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Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry
Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry



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Íàçâàíèå: X-Ray Diffraction by Polycrystalline Materials. Physics in Industry

Àâòîðû: Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.)

Àííîòàöèÿ:

For anyone WI10 has been concerned with X-ray analysis since its early days, it. is fascinating to see how the subject continues to grow and ramify. The present book is a striking illustration of this development. Although it deals with only one branch of crystal analysis, the study of polycrysta]line materials, it has been found desirable tQ invite some thirty experts to make their contributions in order that each aspect of the subject might be covered in an authoritative way. That it has been possible to weld contributions from so many authors into a coherent scheme is both a tribute to the editors and an excellent exalllple of that happy collaboration that has existed froITi the very beginning amongst X-ray crystallographers and continues so manifstly at the present time.


ßçûê: en

Ðóáðèêà: Ôèçèêà/

Ñòàòóñ ïðåäìåòíîãî óêàçàòåëÿ: Ãîòîâ óêàçàòåëü ñ íîìåðàìè ñòðàíèö

ed2k: ed2k stats

Èçäàíèå: 1st edition

Ãîä èçäàíèÿ: 1955

Êîëè÷åñòâî ñòðàíèö: 725

Äîáàâëåíà â êàòàëîã: 06.09.2009

Îïåðàöèè: Ïîëîæèòü íà ïîëêó | Ñêîïèðîâàòü ññûëêó äëÿ ôîðóìà | Ñêîïèðîâàòü ID
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Ïðåäìåòíûé óêàçàòåëü
Polymers, structure determination 408, 446, 534—556      
Polymers, synthesized      542—544
Polymers, synthesized 542—544      
Polymorphism in identification      337 500 507—508 514—516
Polymorphism in identification 337, 500, 507—508, 514—516      
Polymorphism in identification, cellulose esters      539—542
Polymorphism in identification, cellulose esters 539—542      
Polymorphism in identification, cobalt      417
Polymorphism in identification, cobalt 417      
Polymorphism in identification, minerals      531
Polymorphism in identification, minerals 531      
Polymorphism in identification, quantitative analysis      510
Polymorphism in identification, quantitative analysis 510      
Polymorphism in identification, uranium      613—614
Polymorphism in identification, uranium 613—614      
Polypeptide study      533—534 550
Polypeptide study 533—534, 550      
Polypeptide study, $\alpha$ helix      555—557
Polypeptide study, $\alpha$ helix 555—557
Polypeptide study, preferred orientation      490—492
Polypeptide study, preferred orientation 490—492      
Polypeptide study, synthetic types      552—555
Polypeptide study, synthetic types 552—555      
Polystyrene latex      235 238 240—241 451
Polystyrene latex 235, 238, 240—241, 451      
Pont, J.S.      57 253
Pont, J.S. 57, 253      
Porod, G.      233 447 448 453
Porod, G. 233, 447, 448, 453      
Porter, M.W.      325
Porter, M.W. 325      
Portland cements      571—572
Portland cements 571—572      
Positive-ion sheath      196 201
Positive-ion sheath 196, 201      
Post, B.      273
Post, B. 273      
Potassium bromide, monochromator use      140—141
Potassium bromide, monochromator use 140—141      
Potassium chloride, absolute intensities      161
Potassium chloride, absolute intensities 161      
Powder      see "Specimen"
Powder photographs, historical development      78—86
Powder photographs, historical development 78—86      
Powder photographs, introduction      49
Powder photographs, introduction 49      
Powder see “Specimen”      
Powell, H.M.      596
Powell, H.M. 596      
Power packs for counter circuits      212
Power packs for counter circuits 212      
Pre-amplifier for counter      219
Pre-amplifier for counter 219      
Precision powder camera      89—91
Precision powder camera 89—91      
Precision powder camera, back-reflexion      180—181
Precision powder camera, back-reflexion 180—181      
Precision powder camera, resolving power      91—102
Precision powder camera, resolving power 91—102      
Precision powder camera, scattering      103—107
Precision powder camera, scattering 103—107      
Preferred orientation      50 298 462—496
Preferred orientation 50, 298, 462—496      
Preferred orientation, annealed specimens      470
Preferred orientation, annealed specimens 470      
Preferred orientation, axial orientation      358—361 484—489 482—490 493
Preferred orientation, axial orientation 358—361, 464—469, 482—490, 493      
Preferred orientation, basal plane enhancement      466 525
Preferred orientation, basal plane enhancement 466, 525      
Preferred orientation, choice of method      320—322
Preferred orientation, choice of method 320—322      
Preferred orientation, fibre specimens      300 481—496
Preferred orientation, fibre specimens 300, 481—496      
Preferred orientation, flat-layer methods      175
Preferred orientation, flat-layer methods 175      
Preferred orientation, identification aid      343
Preferred orientation, identification aid 343      
Preferred orientation, indexing      358—365
Preferred orientation, indexing 358—365      
Preferred orientation, induction      113
Preferred orientation, induction 113      
Preferred orientation, intensity effect      399—400
Preferred orientation, intensity effect 399—400      
Preferred orientation, organic materials      481—496
Preferred orientation, organic materials 481—496      
Preferred orientation, planar orientation      343 361—363 466—469 491—492
Preferred orientation, planar orientation 343, 361—363, 466—469, 491—492      
Preferred orientation, polycrystalline metals      462—480
Preferred orientation, polycrystalline metals 462—480      
Preferred orientation, quantitative determination      301
Preferred orientation, quantitative determination 301      
Preferred orientation, systems in organic materials      489—491
Preferred orientation, systems in organic materials 489—491      
Preferred-orientation cameras      see "Cameras preferred-orientation"
Preferred-orientation cameras see “Cameras, preferred-orientation”      
Pressure in gas tube      57—58
Pressure in gas tube 57—58      
Preston, G.D.      125 145 153 382
Preston, G.D. 125, 145, 153, 382      
Preston, R.D.      71 284 493 495 556
Preston, R.D. 71, 284, 493, 495, 556      
Price, W.C.      555
Price, W.C. 555      
Primary extinction      54 129 143 399
Primary extinction 54, 129, 143, 399      
Prince, A.T.      560
Prince, A.T. 560      
Prince, E.      211
Prince, E. 211      
Prins, J.A.      441 443 444 451
Prins, J.A. 441, 443, 444, 451      
Probable error      222 382
Probable error 222, 382      
Processing of X-ray films      629—631 634
Processing of X-ray films 629—631, 634      
Profile of powder line      394 see
Profile of powder line see “Breadth of powder line”, 394      
Profile of powder line, calculation      411
Profile of powder line, calculation 411      
Profile of powder line, Debye — Scherrer specimen 91—102, 326—327      
Profile of powder line, Debye — Seherrer specimen      91—102 326—327
Profile of powder line, Debye-Scherrer specimen      91—102 326—7
Profile of powder line, distortion by counter slits      227
Profile of powder line, distortion by counter slits 227      
Profile of powder line, distortion by rate-meter time constant      227
Profile of powder line, distortion by rate-meter time constant 227      
Profile of powder line, experimental determination      418—422
Profile of powder line, experimental determination 418—422      
Profile of powder line, flat-layer specimen      153—155 188
Profile of powder line, flat-layer specimen 153—155, 188      
Profile of powder line, focusing-camera specimen      385—386
Profile of powder line, focusing-camera specimen 385—386      
Profile of powder line, identification      334
Profile of powder line, identification 334      
Profile of powder line, instrumental broadening, correction      228 422—428
Profile of powder line, instrumental broadening, correction 228, 422—428      
Profile of powder line, intrinsic broadening, cause      428—429
Profile of powder line, intrinsic broadening, cause 428—429      
Profile of powder line, separation of instrumental and intrinsic broadening      424—428
Profile of powder line, separation of instrumental and intrinsic broadening 424—428      
Projection, clinographic      36—37
Projection, clinographic 36—37      
Projection, gnomonic      41—42
Projection, gnomonic 41—42      
Projection, spherical      37—38
Projection, spherical 37—39      
Projection, stereograph ic      37—41
Projection, stereographic      37—41
Projection, stereographic 37—41      
Proportional counters      192 195 201—205 206—207 213 522
Proportional counters 192, 195, 201—205 206—207, 213, 522      
Proportional counters, background count      223
Proportional counters, background count 223      
Proportional counters, low-angle methods      235 240
Proportional counters, low-angle methods 235, 240      
Proportional counters, pulse formation      193—194
Proportional counters, pulse formation 193—194      
Proportional counters, scintillation counters      205—208
Proportional counters, scintillation counters 205—208      
Protein study      533—534
Protein study 533—534      
Protein study, $\alpha$ helix      555—557
Protein study, $\alpha$ helix 555—557
Protein study, fibrous types      546—552
Protein study, fibrous types 546—552      
Pseudomorph identification      529—530
Pseudomorph identification 529—530      
Pulse counter      191
Pulse counter 191      
Pulse formation      193—194
Pulse formation 193—194      
Pulse formation, Geiger-counter illustration      195—196
Pulse formation, Geiger-counter illustration 195—196      
Pulse size      196 201
Pulse size 196, 201      
Pulsford, E.W.      208 212
Pulsford, E.W. 208, 212      
Punched-card methods of identification      333 504
Punched-card methods of identification 333, 504      
Purity of chemical standards      503
Purity of chemical standards 503      
Putman, J.L.      196
Putman, J.L. 196      
Pyrex glass      580
Pyrex glass 580      
Pyrex glass, X-ray tube window      63
Pyrex glass, X-ray tube window 63      
Pyroelectric effect      48
Pyroelectric effect 48      
Pyrometry, measurement of camera temperature      255
Pyrometry, measurement of camera temperature 255      
Quadratic forms, table      636—639
Quadratic forms, table 636—639      
qualitative analysis      338—340 see
Qualitative analysis see “Identification”, 338—340      
Quanta of X-rays absorbed by emulsion      191—192 627
Quanta of X-rays absorbed by emulsion 191—192, 627      
Quantitative analysis      405 510 516 530 559
Quantitative analysis 405, 510, 516, 530, 559      
Quantitative analysis, diffractometer use      229—230
Quantitative analysis, diffractometer use 229—230      
Quantum efficiency of radiation detectors      191 206—207
Quantum efficiency of radiation detectors 191, 206—207      
Quartz      370 407 526 531
Quartz 370, 407, 526, 531      
Quartz, camera calibration      124
Quartz, camera calibration 124      
Quartz, monochromator use      122 128—130 133 135 137—141 143
Quartz, monochromator use 122, 128—130, 133, 135, 137—141, 143      
Quartz, refractories      562—563
Quartz, refractories 562—563      
Quartz, thermal history      263
Quartz, thermal history 263      
Quenching of counters, circuit      195—196 212 219 226
Quenching of counters, circuit 195—196, 212, 219, 226      
Quenching of counters, halogen      195—200 202 213
Quenching of counters, halogen 195—200, 202, 213      
Quenching of counters, organic vapour      195—202 213
Quenching of counters, organic vapour 195—202, 213      
Quenching of molten material      242 575 580
Quenching of molten material 242, 575, 580      
Qurashi, M.M.      407 593
Qurashi, M.M. 407, 593      
R value      55
R value 55      
Rachinger, W.A.      217 406 425 460 602 619
Rachinger, W.A. 217, 406, 425, 460, 602, 619      
Radial scatter of spots      454 456
Radial scatter of spots 454, 456      
Radiation choice      303 327—328
Radiation choice 303, 327—328      
Radiation choice, accurate measurements      374—375
Radiation choice, accurate measurements 374—375      
Radiation choice, back-reflexion methods      186—7
Radiation choice, back-reflexion methods 186—187      
Radiation choice, bank-reflexion methods      186—187
Radiation choice, fluorescence      432
Radiation choice, fluorescence 432      
Radiation choice, low-angle methods      240—241
Radiation choice, low-angle methods 240—241      
Radiation detectors      189—208
Radiation detectors 189—208      
Radiation, specimen cooling      270 277
Radiation, specimen cooling 270, 277      
Radiation, specimen heating      254
Radiation, specimen heating 254      
Radiation-purity test      119
Radiation-purity test 119      
Radioactive compounds, counter testing      219 222
Radioactive compounds, counter testing 219, 222      
Radioactive compounds, examination      611—619
Radioactive compounds, examination 611—619      
Radiography      56 71
Radiography 56, 71      
Radiography, film used      620
Radiography, film used 620      
Radius of powder camera      152
Radius of powder camera 152      
Radius of powder camera, Debye — Scherrer camera      80 121 327
Radius of powder camera, Debye — Scherrer camera 80, 121, 327      
Radius of powder camera, diffractometer      218
Radius of powder camera, diffractometer 218      
Radius of powder camera, focusing camera, effective      125
Radius of powder camera, focusing camera, effective 125      
Radius of powder camera, high-temperature camera      257
Radius of powder camera, high-temperature camera 257      
Radius of powder camera, relation to exposure time      110
Radius of powder camera, relation to exposure time 110      
Rae, E.R.      201
Rae, E.R. 201      
Rait, J.R.      295 558 561 563 566 567 569 570
Rait, J.R. 295, 558, 561, 563, 566, 667, 569, 570      
Ralston, A.W.      515
Ralston, A.W. 515      
Ramachandran, G.N.      138 143 223
Ramachandran, G.N. 138, 143, 223      
Raman, C.V.      434
Raman, C.V. 434      
Ramsdell, L.S.      531
Ramsdell, L.S. 531      
Randall, J.T.      443
Randall, J.T. 443      
Random errors in lattice-parameter determination, minimization      376 381—382
Random errors in lattice-parameter determination, minimization 376, 381—382      
Range of Bragg angle, counter diffractometer      329
Range of Bragg angle, counter diffractometer 329      
Range of Bragg angle, Debye — Scherrer camera      107—109 329
Range of Bragg angle, Debye — Scherrer camera 107—109, 329      
Range of Bragg angle, Debye-Scherrer camera      107—9 329
Range of Bragg angle, flat-layer method      146—147 167
Range of Bragg angle, flat-layer method 146—147, 167      
Range of Bragg angle, focusing camera      124 296
Range of Bragg angle, focusing camera 124, 296      
Range of Bragg angle, high-temperature camera      257
Range of Bragg angle, high-temperature camera 257      
Range of Bragg angle, low-angle method      232
Range of Bragg angle, low-angle method 232      
Rare-earth compounds, heavy-element compound relations      612—613
Rare-earth compounds, heavy-element compound relations 612—613      
Rate of counting, background      191
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