Riviere J.C. (ed.), Myhra S. (ed.) — Handbook of Surface and Interface Analysis :: Электронная библиотека попечительского совета мехмата МГУ

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Riviere J.C. (ed.), Myhra S. (ed.) — Handbook of Surface and Interface Analysis

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Название: Handbook of Surface and Interface Analysis

Авторы: Riviere J.C. (ed.), Myhra S. (ed.)

Аннотация:

Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe microscopy, high spatial resolution imaging and synchrotron-based techniques. It emphasizes problem-solving for different classes of materials and material function.

Язык:

Рубрика: Физика/

Статус предметного указателя: Готов указатель с номерами страниц

ed2k: ed2k stats

Издание: 1st edition

Год издания: 1998

Количество страниц: 968

Добавлена в каталог: 16.11.2009

Операции: Положить на полку | Скопировать ссылку для форума | Скопировать ID

Предметный указатель

SEM, Monel 400      675—676 687 694
SEM, pitted corrosion surface      654 656
SEM, Roman lead pipe      840 847
SEM, Roman leaded bronzes      864—865
SEM, spatial resolution      548—549 653—654
SFM, calibration, aspect ratio      426 433—434 439
SFM, calibration, coefficient of friction      431
SFM, calibration, correction factors      428
SFM, calibration, lateral spring constant      429 431—433
SFM, calibration, material      427
SFM, calibration, normal spring constant      428 131
SFM, calibration, precision      431
SFM, calibration, radius of curvature      434 439
SFM, calibration, reference surfaces      438—439
SFM, calibration, resonance frequency      433
SFM, calibration, reverse imaging      433—434
SFM, calibration, standard lever      430
SFM, calibration, tip height      439—440
SFM, calibration, tip tilt      440—441
SFM, force relationships      407 409
SFM, force relationships, probes      425—440
SFM, force relationships, probes, commercial product      425
SFM, force relationships, probes, material      427 433 134
SFM, force relationships, probes, radius of curvature      427 434—439
SFM, force relationships, probes, SEM image      425
SFM, spatial resolution      401—402
SFM, subgroups      400
Shake-up features, XPS, C 1s, $\pi-\pi^{*}$       85—87 336 805
Shake-up features, XPS, Ceria      169—170
Shake-up features, XPS, Cu, CuO, $Cu_{2}O$       169 761
Shake-up features, XPS, Fe to Cu      169 761
Shake-up features, XPS, use in catalysis      761
Si, Auger parameter $\alpha^{*}$       331 512—513 516 585—587 760
Si, in $SiO_{3}$       331
Si, in Cr — O — Si cermet      329—332
Si, in suboxides      510—516
Si, LVV chemical shift      489
Si, reconstruction, STM      398—399
SIMS, elemental sensitivity      751
SIMS, matrix effect      211 223 232—233 282—283 458
SIMS, maximum primary ion dose      212
SIMS, molecular emission      211—212
SIMS, preferential sputtering      283
SIMS, quantification, damage problems      212 614
SIMS, secondary ion yield      211 222
SIMS, sensitivity factor      283
SIMS, static (SSIMS)      212—239
SIMS, surface charging      751
SIMS, yield variation problems      282—283 751
Smoothing, spectral      71—72 99
SNMS, angular distribution      222
SNMS, characteristics      43 258—259 285—288
SNMS, disappearance cross-section      221
SNMS, disappearance yield      221
SNMS, energy distribution      222
SNMS, geometrical yield      223
SNMS, ion profiling      250—251 358—359
SNMS, ion sources      215
SNMS, ion sources, $Cs^{+}$       213 215
SNMS, ion sources, electron impact      212—213 215 267
SNMS, ion sources, LMIG      213—215 267
SNMS, mass analyzers      214—215
SNMS, noble metal substrates      224—226
SNMS, operation      285—286
SNMS, post-ionization      211 216—217 221 224 285—286
SNMS, quantification      282—283 287—288
SNMS, spectral interpretation      220—221
Spatial resolution, AES      200 463 465 476 485 501
Spatial resolution, catalyst requirements      750
Spatial resolution, DCEMS      360
Spatial resolution, field emission SEM      548 653—654
Spatial resolution, Raman spectroscopy      740
Spatial resolution, SAM      118 201 463 491 494 525 531 551 606 750 837 864—865
Spatial resolution, SEM      548—549 653—654
Spatial resolution, SPM      401—402
Spatial resolution, SSIMS      227—229 751
Spatial resolution, STEM      709
Spatial resolution, XPS, imaging      90—91 200—201 485 465—466 492 795 797
Spatial resolution, XPS, scanning      89 485 492
SSIMS problem-solving, catalysis      766—769
SSIMS problem-solving, Cl diffusion in polymers      242—243
SSIMS problem-solving, defects in car paint      239—241
SSIMS problem-solving, grain boundaries, ceramics      569 581 583
SSIMS problem-solving, residues on glass      246—249
SSIMS problem-solving, segregation in ceramics      583
SSIMS problem-solving, surface modification      243—246
SSIMS, angular distribution      222
SSIMS, atomic mass definition      230
SSIMS, characteristics      42 258—259
SSIMS, depth profiling      229 251 266 358—359
SSIMS, disappearance cross-section      221
SSIMS, disappearance yield      221
SSIMS, energy distribution      222
SSIMS, ion sources      215
SSIMS, ion sources, $Cs^{+}$       213 215
SSIMS, ion sources, electron impact      212—213 215 267
SSIMS, ion sources, LMIG      213—215 267
SSIMS, mass analyzers      215
SSIMS, mass analyzers, ion cyclotron resonance      214—215
SSIMS, mass analyzers, magnetic sector      214—215
SSIMS, mass analyzers, quadrupole      214—215
SSIMS, mass analyzers, time-of-flight (ToF)      214 215 226 228 766
SSIMS, mass assignment guidelines      230—232 766—767
SSIMS, performance summary      226 249—250
SSIMS, quantification      232—239 282—283
SSIMS, quantification, calibration curve      234
SSIMS, quantification, choice of standard      235
SSIMS, quantification, internal standards      233—235
SSIMS, quantification, matrix effect      211 223 232—233 282—283 751
SSIMS, quantification, noble metal substrates      224—226
SSIMS, quantification, normalization to substrate      236
SSIMS, quantification, organic monolayer      233
SSIMS, quantification, organic multilayers      237—238
SSIMS, quantification, secondary ion yield      222 233
SSIMS, spatial resolution      227—229 751
SSIMS, spectra databases      766
SSIMS, spectral interpretation      217 219—220
SSIMS, surface charge compensation      216 751
SSIMS, surface specificity      246 249 751 766—768
SSIMS, typical spectrum      217—219
Stable isotopes      887—892
Standardisation progress in surface analysis      906—926
STEM, characteristics      42
STEM, spatial resolution      709
STEM, tribology      709
STM, characteristics      43 401
STM, depth resolution      401 402 404
STM, electron tunnelling      402—406
STM, energy level scheme      403
STM, information      401 546—547 712 725
STM, instrumentation      410—421
STM, physical principles      402 406
STM, spatial resolution      404
STM, surface specificity      416
STM, tip condition      417
STM, tunnel voltage      404—405
STM, work function mapping      405
STS, characteristics      43 402—406
STS, complement to UPS/IPES      405
STS, information      401
STS, physical principles      402—406
STS, valence and conduction state mapping      405
Stylus profilometry, measurement of crater depth      269
Surface charging      70 98—99 172 313 492 493 516 571 589 616—618 750—751 758
Synchrotron radiation photoelectron spectroscopy (SRPS)      486
Synchrotron radiation photoelectron spectroscopy (SRPS), angular and energy resolution      885 887
Synchrotron radiation photoelectron spectroscopy (SRPS), characteristics      40 488
Synchrotron radiation photoelectron spectroscopy (SRPS), DOS mapping      486
Synchrotron radiation photoelectron spectroscopy (SRPS), semiconductors and microelectronics      486
Synchrotron radiation photoelectron spectroscopy (SRPS), sources      489

Synchrotron radiation photoelectron spectroscopy (SRPS), spatial resolution      492
Synchrotron radiation photoelectron spectroscopy (SRPS), surface specificity      487 488 513
Synchrotron radiation photoelectron spectroscopy (SRPS), tuning of photon energy      519
Synchrotron radiation photoelectron spectroscopy (SRPS), vacuum requirements      885
Taper section, for depth profiling      202 494 650—651 810—811
TEM, characteristic’s      41
TEM, grain boundary analysis      450 471 473—477
TEM, high resolution (HRTEM)      360
TEM, implanted layers      359—360
TEM, information      546—547
TEM, phase structure      556—557 578
TEM, tribology      707—709 729
Ti, 2p doublet, BEs      323
Ti, in TiN, 2p peaks      316—320 323—324
Ti, in TiN, effects of ion bombardment      315—320
Ti, in TiN, oxynitride phase      324
Ti, in TiN, valence state variation      314
TiN, coating material      314
TiN, effect of ion bombardment      315—324
TiN, overlapping Ti doublets      320
TiN, plasma nitriding      320—322
TiN, RBS analysis      315
TiN, substoichiometry      322—323
TiN, superstoichiometry      323—324
TiN, XPS analysis      315
TiN, XPS analysis, peak positions      315—320
TiN, XPS analysis, Ti/N ratios      322
ToF — SIMS, C fibres      788 804
ToF — SIMS, characteristics      43
ToF — SIMS, mass resolution      228
ToF — SIMS, minerals, ceramics, and glasses      551
ToF — SIMS, sensitivity      766
ToF — SIMS, spatial distribution of molecular ions on PbS      571—572
ToF — SIMS, spatial resolution      227—229 570—571
Tribology, analysis      705 724 732—733 738—739
Tribology, analysis, wear particles      705 729—730 736
Tribology, analysis, wear scars      705 736
Tribology, analysis      705—706
Tribology, analysis,       705—706 724 727 729 733 736 742
Tribology, analysis,       706 727—729
Tribology, analysis, adsorbed species      720—724 727—729
Tribology, analysis, clean surfaces      705 723—724
Tribology, analysis, difficulties      706
Tribology, analysis, possible techniques      705—706
Tribology, analysis, wear scars      706 724 736 742
Tribology, analysis      706
Tribology, analysis,       706
Tribology, analysis,       706 714
Tribology, analysis, experimental difficulties      706
Tribology, analysis, instrumentation      711
Tribology, analysis, surfaces in motion      706 709—710 719—720
Tribology, $MoS_{2}$ in UHV      732—737
Tribology, $MoS_{2}$ in UHV, $O_{2}$ depth profile      734 735
Tribology, $MoS_{2}$ in UHV, AES analysis      736
Tribology, $MoS_{2}$ in UHV, AFM analysis      736
Tribology, $MoS_{2}$ in UHV, HRTEM analysis of wear particles      736—737
Tribology, $MoS_{2}$ in UHV, NRA analysis      734 735
Tribology, $MoS_{2}$ in UHV, super-low friction      733
Tribology, analysis modes      704—706
Tribology, analysis modes,       704—705
Tribology, analysis modes,       704—705
Tribology, analysis modes,       704 706
Tribology, analysis modes,       704
Tribology, analysis modes,       704
Tribology, analytical criteria, dimensional      701—703
Tribology, analytical criteria, information      702 706—713
Tribology, analytical criteria, time-scale      701 703—706
Tribology, analytical techniques      707—713
Tribology, antiwear additives      717—722
Tribology, antiwear additives, analysis      720—722
Tribology, antiwear additives, analysis      719—720
Tribology, antiwear additives, AES analysis      720—722
Tribology, antiwear additives, analytical techniques      717
Tribology, antiwear additives, ELNES analysis      718
Tribology, antiwear additives, environment of Fe and Zn atoms in wear debris      717—719
Tribology, antiwear additives, friction tests in vacuo      720—722
Tribology, antiwear additives, XANES analysis      717
Tribology, antiwear additives, XPS analysis      720
Tribology, basic phenomena, adhesion      698—700
Tribology, basic phenomena, asperity deformation      698—700
Tribology, basic phenomena, ploughing      698—700
Tribology, boundary lubrication      698—700 714—716
Tribology, boundary lubrication, measurement of film thickness by UFI      714 716
Tribology, carbonaceous coatings      737—740
Tribology, carbonaceous coatings, diamond-like      737—738
Tribology, carbonaceous coatings, frictional behaviour      739—740
Tribology, carbonaceous coatings, H content dependence      739
Tribology, carbonaceous coatings, super-low friction      739
Tribology, dry friction and adsorbed monolayers      727—729
Tribology, dry friction and adsorbed monolayers, instrumentation      728
Tribology, dry friction and adsorbed monolayers, adsorbates      729
Tribology, dry friction and adsorbed monolayers, AES analysis      727—729
Tribology, dry friction and adsorbed monolayers, effects on friction      728—729
Tribology, gas lubrication of ceramics      729—731
Tribology, gas lubrication of ceramics, AES analysis      729—730
Tribology, gas lubrication of ceramics, effect of $O_{2}$       729—730
Tribology, gas lubrication of ceramics, friction in vacuo      729
Tribology, gas lubrication of ceramics, TEM analysis      729
Tribology, information sought      706—713 741
Tribology, information sought, chemical bonds      707 741
Tribology, information sought, chemical phases      707 741
Tribology, information sought, chemical states      707 741
Tribology, information sought, structure      707 741
Tribology, interfaces      712—713
Tribology, interfaces, surface force measurements      713
Tribology, interfaces, very thin lubricating films      713
Tribology, introduction      697—698
Tribology, lubricant additives      699 717—724
Tribology, lubricant film thicknesses      698—700
Tribology, lubrication modes, boundary      698—700 714 716
Tribology, lubrication modes, elastohydrodynamic      698
Tribology, lubrication modes, hydrodynamic      698
Tribology, lubrication modes, mixed      700
Tribology, lubrication modes, solid-film      700
Tribology, microstructure      731—732
Tribology, microstructure, $MoS_{2}$ lubricant      731—732
Tribology, microstructure, coatings on steel      732
Tribology, microstructure, layer structure      731
Tribology, nascent surfaces      722—724
Tribology, size distribution of tribological elements      702—703
Tribology, spatial resolution needed      703 706 709 742
Tribology, surface analytical procedure      701—702
Tribology, surface morphology      711—712
Tribology, surface morphology, AFM      712
Tribology, surface morphology, effect on tribological behaviour      711
Tribology, surface morphology, STM      712 725
Tribology, tribochemical reactions at interfaces      724—727
Tribology, tribochemical reactions at interfaces, AES analysis      724—725
Tribology, tribochemical reactions at interfaces, contact materials      724
Tribology, tribochemical reactions at interfaces, friction in vacuo      724—725
Tribology, tribochemical reactions at interfaces, high temperature lubricants      727
Tribology, tribochemical reactions at interfaces, organic lubricants      725—727
Tribology, tribochemical reactions at interfaces, thin oxides in interface      724
Tribology, tribochemical reactions at interfaces, XPS analysis      724 727
Tribology, tribochemistry of $C_{60}$       740—741
Tribology, tribochemistry of $C_{60}$ , Raman analysis      740—741
Tribology, tribochemistry of $C_{60}$ , thin films      740
TRIM, simulation of depth profiles      312 352—353 387
Ultrathin film interferometry (UFI), characteristics      41
Ultrathin film interferometry (UFI), description      714 716
Ultrathin film interferometry (UFI), measurement of boundary lubricant film thickness      714 716
Ultrathin film interferometry (UFI), sampling depth      714
UPS, angular and energy resolution, SRPS      885 887
UPS, angular and energy resolution, vacuum requirements      885
UPS, angular resolution (ARUPS), adsorbate orientation      887
UPS, angular resolution (ARUPS), band structure mapping      887
UPS, characteristics      40
UPS, comparison with XPS      884 885
UPS, complement to IPES      405
UPS, complement to STS      405

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