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Meeker W.Q., Escobar L. — Statistical Methods for Reliability Data
Meeker W.Q., Escobar L. — Statistical Methods for Reliability Data



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Название: Statistical Methods for Reliability Data

Авторы: Meeker W.Q., Escobar L.

Аннотация:

Explains computer-based statistical methods for reliability data analysis and test planning for industrial products. Demonstrates how to apply the latest graphical, numerical, and simulation-based methods to a broad range of models found in reliability data analysis, and covers areas such as analyzing degradation data, simulation methods used to complement large-sample asymptotic theory, and data analysis computed with the S-PLUS system. Includes chapter exercises using real data sets. For professionals in product reliability and design, and for graduate students in courses in applied reliability data analysis.


Язык: en

Рубрика: Математика/Вероятность/Статистика и приложения/

Статус предметного указателя: Готов указатель с номерами страниц

ed2k: ed2k stats

Год издания: 1998

Количество страниц: 712

Добавлена в каталог: 05.06.2005

Операции: Положить на полку | Скопировать ссылку для форума | Скопировать ID
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Предметный указатель
Prediction intervals, exponential Type II censored data      300
Prediction intervals, information needed for      291
Prediction intervals, likelihood based      312
Prediction intervals, motivation      290
Prediction intervals, multiple samples      304
Prediction intervals, naive intervals      293
Prediction intervals, new sample      290
Prediction intervals, number of recurrences (NHPP)      416
Prediction intervals, one-sided      290
Prediction intervals, pivotal method      296
Prediction intervals, probability prediction      292
Prediction intervals, simple cases      298
Prediction intervals, statistical prediction      293
Prediction intervals, two-sided      290
Prediction intervals, Type I censoring      297
Prediction intervals, Type II censoring      296
Prediction intervals, within sample      290
Prentice, R.L.      42 100 118 284 460
Prior      see “Bayesian methods”
Probabilistic design      604
Probability paper      see “Probability plots”
Probability plots, applications      141
Probability plots, bend or curvature      141 144 385 585
Probability plots, compare distributions      132
Probability plots, complete data      149
Probability plots, display planning values      232
Probability plots, estimates, graphical      126 144
Probability plots, exponential      124
Probability plots, gamma      137
Probability plots, generalized gamma      138
Probability plots, given shape parameter      136 274
Probability plots, given threshold parameter      274
Probability plots, goodness of fit, graphical      127
Probability plots, grid lines      144
Probability plots, lineanzing a cdf      123—127 137—139
Probability plots, location-scale-based distributions      123
Probability plots, lognormal      125
Probability plots, non log-location-scale distributions      136—141
Probability plots, normal      125
Probability plots, plotting positions      128—129
Probability plots, plotting positions, censored data      132 135
Probability plots, reading parameter values from      126
Probability plots, simulation to assess variability      141 149
Probability plots, simultaneous confidence bands      127
Probability plots, summary of plot scales      142
Probability plots, three-parameter Weibull      137 274
Probability plots, unknown shape parameter      136
Probability plots, Weibull      127
product comparison      450 (see also “Comparison”)
Product comparison, combined analysis      454
Product comparison, separate analysis      452
Product design processes      602
Product limit estimator      see “Nonparametric estimation”
Profile likelihood      see “Likelihood”
Propagation of error      see “Delta method”
Proportional hazards model      see “PH”
Proschan, F      118 374 389 585
Pseudo failure times      337 574
Pseudorandom samples of order statistics      93
Pseudorandom samples, continuous distribution      91
Pseudorandom samples, discrete distribution      93
Pseudorandom samples, efficient generation      91
Pseudorandom samples, exponential      71
Pseudorandom samples, failure-censored      92
Pseudorandom samples, generation      93
Pseudorandom samples, NHPP      417
Pseudorandom samples, time-censored      92
Pseudorandom samples, uniform      91
Q-Q plots      445
Quantile      31 77
Quinlan, J.      605
Quon, T.K.      489
Random sample generation      see “Pseudorandom samples”
Rao, C.R.      42 168 622
Rausand, M.      388 389 420
Recurrence      see “MCF”
Recurrence, comparison of two samples      404
Recurrence, data      394 400 402 421 631
Recurrence, nonparametric model      395
Recurrence, parametric models      406—408
Recurrence, rate      395
Recurrence, trend tests, Laplace      409
Recurrence, trend tests, Lewis — Robinson      409
Recurrence, trend tests, MIL-HDBK      189 409
Redundancy      602
Regression      see “ADT” “ALT”
Regression, checking assumptions      443—447
Regression, confidence intervals      436
Regression, Cox — Snell residuals      443
Regression, diagnostics      445
Regression, empirical models      442
Regression, examples      13—15 428—429
Regression, indicator-variables      450
Regression, likelihood      433
Regression, models, failure-time      429—435 447—450 469
Regression, multiple      447
Regression, nonconstant spread      439
Regression, product comparison      450
Regression, quadratic      439
Regression, residual analysis      443 460 501—502
Regression, simple linear      432
Regression, standard errors      436
Regularity conditions      621—623
Reinman, G L.      144 193 310 633 634
Relative likelihood      158 175 profile”)
Reliability      2 28
Reliability data, sources of      22
Reliability practice, modern approach      604
Reliability practice, useful tools      604
Reliability, assurance      602
Reliability, data, components      19
Reliability, data, distinguishing features      3
Reliability, data, examples      4
Reliability, data, nonrepairable units      19
Reliability, data, reasons for collecting      2
Reliability, data, sources      380
Reliability, data, synonyms      3
Reliability, environmental effects      17
Reliability, function      28
Reliability, growth      420
Reliability, improvement      388 601 602—606
Reliability, quality, relationship to      2
Reliability, quantities of interest      76
Reliability, study planning      20 231
Reliability, test      see “ALT”
Reliability, test, audit      606
Reliability, test, demonstration      247
Reliability, test, prototype      467 519
Reliability, test, qualification      467
Reliability, test, screening      467 519
Renewal processes      408
Repairability      370
Repairable system      19 (see also “Recurrence”)
Repairable system, data      20 394
Repairable system, models and analysis      420
Residual analysis      see “Regression residual
Ripley, B.D.      93
Risk set      53
Robinson, J.A.      192 228 380 420 606
Robust-design      605
Ross, G.J.S.      442
Rosso, F.      479 639
Rubin, D.B.      284 363
S AFT      430—431 476—479
S-N curves      595
Safety factors, engineering      602
Sample size, effect on, inferences      234
Sample size, effect on, interval size      158
Sample size, effect on, likelihood shape      158
Sample size, needed to estimate, $\sigma$      241
Sample size, needed to estimate, functions, positive      239
Sample size, needed to estimate, functions, unrestricted      238
Sample size, needed to estimate, hazard      245—247 251
Sample size, needed to estimate, log-location-scale parameters      241
Sample size, needed to estimate, mean      238—239
Sample size, needed to estimate, quantile      242 244 251
Sample size, needed to estimate, shape parameter      241
Sampling distribution      49
Sampling error      49
Saperstein, B.      383 606
Saunders, S.C.      105
Saxena, A.      15
Schafer, R.E.      473 529
Schinner, C.      520
Schmee, J.      197 312 460
Schneider, H.      284
Schroedinger, E.      104
Schwarz, H.A.      473
screening      270 467 519 520—521
Seber, G.A.F.      460
Sensitivity analysis      445 489 604
Serial correlation, test for      411
Series system structure, cdf      371 385
Series system structure, component dependency      371
Series system structure, hazard function      371
Series system structure, reliability      371
Series system structure, Weibull components      372
Series-parallel system structure, component-level redundancy      377
Series-parallel system structure, system-level redundancy      377
Severini, T.A.      364
Shao, J.      228
Shapiro, S.S.      130 149 619
Shimizu, K.      93
Shiomi, H.      471 631
Shooman, M.L.      420
Signal-to-noise ratio      78
Significance level      161
Simultaneous confidence bands for F(t)      60 67 127 197
Simultaneous confidence bands for F(t), goodness of fit, relation to      127 149
Simultaneous confidence bands for F(t), logit transformation based      67
Singpurwalla, N.D.      363 473 512 529 641
Skewed distribution      111
Skewed distribution, ML filling      283
Smallest extreme value (SEV) distribution      83—84
Smith, A, F.M.      118 284 363 364 586
Smith, J.S.      488
Smith, R.L.      284 364 420 623
Snell, E.J.      443
Snyder, D.L.      420
Snyder, M M.      71
Sobel, M.      168
Software reliability      419
Software to use with this book, xviii      3
Software, package capabilities      22
Spread and skewness, parameter comparison      110
Sprott, D A.      169
Sridhar, N.      489
Staggered entry      8 35 193 310
Standard deviation      77
Standardized, log censoring time      240
Standardized, log estimation time      245
Starke, E.A.      489
Stationary increments      407
Stern, H.S.      284 363
Stress corrosion      7
STRIFE      519
Stuart A.      619
Sudden death tests      250
Sun, F.      521
Sundararajan, C.      389
Superimposed renewal processes      408
Survival function      28
Suzuki, K.      340 471 606
Svoboda, K.      477
Sweeting, T.J.      420
System reliability      369 389
System reliability, component dependency      386
System reliability, component importance      388
System reliability, confidence intervals      381
System reliability, estimation from component data      380—386
System reliability, Markov models      388
System reliability, state-space models      388
System reliability, systems with repair      386
System repair data      see “Recurrence data”
System, basic concepts      370
System, cdf      370
System, structure, bridge-system      378
System, structure, k-out-of-s      379
System, structure, other      386
System, structure, parallel system      374—376
System, structure, series system      370—374
System, structure, series-parallel      376—378
Target population      15
Target process      15
Taylor series      see “Delta method”
Temperature acceleration      see “Acceleration Arrhenius”
Temperature acceleration, differential factor (TDK)      472
test planning      17 (see also “ADT planning” “ALT
Test planning, approximate properties      236—238
Test planning, demonstrate conformance      247
Test planning, failure (Type II) censoring      250
Test planning, non log-location-scale distributions      251
Test planning, planning values      232 535 548
Test planning, planning values, sources for      236
Test planning, planning values, uncertainty in      236
Test planning, simulation for      233
Thatcher, A.R.      312
Thiagarajah, K.      4I0 420
Thomas, D.R.      68
Thomas, R.      489
Thompson, V.C.      149
Thompson, W.A.      80 420
Three parameter distributions      see “Threshold distributions”
Threshold distributions      111 118 273
Threshold distributions, correct likelihood      275
Threshold distributions, density approximation inadequacy for ML titling      284
Threshold distributions, embedded models      112—113 277 284
Threshold distributions, ML fitting      276 284
Threshold distributions, probability plotting      284
Tiao, G.C.      363
Tibshirani, R J.      226 227 228 312 3 32 333 568
Time acceleration      see “Acceleration”
Time scales      18 22 523
Time transformations      460 (see also “Acceleration”)
Time transformations, general      459
Time transformations, PH      456
Time transformations, SAFT      430
Titterington, D.M.      118 284
Tobias, P.A.      340 488 578
Tomsky, J.      339
Tortorella, M.      22 578
Total time on test      166 240
Trend tests      409
Trindade, D.C.      284 340 488 578
Trostle, T.      519
Truncated data      41 68 266 284
Truncated data, distributions      266
Truncated data, examples      266 270
Truncated data, Fisher information matrix      284
Truncated data, left      266
Truncated data, likelihood      268 271
Truncated data, ML fitting      269
Truncated data, nonparametric estimation      268 270 284
Truncated data, right      270
Tseng, S.T.      340 578
Tu, D.      228
Turnbull, B.W.      68 268 284
Tustin, W.      521
Tweedie, M.C.K.      104
Two-sample comparison      see “Comparison two
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