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| Yovits M. — Advances in Computers.Volume 26. |
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| Предметный указатель |
Parallel algorithms, design paradigms, concrete 148
Parallel algorithms, paradigms for improving efficiency 101—103
Parallel algorithms, scheduling problems, for 128
Parallel computation, modes of 95—97
Parallel computation, paradigms for organizing 99—101
Parallel machines, special purpose 96—97
Parallelism, asynchronous 99 147
Parallelism, bounded 103
Parallelism, intrinsic 94
Parallelism, synchronous 147
Parallelism, unbounded 103
Parasitic flip-flop (PFF) 299
Parker, D.S. 166 176 184 187 198 199
Parnas, D.L. 338 390 411 429 442
Partition analysis 383—387 388
Partition analysis, evaluation of 386—387
Partition analysis, partition testing 386
Partition analysis, symbolic evaluation, verification 385—386
Pascal, Blaise 51 89
Passivating layer 285
Patel, J.H. 159 172 192 193 198
Path analysis strategies, reliability of 350
Path condition 346 349
Path sensitization technique 303
Path testing approaches 369—371
Path testing approaches, branch coverage 369
Path-oriented testing models 368—387
Path-oriented testing models, domain testing 369 371—377
Path-oriented testing models, domain testing, assumptions 374—375
Path-oriented testing models, domain testing, input space structure 373—374
Path-oriented testing models, domain testing, iterated domains 382
Path-oriented testing models, domain testing, predicate interpretation 371—373
Path-oriented testing models, domain testing, test point selection 375—376
Path-oriented testing models, partition testing (analysis) 369 383—387 388
Path-oriented testing models, perturbation testing 369 382—383 388
Path-oriented testing models, program specification testing 383—384
Path-oriented testing models, sufficient paths criterion 369 377—378 388
Path-oriented testing models, sufficient paths criterion, experiments using 380—381
Path-oriented testing models, sufficient paths criterion, loop iteration limits 381—382
Path-oriented testing models, sufficient paths criterion, sufficient testing sets 378
Path-oriented testing models, sufficient paths criterion, testing blindness, types 378—379
Path-oriented testing models, sufficient paths criterion, vector space model results 379—380
Paths, DU 357
Paths, loop-free 357
Paths, simple 357
Patterson, M. 134 152
Pearl, J. 139 152
Pearl, Judea 44
Pease, M.C. 166 198
Peng, S. 150
Perera, I.A. 377 390
Perfect matching 127
Perfect matching, unique 127—128
Performance 295—296
Performance, issues 408
Performance, verification 291
Permutation, passable 160
Permutation, realizable 160
Perricone, B.T. 400 441
Perturbation testing 369 382—383
Perverted adder (PA) 63—65
Pesch, H. 388 390
Peterson, L.D. 234 278
Peterson, W.W. 234 276 279
Petri nets 99 405—406
Peyravi, H. 197
Pfister, G.F. 194 198
photolithography 283
Pick, R. 44
Pin limitation problem 195
Pinsker, M. 162 198
pipe 133
Pipeline, segment 98
Pipeline, software 98 123
Pipelining 83
Pipelot, Pierre 50
Pippenger, N. 198
Pitt, D.A. 66 91
Plasma (reactive gas) etching 285
Podgurski, A. 389
poisson 419
Polynomial 133—134
Polynomial, zeros 134
Poppelbaum, W.J. 49 52 56 58 60 61 63 65 66 67 69 90 91
Possibility distribution 15
Potter, J.L. 86 92
Prabhu, G.M. 197
Pradhan, D.K. 198 320 331 334
Prakash, A. 443
Predicate 346
Predicate, interpretation 371—373
Predicates, purpose of 21
Premkumar, U.V. 159 198
Preparata, F.P. 132 152
Presson, P.E. 440
Prim, R.C. 113 115 148 152
Probabilistic number representation 54
Probabilistic number representation, asynchronous 54
Probabilistic number representation, synchronous 54
Probability theory 12—13
Probert, R. 388 391
probes 341—342
Probes, documentation 341—342
Probes, standard error 342
Problem purification 401—402
Process 238
Process control systems 271—276
Process, SQUARE 120
Process, TASK 117 121—122
Process, TRIANGLE 120
Processing elements (PEs) 96
Processor reduction 102
Program Evaluator and Test (PET) 342
Program, generators 413
Program, proving 421—422
Program, specification testing 383—384
Program, store (PS) 250—251
Programmable logic arrays (PLAs) 316
PROLOG 388
Propagating uncertainty through an imprecise implication, formula for 30
Prototype 408
Pruning search tree 141—142
Pulse code modulated format unary 62—63
Quality 414
Quality assurance 395
Quinlan, J.R. 15 44
Quinn, J.L. 278
Quinn, M.J. 123 124 152
Quinn, T.M. 257 277 278
Rabin, M.O. 127 152
Raghavendra, C.S. 166 184 187 189 198 199
Raghbati (Arjomandi), E. 105 152
Ramamoorthy, C.V. 241 279 342 390 394 396 403 404 413 414 418 420 423 424 429 430 434 442 443
Randell, B. 256 277 278
Randomization 104
rapid prototyping 408—409
Rapps, S. 356 390
Raster based 292—293
Raster based method 293
Reachability questions 349
Reachable code 346
Reasoning 2 5 9 11 41—42
Reasoning by default 35
Reasoning with uncertainty, imprecision 30—31
Reasoning, computer-based support of 9—17
Reasoning, example revisited 32—33
Reasoning, human, fuzziness and uncertainty 11—17 21—27 33
Reasoning, human, imprecision 10 11—17 19—21 24—25 33
Reasoning, human, learning 10
Reasoning, human, nonmonotonicity 10 33—37
| Reasoning, human, representation and manipulation method to aid 10—11
Reasoning, inexact 10
Reasoning, nondeductive techniques 36
Reasoning, search process 26
Reasoning, tree representation of 20
Reboh, R. 43
Recursive structure 102
Reddy, S.M. 199 315 322 334
Redundancy 183 299—300
Redundancy, dynamic 224
Redundancy, graph 187—188
Redundancy, protective 220—221
Redundancy, retrial 225
Redundancy, selective 223
Redundancy, software 220—220 221 224—225
Redundancy, static 224
Redundancy, techniques 220—226
Redundancy, techniques, dynamic 221 223—224 226
Redundancy, techniques, hardware 220 221—224
Redundancy, techniques, static 221—223 226
Redundancy, time 220 225—226
Redundancy, triplicated majority 222
Redundant predicate 373
Redwine, S.T. 386 391
Reed — Muller expansion 302
Reed, I.S. 332
Reed, J. 443
Reed, W.A. 277
Reghbati, H.K. 299 314 331 332 334
Region operation based 292—293
Reif, J.H. 112 152
Reiter, J.E. 13 44
Reiter, R. 36 44
Relational languages 17
Relaxation 98
Reliability with constant failure rates 205—206
Reliability, algorithm 424—426
Reliability, assessment 393—394
Reliability, estimation 203—211
Reliability, hardware 415
Reliability, requirements, aircraft control 213
Reliability, requirements, applications 212—213
Reliability, software 395 414—418
Reliability, telephone switching system 212—213
Reliability, validation 258—260
Reliability, validation, complementary 260
Reliability, validation, digital 259
Reliability, validation, physical 259
Reliability, validation, test generation 258
Rennels, D.A. 276 277 279
Repair rate (reciprocal of repair time) 207
Repair time, active 207
Repair time, passive 207
Requirements 399
Requirements, specification and design 393—394 399—410
Requirements, understanding 394
Requirements, untestable 424
Resource and activity management 393—395
Resources 426
Resources, hierarchy classification 429
Richardson, D.J. 347 348 383 384 385 386 387 388 389 391
Ring, D. 59 91
Roberts, B.R. 35 44
Roberts, J.A. 277
Roberts, R. 190 191 197 199
Robinson, C.M. 66 92
Robinson, J.A. 17 35 44
Rodeh, M. 152
Rohr, J.A. 277
Rohrbacher, D. 86 92
Rollback, program 224—226
Rolund, M.W. 277
Rosenberg, A.I. 152
Ross, D.T. 400 412 443
Roth, J.P. 303 334
Roussopoulos, N. 443
Rowland, B.R. 430 443
Royce, W.W. 394 396 443
RSL/REVS 408
Rubin, D.K. 277
Rudin, H. 443
Rudolph, L. 197
Rudolph, L.O. 332
Ruehli, A.E. 333
Rule models 40
Russel, R.M. 83 92
Ruzzo, W.L. 113 123 124 151
Ryan, L.D. 60 92
SADON 13
Safety analysis 401—402
Safir, A. 45
Sahay, P.N. 380 381 391
Sahni, S.K. 100 128 131 133 150 151 166 179 198 320 333
Saluja, K.K. 322 334
Sameh, A.H. 103 152
Sample 286
Samuel, A.L. 39 45
Sanchez, A. 17 44
Sangiovanni-Vincentelli, A.L. 333
Sarrazin, D.B. 276 279
Sarwate, D.V. 150
Savage, C. 108 111 113 114 152
Savir, J. 301 321 323 332 334
Sayward, F.G. 389 441
Schafer, R.E. 443
Schaller, H. 390
Scheduling 94
Schickard, Wilhelm 51
Schlichting, R.D. 405 443
Schneider, F.B. 405 442 443
Schnupp, P. 390
Schostak, R.E. 279
Schreider, P.R. 334
Schutz, H.A. 404 408 443
Scott, T.R. 334
Scratch protection 285
Search process, heuristic 26
Sedmak, R.M. 328 334
Selection/Resolution model (S/R) 404 405 406
Sellers, E.F. 302 303 334
Serlin, O. 269 270 276 279
Serra, A. 197
Sevcik, K.L. 244 279
Shannon, C.E. 52 92
Shapiro, E.Y. 15 45
Share memory (SM) model 96
Shaw, R.F. 69 92
Sheffer stroke organ 52
Shen, J.P. 199
Shibata, M. 333
Shift registers 67—69 80—81
Shift registers, raceless bidirectional 82
Shiloach, Y. 100 108 110 113 149 152
Shimono, T. 303 333
Shortcutting 101
Shortest-path problems 124—129
Shortest-path problems, all-pairs 124—126
Shortest-path problems, Dijkstra's algorithm 125
Shortest-path problems, Kucera's method for solving 125
Shortest-path problems, single-source 124—126
Shortliffe, E.H. 13 39 45
Shrira, L. 95 152
Siegel, H.J. 86 92 166 172 183 184 186 189 196 198 199
Siewiorek, D.P. 209 220 278 279
Simon's model 10
Simon, H.A. 2 3 40 44 45
Simon, J. 157
Simons, R.S. 148 153
Simulation 291 294—295
Simulation, process 286
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