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Meeker W.Q., Escobar L. — Statistical Methods for Reliability Data |
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Предметный указатель |
Prediction intervals, exponential Type II censored data 300
Prediction intervals, information needed for 291
Prediction intervals, likelihood based 312
Prediction intervals, motivation 290
Prediction intervals, multiple samples 304
Prediction intervals, naive intervals 293
Prediction intervals, new sample 290
Prediction intervals, number of recurrences (NHPP) 416
Prediction intervals, one-sided 290
Prediction intervals, pivotal method 296
Prediction intervals, probability prediction 292
Prediction intervals, simple cases 298
Prediction intervals, statistical prediction 293
Prediction intervals, two-sided 290
Prediction intervals, Type I censoring 297
Prediction intervals, Type II censoring 296
Prediction intervals, within sample 290
Prentice, R.L. 42 100 118 284 460
Prior see “Bayesian methods”
Probabilistic design 604
Probability paper see “Probability plots”
Probability plots, applications 141
Probability plots, bend or curvature 141 144 385 585
Probability plots, compare distributions 132
Probability plots, complete data 149
Probability plots, display planning values 232
Probability plots, estimates, graphical 126 144
Probability plots, exponential 124
Probability plots, gamma 137
Probability plots, generalized gamma 138
Probability plots, given shape parameter 136 274
Probability plots, given threshold parameter 274
Probability plots, goodness of fit, graphical 127
Probability plots, grid lines 144
Probability plots, lineanzing a cdf 123—127 137—139
Probability plots, location-scale-based distributions 123
Probability plots, lognormal 125
Probability plots, non log-location-scale distributions 136—141
Probability plots, normal 125
Probability plots, plotting positions 128—129
Probability plots, plotting positions, censored data 132 135
Probability plots, reading parameter values from 126
Probability plots, simulation to assess variability 141 149
Probability plots, simultaneous confidence bands 127
Probability plots, summary of plot scales 142
Probability plots, three-parameter Weibull 137 274
Probability plots, unknown shape parameter 136
Probability plots, Weibull 127
product comparison 450 (see also “Comparison”)
Product comparison, combined analysis 454
Product comparison, separate analysis 452
Product design processes 602
Product limit estimator see “Nonparametric estimation”
Profile likelihood see “Likelihood”
Propagation of error see “Delta method”
Proportional hazards model see “PH”
Proschan, F 118 374 389 585
Pseudo failure times 337 574
Pseudorandom samples of order statistics 93
Pseudorandom samples, continuous distribution 91
Pseudorandom samples, discrete distribution 93
Pseudorandom samples, efficient generation 91
Pseudorandom samples, exponential 71
Pseudorandom samples, failure-censored 92
Pseudorandom samples, generation 93
Pseudorandom samples, NHPP 417
Pseudorandom samples, time-censored 92
Pseudorandom samples, uniform 91
Q-Q plots 445
Quantile 31 77
Quinlan, J. 605
Quon, T.K. 489
Random sample generation see “Pseudorandom samples”
Rao, C.R. 42 168 622
Rausand, M. 388 389 420
Recurrence see “MCF”
Recurrence, comparison of two samples 404
Recurrence, data 394 400 402 421 631
Recurrence, nonparametric model 395
Recurrence, parametric models 406—408
Recurrence, rate 395
Recurrence, trend tests, Laplace 409
Recurrence, trend tests, Lewis — Robinson 409
Recurrence, trend tests, MIL-HDBK 189 409
Redundancy 602
Regression see “ADT” “ALT”
Regression, checking assumptions 443—447
Regression, confidence intervals 436
Regression, Cox — Snell residuals 443
Regression, diagnostics 445
Regression, empirical models 442
Regression, examples 13—15 428—429
Regression, indicator-variables 450
Regression, likelihood 433
Regression, models, failure-time 429—435 447—450 469
Regression, multiple 447
Regression, nonconstant spread 439
Regression, product comparison 450
Regression, quadratic 439
Regression, residual analysis 443 460 501—502
Regression, simple linear 432
Regression, standard errors 436
Regularity conditions 621—623
Reinman, G L. 144 193 310 633 634
Relative likelihood 158 175 profile”)
Reliability 2 28
Reliability data, sources of 22
Reliability practice, modern approach 604
Reliability practice, useful tools 604
Reliability, assurance 602
Reliability, data, components 19
Reliability, data, distinguishing features 3
Reliability, data, examples 4
Reliability, data, nonrepairable units 19
Reliability, data, reasons for collecting 2
Reliability, data, sources 380
Reliability, data, synonyms 3
Reliability, environmental effects 17
Reliability, function 28
Reliability, growth 420
Reliability, improvement 388 601 602—606
Reliability, quality, relationship to 2
Reliability, quantities of interest 76
Reliability, study planning 20 231
Reliability, test see “ALT”
Reliability, test, audit 606
Reliability, test, demonstration 247
Reliability, test, prototype 467 519
Reliability, test, qualification 467
Reliability, test, screening 467 519
Renewal processes 408
Repairability 370
Repairable system 19 (see also “Recurrence”)
Repairable system, data 20 394
Repairable system, models and analysis 420
Residual analysis see “Regression residual
Ripley, B.D. 93
Risk set 53
Robinson, J.A. 192 228 380 420 606
Robust-design 605
Ross, G.J.S. 442
Rosso, F. 479 639
Rubin, D.B. 284 363
S AFT 430—431 476—479
S-N curves 595
Safety factors, engineering 602
Sample size, effect on, inferences 234
Sample size, effect on, interval size 158
Sample size, effect on, likelihood shape 158
Sample size, needed to estimate, 241
| Sample size, needed to estimate, functions, positive 239
Sample size, needed to estimate, functions, unrestricted 238
Sample size, needed to estimate, hazard 245—247 251
Sample size, needed to estimate, log-location-scale parameters 241
Sample size, needed to estimate, mean 238—239
Sample size, needed to estimate, quantile 242 244 251
Sample size, needed to estimate, shape parameter 241
Sampling distribution 49
Sampling error 49
Saperstein, B. 383 606
Saunders, S.C. 105
Saxena, A. 15
Schafer, R.E. 473 529
Schinner, C. 520
Schmee, J. 197 312 460
Schneider, H. 284
Schroedinger, E. 104
Schwarz, H.A. 473
screening 270 467 519 520—521
Seber, G.A.F. 460
Sensitivity analysis 445 489 604
Serial correlation, test for 411
Series system structure, cdf 371 385
Series system structure, component dependency 371
Series system structure, hazard function 371
Series system structure, reliability 371
Series system structure, Weibull components 372
Series-parallel system structure, component-level redundancy 377
Series-parallel system structure, system-level redundancy 377
Severini, T.A. 364
Shao, J. 228
Shapiro, S.S. 130 149 619
Shimizu, K. 93
Shiomi, H. 471 631
Shooman, M.L. 420
Signal-to-noise ratio 78
Significance level 161
Simultaneous confidence bands for F(t) 60 67 127 197
Simultaneous confidence bands for F(t), goodness of fit, relation to 127 149
Simultaneous confidence bands for F(t), logit transformation based 67
Singpurwalla, N.D. 363 473 512 529 641
Skewed distribution 111
Skewed distribution, ML filling 283
Smallest extreme value (SEV) distribution 83—84
Smith, A, F.M. 118 284 363 364 586
Smith, J.S. 488
Smith, R.L. 284 364 420 623
Snell, E.J. 443
Snyder, D.L. 420
Snyder, M M. 71
Sobel, M. 168
Software reliability 419
Software to use with this book, xviii 3
Software, package capabilities 22
Spread and skewness, parameter comparison 110
Sprott, D A. 169
Sridhar, N. 489
Staggered entry 8 35 193 310
Standard deviation 77
Standardized, log censoring time 240
Standardized, log estimation time 245
Starke, E.A. 489
Stationary increments 407
Stern, H.S. 284 363
Stress corrosion 7
STRIFE 519
Stuart A. 619
Sudden death tests 250
Sun, F. 521
Sundararajan, C. 389
Superimposed renewal processes 408
Survival function 28
Suzuki, K. 340 471 606
Svoboda, K. 477
Sweeting, T.J. 420
System reliability 369 389
System reliability, component dependency 386
System reliability, component importance 388
System reliability, confidence intervals 381
System reliability, estimation from component data 380—386
System reliability, Markov models 388
System reliability, state-space models 388
System reliability, systems with repair 386
System repair data see “Recurrence data”
System, basic concepts 370
System, cdf 370
System, structure, bridge-system 378
System, structure, k-out-of-s 379
System, structure, other 386
System, structure, parallel system 374—376
System, structure, series system 370—374
System, structure, series-parallel 376—378
Target population 15
Target process 15
Taylor series see “Delta method”
Temperature acceleration see “Acceleration Arrhenius”
Temperature acceleration, differential factor (TDK) 472
test planning 17 (see also “ADT planning” “ALT
Test planning, approximate properties 236—238
Test planning, demonstrate conformance 247
Test planning, failure (Type II) censoring 250
Test planning, non log-location-scale distributions 251
Test planning, planning values 232 535 548
Test planning, planning values, sources for 236
Test planning, planning values, uncertainty in 236
Test planning, simulation for 233
Thatcher, A.R. 312
Thiagarajah, K. 4I0 420
Thomas, D.R. 68
Thomas, R. 489
Thompson, V.C. 149
Thompson, W.A. 80 420
Three parameter distributions see “Threshold distributions”
Threshold distributions 111 118 273
Threshold distributions, correct likelihood 275
Threshold distributions, density approximation inadequacy for ML titling 284
Threshold distributions, embedded models 112—113 277 284
Threshold distributions, ML fitting 276 284
Threshold distributions, probability plotting 284
Tiao, G.C. 363
Tibshirani, R J. 226 227 228 312 3 32 333 568
Time acceleration see “Acceleration”
Time scales 18 22 523
Time transformations 460 (see also “Acceleration”)
Time transformations, general 459
Time transformations, PH 456
Time transformations, SAFT 430
Titterington, D.M. 118 284
Tobias, P.A. 340 488 578
Tomsky, J. 339
Tortorella, M. 22 578
Total time on test 166 240
Trend tests 409
Trindade, D.C. 284 340 488 578
Trostle, T. 519
Truncated data 41 68 266 284
Truncated data, distributions 266
Truncated data, examples 266 270
Truncated data, Fisher information matrix 284
Truncated data, left 266
Truncated data, likelihood 268 271
Truncated data, ML fitting 269
Truncated data, nonparametric estimation 268 270 284
Truncated data, right 270
Tseng, S.T. 340 578
Tu, D. 228
Turnbull, B.W. 68 268 284
Tustin, W. 521
Tweedie, M.C.K. 104
Two-sample comparison see “Comparison two
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