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Авторизация |
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Поиск по указателям |
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Leonid V.Azaroff, Buerger M.L. — Powder Method in X-Ray Crystallography |
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Предметный указатель |
Hagelston, P.J. 45
Half-maximum intensity 256
Half-reduced cell 126 169
Halo, broad 265
Hanawalt catalogue 183
Hanawalt group 190
Hanawalt grouping 189
Hanawalt, J.D. 183 208
Harcourt, G.A. 183 208
Hard radiation 34
Harrington chart 69 79
Harrington chart for hexagonal crystals 74
Harrington chart for tetragonal crystals 70
Harrington, R.A. 67 69 72 78
Harris, G.T. 209
Henry, N.F.N. 91
Herman, C. 44 77
Hess, J.B. 245
Hesse — Lipson method 84 87 89
Hesse — Lipson notation 87 90
Hesse — Lipson procedure 83 122
Hesse, R. 80 85 90
Hexagonal axes 76
Hexagonal cell 72
Hexagonal close-packed array 262
Hexagonal close-packing 262
Hexagonal crystal 62 77 78 80 106 117
Hexagonal indexing 52
Hexagonal indices 49 50 83
Hexagonal lattice 226 231
Hexagonal system 49 50 52 53 56 60 72 82 161 223 225 227
Hexagonal unknown 72
Hicks, V. 209
High-order reflection 63 86
Highest accuracy attainable 217
Hodgman, C.D. 44
Hofer, L.J.E. 45
Hoffroge, C. 77
Holder, film 41
Holder, specimen 41
Hole, exit-port 28
Homes, G. 78
Homogeneous axes 160—162 164 165 170
Homogeneous axes in three dimensions 163
Homogeneous coefficients 166
Homogeneous coordinates 160
Hull — Davey chart 67 69
Hull — Davey chart for hexagonal crystals 71
Hull — Davey chart for rhombohedral crystals 75
Hull — Davey chart for tetragonal crystals 64
Hull — Davey method 65
Hull, A.W. 1 3 62 63 72 77 181
Hume-Rothery, W. 45
Iceland spar 261
Ideal crystal 261
Identification 2 11
Identification of substance 181
Identification of unknown 190
Ievins, A. 31 39 40 42 244 245
Illustration of use of Ito’s method 111
Imhoff, C.E. 209
Imperfect crystal 265
Imperfection in crystal 262
Impurity in tube target 251
Incidence, angle of 8
Incident beam 36
Inclination of track 253
Incoherent scattering 248 250
Incoherently scattered radiation 35
Increasing accuracy of d 220
INDEX 190 194
Index of refraction for x-rays 212
Index to x-ray powder-data file 190
Index volume 189 190 194
Index, ASTM 183
Indexing chart for isometric crystals 61
Indexing, graphical methods of 62
Indexing, hexagonal 52
Indexing, rhombohedral 53 76
Indices, assignment of, when crystal system is known 60
Indices, hexagonal 49 50 83
Indices, rhombohedral 49 50 77
Information, symmetry 56
Instrumental broadening 256
Integral peak 256
Intensity 11
Intensity measurement 184
Intensity scale 185
Intensity, background 213 248
Intensity, half-maximum 256
Intensity, relative 183 187
Intensity, x-ray 26
Interaxial angle 145
Internal calibration standard 187
Internal-standard procedure 233
Internal-standard technique 203
Interplanar spacing 8 10 46 92 93
Irregularity in final photograph 246
Isometric crystal 49 61 62 77 80 106 117 224 233 241 243
Isometric system 49 50 52 56 60 80
Isometric unit cells 11
Isometric unknown 61
Isomorphous compound 182
Isomorphous substitution 199
Isostructural series 182
Ito, Tei-Ichi 105 106 123 180
Ito’s method 106 109 118 145 160 177
Jacob, C.W. 78
Jay, A.H. 42 209 212 216—218 235 245
Jette, E.R. 245
Johnsen, A. 77 126 128 158
Karlik, B. 208
Kennard, E.H. 247
Kettmann extrapolation 235
Kettmann, G. 78 235 244
Keyway 20
Klug, H.P. 203 209
Knaggs, J.E. 208
Knife edge 42
Koenig, H. 45
Kovalev, G.A. 183 208
Lamp black 38 265
Laplace, P.S. 239
Large spacing 80 87
Lattice 4 5 10
Lattice array 6 7 9 11
Lattice extinction 81
Lattice, body-centered 81
Lattice, crystal 97
Lattice, direct 50 92
Lattice, face-centered 81
Lattice, graphical representation of 145
Lattice, hexagonal 226 231
Lattice, level of 132
Lattice, orthorhombic 156
Lattice, primitive 81 94
Lattice, reciprocal 49 56 92 94 97 99 109 132
Lattice, representation of 164
Lattice, rhombohedral 72 76
Lattice, space 4
Lattice, Symmetry of 142
Lattice, two-dimensional 125
Laue, M. von 1
Lauritsen, T. 247
Law, Bragg’s 8 9 92 99 107
Law, reciprocity 184
Lead chloride 206
Lead cup 26
Lead glass 28
Least-squares method 239 240 243 244
| Left-handed representation 129
Legendre, A.M. 239
Length, arc 58 59
Lens 29
Level of lattice 132
Levinson, D.W. 218
Library, film 181
LiI 191
Limit of accuracy 217
Limit, elastic 261 262
Limiting pinhole 26
Line breadth 255
Line broadening 256 257 265
Line displacement by double-coated film 214
Line doubling 251
Line splitting 251
Line width, x-ray 255
Line, additional observed 197
Line, back-reflection 26 224 225
Line, extra 197
Line, extraneous 198
Line, spotty 258
Line, spurious 38 198
Line, superposition of 197
Line, superstructure 265
Linear-absorption coefficient 36 37 201 234
Lipson, H. 80 85 91 217 218
Liquid 266
LiZn 191
Llewellyn, F.J. 44
Location, film 18
Lohrmann, O. 45
Long-chain compound 87
Long-spacing compound 87 89
Lonsdale, K. 44 45
Lorentz factor 250
Lorentz, H.A. 250
Lorentz-polarization factor 199 201 250
Love, W.E. 180
Low-order reflection 63
Lukesh, J.S. 45
Macro strain 261
Maladjustment of camera 252
Marcasite structure 84
Mass-absorption coefficient 36 37
Matching-absorption error 234
Matrices, transformation 144 145 148
Matrix representation of reduced cell 144 157
Matrix transformation 144 158
Matrix, Niggli 155
Matrix, rectangular 166
Matrix, scalar 144
Maxima, diffuse 250
McElroy, O. 209
Measurement of interplanar spacing 57
Measurement of reflections in back-reflection region 219
Measurement, intensity 184
Metal samples 37
Metal, cold working of 262
Method of finding reduced cell 131
Method of mixtures 256
Method, analytical 60
Method, back-reflection 43
Method, Carapella’s 224
Method, chemical 183
Method, Cohen’s 239
Method, Debye — Scherrer’s 1
Method, Delaunay’s 152
Method, flat-cassette 258
Method, front-reflection 42
Method, graphical 60 79 152 243 244
Method, Hesse — Lipson’s 84 87 89
Method, Ito’s 106 109 118 145 160 177
Method, Ito’s, illustration of use of 111
Method, Ito’s, practical aspects of 111
Method, least-squares 239 243 244
Method, null 185
Method, Straumanis’ 222
Method, transmission 42
Method, Vand’s 87 89
Method, visual 185
MICA 263
Micro strain 262 265
Microscope 29 231
Microscope, polarizing 56 183
Microscopic examination 56
Mikheev, V.I. 183 208
Mineral name 187
Minimizing errors by internal standard 233
Misalignment of track 253
Mixtures, method of 256
Money penny, H.K. 209
Monochromatic x-ray beam 34
Monochromator, crystal 213
Monoclinic ambiguity 179
Monoclinic crystal 56 89 93 106
Monoclinic crystal system 50
Monoclinic system 49 53 60 89 90 92
Monoxide, cobalt 197
Monoxide, nickel 197 198
Montmorillonite 265
Motif 4 5 10 11
Motion, centering 29
Motion, thermal 250
Motor 29
Mount, powder 38 41
Mounting, camera 19
Mounting, x-ray tube 20 21
Multiple-film technique 187
Multiplicity of nonprimitive cell 111
Multiplicity of reflecting plane 201
Name, mineral 187
Needle-like crystals of PbO 259
Needle-shaped particle 258 260
Nelson extrapolation 238
Nelson, J.B. 238 239 245
Net, densest 127
Net, shortest translation of 125
Neutral wedge 185
Nickel 257
Nickel catalyst 257
Nickel monoxide 197—198
Nies, N.P. 77
Niggli matrix 155
Niggli matrix representation of reduced cell 146
Niggli, P. 128 144 159
Noncoplanar vectors 108
Nonisometric crystal 242
Nonorthogonal crystal 49
Nonprimitive cell 111
Nonprimitive reciprocal cell 111
Nonuniform background 213
Nonuniformity of background 246
Normal equation 242 243
Normal representation 131
Notation, Hesse — Lipson 87 90
Nowacki, W. 208
Null method 185
Observation, error of 210
Olbricht, K.H. 45
Operating, procedures for 32
Operation centering 29
Optical data 187
Optical procedure 183
Optical spectroscopy 183
Orientation 2
Orientation of reciprocal lattice 100
Orientation, deformation 259 260
Orientation, preferred 258—260
Orientation, shape 258 259
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