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| Yovits M. — Advances in Computers.Volume 26. |
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| Предметный указатель |
Kruskal, C.P. 151 152 172 176 197 198
Kruskal, J.B. 113 148 151
Ku, C.T. 303 333
Kubitz, W.J. 69 92
Kucera's method 125—126
Kucera, L. 105 113 151
Kuck, D.J. 98 103 151
Kuhn, R.H. 103 151
Kulikowski, C.A. 45
Kumar, M. 194 198
Kumar, V. 143 151
Kumar, V.P. 199
Kung, H.T. 96 97 98 149 151
Kuo, H. 391
Kwan, S.C. 113 123 124 151
Laduzinsky, A.J. 276 278
Lakshmivarahan, S. 103 151 176 197
Lala, J.H. 278
Lam, J. 150
Lamport, L. 279 405 442
Landweber, L.H. 347 348 389
Lang, T. 198
Language-based systems, Raddle 405
Languages 411
Languages, design specification 413
Languages, program design 411
Laski, J. 356 357 390
Lauer, H.C. 278
Lawrie, D.FL. 162 166 169 170 186 198
layering 429
Layout-rule checking (LRC) 291 292—293
Layout-rule checking (LRC), hierarchical 292
Layout-rule checking (LRC), incremental 292
Layout-rule checking (LRC), techniques, corner based 292—293
Layout-rule checking (LRC), techniques, raster based 292—293
Layout-rule checking (LRC), techniques, region operation based 292—293
Lea 40 45
Learning 38—41
Learning from examples 40—41
Learning from experience 40
Learning from general advice 40—41
Learning from generalization 40—41
Learning, domain-specific 38
Learning, fragmented 38
Learning, human 33
Learning, modes of 38—41
Learning, rote 39
Lederberg, J. 44
Lee, G. 95 104 151
Lee, P.A. 227 252 277
Lee, R.C. 17 43
Lehman, T.J. 442
Leibniz, Gottfried 51
Leiserson, C.E. 97 151 195 197 198
Lelarasmee, E. 295 333
Lenat, D. 40 43
Lenfant, J. 198
Lev, G. 198
Levitt, K.N. 125 151 197 279 389
Life cycle, software 394—399
Life cycle, software, automatic programming model 396
Life cycle, software, development phase 395
Life cycle, software, operations and maintenance phase 395
Life cycle, software, rapid prototyping model 396
Life cycle, software, spiral model 399
Life cycle, software, waterfall model 396 398
Life period: early, useful 203—204
Lightest edge from each vertex method 113
Lightest edge, first method 113
Lillienkamp, J.E. 198
Lindbloom, E. 319 332
Lindsay, R. 39 41 44
Line permuter 78—80 82—83 85—86
Linear 371
Linear remapping 58
Linearly domained program 375
Linger, R.C. 411 442
Linguistic approximation 17
Link 136—138
Lipovski, G.J. 166 197 198
Lipow, M. 417 441 443
Lipton, R.J. 389 441
Lithography, optical 283
Littlewood 418
Littlewood model 418
Liu, S. 286 333
Load-sharing arrangement 249—250
Loeckx, J. 51 90
Logic, nonmonotonic 36
Logic, verification 291 295—296
Loop iteration limits 380—381
Luby, M. 129 151
Lyons, R.E. 276 278
Machulda, J. 276 278
Maheshwari, S.N. 108 152
Mahoney, G.W. 334
Maintenance cost 336
Majority logic 221
Mak, G.P. 318 333
Makam, S.V. 211 278
Malek, M. 198 276 279
Maleti, P. 151
Manna, Z. 406 442
Manning, E.G. 278
Margrave, Christopher 50
Markov 418 419
Markov model 208—210
Markowski, G. 332
Markowsky, G. 323 333
Marlett, R. 314 333
Mars, P. 49 58 59 90 91
Marvel, O.E. 60 90
Masking redundancy 296
Mason 162
Masson, G.M. 198 303 333
Masuyama, A. 153
Matching 127
Mathur, F.P. 277
Matrix, manipulation problems 104
Matrix, multiplication 124
MAX vertices 140
Maximum matchings 127
MBMS 7
McAuliffe, K.P. 197 198
McCabe, J. 415 441 442
McCarthy, C.E. 276 278
McCarthy, J. 36 44 52 92
McCluskey, E.J. 301 328 329 332 333
McDermott, D. 36 43 44
McLean, H.R. 90
McMillen, R.J. 166 184 198 199
McMullin, P. 384 389
Mead, C.A. 148 151
Mead-Conway, NMOS 293
Mean time between failures (MTBF) 206—207 209—211
Mean time to failure (MTTF) 207 212
mean time to repair (MTTR) 207 212
Mechanical properties 289
Mehta, D. 334
Meinerzhagen, B. 333
Melliar-Smith, P.M. 278 279
Mellish, C.S. 43
Melosh, R.E. 43
Melton, E.A. 198
Memory contention 94
Menon, J. 149
Message-based systems, CSP 405
META-DENDRAL (MD) 41
Meta-level probability evaluation 15
Metal-oxide-semiconductor (MOS) technology 281
| Metal-oxide-semiconductor (MOS) technology, fabrication process 284—285
Metal-oxide-semiconductor (MOS) technology, technology 282
Methods, algebraic 301—303
Methods, architectural 316
Methods, instrumental 286—289
Metrics 414
Metrics, validation 415
Metrics-guided methodology 414
Metze, G. 278
Microscopy, charge collection 289
Miczo, A. 331 333
Miller, E.F. 336 390
Miller, L.L. 151
Milner, R. 404 442
MIN classification, multipath 164
MIN classification, nonblocking 164 166
MIN classification, permutation network blocking (UPP) 164 166
MIN classification, rearrangeable 164 166
Minimal covering set 369—370
Minimax procedure 140
Minimum spanning tree 113
Minimum spanning tree of weighted, connected, and unidirected graph 112
Minimum-cost spanning tree 112
Minker, J. 17 44
Minsky, M. 35 44
Mirambet, P. 90
Missing path errors 338 343 352 374
Mitchell, T.M. 41 44
Mittermeir, R. 443
Model selection 407
Modification request 430
Modified baseline network (MBN) 184 185
Module, software 339
Modules, stub 340
Modules, test-driver 340
Mohan, L.P. 66 91
Moitra, A. 95 98 135 151 152
Mok, Y.R. 442
Monitors 341
Monotonic logic 34
Moore, R.W. 139 140 142 151
Morgan, D.E. 238 278
Moriconi, M. 413 442
Morphology determination 288
Morrison, E. 51 91
Morrison, P. 51 91
Mostow 40
Mu function 22
Mucha, J. 330 332
Mulmuley, K. 127 152
Multipath MINs 182—187
Multipath MINs, digit control 183
Multipath MINs, fault detection 186
Multipath MINs, fault tolerance 187
Multipath MINs, reliability analysis 187—188
Multipath MINs, topology 183—186
Multiple instruction, multiple data machine (MIMD) 96 123
Multiple instruction, multiple data machine (MIMD), MIMD-TC 96
Multiple instruction, multiple data machine (MIMD), MIMD-TC-R 110 115
Multiprocessor system 156
Multiprocessor system, parallel 156
Multistage interconnection networks 158—159
Multistage interconnection networks, connection of 159—160
Multistage interconnection networks, design parameters 160—164
Multistage interconnection networks, layers of design 160
Multistage interconnection networks, partitionability 161
Munro, I. 134 152
Musa model 418
Musa, J.D. 417 418 442
Mutant program generation 360—361
Mutants 359
Mutants, equivalent 361
Mutation 421
Mutation, analysis 358—362
Mutation, analysis, competent programmer hypothesis 359
Mutation, analysis, coupling effect 359
Mutation, analysis, mutant operators 359 360
Mutation, analysis, systems 360
Mutation, analysis, test oracle availability 359
Mutation, testing 361 388
Muth, P. 314 333
Myers, G.J. 336 340 341 354 386 387 390 411 412 417 422 442 443
N-MOSFET 73—74
Nagel, L.W. 295 333
Naheshwari 113
NAND gate 304 305
Narraway, J.J. 199
Nassimi, D. 150 166 179 198
Nath, D. 108 113 152
NC class (Nick's class) 147—148
NEAR 118
Nearest neighbor method 113 115
Needham, J. 50 91
Nelson model 420
Nelson, D.L. 258 278
Nelson, E. 420 442 443
Network topology 160—162
Network topology, dynamic 160
Network topology, static 160
Neureuther, A.R. 286 334
Neville, R.G. 91
Neville, S.M. 278
Newell, A. 44
Ng, Y.W. 211 278
Nicolau, A. 95 152
Nilsson, N.J. 24 35 43 44 139 140 152
Nonfunctional requirements 407—408
Norton, V.A. 194 198
Nowak, J.S. 278
Nozoka, Y. 153
NP-completeness 147
Ntafos, S.C. 338 356 370 389 390
Number representation, probabilistic 54
Number representation, randomness in 56
Number representation, stochastic 54
Nussbaum, E. 277
NxN selection strategy 377
Object model 437
Observability 320
Okumoto, K. 419 441
Olson, M. 3 43
Omega network 169—172 186 192
Omega network, control structure: flip, switch 173
Omega network, data alignment 169—170
Omega network, generalized skewing scheme 169
Omega network, memory system 169
Omega network, parallel access 169
Omega network, reconfiguration 173—175
Omega network, routing conflicts 171—172
Omega network, switches: 2-, 4-function 173
Omega network, topological equivalence 173—175
Omega network, universality 176
One-sided topologies, full switch 162
One-sided topologies, partitioner 162
Opferman, D.C. 198
Osterweil, L.J. 353 389 390 391 423 442
Ostrand, T.J. 351 391
Ottaman, T.A. 97 152
Ottmann, T.A. 293 332
Ouasemzadeh, H. 334
Ousterhout, J.K. 293 332
Padmanabhan, K. 186 198
Padua, D.A. 103 151
Paige, M.R. 344 390
Paige, R.C. 152
Pan, S.S. 7 17 44
Pan, V. 134 149 152
Pang, C.Y. 124 150
Parallel algorithms 93—154
Parallel algorithms, design paradigms, abstract 148
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