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| Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry |
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| Ïðåäìåòíûé óêàçàòåëü |
Specimen movement, low-temperature study, plate specimen 272
Specimen movement, low-temperature study, plate specimen 272
Specimen movement, preferred-orientation study 306—310 319—320
Specimen movement, preferred-orientation study 306—310, 319—320
Specimen movement, rotation head 117
Specimen movement, rotation head 117
Specimen preparation see also "Separation of constituents"
Specimen preparation see “Separation of constituents”
Specimen preparation, Debye — Scherrer method 113—116
Specimen preparation, Debye — Scherrer method 113—116
Specimen preparation, Debye-Scherrer method 113—16
Specimen preparation, diffractometers 220—222
Specimen preparation, diffractometers 220—222
Specimen preparation, diffractometers, qualitative analysis 230
Specimen preparation, diffractometers, qualitative analysis 230
Specimen preparation, flat-layer method 147—148 163
Specimen preparation, flat-layer method 147—148, 163
Specimen preparation, for identification 327 341—343
Specimen preparation, for identification 327, 341—343
Specimen preparation, metallurgical methods 575—578 582—583
Specimen preparation, metallurgical methods 575—578, 582—583
Specimen preparation, mineralogical methods 523—527
Specimen preparation, mineralogical methods 523—527
Specimen preparation, preferred-orientation studies 298—300
Specimen preparation, preferred-orientation studies 298—300
Specimen preparation, small quantities 505—506
Specimen preparation, small quantities 505—506
Specimen scattering 91
Specimen scattering 91
Specimen scattering, Compton 433—436
Specimen scattering, Compton 433—436
Specimen scattering, disorder 437
Specimen scattering, disorder 437
Specimen scattering, fluorescent radiation 432
Specimen scattering, fluorescent radiation 432
Specimen scattering, thermal 436—437
Specimen scattering, thermal 436—437
Specimen see also “Block, Cylindrical, Fibre, Massive, Wire”
Specimen, absorption factors 340 663—666
Specimen, absorption factors 340, 663—666
Specimen, alignment 116—117
Specimen, alignment 116—117
Specimen, back-reflexion 183—184
Specimen, back-reflexion 183—184
Specimen, Debye — Scherrer 86 111—116 326—327
Specimen, Debye — Scherrer 86, 111—116, 326—327
Specimen, Debye — Scherrer, effective diameter 112
Specimen, Debye — Scherrer, effective diameter 112
Specimen, Debye — Scherrer, finite-height effect 371—372
Specimen, Debye-Scherrer 86 111—16 326—7
Specimen, Debye-Scherrer, effective diameter 112
Specimen, Debye-Scherrer, finite-height effect 371—2
Specimen, Debye-Scherrer, finite-height effect 371—372
Specimen, flat-layer 147—148 173
Specimen, flat-layer 147—148, 173
Specimen, flat-layer, line broadening 411
Specimen, flat-layer, line broadening 411
Specimen, high-temperature 243—253 260—261
Specimen, high-temperature 243—253, 260—261
Specimen, temperature control, high 251—254
Specimen, temperature control, high 251—254
Specimen, temperature control, low 270—276
Specimen, temperature control, low 270—276
Spectra line breadth 95—6 366 394 411 454—6 654
Spectral line breadth 95—96 366 394 411 454—456 654
Spectral line breadth 95—96, 366, 394, 411, 454—456, 654
Spectrographic analysis, identification 329 341
Spectrographic analysis, identification 329, 341
Spectrographic analysis, micro-analysis methods 296—297 530
Spectrographic analysis, micro-analysis methods 296—297, 530
Spectrographs analysis, identification 329 341
Spectrographs analysis, micro-analysis methods 296—7 530
Spectrometers Counter diffractometers
Spectrometers see also “Counter diffractometers”
Spectrometers, counter 189—231 see
Spectrometers, counter 189—231
Spectrometers, counter, double-crystal 238—240
Spectrometers, double-crystal 238—40
Spectrometers, double-crystal 238—240
Speed of X-ray film 623—624 see
Speed of X-ray film see also “Sensitivity”, 623—624
Speiser, R. 245 248 250 254 255 263
Speiser, R. 245, 248, 250, 254, 255, 263
Spencer, R.C. 366 394
Spencer, R.C. 366, 394
Sperry, P.R. 469
Sperry, P.R. 469
Spherical projection 37—38
Spherical projection 37—38
Spherical specimens, absorption factors 663—666
Spherical specimens, absorption factors 663—666
Spherical symmetry, particle-size determination 449—450
Spherical symmetry, particle-size determination 449—451
Spherical symmetry, theoretical scattering expressions 441—443
Spherical symmetry, theoretical scattering expressions 441—443
Spherical symmetry, theoretical' scattering expressions 441—3
Spherical triangles 40
Spherical triangles 40
Spiers, F.W. 145 160 161 166 170 403
Spiers, F.W. 145, 160, 161, 166, 170, 403
Spiller, R.C. 325
Spiller, R.C. 325
Spinel structures 501 559—561 564 566—568 570
Spinel structures 501, 559—561, 664, 566—568, 570
Spiral see "Helical"
Spiral see “Helical”
Splettstosser, H.R. 631
Splettstosser, H.R. 631
Sponsier, O.L. 533
Sponsler, O.L. 533
Spot size, determination of crystal size 457—458
Spot size, determination of crystal size 457—458
Spot size, relation to angular range of beam 280—281
Spot size, relation to angular range of beam" 280—281
Spot size, relation to angular range of bearri 280—1
Spot size, relation to crystal size 281—283
Spot size, relation to crystal size 281—283
Spurious counts 196 200
Spurious counts 196, 200
Spurious counts, beaded counters 201
Spurious counts, beaded counters 201
Stability of X-ray counted 199—200 206—207
Stability of X-ray counter 199—200 206—7
Stability of X-ray counter 199—200, 206—207
Stabilization of tube output 208—210 619
Stabilization of tube output 208—210, 619
Stacy, I. 516
Stacy, I. 516
Staellberg-Stenhagen, S. 515
Stallberg-Stenhagen, S. 515
Standard deviation 222 382
Standard deviation 222, 382
Standard deviation, counting-rate meter 223
Standard deviation, counting-rate meter 223
Standard deviation, difference of two counts 223
Standard deviation, difference of two counts 223
Standard deviation, integral intensity 224
Standard deviation, integral intensity 224
Standard deviation, monitoring system 223
Standard deviation, monitoring system 223
Standard films, comparison in identification 328 503
Standard films, comparison in identification 328, 503
Standard films, comparison with single-crystal photographs 526—528
Standard films, comparison with single-crystal photographs 526—528
Standardizing of intensities, flat-layer methods 160—162
Standardizing of intensities, flat-layer methods 160—162
Standardizing of intensities, low-temperature methods 172
Standardizing of intensities, low-temperature methods 172
Standards, internal see "Internal standards"
Standards, internal see “Internal standards”
| Stanghon, L. 114
Stanghon, L. 114
Statistical accuracy 222
Statistical accuracy 222
Statistical accuracy, counter 222
Statistical accuracy, counter 222
Statistical accuracy, counting-rate meter 223
Statistical accuracy, counting-rate meter 223
Statistical accuracy, integral intensity 224
Statistical accuracy, integral intensity 224
Statistical accuracy, monitoring system 222—223
Statistical accuracy, monitoring system 222—223
Staub, H.H. 204
Staub, H.H. 204
Stauff, J. 515
Stauff, J. 515
Steel, inclusions 569—570
Steel, inclusions 569—570
Steel, isothermal transformations 263 342—343
Steel, isothermal transformations 263, 342—343
Steepest-descents method of structure refinement 518
Steepest-descents method of structure refinement 518
Steeple, H. 366—394 461 588 595 614
Steeple, H. 366—394, 461, 588, 595, 614
Steinour, H.H. 572
Steinour, H.H. 572
Stenhagen, E. 515
Stenhagen, E. 515
Stephen, R.A. 142 291 458 459
Stephen, R.A. 142, 291, 458, 459
Stereographic projection 37—40 462—464
Stereographic projection 37—40, 462—464
Stereographic projection, calculations 40—41
Stereographic projection, calculations 40—41
Stevens, G.W.W. 633
Stevens, G.W.W. 633
Stever, H.G. 196 201
Stever, H.G. 196, 201
Steward, E.G. 249 253 264 258 265—277
Steward, E.G. 249, 253, 254, 258, 265—277
Stillman, R.C. 515
Stillman, R.C. 515
Stokes, A.R. 263 409—429 615
Stokes, A.R. 263, 409—429, 615
Stora, C. 411
Stora, C. 411
Stott, V.H. 589
Stott, V.H. 569
Strain measurement 187—188
Strain measurement 187—188
Strain measurement, back-reflexion camera 601—602
Strain measurement, back-reflexion camera 601—602
Strain measurement, calculation for cubic system 416
Strain measurement, calculation for cubic system 416
Strain measurement, line broadening 415—416
Strain measurement, line broadening 415—416
Strain measurement, stressed-specimen mounting 183
Strain measurement, stressed-specimen mounting 183
Straumanis — Ievins film mounting 81 85—86 369—371
Straumanis — Ievins film mounting 81, 85—86, 369—371
Straumanis, M.E. 81 85 115 250 369 870 371 373
Straumanis, M.E. 81, 85, 115, 250, 369, 370, 371, 373
Straumanis-Ievin film mounting 81 85—6 369—71
Strawbridge, D.J. 265 274 275
Strawbridge, D.J. 265, 274, 275
Street, A. 533 550
Street, A. 533, 550
Stress analysis 475—480 601—610
Stress analysis 475—480, 601—610
Stress analysis, back-reflexion precision camera 180—181
Stress analysis, back-reflexion precision camera 180—181
Stress analysis, lattice-strain relation 602—605
Stress analysis, lattice-strain relation 602—605
Stress analysis, lattice-strain relation, cubic system 416
Stress analysis, lattice-strain relation, cubic system 416
Strong, J. 197
Strong, J. 197
Strongest-line groups 333 503—504
Strongest-line groups 333, 503—504
Structural dimensions see "Lattice parameters"
Structural dimensions see “Lattice parameters”
Structure amplitude 52—53 160 395 639
Structure amplitude 52—53, 160, 395, 639
Structure amplitude, calculation of intensity in mixed specimen 338
Structure amplitude, calculation of intensity in mixed specimen 338
Structure amplitude, derivation from intensities 403
Structure amplitude, derivation from intensities 403
Structure amplitude, focusing camera, measurement 125
Structure amplitude, focusing camera, measurement 125
Structure factors see "Structure amplitude"
Structure factors see “Structure amplitude”
Structure-analysis methods 54—55 406—408 516—520
Structure-analysis methods 54—55, 406—408, 516—520
Structure-analysis methods, alloys 592—600
Structure-analysis methods, alloys 592—600
Structure-analysis methods, organic compounds 516—518
Structure-analysis methods, organic compounds 516—518
Structure-analysis methods, organic fibres 534—557
Structure-analysis methods, organic fibres 534—557
Structure-analysis methods, salloys 592—600
Structure-analysis methods, sorganic compounds 516—18
Stuart, A. 325 358
Stuart, A. 325, 358
Subjective errors in lattice-spacing determination, back-reflexion camera 387—388
Subjective errors in lattice-spacing determination, back-reflexion camera 387—388
Subjective errors in lattice-spacing determination, cylindrical focusing camera 382—383
Subjective errors in lattice-spacing determination, cylindrical focusing camera 382—383
Subjective errors in lattice-spacing determination, Debye — Scherrer camera 327—328 381
Subjective errors in lattice-spacing determination, Debye — Scherrer camera 327—328, 381
Subjective errors in lattice-spacing determination, Debye-Scherrer camera 327—8 381
Substitution methods, camera 169—170
Substitution methods, camera 169—170
Substitution methods, measurement of intensities 161—162 403—404
Substitution methods, measurement of intensities 161—162, 403—404
Substitution methods, mechanical specimen interchange 170
Substitution methods, mechanical specimen interchange 170
Sully, A.H. 584
Sully, A.H. 584
Sundius, H.H. 572
Sundius, H.H. 572
Superlattices see "Superstructures"
Superlattices see “Superstructures”
Superstructures 334 593
Superstructures 334, 593
Superstructures, copper-gold alloy 437 594—595
Superstructures, copper-gold alloy 437, 594—595
Superstructures, effect of irradiation 617—618
Superstructures, effect of irradiation 617—618
Superstructures, interstitial structures 597—598
Superstructures, interstitial structures 597—598
Surface films, preferred orientation 299—300
Surface films, preferred orientation 299—300
Surface films, thickness measurement 143
Surface films, thickness measurement 143
Surface-refiexion study of preferred orientation, counter-diffractometer methods 319—20
Surface-refiexion study of preferred orientation, counter-diffractometer methods 319—320
Surface-refiexion study of preferred orientation, discussion of methods 320—2
Surface-refiexion study of preferred orientation, discussion of methods 320—322
Surface-refiexion study of preferred orientation, stationary-film arrangements 303—5
Surface-refiexion study of preferred orientation, stationary-film arrangements 303—305
Surface-reflexion cameras 402
Surface-reflexion cameras 402
Surface-reflexion cameras, flat-layer 145—175
Surface-reflexion cameras, flat-layer 145—175
Surface-reflexion cameras, focusing 123—125 131—132
Surface-reflexion cameras, focusing 123—125, 131—132
Surface-reflexion monochromators 123 125—128
Surface-reflexion monochromators 123, 125—128
Surface-reflexion study of preferred orientation, counter-diffractometer methods 319—320
Surface-reflexion study of preferred orientation, discussion of methods 320—322
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