Ãëàâíàÿ    Ex Libris    Êíèãè    Æóðíàëû    Ñòàòüè    Ñåðèè    Êàòàëîã    Wanted    Çàãðóçêà    ÕóäËèò    Ñïðàâêà    Ïîèñê ïî èíäåêñàì    Ïîèñê    Ôîðóì   
blank
Àâòîðèçàöèÿ

       
blank
Ïîèñê ïî óêàçàòåëÿì

blank
blank
blank
Êðàñîòà
blank
Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry
Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.) — X-Ray Diffraction by Polycrystalline Materials. Physics in Industry



Îáñóäèòå êíèãó íà íàó÷íîì ôîðóìå



Íàøëè îïå÷àòêó?
Âûäåëèòå åå ìûøêîé è íàæìèòå Ctrl+Enter


Íàçâàíèå: X-Ray Diffraction by Polycrystalline Materials. Physics in Industry

Àâòîðû: Peiser H.S, (ed.), Rooksby H.P. (ed.), Wilson A.J.C. (ed.)

Àííîòàöèÿ:

For anyone WI10 has been concerned with X-ray analysis since its early days, it. is fascinating to see how the subject continues to grow and ramify. The present book is a striking illustration of this development. Although it deals with only one branch of crystal analysis, the study of polycrysta]line materials, it has been found desirable tQ invite some thirty experts to make their contributions in order that each aspect of the subject might be covered in an authoritative way. That it has been possible to weld contributions from so many authors into a coherent scheme is both a tribute to the editors and an excellent exalllple of that happy collaboration that has existed froITi the very beginning amongst X-ray crystallographers and continues so manifstly at the present time.


ßçûê: en

Ðóáðèêà: Ôèçèêà/

Ñòàòóñ ïðåäìåòíîãî óêàçàòåëÿ: Ãîòîâ óêàçàòåëü ñ íîìåðàìè ñòðàíèö

ed2k: ed2k stats

Èçäàíèå: 1st edition

Ãîä èçäàíèÿ: 1955

Êîëè÷åñòâî ñòðàíèö: 725

Äîáàâëåíà â êàòàëîã: 06.09.2009

Îïåðàöèè: Ïîëîæèòü íà ïîëêó | Ñêîïèðîâàòü ññûëêó äëÿ ôîðóìà | Ñêîïèðîâàòü ID
blank
Ïðåäìåòíûé óêàçàòåëü
Crystallite size, exposure time 281      
Crystallite size, flat-layer methods      153—155
Crystallite size, flat-layer methods 153—156      
Crystallite size, microbeam methods      292—295
Crystallite size, microbeam methods 292—295      
Crystallite size, mineral samples      526—526 529
Crystallite size, mineral samples 525—526, 529      
Crystallite size, non-continuous rings      456—459
Crystallite size, non-continuous rings 456—459      
Crystallite size, refractories      559—560
Crystallite size, refractories 559—560      
Crystallite size, relation to line breadth      413
Crystallite size, relation to line breadth 413      
Crystallite size, relation to spot size      281—283
Crystallite size, relation to spot size 281—283      
Crystallite size, variation with lattice spacing in graphite      615—616
Crystallite size, variation with lattice spacing in graphite 615—616      
Crystals for monochromators      122 140
Crystals for monochromators 122, 140      
Crystals for monochromators, focusing      137—139
Crystals for monochromators, focusing 137—139      
Crystals for monochromators, plane      139 141
Crystals for monochromators, plane 139, 141      
Cubic system identification      328—9
Cubic system identification 328—329      
Cubic system indexing of photograph, quadratic forms 636—638      
Cubic system, calculation of strain      416
Cubic system, calculation of strain 416      
Cubic system, cell-dimension determination      82 345—346
Cubic system, cell-dimension determination 82, 345—346      
Cubic system, cell-dimension determination, accurate      369—375
Cubic system, cell-dimension determination, accurate 369—375      
Cubic system, identification      328—329
Cubic system, indexing of photograph      346
Cubic system, indexing of photograph 346      
Cubic system, interplanar angles      649—651
Cubic system, interplanar angles 649—651      
Cubic system, lattice spacings, calculation      43
Cubic system, lattice spacings, calculation 43      
Cubic system, multiplicity factors      639—641
Cubic system, multiplicity factors 639—641      
Cubic system, quadratic forms      636—638
Cubic system, radiation selection for back-reflexion method      187
Cubic system, radiation selection for back-reflexion method 187      
Cubic system, symmetry      31
Cubic system, symmetry 31      
Cunningham, J.      172 248 250 253 582
Cunningham, J. 172, 248, 250, 253, 582      
Curran, S.C.      194 201 204 205 208 213 522
Curran, S.C. 194, 201, 204, 205, 208, 213, 522      
Current heating of specimen, externally      253—254
Current heating of specimen, externally 253—254      
Current heating of specimen, internally      254
Current heating of specimen, internally 254      
Curved crystal, line broadening      416
Curved crystal, line broadening 416      
Curved specimen      214
Curved specimen 214      
Curved specimen, instrumental broadening      411
Curved specimen, instrumental broadening 411      
Curved-crystal reflectors, back-reflexion methods      182—183
Curved-crystal reflectors, back-reflexion methods 182—183      
Curved-crystal reflectors, development      125—126
Curved-crystal reflectors, development 125—126      
Curved-crystal reflectors, focusing      127—128 596
Curved-crystal reflectors, focusing 127—128, 596      
Curved-crystal reflectors, low-angle method's      235—238
Curved-crystal reflectors, low-angle methods      235—8
Curved-crystal reflectors, low-angle methods 235—238      
Curved-crystal reflectors, reflexion      128—129
Curved-crystal reflectors, reflexion 128—129      
Curved-crystal reflectors, suitable crystals      137—139
Curved-crystal reflectors, suitable crystals 137—139      
Custers, J.F.H.      175 303 305 306 307
Custers, J.F.H. 175, 303, 305, 306, 307      
Cut-off of diffracted beam, high-angle      509
Cut-off of diffracted beam, high-angle 509      
Cut-off of diffracted beam, low-angle      355
Cut-off of diffracted beam, low-angle 355      
Cut-out, X-rav generator      68
Cut-out, X-ray generator      68
Cut-out, X-ray generator 68      
Cylindrical collimator      see also "Collimating systems"
Cylindrical collimator, microbeam designs      283—4 290—1 Collimating
Cylindrical collimator, microbeam designs see also “Collimating systems”, 283—284, 290—291      
Cylindrical collimator, microbearn designs      283—284 290—291
Cylindrical films, Debye — Scherrer camera      81—86
Cylindrical films, Debye — Scherrer camera 81—86      
Cylindrical films, Debye-Scherrer camera      81—6
Cylindrical films, intensity corrections      53
Cylindrical films, intensity corrections 53      
Cylindrical films, preferred-orientation camera      301—302 313—315
Cylindrical films, preferred-orientation camera 301—302, 313—315      
Cylindrical films, Seemann — Bohlin focusing camera      123—125
Cylindrical films, Seemann — Bohlin focusing camera 123—125      
Cylindrical films, Seemann-Bohlm focusing camera      123—5
Cylindrical films, single-crystal photographs      50
Cylindrical films, single-crystal photographs 50      
Cylindrical reflector, point-focusing systems      135—136
Cylindrical reflector, point-focusing systems 135—136      
Cylindrical specimen, absorption factors      663—666
Cylindrical specimen, absorption factors 663—666      
Cylindrical specimen, breadth of powder line      94—95 327
Cylindrical specimen, breadth of powder line 94—95, 327      
Cylindrical specimen, broadening of po wder line      410—11
Cylindrical specimen, broadening of powder line      410—411
Cylindrical specimen, broadening of powder line 410—411      
Cylindrical specimen, comparison with flat -layer techniques      146—8
Cylindrical specimen, comparison with flat-layer techniques      146—148
Cylindrical specimen, comparison with flat-layer techniques 146—148      
Cylindrical specimen, diffractometers      220
Cylindrical specimen, diffractometers 220      
Cylindrical specimen, high-temperature cameras      173 259—260
Cylindrical specimen, high-temperature cameras 173, 259—260      
Cylindrical specimen, low-temperature cameras      277
Cylindrical specimen, low-temperature cameras 277      
Cylindrical specimen, preferred-orientation work      299 318
Cylindrical specimen, preferred-orientation work 299, 318      
Cylindrical symmetry, preferred-orientation study      300
Cylindrical symmetry, preferred-orientation study 300      
Cylindrical symmetry, theoretical scattering expression      442—443
Cylindrical symmetry, theoretical scattering expression 442—443      
d spacing, corrected values      112—113 376
d spacing, corrected values 112—113, 376      
d spacing, equations      42—43
d spacing, equations 42—43      
d spacing, scales      74—75
d spacing, scales 74—75      
d spacing, use in identification      331—333 502—503 514
d spacing, use in identification 331—333, 502—503, 514      
Daams, H.      239
Daams, H. 239      
Dacron      see "Terylene"
Dacron see “Terylene”      
Daniel, V.      114 597
Daniel, V. 114, 597      
Danielson, G.C.      444
Danielson, G.C. 444      
Danielson, W.E.      238 451
Danielson, W.E. 238, 451      
Darbord, R.      126
Darbord, R. 126      
Darmois, E.      443
Darmois, E. 443      
Darmon, S.E.      557
Darmon, S.E. 557      
Darwin's equation      128
Darwin's equation 128      
Darwin, C.G.      395
Darwin, C.G. 395      
Daubeny, R.de P.B.      534 544
Daubeny, R.de P.B. 534, 544      
Daubert, B.F.      515
Daubert, B.F. 515      
Davey, C.N.      197 212
Davey, C.N. 197, 212      
Davey, W.P.      78 115 214 395
Davey, W.P. 78, 115, 214, 395      
Davidson, R.L.      533
Davidson, R.L. 533      
Davis, M.M.      534
Davis, M.M. 534      
Davison, D.W.      173
Davison, D.W. 173      
Dawez, P.      568 569
Dawson, W.E.      311
Dawson, W.E. 311      
Dawton, R.H.V.M.      633
Dawton, R.H.V.M. 633      
De Barr, A.E.      321
De Barr, A.E. 321      
De Benedetti, S.      207
de Benedetti, S. 207      
de Beurs, P.H.      212
de Beurs, P.H. 212      
de Broglie, M.      125 134
de Broglie, M. 125, 134      
de Graaf, J.E.      61 80
de Graaf, J.E. 61, 80      
de Jong, W.F.      382
de Jong, W.F. 382      
de Keyser, W.L.      567
de Keyser, W.L. 567      
de Smedt, J.      270
de Smedt, J. 270      
de Wolff camera      133—134
de Wolff camera 133—134      
de Wolff focusing camera      133—134
de Wolff focusing camera 133—134      
de Wolff, P.M.      132 133 134 135 167 404 413
de Wolff, P.M. 132, 133, 134, 135, 167, 404, 413      
Dead time of counter      196 201 224
Dead time of counter 196, 201, 224      
Dead volume of counter      197
Dead volume of counter 197      
Debye — Scherrer method 78—121      
Debye — Scherrer method, absolute-intensity measurement 402—405      
Debye — Scherrer method, accurate lattice-parameter determination 366—381, 393—394      
Debye — Scherrer method, cameras 80—86, 87—91      
Debye — Scherrer method, features 86—87, 91—111      
Debye — Scherrer method, intensity measurement 400, 404      
Debye — Scherrer method, stereographic projection, relation 463—464      
Debye — Seherrer method      78—121
Debye — Seherrer method, absolute-intensity measurement      402—405
Debye — Seherrer method, accurate lattice-parameter determination      366—381 393—394
Debye — Seherrer method, cameras      80—86 87—91
Debye — Seherrer method, features      86—87 91—111
Debye — Seherrer method, intensity measurement      400 404
Debye — Seherrer method, stereographic projection, relation      463—464
Debye — Waller temperature factor      396
Debye — Waller temperature factor 396      
Debye, P.      145 396 400 441 442
Debye, P. 145, 396, 400, 441, 442      
Debye-Scherrer absolute-intensity measurement      402—5
Debye-Scherrer accurate lattice-parameter determination      366—81 393—4
Debye-Scherrer cameras      80—6 87—91
Debye-Scherrer features      86—7 91—111
Debye-Scherrer intensity measurement      400 404
Debye-Scherrer method      78—121
Debye-Scherrer stereographic projection, relation      463—4
Debye-Waller temperature factor      396
Decker, B.F.      175 231 317 318 319 615
Decker, B.F. 175, 231, 317, 318, 319, 615      
Defect structures      334 501 587
Defect structures 334, 501, 587      
Delaunay's reduction method      354—356 363
Delaunay's reduction method 354—356, 363      
Delaunay, B.      354 355 356 363 407
Delaunay, B. 354, 355, 356, 363, 407      
Demountable fine focus      69—70
Demountable merits      68
Demountable operation      64—8
Demountable rotating target      62 70—2
Demountable X-ray tubes      59—61 209
Demountable X-ray tubes 59—61, 209      
Demountable X-ray tubes, fine focus      69—70
Demountable X-ray tubes, fine focus 69—70      
Demountable X-ray tubes, merits      68
Demountable X-ray tubes, merits 68      
Demountable X-ray tubes, operation      64—68
Demountable X-ray tubes, operation 64—68      
Demountable X-ray tubes, rotating target      62 70—72
Demountable X-ray tubes, rotating target 62, 70—72      
den Hartog, H.      196 201
den Hartog, H. 196, 201      
Densitometer      76—77
Densitometer 76—77      
Densitometer, measurement of X-ray films      621 633
Densitometer, measurement of X-ray films 621, 633      
Density of matter, calculation from cell dimensions      29 337 348 353 357
Density of matter, calculation from cell dimensions 29, 337, 348, 353, 357      
Density of X-ray film      191—192
Density of X-ray film 191—192      
Density of X-ray film, measurement      621
Density of X-ray film, measurement 621      
Density of X-ray film, relation to exposure      628—629
Density X-ray film, relation to exposure      628—9
Density X-ray film, relation to exposure 628—629      
Desch, C.H.      571 572
Desch, C.H. 571, 572      
Detectors, radiation      190—208
Detectors, radiation 190—208      
Deutsch, F.      540
Deutsch, F. 540      
Deutsch, M.      205
Deutsch, M. 205      
Devaux, J.      60
Devaux, J. 60      
Development of films      625—626 629—670
Development of films 625—626, 629—670      
Dexter, D.L.      452
Dexter, D.L. 452      
di Giovanni, H.J.      279
di Giovanni, H.J. 279      
Diameter of camera, Debye — Scherrer      80 120—121 327
Diameter of camera, Debye — Scherrer 80, 120—121, 327      
Diameter of camera, Debye-Scherrer      80 120—1 327
Diameter of camera, diffractometer      218
Diameter of camera, diffractometer 218      
Diameter of camera, focusing, effective      125
Diameter of camera, focusing, effective 125      
Diameter of camera, high temperature      257
Diameter of camera, high temperature 257      
Diameter of camera, relation to exposure time      80
Diameter of camera, relation to exposure time 80      
diamond      407
Diamond 407      
Diamond, monochromator use      122 139—141
Diamond, monochromator use 122, 139—141      
Diamond, monoehromator use      122 139—41
Dickins, G.J.      593 615
Dickins, G.J. 593, 615      
Dickinson, S. 548      
Dickirison, S.      548
Diesel engines corrosion products      500
Diesel engines corrosion products 500      
Diffracted beam      see also "Scattering"
Diffracted beam amplitude      395
Diffracted beam amplitude 395      
Diffracted beam divergence      219—20
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21
blank
Ðåêëàìà
blank
blank
HR
@Mail.ru
       © Ýëåêòðîííàÿ áèáëèîòåêà ïîïå÷èòåëüñêîãî ñîâåòà ìåõìàòà ÌÃÓ, 2004-2024
Ýëåêòðîííàÿ áèáëèîòåêà ìåõìàòà ÌÃÓ | Valid HTML 4.01! | Valid CSS! Î ïðîåêòå