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| Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry |
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| Ïðåäìåòíûé óêàçàòåëü |
Organic-vapour quenching, proportional counter 201—202
Organic-vapour quenching, proportional counter 201—202
Orientation of reflecting crystallites 482—489 606—607
Orientation of reflecting crystallites 482—489, 606—607
Orientation texture study 298—322 see
Orientation texture study see “Preferred orientation”, 298—322
Orthorhombic system, axial constants, calculation 40—41
Orthorhombic system, axial constants, calculation 40—41
Orthorhombic system, cell-dimension determination 350—353 378
Orthorhombic system, cell-dimension determination 350—353, 378
Orthorhombic system, lattice-spacing calculation 43
Orthorhombic system, lattice-spacing calculation 43
Orthorhombic system, multiplicity factors 640
Orthorhombic system, multiplicity factors 640
Orthorhombic system, symmetry 31
Orthorhombic system, symmetry 31
Oscillation of specimen see "Scanning"
Oscillation of specimen see “Scanning”
Osswald, E. 391
Osswald, E. 391
Oster, G. 441 442 449
Oster, G. 441, 442, 449
Ott, E. 114
Ott, E. 114
Overlapping powder lines 335 500 518—520
Overlapping powder lines 335, 500, 518—520
Overlapping powder lines, resolution of intensities 405—406 421—422
Overlapping powder lines, resolution of intensities 405—406, 421—422
Owen, E.A. 125 145 153 162 166 173 186 245 246 248 249 250 255 257 258 272 386 460 574—584
Owen, E.A. 125, 145, 153, 162, 166, 173, 186, 245, 246, 248, 249, 250, 255, 257, 258, 272, 386, 460, 574—584
Owen, E.B. 208
Owen, E.B. 208
Oxidation 584
Oxidation 584
Oxidation, high-temperature specimens 252 256 582—583
Oxidation, high-temperature specimens 252, 256, 582—583
Oxidation, identification aid 342
Oxidation, identification aid 342
Oxygen as cooling liquid 266 275
Oxygen as cooling liquid 266, 275
Pankow, G.W. 560
Pankow, G.W. 650
Parameter determination see "Lattice parameter structure-analysis
Parameter determination see “Lattice parameter, structure-analysis methods”
Parametral plane 34
Parametral plane 34
Parasitic scattering 232 239—240 270 289 439
Parasitic scattering 232, 239—240, 279, 289, 439
Parasitic scattering, air scattering 103—107 109 132 232—233 279 420 430
Parasitic scattering, air scattering 103—107, 109, 132, 232—233, 279, 420, 430
Parasitic scattering, slit scattering 287
Parasitic scattering, slit scattering 287
Parker, A.M.B. 114 698
Parker, A.M.B. 114, 698
Parker, T.W. 561
Parker, T.W. 561
Parks, T.D. 516
Parks, T.D. 516
Parratt, L.G. 201 205
Parratt, L.G. 201, 205
Parrish, W. 74 108 109 158 214 329 370 430
Parrish, W. 74, 108, 109, 158, 214, 329, 370, 430
Particle absorption factor 339—340
Particle absorption factor 339—340
Particle size see also "Crystallite size"
Particle size see also “Crystallite size”
Particle size, apparent 413—415
Particle size, apparent 413—415
Particle size, back-reflexion methods 188
Particle size, back-reflexion methods 188
Particle size, effect on intensity 399
Particle size, effect on intensity 399
Particle size, flat-layer methods 153—155
Particle size, flat-layer methods 153—155
Particle size, microbeam methods 292—295
Particle size, microbeam methods 292—295
Particle size, non-crystalline media 449—453
Particle size, non-crystalline media 449—53
Partridge, J.H. 567
Partridge, J.H. 567
Pascoe, K.J. 416
Pascoe, K.J. 416
Paterson, M.S. 427 428 429
Paterson, M.S. 427, 428, 429
Patterson function 55
Patterson function 55
Patterson function, equivalent in non-crystalline media 446
Patterson function, equivalent in non-crystalline media 446
Patterson, A.L. 413
Patterson, A.L. 413
Pauling, L. 547 552 554 555 591 592 600
Pauling, L. 547, 552, 554, 555, 591, 592, 600
Peak intensity 139—141 413 418 421
Peak intensity 139—141, 413, 418, 421
Peak positions of powder line, displacement 366
Peak positions of powder line, displacement 366
Peak positions of powder line, displacement, Debye — Scherrer method 93
Peak positions of powder line, displacement, Debye — Scherrer method 93
Peak positions of powder line, displacement, Debye-Scherrer method 93
Peak positions of powder line, displacement, diffractometer 227—229 392 394
Peak positions of powder line, displacement, diffractometer 227—229, 392, 394
Peak positions of powder line, displacement, flat-layer method 156
Peak positions of powder line, displacement, flat-layer method 156
Peak positions of powder line, displacement, focusing method 385—386
Peak positions of powder line, displacement, focusing method 385—386
Peak positions of powder line, measurement, back-reflexion method 182
Peak positions of powder line, measurement, flat-layer method 152—153
Peak posotions of powder line, measurement, back-reflexion method 182
Peak posotions of powder line, measurement, back-reflexion method 182
Peak posotions of powder line, measurement, flat-layer method 152—3
Peak posotions of powder line, measurement, flat-layer method 152—153
Peak voltages 68 208 653—654
Peak voltages 68, 208, 653—654
Pearson, W.B. 255 593
Pearson, W.B. 255, 593
Pease, R.S. 406 425 618 619
Pease, R.S. 406, 425, 618, 619
Peebles, W.C. 113 516
Peebles, W.C. 113, 516
Peierls, R. 594
Peierls, R. 594
Peiser, H.S. 27—55 56—77 253 365 542 631
Peiser, H.S. 27—55, 56—77, 253, 365, 542, 631
Pelc, S.R. 627
Pelc, S.R. 627
Penetration of specimen by incident beam, diffractometer 392
Penetration of specimen by incident beam, diffractometer 392
Penetration of specimen by incident beam, fiat-layer techniques 156 388 411
Penetration of specimen by incident beam, fiat-layer techniques 156, 388, 411
Penetration of specimen by incident beam, focusing camera 386
Penetration of specimen by incident beam, focusing camera 386
Penetration of specimen by incident beam, metals 603—604
Penetration of specimen by incident beam, metals 603—604
Pentaerythritol, monochromator use 140—141 328
Pentaerythritol, monochromator use 140—141, 328
Pepinsky, R. 69 274
Pepinsky, R. 69, 274
Perio, P. 617
Perio, P. 617
Perutz, M.F. 555
Perutz, M.F. 555
Petch, N.J. 80 86 598
Petch, N.J. 80, 86, 598
Peters, C.L. 588
Peters, C.L. 588
Phase angle 55 517
Phase angle 55, 517
Phase-boundary determination 82 268 507 574—575
Phase-boundary determination 82, 268, 507, 574—575
Phase-boundary determination, high-temperature cameras 582—583
| Phase-boundary determination, high-temperature cameras 582—583
Phase-boundary determination, lattice-spacing method 579—582
Phase-boundary determination, lattice-spacing method 579—582
Phase-boundary determination, vanishing-phase method 578—579
Phase-boundary determination, vanishing-phase method 578—579
Phase-equilibrium studies 82 231 252—253 263—264 341
Phase-equilibrium studies 82, 231, 252—253, 263—264, 341
Phase-equilibrium studies, ceramic-oxide systems 558—560
Phase-equilibrium studies, ceramic-oxide systems 558—60
Phase-equilibrium studies, orientation of coexisting phases 587—588
Phase-equilibrium studies, orientation of coexisting phases 587—588
Philips 181
Philips 181
Phillips, F.C. 34 36
Phillips, F.C. 34, 36
Phosphoresence of zinc sulphide screens 628
Phosphoresence of zinc sulphide screens 628
Phosphors for scintillation counters 205
Phosphors for scintillation counters 205
Photographic density 191 see
Photographic density see “Microdensitometry”, 191
Photographic density, measurement of intensity 621
Photographic density, measurement of intensity 621
photography see "Film" "Emulsion" "Processing"
Photography see “Film, Emulsion, Processing”
Photometer see "Microdensitometry"
Photometer see “Microdensitometry”
Pickup, L. 125 583
Pickup, L. 125, 583
Pickus, M.R. 467
Pickus, M.R. 467
Pierce, F.T. 534
Pierce, F.T. 534
Piezoelectric effect 48
Piezoelectric effect 48
Piles, atomic 611
Piles, atomic 611
Pinder, H.W. 295 569 570
Pinder, H.W. 295, 569, 570
Pinhole collimation 527
Pinhole collimation 527
Pinhole collimation, back-reflexion cameras 176—177
Pinhole collimation, back-reflexion cameras 176—177
Pinhole collimation, flat-layer cameras 165
Pinhole collimation, flat-layer cameras 165
Pinhole collimation, low-angle cameras 234—235
Pinhole collimation, low-angle cameras 234—235
Pinhole collimation, low-temperature camera 275
Pinhole collimation, low-temperature camera 275
Pinhole collimation, microbeam techniques 283—284
Pinhole collimation, microbeam techniques 283—284
Pinhole collimation, optimum conditions 280—283
Pinhole collimation, optimum conditions 280—283
Piper, S.H. 515
Piper, S.H. 515
Pirenne, M.H. 443
Pirenne, M.H. 443
Pish, G. 183
Pish, G. 183
Planar orientation, interpretation of photographs 361—365
Planar orientation, interpretation of photographs 361—365
Planar orientation, organic materials 490—492
Planar orientation, organic materials 490—492
Planar orientation, polycrystalline metals 466—469
Planar orientation, polycrystalline metals 466—469
Planar orientation, polycrystalline minerals 525
Planar orientation, polycrystalline minerals 525
Plane monochromators 138—141
Plane monochromators 138—141
Plane monochromators, concentrating type 142—144
Plane monochromators, concentrating type 142—144
Plane monochromators, focusing monochromator comparison 130
Plane monochromators, focusing monochromator comparison 130
Plane of symmetry see "Symmetry plane"
Plane of symmetry see “Symmetry plane”
Plastic anisotropy 475—480 609—610
Plastic anisotropy 475—480, 609—610
Plastic anisotropy, non-continuous diffraction rings 459—460
Plastic anisotropy, non-continuous diffraction rings 459—460
Plastic deformation 33 603
Plastic deformation 33, 603
Plastic deformation, preferred orientation 466—470
Plastic deformation, preferred orientation 466—470
Plastically bent crystal reflectors 128 129 137—138
Plastically bent crystal reflectors 128, 129, 137—138
Plasticine 114 505
Plasticine 114, 505
Plate specimens, high-temperature study 172—175
Plate specimens, high-temperature study 172—175
Plate specimens, low temperature study 272
Plate specimens, low temperature study 272
Plateau curve of Geiger counter 195
Plateau curve of Geiger counter 195
Platinum, high-temperature uses 253—255 259
Platinum, high-temperature uses 253—256, 259
Plutonium, atomic energy 611
Plutonium, atomic energy 611
Plutonium, fluoride, structure determination 613
Plutonium, fluoride, structure determination 613
Point group 30—32 see
Point group see also “Crystal class”, 30—32
Point group, enantiomorphous classes 48
Point group, enantiomorphous classes 48
Point group, Laue groups 48
Point group, Laue groups 48
Poisson distribution 222
Poisson distribution 222
Poisson's ratio 608
Poisson's ratio 608
Polanyi, M. 533
Polanyi, M. 533
Polar arcs, axial orientation 485—487 545—552
Polar arcs, axial orientation 485—487, 545—552
Polar arcs, helical orientation 496 555
Polar arcs, helical orientation 496, 555
Polar arcs, influence of tilt on angular spread 487—488
Polar arcs, influence of tilt on angular spread 487—488
Polarization factor 395 433
Polarization factor 395, 433
Polarization factor, table 646
Polarization factor, table 646
Polarization of incident beam 395—396
Polarization of incident beam 395—396
Pole figures 50 468—469 482—488
Pole figures 50, 468—469, 482—486
Pole figures, cellulose systems 490—491
Pole figures, cellulose systems 490—491
Pole-figure determination, counter-diffractometer methods 316—320
Pole-figure determination, counter-diffractometer methods 316—320
Pole-figure determination, moving-film methods 313—316
Pole-figure determination, moving-film methods 313—316
Pole-figure determination, stationary-film methods 305—307
Pole-figure determination, stationary-film methods 305—307
Poles 38 463
Poles 38, 463
Pollard, J.R. 211
Pollard, J.R. 211
Pollock, A.R. 166 184 310 456 619
Pollock, A.R. 166, 184, 310, 456, 619
Polycrystalline specimens 113—116 525—527
Polycrystalline specimens 113—116, 525—527
Polymers 533—557
Polymers 533—557
Polymers, cell-size determination 361 363
Polymers, cell-size determination 361, 363
Polymers, disorder scattering 437
Polymers, disorder scattering 437
Polymers, preferred orientation 481—496
Polymers, preferred orientation 481—496
Polymers, structure determination 408 446 534—556
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