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Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry
Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry



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Íàçâàíèå: X-Ray Diffraction by Polycrystalline Materials. Physics in Industry

Àâòîðû: Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.)

Àííîòàöèÿ:

For anyone WI10 has been concerned with X-ray analysis since its early days, it. is fascinating to see how the subject continues to grow and ramify. The present book is a striking illustration of this development. Although it deals with only one branch of crystal analysis, the study of polycrysta]line materials, it has been found desirable tQ invite some thirty experts to make their contributions in order that each aspect of the subject might be covered in an authoritative way. That it has been possible to weld contributions from so many authors into a coherent scheme is both a tribute to the editors and an excellent exalllple of that happy collaboration that has existed froITi the very beginning amongst X-ray crystallographers and continues so manifstly at the present time.


ßçûê: en

Ðóáðèêà: Ôèçèêà/

Ñòàòóñ ïðåäìåòíîãî óêàçàòåëÿ: Ãîòîâ óêàçàòåëü ñ íîìåðàìè ñòðàíèö

ed2k: ed2k stats

Èçäàíèå: 1st edition

Ãîä èçäàíèÿ: 1955

Êîëè÷åñòâî ñòðàíèö: 725

Äîáàâëåíà â êàòàëîã: 06.09.2009

Îïåðàöèè: Ïîëîæèòü íà ïîëêó | Ñêîïèðîâàòü ññûëêó äëÿ ôîðóìà | Ñêîïèðîâàòü ID
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Ïðåäìåòíûé óêàçàòåëü
Krutter, H. 444      
Krypton, counter-chamber use      192 198—199
Krypton, counter-chamber use 192, 198—199      
Kubo, T.      248 254
Kubo, T. 248, 254      
Kuczynski, G.C.      475
Kuczynski, G.C. 475      
Kuentzel, L.E.      333 504
Kuentzel, L.E. 333, 504      
Kuepferle, G.      139 141
Kulp, J.L.      531
Kulp, J.L. 531      
Kummer, E.      225 230
Kummer, E. 225, 230      
Kupferle, G. 139, 141      
kX units      367 652—654
kX units 367, 652—654      
Lagsdin, J.B.      59
Lagsdin, J.B. 59      
Lanczos, C.      444
Lanczos, C. 444      
Lander, J.J.      253
Lander, J.J. 253      
Lang, A.R.      202 204 211 223 240 421 430 522
Lang, A.R. 202, 204, 211, 223, 240, 421, 430, 522      
Larsen, E.S.      529
Larsen, E.S. 529      
Lattice concept      27—30
Lattice concept 27—30      
Lattice concept, crystal faces (hkl)      33—34
Lattice concept, crystal faces (hkl) 33—34      
Lattice concept, direction $\langle hkl\rangle$      464
Lattice concept, direction <hkl>      464
Lattice concept, direction <hkl> 464
Lattice concept, form {hkl}      34
Lattice concept, form {hkl} 34      
Lattice concept, planes (hkl)      42—43
Lattice concept, planes (hkl) 42—3      
Lattice concept, zone axis [hkl]      29 35—36
Lattice concept, zone axis [hkl] 29, 35—36      
Lattice parameters      344—365 see
Lattice parameters see also “Errors in lattice-parameter determination”, 344—365      
Lattice parameters, accurate determination      177 186—187 297 366—394 601—602
Lattice parameters, accurate determination 177, 186—187, 297, 366—394, 601—602      
Lattice parameters, accurate determination, early methods      81—82
Lattice parameters, accurate determination, early methods 81—82      
Lattice parameters, accurate determination, single crystal      375
Lattice parameters, accurate determination, single crystal 375      
Lattice parameters, check on alloy homogeneity      576—8
Lattice parameters, check on alloy homogeneity 576—578      
Lattice parameters, cheek on alloy homogeneity      576—578
Lattice parameters, equations      42—43
Lattice parameters, equations 42—43      
Lattice parameters, film calibration      83—84 184—185
Lattice parameters, film calibration 83—84, 184—185      
Lattice parameters, flat-layer method      147 161—163 155—159
Lattice parameters, flat-layer method 147, 161—163, 166—169      
Lattice parameters, focusing methods      125
Lattice parameters, focusing methods 125      
Lattice parameters, identification      336—337
Lattice parameters, identification 336—337      
Lattice parameters, phase-boundary determination      579—582
Lattice parameters, phase-boundary determination 579—582      
Lattice parameters, variation with coarse-grained specimen      454—456
Lattice parameters, variation with coarse-grained specimen 454—456      
Lattice parameters, variation with crystal size in graphite      615—616
Lattice parameters, variation with crystal size in graphite 615—616      
Lattice strain      415—416 601—602
Lattice strain 415—416, 601—602      
Lattice strain, elastic anisotropy      426 607—609
Lattice strain, elastic anisotropy 416, 607—609      
Lattice strain, plastic anisotropy      608—610
Lattice strain, plastic anisotropy 609—610      
Lattice strain, relation with stress      416 602—605
Lattice strain, relation with stress 416, 602—605      
Lattice types      356
Lattice types 356      
Lattice types, body-centred      30 345
Lattice types, body-centred 30, 345      
Lattice types, Bravais      29—30
Lattice types, Bravais 29, 30      
Lattice types, determination from photographs      51
Lattice types, determination from photographs 51      
Lattice types, face-centred      30 345
Lattice types, face-centred 30, 345      
Lattice types, imperfect      33
Lattice types, imperfect 33      
Lattice types, reciprocal      46—47 518—519
Lattice types, reciprocal 46—47, 618—619      
Laue groups      48
Laue groups 48      
Laue integral breadth      413 421
Laue integral breadth 413, 421      
Laue photographs      47—49 191 295 466—447
Laue photographs 47—49, 191, 296, 456—457      
Laue photographs, stereographic projection, relation      463
Laue photographs, stereographic projection, relation 463      
Laval, J.      128
Laval, J. 128      
Laws, Bragg'a      45—46
Laws, Bragg's      46—6
Laws, Bragg's 45—46      
Laws, Friedel's      48
Laws, Friedel's 48      
Laws, rational indices      33—34
Laws, rational indices 33—34      
Laws, reciprocity      625
Laws, reciprocity 625      
Laws, Weiss' zone      35
Laws, Weiss' zone 35      
Layer line      51
Layer line 51      
Layer line, fibre photographs      358—361
Layer line, fibre photographs 368—361      
Layer structures, line broadening by random stacking      417 437
Layer structures, line broadening by random stacking 417, 437      
Layer structures, line broadening by random staoking      417 437
Layer structures, preferred orientation of powder      343 466 525
Layer structures, preferred orientation of powder 343, 466, 525      
le Galley, D.P.      214
le Galley, D.P. 214      
Le Mieux, A.F.      209
Le Mieux, A.F. 209      
Lea, F.M.      571 572
Lea, F.M. 571, 572      
Leak in gas tube      57—58
Leak in gas tube 57—58      
Leak in vacuum camera      256
Leak in vacuum camera 256      
Least-squares method of accurate spacing determination, cubic system      376—377
Least-squares method of accurate spacing determination, cubic system 376—377      
Least-squares method of accurate spacing determination, non-cubic systems      377—378
Least-squares method of accurate spacing determination, non-cubic systems 377—378      
Least-squares method of structure refinement      517—518
Least-squares method of structure refinement 517—518      
Leeds, R.E.      283
Leeds, R.E. 283      
Lees, C.S.      75 209 619
Lees, C.S. 75, 209, 619      
Lehmann, H.      561
Lehmann, H. 561      
Lely, J.A.      287
Lely, J.A. 287      
Lennox, D.H.      230
Lennox, D.H. 230      
Leonard, B.R., jun.      235 451
Leonard, B.R., jun. 235, 451      
Leroux, J.      230
Leroux, J. 230      
Levin, I.      114
Levin, I. 114      
Levinson, D.W.      384
Levinson, D.W. 384      
Liebson, S.H.      195
Liebson, S.H. 195      
Lihl, F.      456 602
Lihl, F. 456, 602      
Lind, D.A.      126 129 138
Lind, D.A. 126, 129, 138      
Lindemann glass, specimen mounting      115—116 277
Lindemann glass, specimen mounting 115—116, 277      
Lindemann glass, X-ray tube windows      63 80
Lindemann glass, X-ray tube windows 63, 80      
Lindemann, F.A.      125
Lindemann, F.A. 125      
Lindemann, R.      214
Lindemann, R. 214      
Lindh, A.E.      242
Lindh, A.E. 242      
Line      see also "Breadth" "Broadening" "Centre" "Diffraction "Geometric "Intensity" "Overlapping" "Peak "Penetration "Profile" "Resolution"
Line focus      61 216—217 279
Line focus 61, 216—217, 279      
Line focus, low-angle camera collimation      232—234
Line focus, low-angle camera collimation 232—234      
Line focus, monochromator production      123—131 132—135
Line focus, monochromator production 123—131, 132—135      
Line, number expected      352 518—519
Line, number expected see also “Breadth, Broadening, Centre, Diffraction broadening, Geometric breadth, Intensity, Overlapping, Peak position, Penetration of specimen by beam, Profile, Resolution”, 352, 518—519      
Linear absorption coefficient      339 386 388 392 398 401—402
Linear absorption coefficient 339, 386, 388, 392, 398, 401—402      
Lipscomb, W.N.      408
Lipscomb, W.N. 408      
Lipson's method for indexing ortho-rhombic powder photographs      360—3
Lipson's method for indexing ortho-rhombic powder photographs, table of $sin^2\theta$      642—3
Lipson's method for indexing orthorhombic powder photographs      350—353
Lipson's method for indexing orthorhombic powder photographs 360—363      
Lipson's method for indexing orthorhombic powder photographs, table of $sin^2\theta$ 642—643
Lipson's method for indexing orthorhombic powder photographs, table of $\sin^2\theta$      642—643
Lipson, H.      45 50 51 61 80 81 86 114 115 121 139 140 141 233 302 321 348 350 351 352 353 359 363 366—94 416 417 426 437 454 461 531 588 593 594 595 596 597 598 615 636 639 644 655
Lipson, H. 45, 50, 51, 61, 80, 81, 86, 114, 115, 121, 139, 140, 141, 233, 302, 321, 348, 350, 351, 352, 353, 359, 363, 366—394, 416, 417, 426, 437, 454, 461, 531, 588, 593, 594, 595, 596, 597, 598, 615, 636, 639, 644, 655      
Liquefied gases      266
Liquefied gases 266      
Liquid air      265
Liquid air 265      
Liquid air, cooling arrangements for specimens      171—172 266 270—271
Liquid air, cooling arrangements for specimens 171—172, 266, 270—271      
Liquid cooling of specimen      268—269 273—274
Liquid cooling of specimen 268—269, 273—274      
Liquid scattering      443—446
Liquid scattering 443—446      
Liquid scattering, expressions      441—443
Liquid scattering, expressions 441—443      
Lithium fluoride, isotope study      618
Lithium fluoride, isotope study 618      
Lithium fluoride, monochromator use      122 130 137—138 140—141 143
Lithium fluoride, monochromator use 122, 130, 137—138, 140—141, 143      
Lithium, low-temperature studies      272
Lithium, low-temperature studies 272      
Liu, Y.H.      186 460 584
Liu, Y.H. 186, 460, 584      
Lloyd, E.H.      180 181
Lloyd, E.H. 180, 181      
Logarithmic-spiral monochromator      134—135
Logarithmic-spiral monochromator 134—136      
Lomer, T.R.      518
Lomer, T.R. 518      
London, H.      618
London, H. 618      
Long wavelengths, low-angle methods      240—241
Long wavelengths, low-angle methods 240—241      
Long, A.      138
Long, A. 138      
Long-chain organic compounds, fibre study      534—542
Long-chain organic compounds, fibre study 534—542      
Long-chain organic compounds, identification      335 508—509 515
Long-chain organic compounds, identification 336, 508—509, 515      
Long-chain organic compounds, preferred orientation      335 481—496
Long-chain organic compounds, preferred orientation 335, 481—496      
Long-chain organic compounds, synthesis      542—544
Long-chain organic compounds, synthesis 542—544      
Long-range order      27 593—594
Long-range order 27, 593—594      
Longenecker, H.E.      515
Longenecker, H.E. 515      
Lonsdale, K.      32 33 40 48 53 116 227 265 268 297 437 528 639 653
Lonsdale, K. 32, 33, 40, 48, 53, 116, 227, 265, 268, 297, 437, 528, 639, 653      
Low-angle cameras      232—241
Low-angle cameras 232—241      
Low-angle scattering, crystalline media      232—241 280
Low-angle scattering, crystalline media 232—241, 280      
Low-angle scattering, non-crystalline media      446—453
Low-angle scattering, non-crystalline media 446—453      
Low-temperature cameras      see "Cameras low-temperature"
Low-temperature Lump specimen      Block specimen
Lump specimen      see "Block specimen"
Lump specimen see “Block specimen”      
Lund, L.H.      453
Lund, L.H. 453      
Lutton, E.S.      515
Lutton, E.S. 515      
MacArthur, I.      71 72 235 284 287 550 553 555
MacArthur, I. 71, 72, 235, 284, 287, 550, 553, 555      
MacDonald, R.A.      616
MacDonald, R.A. 616      
MacEwan, D.M.C.      59 561 562
MacEwan, D.M.C. 59, 561, 562      
MacGregor, J.M.      536 537
MacGregor, J.M. 536, 537      
Machlett      62 181
Machlett 62, 181      
Mackay, A.L.      310
Mackay, A.L. 310      
MacKenzie, J.K.      474
Mackenzie, J.K. 474      
MacQueen, J.M.      516
MacQueen, J.M. 516      
Magnesia      558—560 568
Magnesia 558—560, 568      
Magnesite      558
Magnesite 568      
Magnesite, bricks      559—560 563 566
Magnesite, bricks 559—560, 563, 566      
Magnesite, rock      562
Magnesite, rock 562      
Malkin, T.      515
Malkin, T. 515      
Manganese radiation      328 569
Manganese radiation 328, 569      
Mark, H.      268 284 290 302 310 533 546 550 556
Mark, H. 268, 284, 290, 302, 310, 533, 546, 550, 556      
Markley, K.S.      515
Markley, K.S. 515      
Marshall, F.H.      205
Marshall, F.H. 205      
Martensite      252 598
Martensite 252, 598      
Martin, A.J.P.      194
Martin, A.J.P. 194      
Martin, E.J.      570
Martin, E.J. 570      
Marwick, T.C. 550      
Marwiek, T.C.      550
Mass absorption coefficients      660—662 see
Mass absorption coefficients see also “Absorption coefficients”, 660—662      
Massive specimens, back-reflexion cameras      176 181 188
Massive specimens, back-reflexion cameras 176, 181, 188      
Massive specimens, glancing-angle cameras      163 173—175
Massive specimens, glancing-angle cameras 163, 173—175      
Massive specimens, preferred orientation      300 303—306
Massive specimens, preferred orientation 300, 303—305      
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