|
|
 |
| Àâòîðèçàöèÿ |
|
|
|
| Ïîèñê ïî óêàçàòåëÿì |
|
|
|
|
|
|
|
 |
|
|
|
| Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry |
|
|
|
| Ïðåäìåòíûé óêàçàòåëü |
Angular range of powder camera Debye — Scherrer 107—109
Angular range of powder camera Debye-Scherrer 107—9
Angular range of powder camera flat-layer method 146—147, 150—151, 167, 173
Angular range of powder camera, Debye — Scherrer 107—109
Angular range of powder camera, flat-layer method 146—147 150—151 167 173
Angular range of powder camera, focusing 124
Angular range of powder camera, focusing 124
Angular range of powder camera, high-temperature 257
Angular range of powder camera, high-temperature 257
Angular range of powder camera, low-angle 232
Angular range of powder camera, low-angle 232
Angular reciprocal axis to real axis 486
Angular relation to recording speed 111
Angular relations of axial constants 43—44
Angular relations of axial constants 43—44
Angular relations of axial constants, reciprocal axis to real axis 486
Angular relations of axial constants, reciprocal axis to real axis 486
Angus, J. 204 522
Angus, J. 204, 522
Anharmonic sine ratio 36
Anharmonic sine ratio 36
Aniline hydrochloride 28
Aniline hydrochloride 28
Anisotropy elastic 416 474—5
Anisotropy factor for cubic crystals 417
Anisotropy of crystalline materials 462
Anisotropy of crystalline materials 462
Anisotropy of crystalline materials, elastic 416 474—475
Anisotropy of crystalline materials, elastic 416, 474—475
Anisotropy of crystalline materials, factor for cubic crystals 417
Anisotropy of crystalline materials, factor for cubic crystals 417
Anisotropy of crystalline materials, plastic 475—480
Anisotropy of crystalline materials, plastic 475—480
Anisotropy plastic 475—80
Annealed homogeneous ingot, preparation 575—8
Annealed intrinsic broadening 423—9 595
Annealed phase-boundary determination 580
Annealed preferred orientation 470
Annealed specimen, equilibrium conditions 584—585
Annealed specimen, equilibrium conditions 684—685
Annealed specimen, homogeneous ingot, preparation 575—578
Annealed specimen, homogeneous ingot, preparation 575—578
Annealed specimen, intrinsic broadening 423—429 595
Annealed specimen, intrinsic broadening 423—429, 595
Annealed specimen, phase-boundary determination 580
Annealed specimen, phase-boundary determination 580
Annealed specimen, preferred orientation 470
Annealed specimen, preferred orientation 470
Annealed specimen, uranium oxides 617
Annealed specimen, uranium oxides 617
Annealed uranium oxides 617
Anode see also "Target"
Anode gas tube 58
Anode gas tube 58
Anode ionization counter 192 203 205
Anode ionization counter 192, 203, 205
Anode see also “Target”
Anode vacuum tube 59 61
Anode vacuum tube 59, 61
Anode, gas tube 58
Anode, ionization counter 192 203 205
Anode, vacuum tube 59 61
Anorthic system see "Triclinic system"
Anorthic system see “Triclinic system”
ARC see "Breadth" "Centre" "Diffraction "Geometric "Instrumental "Intensity" "Intrinsic "Overlapping resolution" "Peak "Profile"
Arc see “Breadth Centre, Diffraction broadening, Geometric breadth, Instrumental broadening, Intensity, Intrinsic broadening, Overlapping, resolution, Peak position, Profile”
Argon, counter chamber use 192—193 198—199
Argon, counter chamber use 192—193, 198—199
Argon, purification 205
Argon, purification 205
Arlman, J.J. 239
Arlman, J.J. 239
Armitage, M.D. 209 619
Armitage, M.D. 209, 619
Arndt, U.W. 189—231 235 240 419 421 430 446
Arndt, U.W. 189—231, 235, 240, 419, 421, 430, 446
Aromatic compounds, identification 516
Aromatic compounds, identification 516
Aruja, E. 114 115 437
Aruja, E. 114, 115, 437
Asp, E.T. 175 231 317 318 319
Asp, E.T. 175, 231, 317, 318, 319
Astbury, W.T. 71 484 485 489 533 534 536 545 548 549 550 551 553 556
Astbury, W.T. 71, 484, 485, 489, 533, 534, 536, 545, 548, 549, 550, 551, 553, 556
Asymmetric focusing 130 133 134 138 237
Asymmetric method see "Straumanis — Ievins film mounting"
Asymmetric method see “Straumanis — Ievins film mounting”
Asymmetric monochromators focusing 130, 133, 134, 138, 237
Asymmetric monochromators plane 142—144
Asymmetric monochromators, focusing 130 133 134 138 237
Asymmetric monochromators, plane 142—144
Asymmetric plane 142—4
Atlee, Z.J. 63
Atlee, Z.J. 63
Atmosphere in high-temperature cameras 246—249 260—261
Atmosphere in high-temperature cameras 246—249, 260—261
Atomic coordinates 29
Atomic coordinates 29
Atomic coordinates, transformation 45
Atomic coordinates, transformation 45
Atomic elements in alloys 587
Atomic elements in alloys 587
Atomic piles 611—612
Atomic piles 611—612
Atomic scattering factor 45 434 438 656—659
Atomic scattering factor 45, 434, 438, 656—659
Atomic scattering factor, elements in alloys 587
Atomic transformation 45
Auger effect 193 431—432
Auger effect 193, 431—432
Austenite 343 598
Austenite 343, 598
Auxiliary circuits, X-ray counters 207
Auxiliary circuits, X-ray counters 207
Auxiliary circuits, X-ray tubes 64 67
Auxiliary circuits, X-ray tubes 64, 67
Avalanches, ion 193—194 196
Avalanches, ion 193—194, 196
Averbach, B.L. 338 428
Averbach, B.L. 338, 428
Axial angular relations 43—4 486
Axial angular relations 43—44, 486
Axial calculations 40—41 344—365
Axial calculations 40—41, 344—365
Axial choice 363
Axial choice 363
Axial cross 28 36
Axial cross 28, 36
Axial elements 27
Axial elements 27
Axial elements, angular relations 43—44 486
Axial elements, choice 363
Axial orientation, interpretation of photographs 358—361 363—365
Axial orientation, interpretation of photographs 358—361, 363—365
Axial orientation, organic materials 482—490 492—493
Axial orientation, organic materials 482—490, 492—493
Axial orientation, polycrystalline metals 464—469 493
Axial orientation, polycrystalline metals 464—469, 493
Axial orientation, texture study 300
Axial orientation, texture study 300
Axial transformations 44
Axial transformations 44
Axis of stress 605
Axis of stress 605
Axis of symmetry see "Symmetry axis"
Axis of symmetry see “Symmetry axis”
Back-reflexion cameras see "Cameras backreflexion"
Back-reflexion cameras see “Cameras, back-reflexion”
Back-reflexion diffractometer 215—216
Back-reflexion diffractometer 215—216
| Back-reflexion methods 176—188
Back-reflexion methods 176—188
Back-reflexion methods, accurate lattice parameters 387—392 393—394
Back-reflexion methods, intensity of reflected beam 401—402
Back-reflexion methods, preferred orientation, massive specimen 303—305
Back-reflexion methods, strain measurement 601
Back-reflexion, accurate lattice parameters 387—92 393—4
Back-reflexion, accurate lattice parameters 387—392, 393—394
Back-reflexion, intensity of reflected beam 401—2
Back-reflexion, intensity of reflected beam 401—402
Back-reflexion, preferred orientation, massive specimen 303—5
Back-reflexion, preferred orientation, massive specimen 303—305
Back-reflexion, strain measurement 601
Back-reflexion, strain measurement 601
Background counting 191 223 262
Background counting 191, 223, 262
Background elimination 420—1
Background elimination 420—421
Background fiducial marks 83—4
Background fiducial marks 83—84
Background intensity 430—437 513—514
Background intensity 430—437, 513—514
Background intensity, counting 191 223 262
Background intensity, elimination 420—421
Background intensity, fiducial marks 83—84
Background intensity, scattering considerations 103—107
Background scattering considerations 103—7
Background scattering considerations 103—107
Bacon, G.E. 378 615 616 619
Bacon, G.E. 378, 615, 616, 619
Bacon, R.C. 211
Bacon, R.C. 211
Badger, E.H.M. 116
Badger, E.H.M. 116
Baenziger, N.C 616
Baenziger, N.C. 616
Baerger, N.W. 246 250 255 258
Bagchi, S.N. 443
Bagchi, S.N. 443
Bakarian, P.W. 299
Bakarian, P.W. 299
Baker, J.C 211
Baker, J.C. 211
Baker, W. 205
Baker, W. 205
Ball, C.J. 295
Ball, C.J. 295
Bamford, C.H. 491 534 552 553 554 555 556
Bamford, C.H. 491, 534, 552, 553, 554, 555, 556
Bannister, F.A. 461 523—532
Bannister, F.A. 461, 523—532
Barker index 325
Barker index 325
Barker, T.V. 325
Barker, T.V. 325
Barnes, R. 229
Barnes, R. 229
Barnes, R.B. 516
Barnes, R.B. 516
Barnes, R.J. 142 291 458 459
Barnes, R.J. 142, 291, 458, 459
Barraud, J. 134
Barraud, J. 134
Barrett, C.S. 33 114 139 272 306 307 310 311 317 321 470 473 628
Barrett, C.S. 33, 114, 139, 272, 306, 307, 310, 311, 317, 321, 470, 473, 628
Barrett, L.R. 568
Barrett, L.R. 568
Bartlett, H.B. 569
Bartlett, H.B. 569
Base of diffractometer 217—218
Base of diffractometer 217—218
Basic refractories 563—567
Basic refractories 563—567
Basinski, Z.S. 255
Basinski, Z.S. 255
Bates, T.F. 530
Bates, T.F. 530
Battell, W.J. 211
Battell, W.J. 211
Batteries for Geiger counters 213
Batteries for Geiger counters 213
Bauer, A. 569
Bauer, A. 569
Bauer, S.H. 449
Bauer, S.H. 449
Baxter, A. 170
Baxter, A. 170
Beaded counters 201
Beaded counters 201
Beam trap 108—109 232—233
Beam trap 108—109, 232—233
Bear, K.E. 116
Bear, K.E. 116
Bear, R.S. 111 234 278 279 280 296 446 447
Bear, R.S. 111, 234, 278, 279, 280, 296, 446, 447
Bearden, J.A. 366 367 403 652 653
Bearden, J.A. 366, 367, 403, 652, 653
Beatty, S. van D. 175, 317
Beatty, S.E.A. 74
Beatty, S.E.A. 74
Beatty, S.van D. 175 317
Beaumont, C.F.A. 265
Beaumont, C.F.A. 265
Beck, P.A. 231 320 469
Beck, P.A. 231, 320, 469
Becker, K. 242 254
Becker, K. 242, 254
Beeman, W.W. 209 235 239 240 451 452
Beeman, W.W. 209, 235, 239, 240, 451, 452
Beese, N.C. 60
Beese, N.C. 60
Beevers, C.A. 426
Beevers, C.A. 426
Belanger, J.B. 615
Belanger, J.B. 615
Belcher, E.H. 207
Belcher, E.H. 207
Bell, F.O. 533
Bell, F.O. 533
Bell, G.E. 625 626
Bell, G.E. 625, 626
Bell, P.R. 205
Bell, P.R. 205
Bell, R.J.J. 43
Bell, R.J.J. 43
Bell, R.L. 296
Bell, R.L. 296
Ben, K.E. 630 631
Ben, K.E. 630, 631
Bennett, A.I. 205
Bennett, A.I. 205
Bent costal see "Curved crystal"
Bent crystal see “Curved crystal”
Bent crystal, see Curved crystal Bernal chart 359
Berg, W.F. 620
Berg, W.F. 620
Bergman, B.G. 615
Bergman, B.G. 615
Berl, E. 533
Berl, E. 533
Berman, H. 529
Berman, H. 529
Bernal chart 359
Bernal chart 359
Bernal, J.D. 309 615
Bernal, J.D. 309, 615
Bernstein, W. 204
Bernstein, W. 204
Berry, C.R. 426 427
Berry, C.R. 426, 427
|
|
|
| Ðåêëàìà |
|
|
|
|
|
Î ïðîåêòå