Simulators, behavioral 294—295
Simulators, circuit 295
Simulators, gate-level 295
Simulators, register-transfer-level (RTL) 294—295
Simulators, switch-level 295
Simulators, timing 295
Single instruction, multiple data machine (SIMD) 95—96 98
Single instruction, multiple data machine (SIMD), SIMD-Cube Connected 125
Single instruction, multiple data machine (SIMD), SIMD-Perfect Shuffle 125
Single instruction, multiple data machine (SIMD), SIMD-SM 95 99 108 113
Single instruction, multiple data machine (SIMD), SIMD-SM-R 95 105 106 108 110—113 115 123
Single instruction, multiple data machine (SIMD), SIMD-SM-RW 95 105 108 110 112 125 134
Single instruction, multiple data machine (SIMD), SIMD-SMM 128
Single stuck-line (SSL) 298 303
Sisson, W.H. 278
Skyum, S. 134 153
Slagle, J.R. 139 140 152
Slocum, J. 43
Smith, G.W. 278
Smith, J.E. 317 319 320 334
Smith, M.G. 332
Smith, T.B. 111 278
Snir, M. 172 176 197 198
So, H.H. 403 442
So, K.M. 199
Software 6
Software, design 410—413
Software, design, algorithm 411
Software, design, knowledge-based 410—411
Software, design, system 411—413
Software, engineering, environments 436
Software, engineering, methodology 336—337
Software, engineering, techniques 394
Software, engineering, techniques, phase dependent 394 398—399
Software, engineering, techniques, phase independent 394 398—399
Software, family concept 428—429
Software, family concept, members 429
Software, management 426—440
Software, management, activity management (manager) 426 434—436
Software, management, data base support (DB) 426 436—440
Software, management, knowledge base support (KB) 426 436—440
Software, management, resource management (manager) 426—434
Software, modifications 336
Software, quality 414
Software, quality assurance 413—426
Software, quality assurance, software metrics 414—415
Software, reliability 21 219—226 414—426
Software, reliability assessment environment (SRAE) 425—426
Software, reliability, assumptions in various models 418—420
Software, reliability, correctness measures for 420—421
Software, reliability, evaluation criteria 416
Software, reliability, evaluation criteria, correction errors 417
Software, reliability, evaluation criteria, ease of data collection 418
Software, reliability, evaluation criteria, input distribution 417
Software, reliability, evaluation criteria, language independent 416
Software, reliability, evaluation criteria, methodology independent 417
Software, reliability, evaluation criteria, model validation 418
Software, reliability, evaluation criteria, program complexity 417
Software, reliability, evaluation criteria, representativeness 417
Software, reliability, evaluation criteria, test selection criteria 417
Software, reliability, evaluation criteria, time 418
Software, reliability, operational definition 420
Software, reliability, reliability growth models 418—420
Software, reliability, reliability growth models, error-counting: Musa, Littlewood General Poisson 418—419
Software, reliability, reliability growth models, nonerror-counting: imperfect debugging, input domain-based 418
Software, specification 336
Software, test strategies 421—426
Software, test strategies, automatic tools for testing 423
Software, test strategies, test case design 422
Software, test strategies, test coverage 422—423
software, testing 421
Software, validation phase 420
Software, validation phase, Nelson model 420
Software-implemented fault tolerance (SIFT) 225
Solid circuit 282
Sollin, M. 113 152
Somani, A.K. 97 152
Son, K. 320 334
Soundararajan, N. 405 443
SPA 385
Space-time product measure 195
Spanning tree 115
Spanning tree, depth-first spanning tree 100 111 112
Spanning tree, graphs, for 100—101 112
Sparse graphs 104
Specification 399
Specification, choosing a model 402—403
Specification, model 406
Specification, model, hierarchical 406
Specification, model, modular 406
Specification-dependent testing 383—384
Specifications, changing 408—410
Specifications, implementation 406
Specifications, interface 406
Specifications, procedural 406
Specifications, service 406
Speed-up ratio s 97
SPICE 295
Spirk, A.P. 390
Sprague, R.H. 3 7 8 42 45
SPREAD 158—159
Sridhar, T. 324 334
Staehler, R.E. 214 279
STARAN computer 86
STARAN computer, FLIP network 86
statement coverage 354—355 387
Steepest gradient approach 409—410
Steepest gradient approach, example: telecommunication system 409—410
Stenzel, W.J. 69 92
Stevens, W.P. 411 412 443
Stifler, W.W., Jr. 92
Stochastic calculators and computers 58—59
Stochastic calculators and computers, ADDIE 58—59
Stochastic calculators and computers, DISCO 59
Stochastic calculators and computers, POSTCOMP 59
Stochastic calculators and computers, RASCEL 59
Stochastic calculators and computers, stochastic computer 59
Stochastic elements 52
Stochastic number representation 54
Stochastic operations, division 57
Stochastic operations, negative numbers, representation 57—58
Stochastic operations, subtraction 57
Stochastic processing 61—62
Stochastic processing, applications of 60
Stochastic processing, randomness and long-term averaging 57
Stochastic processing, special applications of 60
Stochastic processing, time stochastic processing (TSP) 59
Stochastic processing, TRANSFOR MATRIX 60
Stockmeyer, L.J. 152
Stone, H.S. 96 152 162 199
Stonebraker, M. 430 443
Storage media 6
Storey, T.F. 278
Stratalink 271
Stratus Computer 266 269—271
Strings, compacted, shift registers for 68—69
STRIPS 35
Strom, R. 95 153
Structural verification 291—294
Structural verification, connectivity verification systems (CVS) 291—292
Structural verification, electrical-rule checking (ERC) 291
Structural verification, layout-rule checking (LRC) 291
Structural verification, validation 291
Structural verification, verification 291—294
Structure 337
Structure, crystallographic 289
Stucki, L.G. 342 391
Su-Sung 50
SUE operating system 244
Sufficient paths criterion 369 370 377—378 380—381
| Sufficient set 378
Sufficient testing sets 378
Sukert, A. 443
Sun, Z. 329 334
Super-system 402
Supervertices 105
Supervertices, nonisolated 108
SUPREM 286
Suzuki, K. 442
SW-banyan 190—192
Swarz, R.S. 209 279
switch 158—159
Switch, functional characteristics, centralized control 163
Switch, functional characteristics, distributed control 163
Symbolic evaluations 348
Symbolic execution 411
Synchronization 98
Synchronization, explicit 98
Synchronization, implicit 98
Synchronous Random Pulse Sequence (SRPS) 54 58
Synchronous Random Pulse Sequence (SRPS), generation 55
Synchronous Random Pulse Sequence (SRPS), quasi-noise 55
System design methodologies 411—413
System design methodologies, data flow 411 412
System design methodologies, data flow, cohesion 412
System design methodologies, data flow, coupling 412
System design methodologies, data structure 411
System design methodologies, data structure, Jackson Methodology 412
System design methodologies, decomposition 412
System design methodologies, functional decomposition 411
System design methodologies, hierarchical 411
System design methodologies, partitioning 412
System failures 213—218
System failures, hardware 213 215
System failures, interaction 218
System failures, procedural 213 218
System failures, software 213 215—217
System utilization effect 218—220
Systolic array model 125—126
Table look-up techniques 69—76
Table look-up techniques, centralized control 163
Table look-up techniques, distributed control 163
Takamatsu, Y. 333
Tanaka, Y. 97 153
Tandem computer 252 266 269—270
Tandem computer, nonstop 235 266
Tatjan, R.E. 100 111 112 113 115 150 153
Taylor, D.J. 238 278
Taylor, G.L. 63 66 92
Taylor, R.N. 353 390 391
Teichroew, D. 400 443
Telecommunication example 410
Telephone switching systems, electronic (ESS) 261—266
Temporal logic 406
Teng, F.C. 391
Tenstrings 67—69 73
TERESIAS 40
Terminal reliability (TR) 161 187—188
Ternary threshold logic 59
Test chips 286—287
Test data generation 388
Test data generation, random 338
Test effectiveness ratio 370
Test plan 336—337
Test points, OFF 375—376
Test points, ON 375—376
Test selection, criteria 350—351
Test selection, criteria, complete 351
Test selection, criteria, consistent 351
Test selection, criteria, successful 351
Test selection, problems 349
Test selection, rules 366
Test sets, universal 314—315
Test strategies for software reliability 421—426
Test structures, types of 286—287
Testability 366—367
Testing 296—320
Testing blindness 378—379
Testing blindness, assignment blindness 378—379
Testing blindness, equality blindness 378—379
Testing blindness, self-blindness 378—379
Testing oracle 343—344 366 387
Testing strategies 417
Testing, automatic tools for 423
Testing, automatic tools for, dynamic analysis 423
Testing, automatic tools for, intermodule interface analysis 423
Testing, automatic tools for, static analysis 423
Testing, automatic tools for, symbolic execution 423
Testing, black box 337 338 339
testing, bottom-up 340—341
Testing, branch 355
Testing, component 362—364
Testing, decidability problems 347—350
Testing, dynamic 346 387
Testing, dynamic redundancy 296—297
Testing, exhaustive 300—301
Testing, fault avoidance 296
Testing, fault detection 296
Testing, fault masking 296
Testing, functional 337 339 364—368 387
Testing, fundamental theorem of 350
Testing, masking redundancy 296
Testing, mathematical theory of 344—352
Testing, methodologies 337
Testing, methodologies, path-oriented 339
Testing, mutation 361 388
Testing, off-line 297
Testing, random 300—301
Testing, specification-dependent 383
Testing, static 346 347 349 354 387
Testing, structural 338 339 388
Testing, structural-level 303
Testing, test generation techniques 300—320
Testing, test generation techniques, D-algorithm 303 307—310
Testing, test generation techniques, PODEM 303 310—314
Testing, test generation techniques, process 297—298
Testing, test generation techniques, programmable logic arrays (PLAs) 316—320
Testing, test generation techniques, regular circuits 316
Testing, test generation techniques, sensitization 301
Testing, test generation techniques, sequential circuits 314
Testing, test generation techniques, structural techniques 303—314
Testing, Testing, data flow 356—358 387—388
Testing, theoretical foundation for 350—352
Testing, top-down 340—341 384
Testing, weak mutation 358 362—364 387
Testing, white box 337 338—339
Tests, acceptance 340
Tests, evaluation 339—340
Tests, incremental 339
Tests, integration 339—341
Tests, module 339—340
Tests, systems 339—340
Tests, unit 339
Thatte, S.M. 316 334
Thayer, R.A. 422 443
Theorem proving, nonresolution 35
Theorem proving, resolution 34—35
Thevenod-Fosse, P. 301 332
Thierauf, R.J. 3 45
Thomas, W.J. 197
Threshold logic 52
Tietz, L.C. 63 92
Time reduction (TR) paradigm 103
Time-complexity reduction 102—103
Time-shared bus 156
Timing control 195—196
Timing control, asynchronous 195—196
Timing control, clocked 196
Topological equivalence 160—161
Topological equivalence, equivalence condition 161
|
|
|
Î ïðîåêòå