—453
Coherent scattering 431, 438—453
Cohn, W. 242 243 254
Cohn, W. 242, 243, 254
Coincident powder lines see "Overlapping powder lines"
Coincident powder lines see “Overlapping powder lines”
Cold-worked metals, diffraction rings, study 291—296 429 460
Cold-worked metals, diffraction rings, study 291—296, 429, 460
Cold-worked metals, equilibrium conditions 585
Cold-worked metals, equilibrium conditions 585
Cold-worked metals, preferred orientation 470
Cold-worked metals, preferred orientation 470
Cole, D.G. 211 231 254
Cole, D.G. 211, 231, 254
Cole, W.F. 375
Cole, W.F. 375
Colegrave, E.B. 562
Colegrave, E.B. 562
Collagen 234 240 446—447 549
Collagen 234, 240, 446—447, 549
Collimating system, adaption for angular ranges 108—109
Collimating system, adaption for angular ranges 108—109
Collimating system, back-reflexion camera 176—177 180—181
Collimating system, back-reflexion camera 176—177, 180—181
Collimating system, Debve-Scherrer camera 86 88 104—7
Collimating system, Debye — Scherrer camera 86 88 104—107
Collimating system, Debye-Scherrer camera 86, 88, 104—107
Collimating system, diffractometer 219—220
Collimating system, diffractometer 219—220
Collimating system, flat-laver methods 165—166
Collimating system, flat-layer methods 165—6
Collimating system, flat-layer methods 165—166
Collimating system, high-temperature camera, block specimen 173
Collimating system, high-temperature camera, block specimen 173
Collimating system, high-temperature camera, central specimen 257
Collimating system, high-temperature camera, central specimen 257
Collimating system, inclination to target 61 88 118
Collimating system, inclination to target 61, 88, 118
Collimating system, low-angle camera 232—235
Collimating system, low-angle camera 232—235
Collimating system, microbeam, designs 283—287 290—293
Collimating system, microbeam, designs 283—287, 290—293
Collimating system, precision camera 89—90
Collimating system, precision camera 89—90
Collimating system, preferred orientation camera 308—309
Collimating system, preferred orientation camera theoretical considerations 278—83
Collimating system, preferred-orientation camera 308—309
Collimating system, theoretical considerations 278—283
Collimating system, theoretical considerations 278—283
Collimation errors, low-angle methods 234 241
Collimation errors, low-angle methods 234, 241
Colloidal material, scattering 447—448
Colloidal material, scattering 447—448
Coltman, J.W. 205
Coltman, J.W. 205
Coltman, R.R. 618
Coltman, R.R. 618
Comeforo, J.E. 567
Comeforo, J.E. 567
Compton scattering 279 431 433
Compton scattering 279, 431, 433
Compton, A.H. 96 193 220 395 406 434
Compton, A.H. 96, 193, 220, 395, 406, 434
Concave reflector see "Focusing monochromator"
Concave reflector see “Focusing monochromator”
Conduction cooling of specimen 268—270 274—276
Conduction cooling of specimen 268—270, 274—276
Coneave reflector Focusing monochromator
Connell, L.F. 246
Connell, L.F. 246
Conrad, C.M. 300 318
Conrad, C.M. 300, 318
Constant-temperature camera 619
Constant-temperature camera 619
Contamination of alloy samples 577—578
Contamination of alloy samples 577—578
Contamination of target 62 209
Contamination of target 62, 209
Continuous radiation intensity 67 see
Continuous radiation intensity see also “White radiation”, 67
Contrast in X-ray films 622—623
Contrast in X-ray films 622—623
Convection heating of specimen 243
Convection heating of specimen 243
Convergent incident beam see "Incident beam convergent"
Convergent incident beam see “Incident beam, convergent”
Cook, M. 470 473 474 475 476
Cook, M. 470, 473, 474, 475, 476
Cook, R.L. 229 570
Cook, R.L. 229, 570
Cooke-Yarborough, E.H. 197 208 212
Cooke-Yarborough, E.H. 197, 208, 212
Coolidge tube 59
Coolidge tube 59
Cooling methods, specimen 266—276
Cooling methods, specimen 266—276
Cooling methods, target 58
Cooling methods, target 58
Cooper alloys, gold 437
Cooper alloys, gold 437
Cooper alloys, iron-nickel 596—7
Cooper alloys, iron-nickel 596—597
Cooper alloys, silver 580—582
Cooper alooys, silver 580—2
Cooper radiation, counter gas for 198—9
Cooper radiation, counter gas for 198—199
Cooper radiation, low-angle methods 241
Cooper radiation, low-angle methods 241
Cooper radiation, penetration into metal 603—4
Cooper radiation, penetration into metal 603—604
Cooper radiation, quantum energy 193—4
Cooper radiation, quantum energy 193—194
Copper alloys, arsenic 583
Copper alloys, arsenic 583
Copper alloys, gold 437
Copper alloys, iron-nickel 596—597
Copper alloys, silver 580—582
Copper radiation 61—62 203 207 226 303 328 366 507 512
Copper radiation 61—62, 203, 207, 226, 303, 328, 366, 507, 512
Copper radiation, counter gas for 198—199
Copper radiation, low-angle methods 241
Copper radiation, penetration into metal 603—604
Copper radiation, quantum energy 193—194
Copper, texture 416 455 467—480
Copper, texture 416, 455, 467—480
Corey, R.B. 547 552 554 555
Corey, R.B. 547, 552, 554, 555
Corney, G.M. 631
Corney, G.M. 631
Corona stabilizers 212—13
Corona stabilizers 212—213
Corona, stabilizers 212—213
Correction factors intensity, focusing cameras 125
Correction factors intensity, focusing cameras 125
| Correction factors intensity, polarization 395—6 439
Correction factors intensity, polarization 395—396, 439
Correction factors intensity, temperature 53 396
Correction factors intensity, temperature 53, 396
Correction factors, d spacing Bragg angle 112—13 366—94
Correction factors, d spacing Bragg angle 112—113, 366—394
Correction factors, d spacing instrumental broadening 385 414
Correction factors, d spacing instrumental broadening 385, 414
Correction factors, d spacing refraction 368
Correction factors, d spacing refraction 368
Correction factors, d spacing specimen height 371—2
Correction factors, d spacing specimen height 371—372
Correction factors, d spacing stationary powder layers 151—6
Correction factors, d spacing stationary powder layers 151—155
Correction factors, d spacing, Bragg angle 112—113 366—394
Correction factors, d spacing, instrumental broadening 385 414
Correction factors, d spacing, refraction 368
Correction factors, d spacing, specimen height 371—372
Correction factors, d spacing, stationary powder layers 151—155
Correction factors, intensity, focusing cameras 125
Correction factors, intensity, polarization 395—396 439
Correction factors, intensity, temperature 53 396
Cosmic radiation, elimination from counters 223
Cosmic radiation, elimination from counters 223
Counter background elimination 420—1
Counter diffractometers 189—231
Counter diffractometers 189—231
Counter diffractometers Soller-slit system 132
Counter diffractometers, background elimination 420—421
Counter diffractometers, background elimination 420—421
Counter diffractometers, resolving power 520
Counter diffractometers, resolving power 520
Counter diffractometers, Soller-slit system 132
Counter diffractometers, use accurate lattice-parameter determination 392—3
Counter diffractometers, use accurate lattice-parameter determination 392—393
Counter diffractometers, use flat-layer methods 150 155—9
Counter diffractometers, use flat-layer methods 150, 155—159
Counter diffractometers, use high-temperature methods 260—2 342
Counter diffractometers, use high-temperature methods 260—262, 342
Counter diffractometers, use identification 510—11 516 521—2
Counter diffractometers, use identification 510—511, 516, 521—522
Counter diffractometers, use limitations 231
Counter diffractometers, use limitations 231
Counter diffractometers, use low-angle methods 235 240
Counter diffractometers, use low-angle methods 235, 240
Counter diffractometers, use low-temperature methods 272 274—6
Counter diffractometers, use low-temperature methods 272, 274—276
Counter diffractometers, use microbeam technique 296
Counter diffractometers, use microbeam technique 296
Counter diffractometers, use preferred-orientation methods 316—20
Counter diffractometers, use preferred-orientation methods 316—320
Counter diffractometers, use profile study 419—20
Counter diffractometers, use profile study 419—420
Counter diffractometers, use rapid transformation study 342—3
Counter diffractometers, use rapid transformation study 342—343
Counter diffractometers, use, accurate lattice-parameter determination 392—393
Counter diffractometers, use, flat-layer methods 150 155—159
Counter diffractometers, use, high-temperature methods 260—262 342
Counter diffractometers, use, identification 610—611 516 621—622
Counter diffractometers, use, limitations 231
Counter diffractometers, use, low-angle methods 235 240
Counter diffractometers, use, low-temperature methods 272 274—276
Counter diffractometers, use, microbeam technique 296
Counter diffractometers, use, preferred-orientation methods 316—320
Counter diffractometers, use, profile study 419—420
Counter diffractometers, use, rapid transformation study 342—343
Counter resolving power 520
Counter Soller-slit system 132
Counter spectrometers see "Counter diffractometers"
Counter spectrometers see “Counter diffractometers”
Counters see also "Circuits" "Geiger
Counters beaded 201—5
Counters beaded 201—205
Counters corrections 224—5
Counters corrections 224—225
Counters efficiency 197—9
Counters efficiency 197—199
Counters Geiger-Muller 195—206
Counters Geiger-Muller 195—206
Counters ionization 192
Counters ionization 192
Counters proportional 201
Counters proportional 201
Counters scintillation 205—8
Counters scintillation 205—208
Counters see also “Circuits, Geiger — Muller counters”
Counters, beaded 201—205
Counters, corrections 224—225
Counters, efficiency 197—199
Counters, Geiger — Mueller 195—206
Counters, ionization 192
Counters, proportional 201
Counters, scintillation 205—208
Counting rate statistics 223
Counting rate statistics 223
Counting rate, background 191 223
Counting rate, background 191, 223
Counting rate, beaded counter 201
Counting rate, beaded counter 201
Counting rate, estimation 192
Counting rate, estimation 192
Counting rate, Geiger-counter, galvanometer measurement 201
Counting rate, Geiger-counter, galvanometer measurement 201
Counting rate, Gesger-counter, galvanometer measurement 201
Counting rate, plateau curve 196
Counting rate, plateau curve 196
Counting rate, proportional counter 201—202
Counting rate, proportional counter 201—202
Counting rate, pulsed X-ray tubes 225—226
Counting rate, pulsed X-ray tubes 225—226
Counting-loss corrections 224—225
Counting-loss corrections 224—225
Counting-loss corrections, monitored system 226
Counting-loss corrections, monitored system 226
Counting-loss monitored system 226
Counting-rate meters 208 211—213
Counting-rate meters, statistics 223
Counting-rate, meters 208 211—13
Counting-rate, meters 208, 211—13
Craggs, J.D. 194 208 213
Craggs, J.D. 194, 208, 213
Craik, J. 533 539
Craik, J. 533, 539
Crathorn, A.R. 204
Crathorn, A.R. 204
Creely, J. 300 318
Creely, J. 300, 318
Crick, F.H.C. 553 555 556
Crick, F.H.C. 553, 555, 556
Cristobalite refractories 562—563
Cristobalite refractories 562—563
Crystal classes 30—32
Crystal classes 30—32
Crystal classes, multiplicity factors 639—641
Crystal classes, multiplicity factors 639—641
Crystal-reflected back-reflexion methods 182—3
Crystal-reflected back-reflexion methods 182—183
Crystal-reflected low-angle techniques 233 235—40
Crystal-reflected low-angle techniques 233, 235—240
Crystal-reflected radiation 49 98 122—123 328
Crystal-reflected radiation 49, 93, 122—123, 328
Crystal-reflected radiation, back-reflexion methods 182—183
Crystal-reflected radiation, low-angle techniques 233 235—240
Crystal-structure models 36—37
Crystal-structure models 36—37
Crystallite size, back-reflexion methods 188
Crystallite size, back-reflexion methods 188
Crystallite size, effect on intensity 899
Crystallite size, effect on intensity 399
Crystallite size, exposure time 281
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