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| Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry |
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| Ïðåäìåòíûé óêàçàòåëü |
Seemann — Bohlin focusing camera 123—125
Seemann — Bohlin focusing camera, back-reflexion techniques 182
Seemann — Bohlin focusing camera, back-reflexion techniques 182
Seemann — Bohlin focusing camera, counter diffractometer 214
Seemann — Bohlin focusing camera, counter diffractometer 214
Seemann — Bohlin focusing camera, microbeam adaption 296
Seemann — Bohlin focusing camera, microbeam adaption 296
Seemann, H. 123 124 246 243
Seemann, H. 123, 124, 246, 243
Seemann, H.E. 623 625
Seemann, H.E. 623, 625
Seemann-Bohlin focusing camera 123—5
Seemann-Bohlin focusing camera, back-reflexion techniques 182
Seemann-Bohlin focusing camera, counter diffractometer 214
Seemann-Bohlin focusing camera, microbeam adaption 296
Segal, L. 300 318
Segal, L. 300, 318
Selective orientation, axial 493
Selective orientation, axial 493
Selective orientation, planar 491—492
Selective orientation, planar 491—492
Selective orientation, reflecting crystallites with incident beam 482—489 606—607
Selective orientation, reflecting crystallites with incident beam 482—489, 606—607
Self-quenching counters 195
Self-quenching counters 195
Semi-focusing cameras 164 166—169
Semi-focusing cameras 164, 166—169
Sengstaken, R.W. 283
Sengstaken, R.W. 283
Senio, P. 614
Senio, P. 614
Sensitivity, X-ray counters 195—197 209
Sensitivity, X-ray counters 195—197, 209
Sensitivity, X-ray film 191—192 420 620—629
Sensitivity, X-ray film 191—192, 420, 620—629
Separation of constituents of mixture chemical 506
Separation of constituents of mixture chemical 506
Separation of constituents of mixture chemical, mechanical 342 506 523
Separation of constituents of mixture chemical, mechanical 342, 506, 523
Separation of constituents of mixture chemical, photographic 500—1
Separation of constituents of mixture chemical, photographic 500—501
Separation of constituents of mixture, chemical 506
Separation of constituents of mixture, mechanical 342 506 523
Separation of constituents of mixture, photographic 500—501
Serov, V.V. 572
Serov, V.V. 572
Serutton, R.F. 460
Sharpe, J. 200 211
Sharpe, J. 200, 211
Sharpless, N.E. 515
Sharpless, N.E. 515
Shaw, C.H. 366 367 653
Shaw, C.H. 366, 367, 653
Shearer, G. 59 515
Shearer, G. 59, 515
Shenfil, L. 238 451
Shenfil, L. 238, 451
Shockley, W. 596
Shockley, W. 596
Shoemaker, D.P. 615
Shoemaker, D.P. 615
Short-range order 593
Short-range order 593
Shrinkage of film 82—85 119 185—186 368 369 371 383 388 630—631
Shrinkage of film 82—85, 119, 185—186, 368, 369, 371, 383, 388, 630—631
Shull, C.G. 426 448 449 452
Shull, C.G. 426, 448, 449, 452
Side bands 596—597
Side bands 596—597
Sidhu, S.S. 114 515
Sidhu, S.S. 114, 515
Siegbahn, M. 82 366 652 653
Siegbahn, M. 82, 366, 652, 653
Siegel, S. 93 95 367 394 455 617
Siegel, S. 93, 95, 367, 394, 455, 617
Silberstein, L. 627
Silberstein, L. 627
Silica see also "Quartz"
Silica see also “Quartz”
Silica, bricks for refractories 562—563
Silica, bricks for refractories 562—563
Silica, isomorphs 531
Silica, isomorphs 531
Silica, specimen tubes 115
Silica, specimen tubes 115
Silica, study of raw material 561
Silica, study of raw material 561
Silicon 501
Silicon 501
Silicon, accurate lattice parameters 370
Silicon, accurate lattice parameters 370
Silicon, expansion 370
Silicon, expansion 370
Silicon, film calibration 370
Silicon, film calibration 370
Silver alloys, arsenic 583
Silver alloys, arsenic 583
Silver alloys, copper 580—581
Silver alloys, copper 580—581
Silver alloys, zinc 407
Silver alloys, zinc 407
Silver bromide, emulsion on X-ray films 191 620 624 627
Silver bromide, emulsion on X-ray films 191, 620, 624, 627
Silver bromide, microbeam study of emulsion 294—295
Silver bromide, microbeam study of emulsion 294—295
Silver radiation 303
Silver radiation 303
Simon, A.W. 193
Simon, A.W. 193
Sinclair, H. 91 92 327 339 373 424
Sinclair, H. 91, 92, 327, 339, 373, 424
Sine ratio, anharmonic 36
Sine ratio, anharmonic 36
Single-coated film see "Films single-coated"
Single-coated film see “Films, single-coated”
Single-crystal photography 50—51 280 327
Single-crystal photography 50—51, 280, 327
Single-crystal photography, accurate lattice-parameter determination 375
Single-crystal photography, accurate lattice-parameter determination 375
Single-crystal photography, analogy with preferred-orientation study 308—309 358 466
Single-crystal photography, analogy with preferred-orientation study 308—309, 358, 466
Single-crystal photography, comparison with powder data 337 513—514 526—528 587 593
Single-crystal photography, comparison with powder data 337, 513—514, 526—528, 587, 593
Single-crystal photography, study in matrix 297 528
Single-crystal photography, study in matrix 297, 528
Sissons, W.A. 489 490 493 556
Sissons, W.A. 489, 490, 493, 556
Size of crystallites see also "Crystallite size"
Size of crystallites see “Crystallite size”
Size of crystallites, back-refiexion method 188
Size of crystallites, back-reflexion method 188
Size of crystallites, back-reflexion method 188
Size of crystallites, effect on intensity 399
Size of crystallites, effect on intensity 399
Size of crystallites, effect on line breadth 412—415 428
Size of crystallites, effect on line breadth 412—415, 428
Size of crystallites, flat-layer methods 153—155
Size of crystallites, flat-layer methods 153—155
Size of crystallites, non-continuous rings 456—459
Size of crystallites, non-continuous rings 456—459
Skehan, J.W. 63
Skehan, J.W. 63
Slagging 559
Slagging 559
Slags in steel making 563
Slags in steel making 563
Slater, J.C. 596
Slater, J.C. 596
Slip plane 33 481 603
Slip plane 33, 481, 603
| Slip plane, face-centred-cubic structures 465 476—479
Slip plane, face-centred-cubic structures 465, 476—479
Slit system, back-reflexion cameras 177 180
Slit system, back-reflexion cameras 177, 180
Slit system, counters 219 227
Slit system, counters 219, 227
Slit system, Debye — Scherrer cameras 88—90 95 98
Slit system, Debye — Scherrer cameras 88—90, 95, 98
Slit system, Debye-Scherrer cameras 88—90 95 98
Slit system, diffractometers 214—217
Slit system, diffractometers 214—217
Slit system, effect on line breadth 409—429
Slit system, effect on line breadth 409—429
Slit system, flat-layer cameras 165—166
Slit system, flat-layer cameras 165—166
Slit system, high-temperature cameras 246—249 257
Slit system, high-temperature cameras 246—249, 257
Slit system, low-angle cameras 232—235 286
Slit system, low-angle cameras 232—235, 286
Slit system, scattering 287
Slit system, scattering 287
Slit system, trimming 132
Slit system, trimming 132
Smallman, R.E. 211
Smallman, R.E. 211
Smith, A.F. 550 556
Smith, A.F. 4, 550, 556
Smith, C.S. 132 138
Smith, C.S. 132, 138
Smith, E.M. 460
Smith, E.M. 460
Smith, F.R. 214
Smith, F.R. 214
Smith, G.D. 208 212
Smith, G.D. 208, 212
Smith, H. 265 268
Smith, H. 265, 268
Smith, I.C.P. 115
Smith, I.C.P. 115
Smith, R.A. 210 218 419
Smith, R.A. 210, 218, 419
Smoluchowski, R. 175 303 588
Smoluchowski, R. 175, 303, 588
Snow, A.I. 588
Snow, A.I. 588
Soaps, identification 334—335 514—515
Soaps, identification 334—335, 514—515
Sodium chloride 407 see
Sodium chloride see “Rocksalt”, 407
Sodium chloride, absolute intensity 161
Sodium chloride, absolute intensity 161
Sodium chloride, camera calibration 124
Sodium chloride, camera calibration 124
Sodium iodide, phosphor use 205
Sodium iodide, phosphor use 205
Sohncke, L. 479
Sohncke, L. 479
Sohoening, F.R.L. 228 427
Sohon, F.J. 38 39
Sohon, F.J. 38, 39
Sohossberger, F. 245 246 250
Soldate, A.M. 516
Soldate, A.M. 516
Solid solutions 329 see
Solid solutions see also “Isomorphism in identification”, 329
Solid solutions, identification 329 333—334 503 508 510
Solid solutions, identification 329, 333—334, 503, 508, 510
Solid solutions, phase-equilibrium studies 82
Solid solutions, phase-equilibrium studies 82
Soller slits, focusing system 132—133
Soller slits, focusing system 132—133
Soller slits, parallel 132 155 214 216—217
Soller slits, parallel 132, 155, 214, 216—217
Soller, W. 214
Soller, W. 214
Solomon, E. 235 449
Solomon, E. 235, 449
Southwell, R.V. 427
Southwell, R.V. 427
Space group 32—33
Space group 32—33
Space group, determination 52
Space group, determination 52
Space group, systematic absences 51—52
Space group, systematic absences 51—52
Space lattice 27—30
Space lattice 27—30
Spacing measurements, accuracy 366—395 see
Spacing measurements, accuracy see also “Lattice parameters”, 366—395
Spacing measurements, accuracy, flat-layer methods 147
Spacing measurements, accuracy, focusing camera 124
Spacing measurements, flat-layer methods 147
Spacing measurements, flat-layer methods 147
Spacing measurements, focusing camera 124 Lattice
Spacing measurements, focusing camera 124
Spear, W.E. 70 120
Spear, W.E. 70, 120
Special positions of atoms 33
Special positions of atoms 33
Specimen see also "Block" "Cylindrical" "Fibre" "Massive" "Wire"
Specimen height, effect, Debye — Scherrer method 371—372
Specimen height, effect, Debye — Scherrer method 371—372
Specimen height, effect, Debye-Scherrer method 371—2
Specimen height, effect, flat-layer, diffractometer methods 155
Specimen height, effect, flat-layer, diffractometer methods 155
Specimen holders flat-layer camera, interchangeable specimens 169—170
Specimen holders flat-layer camera, low-temperature 171—172, 276
Specimen holders, back-reflexion camera 179—180 183—184
Specimen holders, back-reflexion camera 179—180, 183—184
Specimen holders, cylindrical specimen 115—116
Specimen holders, cylindrical specimen 115—116
Specimen holders, de Wolff focusing camera 133—134
Specimen holders, de Wolff focusing camera 133—134
Specimen holders, diffractometer 218—219 220—222
Specimen holders, diffractometer 218—219, 220—222
Specimen holders, fibres 290—291 300 318—319
Specimen holders, fibres 290—291, 300, 318—319
Specimen holders, flat-layer camera 163—164
Specimen holders, flat-layer camera 163—164
Specimen holders, flat-layer camera, interchangeable specimens 169—170
Specimen holders, flat-layer camera, low-temperature 171—172 276
Specimen holders, high-temperature camera 258
Specimen holders, high-temperature camera 258
Specimen holders, interchangeable specimens 169—70
Specimen holders, low-temperature 171—2 276
Specimen holders, massive specimens 181
Specimen holders, massive specimens 181
Specimen holders, preferred-orientation camera 308—310 317—319
Specimen holders, preferred-orientation camera 308—310, 317—319
Specimen mounting, flat-layer method 163 165
Specimen mounting, flat-layer method 163, 165
Specimen mounting, focusing cameras 183
Specimen mounting, focusing cameras 183
Specimen mounting, high-temperature cameras 258—261 582—583
Specimen mounting, high-temperature cameras 258—261, 582—583
Specimen mounting, low-temperature cameras 272 276
Specimen mounting, low-temperature cameras 272, 276
Specimen mounting, preferred-orientation cameras 309—310 319—320
Specimen mounting, preferred-orientation cameras 309—310, 319—320
Specimen mounting, tension-compression device 183
Specimen mounting, tension-compression device 183
Specimen movement see also "Scanning"
Specimen movement see also “Scanning”
Specimen movement, back-reflexion cameras 183—184
Specimen movement, back-reflexion cameras 183—184
Specimen movement, Debye — Scherrer camera 87
Specimen movement, Debye — Scherrer camera 87
Specimen movement, Debye-Scherrer camera 87
Specimen movement, high-temperature cameras 258
Specimen movement, high-temperature cameras 258
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