Riviere J.C. (ed.), Myhra S. (ed.) — Handbook of Surface and Interface Analysis :: Электронная библиотека попечительского совета мехмата МГУ

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Riviere J.C. (ed.), Myhra S. (ed.) — Handbook of Surface and Interface Analysis

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Название: Handbook of Surface and Interface Analysis

Авторы: Riviere J.C. (ed.), Myhra S. (ed.)

Аннотация:

Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe microscopy, high spatial resolution imaging and synchrotron-based techniques. It emphasizes problem-solving for different classes of materials and material function.

Язык:

Рубрика: Физика/

Статус предметного указателя: Готов указатель с номерами страниц

ed2k: ed2k stats

Издание: 1st edition

Год издания: 1998

Количество страниц: 968

Добавлена в каталог: 16.11.2009

Операции: Положить на полку | Скопировать ссылку для форума | Скопировать ID

Предметный указатель

Ion sources, ion implantation, “bucket      354
Ion sources, ISS      126—127
Ion sources, SSIMS, SNMS      212—213 215
Ion sources, SSIMS, SNMS, $Cs^{+}$ bombardment      213 215
Ion sources, SSIMS, SNMS, electron impact      212—213 215 267
Ion sources, SSIMS, SNMS, LMIG      213—215 267
Ion sputtering process      107 210—211 350—351
Ion sputtering process, artefacts introduced      107 300 306 325 664 772 808
Ion sputtering process, atom ejection      211 350
Ion sputtering process, atomic mixing      271 300—301 310—311 353
Ion sputtering process, atomic mixing, energy dependence      310—311
Ion sputtering process, collision cascade      210 227 240 350—351
Ion sputtering process, compound reduction      271—272 313 325—332 496 510 772
Ion sputtering process, compound reduction, database reference      772
Ion sputtering process, dependence on crystallinity      108 270
Ion sputtering process, dependence on primary ion energy      108 270 272 300 351—352 772
Ion sputtering process, depth resolution degradation      108 269—273 300
Ion sputtering process, induced microtopography      271 302 306—308 664
Ion sputtering process, induced segregation      271 310 772
Ion sputtering process, preferential sputtering      268—269 310
Ion sputtering process, recoil atoms      210—211 350
Ion sputtering process, Sigmund model      107 353
Ion sputtering process, statistical nature      107 350
Ion sputtering process, surface roughening      270—271 302 306—308 664
Ionization, post, in SNMS      211 216—217 221 224 285—286
Ionization, secondary, in SIMS      211 222
IPES, complement to STS      405
IPES, complement to UPS      405
IR spectroscopy      246 524
IR spectroscopy, corrosion      667
IR spectroscopy, Fourier Transform (FTIR)      552 739
IR spectroscopy, information      546—547
IR spectroscopy, tribology      707 738—739
Ir, reaction with Si, RBS      262—263
Isotopic data      877—883
ISS      121—152
ISS problem-solving, catalysis, $WO_{3}$ on $TiO_{2}$       776
ISS problem-solving, catalysis, applicability      749
ISS problem-solving, catalysis, charge compensation      751
ISS problem-solving, catalysis, combination with XPS      752
ISS problem-solving, catalysis, coverage plot      775—776
ISS problem-solving, catalysis, intensity/coverage relationship      775
ISS problem-solving, catalysis, surface specificity      751
ISS problem-solving, grain boundaries in minerals and ceramics      569
ISS problem-solving, surface sites on ceramics      579—580
ISS spectra, $SnO_{2}$ , platinized      134
ISS spectra, $WO_{3}$ on $TiO_{2}$       776
ISS spectra, Ag, cleaning treatments      143
ISS spectra, Ag, oxidation      144
ISS spectra, Ag/ $Al_{2}O_{3}$ , catalyst      123
ISS spectra, Al oxidation      127
ISS spectra, Mg      129
ISS spectra, Ni/Cr      138
ISS spectra, Pd      139
ISS spectra, Zn/Cr/O spinel catalyst      152
ISS spectra, ZnS      126
ISS, $H_{2}^{+}$ as primary ion      125
ISS, background intensity      133 148 150
ISS, characteristics      43 121—122 258—259
ISS, charging problems      130 751
ISS, choice of primary ion      136—138 144—145
ISS, comparison with AES and XPS      142—143
ISS, data processing      150—151
ISS, depth profiling      151—152 772
ISS, detection of C      140
ISS, detection of H      139—140
ISS, differential scattering cross-section      148—149
ISS, elemental sensitivity      141—142 614
ISS, energy analyzers      128—130
ISS, energy and mass resolution      144—146
ISS, energy relation      122
ISS, experimental geometry      122
ISS, history      121 124—125
ISS, influence of adsorbed H      139
ISS, information      546—547
ISS, instrumentation      126—130
ISS, intensity in inelastic tail      150
ISS, ion sources      126—127
ISS, isotopic effects      148
ISS, isotopic purity of primary ion      136
ISS, multiple scattering      126 134
ISS, multiply charged ion scattering      127 135
ISS, neutralization probability      132—133 136 150
ISS, peak shape, theory      147—148 150
ISS, potential damage      126—127 137
ISS, primary ion mass      137
ISS, quantification      148—150 751 775—776
ISS, scattering      123—125
ISS, scattering angle      128—130
ISS, shadowing, blocking      124
ISS, spectral interpretation      123 130—132 134
ISS, structural analysis of minerals, ceramics and glasses      550
ISS, surface specificity      121—123 142—144 751 775
ISS, typical spectrum      123
ISS, vacuum conditions      127
Josephson junctions, AES analysis      494—496
Josephson junctions, AES analysis, backscattering effects      495—496
Josephson junctions, aging behaviour      493
Josephson junctions, choice of analytical methods      493—494
Josephson junctions, depth profiles      495—496
Josephson junctions, description      486 493
Josephson junctions, protective role of In      503
Josephson junctions, surface analysis requirements      486
Josephson junctions, XPS analysis      496—499
Josephson junctions, XPS analysis, Nb/(Pb — In) junction      497
Josephson junctions, XPS analysis, Nb/Pb junction      497
Josephson junctions, XPS analysis, Pb lineshape during profiling      497
KEs, Auger, table      902—904
Kikuchi diffraction, in SEM      654
Kikuchi diffraction, in SEM, use in corrosion      654
KLL, Si, effect of ion bombardment      328—329 512—513 527
KLL, Si, effect of ion bombardment, peak energies      512—513
KLL, Si, effect of ion bombardment, peak width      517 521 523
Krytox, SSIMS spectrum      232
KVV, O, in $SiO_{2}$ on Si depth profile      516
KVV, O, in InP on $SiO_{2}$ compound indicator      530
Laser ablation assisted deposition (LAPVD)      298
LEED, application to mineral, ceramic and glass surfaces      549
LEED, application to mineral, ceramic and glass surfaces, surface sites      566
LEED, information      546—547
Lewis acids and bases, role in ceramic/polymer adhesion      804
Line scanning, SAM      491 527 531
Line scanning, scanning ELS (REELM)      491
Line widths, characteristics X-rays      65—66 625
LMIG, beam damage      614
LMIG, characteristics      267
LMIG, fine focussing      213 215
LMIG, high brightness      213
LMIG, spatial resolution      227—228 551 571
lnterferometry, tribology      712
lnterferometry, ultrathin film (UFI), measurement of boundary lubricant film thickness      714 716
Low angle electron diffraction (LAED) LRM      300
Low angle electron diffraction (LAED) LRM, characteristics      40
Lubricant, SSIMS spectrum      232
LVV, $SiO_{2}$ , lineshape      524
LVV, $SiO_{2}$ , surface specificity      524 527
LVV, ion bombardment damage      527
LVV, Si, chemical shift      489
M $\ddot{o}$ ssbauer spectroscopy      359—368
M $\ddot{o}$ ssbauer spectroscopy, adhesion      810
M $\ddot{o}$ ssbauer spectroscopy, catalysis, bimetallic systems      771
M $\ddot{o}$ ssbauer spectroscopy, conversion electron (CEMS)      359—368
M $\ddot{o}$ ssbauer spectroscopy, conversion electron (CEMS), description      359—362
M $\ddot{o}$ ssbauer spectroscopy, conversion electron (CEMS), isomer shift      361
M $\ddot{o}$ ssbauer spectroscopy, conversion electron (CEMS), magnetic splitting      361
M $\ddot{o}$ ssbauer spectroscopy, conversion electron (CEMS), measurement geometries      362
M $\ddot{o}$ ssbauer spectroscopy, conversion electron (CEMS), quadrupole splitting      361
Mass analyzers, choice for SSIMS and SNMS      214
Mass analyzers, ion cyclotron resonance      214—215
Mass analyzers, magnetic sector      214—215

Mass analyzers, quadrupole      214—215
Mass analyzers, time-of-flight      214—216 226 228 766
Mass peak assignment, SSIMS      230—232
Matrix assisted laser desorption (MALDI)      246
Matrix effect, in SIMS      211 223 232—233 282—284 761
Matrix effect, in SNMS      285
Medical prostheses, polyethylene      369
Medical prostheses, Ti6Al4V alloy      369
Medical prostheses, wear improvement by ion implantation      369—376
Metals, failure mechanisms      449
Metals, grain boundaries      447—449
Metals, grain boundaries, particle formation      448 449
Metals, grain boundaries, segregation      448—455
Metals, grain boundaries, strength      448 449
Metals, grain size      449
Metals, grain size, effect of aging      449
MFM      400—401 427
MFM, probe materia]      427
Mg, ISS spectra      129
Microelectronics, surface analysis, small area requirement      485
Minerals, adsorption      570—573
Minerals, adsorption of ethyl xanthate      564
Minerals, adsorption, information from combined techniques      573
Minerals, adsorption, information from STM and AFM      571
Minerals, adsorption, information from ToF-SIMS      572
Minerals, adsorption, surface coverage      573
Minerals, analysis strategy      545—549
Minerals, analysis strategy, chemical analysis      550
Minerals, analysis strategy, physical imaging      548
Minerals, analysis strategy, structural analysis      548—550
Minerals, combined techniques      545 570
Minerals, depth profiles      570
Minerals, depth profiles, ARXPS      570
Minerals, depth profiles, combined techniques      570
Minerals, depth profiles, labradorite, by SIMS      570—571
Minerals, depth profiles, sputtering      570
Minerals, grain boundaries      568—570
Minerals, grain boundaries, C on faces of ground sulphide ore      569
Minerals, grain boundaries, exposure by fracture      569
Minerals, grain boundaries, information from TEM techniques      569
Minerals, grain boundaries, information from XPS, SAM, SSIMS, and ISS      569
Minerals, grain boundaries, layer thickness      569
Minerals, grain boundaries, microinclusions      569
Minerals, grain boundaries, segregation and segregation factor      569
Minerals, growth of oxidation products on PbS      561—562
Minerals, information from AFM      561—565
Minerals, information from STM and STS      558—566
Minerals, information from XPS      560—562
Minerals, information requirement      543—547
Minerals, oxidised PbS STM image      560
Minerals, PbS(001)STM image      560—561
Minerals, pH dependence      564
Minerals, phase structures      552—558
Minerals, phase structures, analysis by EDS      556—557
Minerals, phase structures, analysis by XRF      557
Minerals, phase structures, identification by      556—557
Minerals, phase structures, identification by SEM, BSE      553—555
Minerals, phase structures, information from XRD and neutron diffraction      553
Minerals, phase structures, lattice imaging      556
Minerals, phase structures, optical microscopy      552
Minerals, phase structures, phase contrast imaging      556
Minerals, purging gas dependence      564
Minerals, STM-deposition of Pb(OH)      565
Minerals, surface characterisation requirements      543—544
Minerals, surface features      543—544
Minerals, surface modification      574—576
Minerals, surface modification, bauxite ore particles      575—576
Minerals, surface modification, calcination      575—576
Minerals, surface modification, catalytic properties      575—576
Minerals, surface modification, information from combined techniques      575
Minerals, surface modification, information from FTIR      575
Minerals, surface modification, information from SEM and      575
Minerals, surface modification, information from XPS      575
Minerals, surface modification, Kuolinite      575
Minerals, surface modification, molecular modelling      575
Minerals, surface modification, SIMS depth profiles      575—576
Minerals, surface modification, water vapour plasma      575
Minerals, surface reactions      573—574
Minerals, surface reactions, information from combined techniques      573
Minerals, surface reactions, information from XRD and XPS      574
Minerals, surface reactions, leaching, dissolution, precipitation      574
Minerals, surface reactions, oxidation of sulphides      573
Minerals, surface reactions, solution analysis      574
Minerals, surface reactions, sulphur oxidation products      573
Minerals, surface reactions, surface phase transformation      574
Minerals, surface sites      566—568
Minerals, surface sites, AES depth profile      566
Minerals, surface sites, ARXPS      566—567
Minerals, surface sites, Fe(III) on $Fe_{7}S_{8}$       566
Minerals, surface sites, information from EXAFS      568
Minerals, surface sites, information from structural techniques      566
Minerals, surface sites, information from XPS      566—568
Minerals, surface sites, modelling theory      568
Minerals, surface sites, oxidation of $Fe_{7}S_{8}$       566—568
Minerals, surface sites, water adsorption      567—568
Minerals, surface structures      558—566
Minerals, water-treated PbS      563
molecular beam epitaxy (MBE)      298
Molecular modelling, adhesion      823—827
Molecular modelling, adhesion, introduction      823
Molecular modelling, adhesion, molecular dynamics approximation      824—827
Molecular modelling, adhesion, simulation of arrangement, of organosilane molecules on FeOOH      824—827
Monel 400, composition      669
Monel 400, corrosion      668—696
Monel 400, corrosion, background      668—669
Monel 400, corrosion, experimental strategy      669—671
Monel 400, corrosion, grain boundary segregation      668—670
Monel 400, corrosion, SIMS images      670
Monel 400, corrosion, specimen preparation      669—671
Monochromatisation, X-rays      65 165 513 628—630 805
Multilayer structures      360
Multilayer structures, depth profiles      305
Multilayer structures, depth profiles, oscillatory behaviour, ion energy dependence      304 306
Multiplet splitting, XPS      85—87 566—567 763
Multiplet splitting, XPS, Cr 3s      87
Multiplet splitting, XPS, rare earths      4 86
N (nitrogen), in polymers, 1s spectra      337
N (nitrogen), in polymers, BEs      337
N (nitrogen), in polymers, ion beam damage      336—337
N (nitrogen), in TiN, new $TiN_{2}$ phase      323—324
N (nitrogen), in TiN, oxynitride phase      324
N, 1s, BE in Al/epoxy joint      802
N, 1s, BE in TiN      316—317 320—324
N, 1s, BEs      631—632
N, 1s, chemical shift in pyridine as probe of acid-base properties      769—770
N, 1s, chemical shifts      171 173 316—317 321 324 769
N, 1s, coating on fibre      618
N, 1s, curve-fitting      316—317 631—632
N, 1s, curve-fitting, effects of ion bombardment of TiN      320
N, 1s, curve-fitting, loss peaks      317
N, 1s, shifts on C fibres      787
N-methyl pyrrolidone, use in removal of polymers to expose buried interface      808—809
NaCl, Na 1s spectra      756
Nb 3d BEs      499
Neutralization probability. ISS      132—133 136 150
NEXAFS, use in analysis of minerals      556
Ni, adsorption of benzene. UPS      886
Ni/Cr, Auger KEs      105
Ni/Cr, cleaning by H atoms      73—74
Ni/Cr, ISS spectra      138
Ni/Cr, oxidation. AES spectra      105
NMR, informaiion      546—547
Noble meial substrates in SSIMS and SNMS      224—225
NRA, characteristics      43 358
NRA, description      734
NRA, ion implanted layers      358
NRA, tribology      734—735
O(oxygen), 1s spectrum, component peaks      611 613 621—622
O(oxygen), 1s spectrum, curve fitting      611 618 620—621 630—631
O(oxygen), 1s spectrum, peak positions      512 516 630—631

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