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Àâòîðèçàöèÿ |
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Ïîèñê ïî óêàçàòåëÿì |
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Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry |
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Ïðåäìåòíûé óêàçàòåëü |
Polymers, structure determination 408, 446, 534—556
Polymers, synthesized 542—544
Polymers, synthesized 542—544
Polymorphism in identification 337 500 507—508 514—516
Polymorphism in identification 337, 500, 507—508, 514—516
Polymorphism in identification, cellulose esters 539—542
Polymorphism in identification, cellulose esters 539—542
Polymorphism in identification, cobalt 417
Polymorphism in identification, cobalt 417
Polymorphism in identification, minerals 531
Polymorphism in identification, minerals 531
Polymorphism in identification, quantitative analysis 510
Polymorphism in identification, quantitative analysis 510
Polymorphism in identification, uranium 613—614
Polymorphism in identification, uranium 613—614
Polypeptide study 533—534 550
Polypeptide study 533—534, 550
Polypeptide study, helix 555—557
Polypeptide study, helix 555—557
Polypeptide study, preferred orientation 490—492
Polypeptide study, preferred orientation 490—492
Polypeptide study, synthetic types 552—555
Polypeptide study, synthetic types 552—555
Polystyrene latex 235 238 240—241 451
Polystyrene latex 235, 238, 240—241, 451
Pont, J.S. 57 253
Pont, J.S. 57, 253
Porod, G. 233 447 448 453
Porod, G. 233, 447, 448, 453
Porter, M.W. 325
Porter, M.W. 325
Portland cements 571—572
Portland cements 571—572
Positive-ion sheath 196 201
Positive-ion sheath 196, 201
Post, B. 273
Post, B. 273
Potassium bromide, monochromator use 140—141
Potassium bromide, monochromator use 140—141
Potassium chloride, absolute intensities 161
Potassium chloride, absolute intensities 161
Powder see "Specimen"
Powder photographs, historical development 78—86
Powder photographs, historical development 78—86
Powder photographs, introduction 49
Powder photographs, introduction 49
Powder see “Specimen”
Powell, H.M. 596
Powell, H.M. 596
Power packs for counter circuits 212
Power packs for counter circuits 212
Pre-amplifier for counter 219
Pre-amplifier for counter 219
Precision powder camera 89—91
Precision powder camera 89—91
Precision powder camera, back-reflexion 180—181
Precision powder camera, back-reflexion 180—181
Precision powder camera, resolving power 91—102
Precision powder camera, resolving power 91—102
Precision powder camera, scattering 103—107
Precision powder camera, scattering 103—107
Preferred orientation 50 298 462—496
Preferred orientation 50, 298, 462—496
Preferred orientation, annealed specimens 470
Preferred orientation, annealed specimens 470
Preferred orientation, axial orientation 358—361 484—489 482—490 493
Preferred orientation, axial orientation 358—361, 464—469, 482—490, 493
Preferred orientation, basal plane enhancement 466 525
Preferred orientation, basal plane enhancement 466, 525
Preferred orientation, choice of method 320—322
Preferred orientation, choice of method 320—322
Preferred orientation, fibre specimens 300 481—496
Preferred orientation, fibre specimens 300, 481—496
Preferred orientation, flat-layer methods 175
Preferred orientation, flat-layer methods 175
Preferred orientation, identification aid 343
Preferred orientation, identification aid 343
Preferred orientation, indexing 358—365
Preferred orientation, indexing 358—365
Preferred orientation, induction 113
Preferred orientation, induction 113
Preferred orientation, intensity effect 399—400
Preferred orientation, intensity effect 399—400
Preferred orientation, organic materials 481—496
Preferred orientation, organic materials 481—496
Preferred orientation, planar orientation 343 361—363 466—469 491—492
Preferred orientation, planar orientation 343, 361—363, 466—469, 491—492
Preferred orientation, polycrystalline metals 462—480
Preferred orientation, polycrystalline metals 462—480
Preferred orientation, quantitative determination 301
Preferred orientation, quantitative determination 301
Preferred orientation, systems in organic materials 489—491
Preferred orientation, systems in organic materials 489—491
Preferred-orientation cameras see "Cameras preferred-orientation"
Preferred-orientation cameras see “Cameras, preferred-orientation”
Pressure in gas tube 57—58
Pressure in gas tube 57—58
Preston, G.D. 125 145 153 382
Preston, G.D. 125, 145, 153, 382
Preston, R.D. 71 284 493 495 556
Preston, R.D. 71, 284, 493, 495, 556
Price, W.C. 555
Price, W.C. 555
Primary extinction 54 129 143 399
Primary extinction 54, 129, 143, 399
Prince, A.T. 560
Prince, A.T. 560
Prince, E. 211
Prince, E. 211
Prins, J.A. 441 443 444 451
Prins, J.A. 441, 443, 444, 451
Probable error 222 382
Probable error 222, 382
Processing of X-ray films 629—631 634
Processing of X-ray films 629—631, 634
Profile of powder line 394 see
Profile of powder line see “Breadth of powder line”, 394
Profile of powder line, calculation 411
Profile of powder line, calculation 411
Profile of powder line, Debye — Scherrer specimen 91—102, 326—327
Profile of powder line, Debye — Seherrer specimen 91—102 326—327
Profile of powder line, Debye-Scherrer specimen 91—102 326—7
Profile of powder line, distortion by counter slits 227
Profile of powder line, distortion by counter slits 227
Profile of powder line, distortion by rate-meter time constant 227
Profile of powder line, distortion by rate-meter time constant 227
Profile of powder line, experimental determination 418—422
Profile of powder line, experimental determination 418—422
Profile of powder line, flat-layer specimen 153—155 188
Profile of powder line, flat-layer specimen 153—155, 188
Profile of powder line, focusing-camera specimen 385—386
Profile of powder line, focusing-camera specimen 385—386
Profile of powder line, identification 334
Profile of powder line, identification 334
Profile of powder line, instrumental broadening, correction 228 422—428
Profile of powder line, instrumental broadening, correction 228, 422—428
Profile of powder line, intrinsic broadening, cause 428—429
Profile of powder line, intrinsic broadening, cause 428—429
Profile of powder line, separation of instrumental and intrinsic broadening 424—428
Profile of powder line, separation of instrumental and intrinsic broadening 424—428
Projection, clinographic 36—37
Projection, clinographic 36—37
Projection, gnomonic 41—42
Projection, gnomonic 41—42
Projection, spherical 37—38
Projection, spherical 37—39
Projection, stereograph ic 37—41
Projection, stereographic 37—41
Projection, stereographic 37—41
Proportional counters 192 195 201—205 206—207 213 522
| Proportional counters 192, 195, 201—205 206—207, 213, 522
Proportional counters, background count 223
Proportional counters, background count 223
Proportional counters, low-angle methods 235 240
Proportional counters, low-angle methods 235, 240
Proportional counters, pulse formation 193—194
Proportional counters, pulse formation 193—194
Proportional counters, scintillation counters 205—208
Proportional counters, scintillation counters 205—208
Protein study 533—534
Protein study 533—534
Protein study, helix 555—557
Protein study, helix 555—557
Protein study, fibrous types 546—552
Protein study, fibrous types 546—552
Pseudomorph identification 529—530
Pseudomorph identification 529—530
Pulse counter 191
Pulse counter 191
Pulse formation 193—194
Pulse formation 193—194
Pulse formation, Geiger-counter illustration 195—196
Pulse formation, Geiger-counter illustration 195—196
Pulse size 196 201
Pulse size 196, 201
Pulsford, E.W. 208 212
Pulsford, E.W. 208, 212
Punched-card methods of identification 333 504
Punched-card methods of identification 333, 504
Purity of chemical standards 503
Purity of chemical standards 503
Putman, J.L. 196
Putman, J.L. 196
Pyrex glass 580
Pyrex glass 580
Pyrex glass, X-ray tube window 63
Pyrex glass, X-ray tube window 63
Pyroelectric effect 48
Pyroelectric effect 48
Pyrometry, measurement of camera temperature 255
Pyrometry, measurement of camera temperature 255
Quadratic forms, table 636—639
Quadratic forms, table 636—639
qualitative analysis 338—340 see
Qualitative analysis see “Identification”, 338—340
Quanta of X-rays absorbed by emulsion 191—192 627
Quanta of X-rays absorbed by emulsion 191—192, 627
Quantitative analysis 405 510 516 530 559
Quantitative analysis 405, 510, 516, 530, 559
Quantitative analysis, diffractometer use 229—230
Quantitative analysis, diffractometer use 229—230
Quantum efficiency of radiation detectors 191 206—207
Quantum efficiency of radiation detectors 191, 206—207
Quartz 370 407 526 531
Quartz 370, 407, 526, 531
Quartz, camera calibration 124
Quartz, camera calibration 124
Quartz, monochromator use 122 128—130 133 135 137—141 143
Quartz, monochromator use 122, 128—130, 133, 135, 137—141, 143
Quartz, refractories 562—563
Quartz, refractories 562—563
Quartz, thermal history 263
Quartz, thermal history 263
Quenching of counters, circuit 195—196 212 219 226
Quenching of counters, circuit 195—196, 212, 219, 226
Quenching of counters, halogen 195—200 202 213
Quenching of counters, halogen 195—200, 202, 213
Quenching of counters, organic vapour 195—202 213
Quenching of counters, organic vapour 195—202, 213
Quenching of molten material 242 575 580
Quenching of molten material 242, 575, 580
Qurashi, M.M. 407 593
Qurashi, M.M. 407, 593
R value 55
R value 55
Rachinger, W.A. 217 406 425 460 602 619
Rachinger, W.A. 217, 406, 425, 460, 602, 619
Radial scatter of spots 454 456
Radial scatter of spots 454, 456
Radiation choice 303 327—328
Radiation choice 303, 327—328
Radiation choice, accurate measurements 374—375
Radiation choice, accurate measurements 374—375
Radiation choice, back-reflexion methods 186—7
Radiation choice, back-reflexion methods 186—187
Radiation choice, bank-reflexion methods 186—187
Radiation choice, fluorescence 432
Radiation choice, fluorescence 432
Radiation choice, low-angle methods 240—241
Radiation choice, low-angle methods 240—241
Radiation detectors 189—208
Radiation detectors 189—208
Radiation, specimen cooling 270 277
Radiation, specimen cooling 270, 277
Radiation, specimen heating 254
Radiation, specimen heating 254
Radiation-purity test 119
Radiation-purity test 119
Radioactive compounds, counter testing 219 222
Radioactive compounds, counter testing 219, 222
Radioactive compounds, examination 611—619
Radioactive compounds, examination 611—619
Radiography 56 71
Radiography 56, 71
Radiography, film used 620
Radiography, film used 620
Radius of powder camera 152
Radius of powder camera 152
Radius of powder camera, Debye — Scherrer camera 80 121 327
Radius of powder camera, Debye — Scherrer camera 80, 121, 327
Radius of powder camera, diffractometer 218
Radius of powder camera, diffractometer 218
Radius of powder camera, focusing camera, effective 125
Radius of powder camera, focusing camera, effective 125
Radius of powder camera, high-temperature camera 257
Radius of powder camera, high-temperature camera 257
Radius of powder camera, relation to exposure time 110
Radius of powder camera, relation to exposure time 110
Rae, E.R. 201
Rae, E.R. 201
Rait, J.R. 295 558 561 563 566 567 569 570
Rait, J.R. 295, 558, 561, 563, 566, 667, 569, 570
Ralston, A.W. 515
Ralston, A.W. 515
Ramachandran, G.N. 138 143 223
Ramachandran, G.N. 138, 143, 223
Raman, C.V. 434
Raman, C.V. 434
Ramsdell, L.S. 531
Ramsdell, L.S. 531
Randall, J.T. 443
Randall, J.T. 443
Random errors in lattice-parameter determination, minimization 376 381—382
Random errors in lattice-parameter determination, minimization 376, 381—382
Range of Bragg angle, counter diffractometer 329
Range of Bragg angle, counter diffractometer 329
Range of Bragg angle, Debye — Scherrer camera 107—109 329
Range of Bragg angle, Debye — Scherrer camera 107—109, 329
Range of Bragg angle, Debye-Scherrer camera 107—9 329
Range of Bragg angle, flat-layer method 146—147 167
Range of Bragg angle, flat-layer method 146—147, 167
Range of Bragg angle, focusing camera 124 296
Range of Bragg angle, focusing camera 124, 296
Range of Bragg angle, high-temperature camera 257
Range of Bragg angle, high-temperature camera 257
Range of Bragg angle, low-angle method 232
Range of Bragg angle, low-angle method 232
Rare-earth compounds, heavy-element compound relations 612—613
Rare-earth compounds, heavy-element compound relations 612—613
Rate of counting, background 191
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