Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry :: Электронная библиотека попечительского совета мехмата МГУ

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Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry

$Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry$

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Название: X-Ray Diffraction by Polycrystalline Materials. Physics in Industry

Авторы: Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.)

Аннотация:

For anyone WI10 has been concerned with X-ray analysis since its early days, it. is fascinating to see how the subject continues to grow and ramify. The present book is a striking illustration of this development. Although it deals with only one branch of crystal analysis, the study of polycrysta]line materials, it has been found desirable tQ invite some thirty experts to make their contributions in order that each aspect of the subject might be covered in an authoritative way. That it has been possible to weld contributions from so many authors into a coherent scheme is both a tribute to the editors and an excellent exalllple of that happy collaboration that has existed froITi the very beginning amongst X-ray crystallographers and continues so manifstly at the present time.

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Рубрика: Физика/

Статус предметного указателя: Готов указатель с номерами страниц

ed2k: ed2k stats

Издание: 1st edition

Год издания: 1955

Количество страниц: 725

Добавлена в каталог: 06.09.2009

Операции: Положить на полку | Скопировать ссылку для форума | Скопировать ID

Предметный указатель

Heating methods, external current      253—254
Heating methods, external current 253—254
Heating methods, induction      254—255
Heating methods, induction 254—255
Heating methods, internal current      254
Heating methods, internal current 254
Heavy element compounds      612—615
Heavy element compounds 612—615
Hefter, O.      533
Hefter, O. 533
Heisenberg, W.      434
Heisenberg, W. 434
Helical orientation      493—496
Helical orientation 493—496
Helical orientation, equatorial reflexions      493—496
Helical orientation, equatorial reflexions 493—496
Helical orientation, polar reflexions      496
Helical orientation, polar reflexions 496
Helical structure of synthetic polypeptides      552—557
Helical structure of synthetic polypeptides 552—557
Helical structure of synthetic polypeptides, $\alpha$ helix      555—556
Helical structure of synthetic polypeptides, $\alpha$ helix 555—556
Helium, cooling liquid      266 274
Helium, cooling liquid 266, 274
Helium, reduction of air scattering      132
Helium, reduction of air scattering 132
Helix      see "Helical"
Helix see “Helical”
Hempstead, C.F.      201
Hempstead, C.F. 201
Hendricks, S.B.      418 598
Hendricks, S.B. 418, 598
Hengstenberg, J.      268
Hengstenberg, J. 268
Henke, B.      241 451
Henke, B. 241, 451
Henry, N.F.M.      32 33 40 45 48 50 51 53 61 121 302 321 348 350 351 353 359 363 366 369 374 375 531 636 639 644
Henry, N.F.M. 32, 33, 40, 45, 48, 50, 51, 53, 61, 121, 302, 321, 348, 350, 351, 353, 359, 363, 366, 369, 374, 375, 531, 636, 639, 644
Henry, W.G.      249 255 258
Henry, W.G. 249, 255, 258
Hergenrother, R.C.      243 263 265
Hergenrother, R.C. 243, 263, 265
Hering, H.      617
Hering, H. 617
Hermann, C.      588
Hermann, C. 588
Hermans, P.H.      543 557
Hermans, P.H. 543, 557
Hermite functions      427
Hermite functions 427
Herz, R.H.      620—634
Herz, R.H. 620—634
Herzog, R.O.      533
Herzog, R.O. 533
Hess, J.B.      376 378 381
Hess, J.B. 376, 378, 381
Hess, K.      533 538 540
Hess, K. 533, 538, 540
Hesse, R.      350 351 352 353
Hesse, R. 350, 351, 352, 353
Hexagonal system, axial constants, calculation      41
Hexagonal system, axial constants, calculation 41
Hexagonal system, cell dimensions, determination      349—350
Hexagonal system, cell dimensions, determination 349—350
Hexagonal system, extrapolation methods      375
Hexagonal system, extrapolation methods 375
Hexagonal system, lattice spacings, calculation      43
Hexagonal system, lattice spacings, calculation 43
Hexagonal system, Miller — Bravais indices      35
Hexagonal system, Miller — Bravais indices 35
Hexagonal system, multiplicity factors      639 641
Hexagonal system, multiplicity factors 639, 641
Hexagonal system, quadratic forms for indexing      636—638
Hexagonal system, quadratic forms for indexing 636—638
Hexagonal system, symmetry      30 31
Hexagonal system, symmetry 30, 31
Hey, M.H.      528 531
Hey, M.H. 528, 531
Heyn microstresses      609—610
Heyn microstresses 609—610
Hickman, J.W.      310
Hickman, J.W. 310
Higgins, G.C.      620 634
Higgins, G.C. 620, 634
High-temperature cameras      see "Cameras high-temperature"
High-temperature cameras see “Cameras, high - temperature”
High-tension unit      64—67
High-tension unit 64—67
High-tension unit, stabilization for counters      212
High-tension unit, stabilization for counters 212
Hildebrand, J.H.      269 271
Hildebrand, J.H. 269, 271
Hilliard, A.      569
Hilliard, A. 569
Hinde, R.M.      429
Hinde, R.M. 429
Hirsch, P.B.      71 120 121 142 143 144 192 278—297 458 459
Hirsch, P.B. 71, 120, 121, 142, 143, 144, 192, 278—297, 458, 459
Hirsh, F.R.      627
Hirsh, F.R. 627
Hoenl, H.      435
Hofer, L.J.E.      113 516
Hofer, L.J.E. 113, 516
Hofstadter, R.      205
Hofstadter, R. 205
Holden, A.N.      231 320
Holden, A.N. 231, 320
Holdridge, D.A.      561
Holdridge, D.A. 561
Holland, H.D.      531
Holland, H.D. 531
Homogeneity of ingot      575—577
Homogeneity of ingot 575—577
Homologous series, identification      508—509
Homologous series, identification 508—509
Honeyborne, D.B.      561
Honeyborne, D.B. 561
Honeycombe, R.W.K.      295
Honeycombe, R.W.K. 295
Honl, H. 435
Hoppe, W.      137
Hoppe, W. 137
Horizontal divergence of beam      see "Counter diffractorneter" "Divergence" "Errors" "Incident horizontal
Horizontal divergence of beam see “Counter diffractometer, Divergence, Errors, Incident beam, horizontal divergence”
Hosemann, R.      240 278 443 448 449 453
Hosemann, R. 240, 278, 443, 448, 449, 453
Hough, G.H.      211
Hough, G.H. 211
Howard, H.C.      269
Howard, H.C. 269
Howarth, J.L.      166 174
Howarth, J.L. 166, 174
Howell, W.D.      211
Howell, W.D. 211
Hu, H.      469
Hu, H. 469
Hughes, E.W.      407 517 549 550
Hughes, E.W. 407, 517, 549, 550
Hughes, J.W.      226 419
Hughes, J.W. 226, 419
Hull, A.W.      145 326 400 407
Hull, A.W. 145, 326, 400, 407
Hulubei, H.      653
Hulubei, H. 653
Hume-Rothery, W.      245 246 250 256 263 265 274 275 574 582 586 588 593 596
Hume-Rothery, W. 245, 246, 250, 256, 263, 265, 274, 275, 574, 582, 586, 588, 593, 596
Hutchinson, T.S.      265
Hutchinson, T.S. 265
Huxley, H.E.      278 280 555
Huxley, H.E. 278, 280, 555

Hydrogen, cooling liquid      266
Hydrogen, cooling liquid 266
Hydrogen, reduction of air scattering      106—107 118—119 132 420
Hydrogen, reduction of air scattering 106—107, 118—119, 132, 420
Hyslop, J.F.      567
Hyslop, J.F. 567
Iball, J.      125
Iball, J. 125
Ideally imperfect crystals      54 395
Ideally imperfect crystals 54, 395
Identification      325—343
Identification 325—343
Identification, "industrial" deposits      507—508
Identification, "industrial" deposits 507—508
Identification, amorphous materials      335—336 500 506 527
Identification, amorphous materials 335—336, 500, 506, 527
Identification, ceramics      558—573
Identification, ceramics 558—573
Identification, chemical analysis      499—511
Identification, chemical analysis 499—511
Identification, counter diffractometer use      229
Identification, counter diffractometer use 229
Identification, industrial deposits      507—8
Identification, minerals      523—532
Identification, minerals 523—532
Identification, mixtures      326—327 336 341—342 500—501 514 529
Identification, mixtures 326—327, 336, 341—342, 500—501, 514, 529
Identification, organic chemicals      512—522
Identification, organic chemicals 512—522
Identification, polymers      533—557
Identification, polymers 533—557
Identification, refractories      558—573
Identification, refractories 558—573
Ievins — Straumanis film motmting      81 85—86 369—371
Ievins — Straumanis film mounting      81 85—6 369—71
Ievins — Straumanis film mounting 81, 85—86, 369—371
Ievins, A.      81 85 98 99 250
Ievins, A. 81, 85, 98, 99, 250
Ievins, I.      370 371 373
Ievins, L. 370, 371, 373
Imhoff, C.E.      507
Imhoff, C.E. 507
Imperfect structures      33 415—418 438—453 587
Imperfect structures 33, 415—418 438—453, 587
Incident beam, absorption      327 338—340
Incident beam, absorption 327, 338—340
Incident beam, absorption, correction      398
Incident beam, absorption, correction 398
Incident beam, absorption, counter-diffractometer specimen      220
Incident beam, absorption, counter-diffractometer specimen 220
Incident beam, absorption, extinction effect      398—399
Incident beam, absorption, extinction effect 398—399
Incident beam, absorption, factors      863—866
Incident beam, absorption, factors 663—666
Incident beam, absorption, flat-layer specimen      147 159—160
Incident beam, absorption, flat-layer specimen 147, 159—160
Incident beam, absorption, preferred-orientation specimen      175 305 316—320
Incident beam, absorption, preferred-orientation specimen 175, 305, 316—320
Incident beam, angular range      281
Incident beam, angular range 281
Incident beam, angular range, collimator increase      285
Incident beam, angular range, collimator increase 285
Incident beam, angular range, horizontally divergent beam      214—215 219—220 385 390
Incident beam, angular range, horizontally divergent beam 214—215, 219—220, 385, 390
Incident beam, angular range, Soller slit limitation      214 220
Incident beam, angular range, Soller slit limitation 214, 220
Incident beam, angular range, vertically divergent beam      96—98 134 155 220
Incident beam, angular range, vertically divergent beam 96—98, 134, 155, 220
Incident beam, convergent, curved-crystal method      236
Incident beam, convergent, curved-crystal method 236
Incident beam, convergent, curved-crystal method, microbeam method      287—289
Incident beam, convergent, microbeam method      287—9
Incident beam, convergent, microbeam method 287—289
Incident beam, divergent      215
Incident beam, divergent 215
Incident beam, horizontal divergence, collimation      219
Incident beam, horizontal divergence, collimation 219
Incident beam, horizontal divergence, collimation, effect on line position      158 228 385 390
Incident beam, horizontal divergence, effect on line position      158 228 385 390
Incident beam, horizontal divergence, effect on line position 158, 228, 385, 390
Incident beam, intensity      67
Incident beam, intensity 67
Incident beam, mis-setting errors      388—390
Incident beam, mis-setting errors 388—390
Incident beam, scattering      89 103—107 119—120
Incident beam, scattering 89, 103—107, 119—120
Incident beam, vertical divergence, "umbrella" effect 96—98, 371—372
Incident beam, vertical divergence, collimation      155 220
Incident beam, vertical divergence, collimation 155, 220
Incident beam, vertical divergence, collimation, "umbrella" effect      96—98 371—372
Incident beam, vertical divergence, collimation, curved-crystal monochromator      127 134 217
Incident beam, vertical divergence, collimation, effect on line profile      155—159 228
Incident beam, vertical divergence, curved -crystal monochromator      127 134 217
Incident beam, vertical divergence, curved -crystal monochromator 127, 134, 217
Incident beam, vertical divergence, effect on line profile      155—9 228
Incident beam, vertical divergence, effect on line profile 155—159, 228
Incident beam, vertical divergence, “umbrella” effect      96—8 371—2
Inclusions, X-ray identification in steel      569—570
Inclusions, X-ray identification in steel 569—570
Incoherent scattering      433—436
Incoherent scattering 433—436
Indexing of powder photographs, cubic      346
Indexing of powder photographs, cubic 346
Indexing of powder photographs, hexagonal      349
Indexing of powder photographs, hexagonal 349
Indexing of powder photographs, multiplicity factor use      461
Indexing of powder photographs, multiplicity factor use 461
Indexing of powder photographs, orthorhombic      350—353
Indexing of powder photographs, orthorhombic 350—353
Indexing of powder photographs, orthorhornbie      350—3
Indexing of powder photographs, quadratic forms for      636—638
Indexing of powder photographs, quadratic forms for 636—638
Indexing of powder photographs, rhombohedral      349—350
Indexing of powder photographs, rhombohedral 349—350
Indexing of powder photographs, rhomboliedral      349—50
Indexing of powder photographs, tetragonal      346—348
Indexing of powder photographs, tetragonal 346—348
Indexing of powder photographs, unknown symmetry      350 353—356 531 593
Indexing of powder photographs, unknown symmetry 350, 353—356, 531, 593
Indices of lattice planes (crystal faces) (hkl)      33—34 42
Indices of lattice planes (crystal faces)(hkl)      33—4 42
Indices of lattice planes (crystal faces)(hkl) 33—34, 42
Induction heating of specimen      254—255
Induction heating of specimen 254—255
Infra-red study of polypeptides      555—556
Infra-red study of polypeptides 555—556
Ingelstam, E.      138
Ingelstam, E. 138
Ingot production      575—577
Ingot production 575—577
Insley, H.      558 567
Insley, H. 558, 567
Instrumental line broadening      see "Broadening of powder lines" "Geometrical
Instrumental line broadening see “Broadening of powder lines, Geometrical line broadening”
Integral breadth of powder line      413 421—422
Integral breadth of powder line 413, 421—422
Integrated intensity      129 139—141 396 413
Integrated intensity 129, 139—141, 396, 413
Integrated intensity, calculation of line breadths      154 413
Integrated intensity, calculation of line breadths 154, 413
Integrated intensity, statistics of diffractometer measurement      224
Integrated intensity, statistics of diffractometer measurement 224
Intensification of films, chemical      631
Intensification of films, chemical 631
Intensification of films, screens      620 628—629
Intensification of films, screens 620, 628—629
Intensity of direct beam      59 67 111
Intensity of direct beam 59, 67, 111
Intensity of direct beam, totally reflecting collimator, increase      285
Intensity of direct beam, totally reflecting collimator, increase 285

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