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Park R., Lagally M. — Methods of Experimental Physics.Volume 22.Solid State Physics:Surfaces.
Park R., Lagally M. — Methods of Experimental Physics.Volume 22.Solid State Physics:Surfaces.



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Название: Methods of Experimental Physics.Volume 22.Solid State Physics:Surfaces.

Авторы: Park R., Lagally M.

Аннотация:

The importance of the properties of surfaces is increasingly felt in a wide variety of technologies. Although some surface properties, such as chemical interactions leading to corrosion, have been recognized for many hundreds of years, the use of surfaces for specific applications is a recent phenomenon that is fueled by our increasing understanding of their properties. The technological success of devices and processes involving surfaces has in turn driven the development of increasingly sophisticated instrumentation designed to improve further our understanding of surface properties. This volume attempts to review, in a tutorial fashion, techniques that allow a definition of the major static properties of a surface. These can be classified as chemical or compositional, structural, and electronic. Because this volume is one in a treatise on experimental methods, the emphasis is deliberately on the techniques, their use, and the evaluation of measurements, rather than principally on the surface properties themselves.


Язык: en

Рубрика: Физика/

Статус предметного указателя: Готов указатель с номерами страниц

ed2k: ed2k stats

Год издания: 1985

Количество страниц: 565

Добавлена в каталог: 20.08.2014

Операции: Положить на полку | Скопировать ссылку для форума | Скопировать ID
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Предметный указатель
Schwinger, J.      141 142(20) 143(20)
Schwoebel, R.L.      238
screening      229 231
Seabury, C.      501
Seah, M.R      198 505
Sears, G.N.      495
Second-order desorption kinetics      425 457 460
Second-order light      481
secondary      see "Secondary electron"
Secondary electron      131 148 150 153 174 176 178 179
Secondary Mahan cone      163 164
Secondary neutral mass spectrometry      329
Secondary-electron emission      193 202 331
Secondary-electron multiplier      320
Secondary-electron yield      210
Secondary-emission spectrum      227
Secondary-ion mass spectroscopy      339 403
Secondary-ion mass spectroscopy, static      339
Seidman, D.N.      410
Selective ionization      410
Seliger, R.D.      403
Semancik, S.      254
Sensitivity      258 286
Sexton, B.A.      34 35(80) 36(79) 47(79) 122(79 80 260 263 265) 123 501
Seya — Namioka monochromator      144
Shadow cone      310
Shadow technique      418
Shadowing coefficient      304
Shapira, Y.      465(5) 466 498(5) 499(5)
Sharma, S.P.      308
Shaw, C.G.      285
Shek, M.-L.      500 504
Shelef, M.      326
Sheline, R.K.      64
Shelton method      13 14
Shelton method, application      14
Shelton method, retarding-potential      13
Shelton method, thermionic emission      13
Shelton, H.      11
Shepherd, F.R.      285
Sheppard, N.      81
Shibata, S.      400
Shigeishi, R.A.      59 65(123) 88(123) 124
Shih, A.      21
Shimizu, R.      197
Shimp, L.A.      112
Shirai, E.      400
Shirley, D.A.      189 229 507 509
Shockley, W.      353 354(22)
Shot noise      259
Shulga, V.I.      307
Shurwell, H.F.      112
Si      see "Silicon"
Sichtermann, W.K.      343
Siegbahn, K.      189 216 219
Siegbahn, M.      189
Siegel, B.M.      401
Siekhaus, W.J.      290
Sigmund, P.      329 332(87) 333(87) 348
Signal gating      313
Signal-to-noise ratio      285 292
Signal-to-shot-noise ratio      259
Silicon      154 157 175 181 182
Silicon, Si(111)      154 157 169 182
Silicon, Si(111) $(2 \times 1)$ surface      153 175
Silicon, Si(111) $(7 \times 7)$ surface      153 155
Silicon, Si(111)-A1      155
Silicon, Si(111)-C1      157 158 169 181
Simms, D.L.      329 336(79) 337(79)
Simonson, M.G.      26
Simpson, J.A.      35 38(84) 139
Sims, M.L.      26 82(22)
Single molecule      370
Smith, A.K.      110
Smith, B.E.      110 112
Smith, D.P.      299 302 305(18) 316 317 324
Smith, G.D.W.      410 415
Smith, N.V.      135 138 139 166 167(40) 168(40) 169(41) 476 482(54b)
Smith, R.J.      161
Smith, S.T.      368
Snoek, C.      307
Soft x-ray appearance-potential spectroscopy      202 207
Sokcevic, D.      47 49(107) 50
Sokoloff, D.R.      368
Solid-state detector      210
Soma, M.      62 63(137) 64(137)
Somoijai, G.A.      122(284) 123 239 285 443 509
Southern, A.L.      331
Sovitsky, A.      78 380 390 410(293) 412 415
Space charge buildup      6
Spangenberg, K.R.      41 259
Sparnaay, M.J.      324 325(64)
Spatial ionization      383
spatial resolution      287
Spectrometers, angle-resolved      140
Spectrometers, Kuyatt — Simpson electron      35 40
Spectrometers, magnetic      219
Speer, D.A.      372
Spherical electrostatic analyzer      317
Spherical-capacitor analyzer      223
Spherical-grid retarding potential analyzer      219 227
Spherical-sector analyzer      139
Spicer, W.E.      129 130(4) 149
Spin-orbit splitting      216
Spindt, C.A.      207 401
Spiro, T.G.      114
Sproull, W.T.      238
Sputter cleaning      487
Sputter etching      290
sputtering      321 328 366
Sputtering, rate      367
Sputtering, yield      321 330 334 367
Srivastana, S.K.      53
St. John, G.A.      400
Staib, P.      199 213
Stair, P.G      238 285
Static capacitor      19
Statistical thermodynamics of desorption      457
Staudenmaier, G.      331 338
Stayer, R.W.      15 367
Stefan — Boltzmann law      76
Steiger, W.      338
Steinwedel, H.      340
Steit, K.M.      33
Stenzel, W.      84 85(183) 91(183)
Step height      251
Stephan, C.H.      390
Stern, E.A.      197 232
Stern, R.C.      444 495
Stern, T.E.      350
Sticking probability      324
Sticking-coefficient determination      442
Stillwagon, L.E.      511
Stimpson, B.P.      474 475(49)
Stobie, R.W.      79 80(169)
Stockbauer, R.      467 468 469(22) 471 472(34) 477 481 493(21) 494(21)
Stoehr, J.      235 480
Stoffel, N.G.      138 139(12) 153 154(28) 155 159 175 496
Stolt, K.      393
Storage ring      141 142
Stozier, J.A., Jr.      239
Strangler, F.      372 374
Strausser, Y.E.      509
Streak length in RHEED      276
Strehlow, W.H.      324
Streit, K.M.      88
String model      309 310
Strobel, H.A.      79
Subgrain structure      248
Sugata, E.      367
Sunjic, M.      47 382
Superlattice      253 254
Surface adsorbates      356
Surface analysis      313
Surface barrier      162 171
Surface binding states      428
Surface chemical shift      224
Surface cleaning      324 354
Surface composition      231 333
Surface coverage      363
Surface crystallography measurements      267
Surface defects      245
Surface diffusion      363 392 393 395
Surface diffusion, activation energy      395
Surface ionization detectors      497
Surface plasmons      196 382
Surface potential      2
Surface potential, correlation energy      2
Surface potential, dipole layer      2
Surface potential, ion-core potential      2
Surface roughness      367
Surface segregation      324
Surface self-diffusion      367
Surface sensitivity      131 152
Surface state      152 153
Surface state, studies in electron distribution curve mode      152
Surface steps      248
Surface structure      328 333
Surface-barrier detector      210
Surface-extended x-ray-absorption fine structure      232 233 234 235 236
Surface-state quenching      152
Suzuki, M.      400
Swanson, L.W.      15(18) 20 26 358 361 362 367 397 402
Synchronous detector      285
Synchrotron radiation      127 128 141 144 147 171 183 184 217 225 480 491
Synchrotron radiation, source      156 171
Szoke, A.      368
Szymonski, M.      332
Taglauer, E.      207 299 301 302 303 304 305 306(17) 307(17) 308 309 310 311(35) 313(9) 314 316(12 51) 319(51) 320 322 324(62) 325(63) 326 328(35) 329 333 336 337(84) 340(100) 342(100) 343(100) 348
Takeda, K.      367
Takezawa, N.      107
Tamm, P.W.      432 433 434 446
Tamura, H.      338
Taylor cone      403
Taylor, G.I.      403
Taylor, J.B.      427
Taylor, J.L.      44 434 449 450 451
Taylor, T.N.      313
Teller, W.      394
Temperature-programmed desorption      428 431 446
Temperature-programmed desorption from single crystal      432
Terada, K.      196
Terada, M.      112
Terrace, distribution of sizes      252
Terrace, reciprocal-lattice rod      252
Terrace, structure factor      250
Terzic, I.      299 313(7 8)
Thermal accommodation      383
Thermal activation      354 406
Thermal desorption      354 430 464 499 503
Thermal desorption from polycrystalline substrates      427
Thermal desorption from polycrystalline substrates, surface binding states      428 429
Thermal desorption from single crystal      431
Thermal desorption from single crystal, preparation and mounting of single crystal      432
Thermal desorption, apparatus      436
Thermal desorption, data treatment      447
Thermal desorption, detector      444
Thermal desorption, surface binding state      428
Thermal desorption, theory      454
Thermal spikes      330
Thermal vibrations      247
Thermal-desorption spectroscopy      508
Thermal-diffuse scattering      274
Thermionic emission      5 20 21 205
Thermionic emission, current density of electrons      5
Thermionic method      6
Thiel, P.A.      34 36(83) 46 67 70 71 72(146) 73(146) 74 84 117(146) 122(145 146 182 266) 123 443 457
Thomas — Fermi potential      311
Thomas, E.W.      336 337(101)
Thomas, G.E.      28 31 34(57) 39 43 44 47(61 62) 48 52 62(62) 63 64(62) 67 68 114 115 116 122 329 511
Thomas, R.E.      1 19(1) 20 21
Thompkins, F.C.      1 3(6)
Thompson, L.F.      511
Thompson, L.W.      107
Three-dimensional band structure mapping      169
Three-step model      127 129 130
Threshold energies for sputtering      367
Threshold measurement      479
Thum, F.      331
Thurstans, R.E.      395
Tice, D.R.      392
Time digitizer      479
Time structure      143
Time-of-flight      328 404
Time-of-flight atom-probe      404
Time-of-flight mass spectrometer      404 444
Time-of-flight mass spectrometry      480
Time-of-flight spectrum      478
Time-of-flight, method      494
Time-of-flight, system      319
Time-of-flight, technique      476 491 495
Time-to-amplitude converter      477 478
Tip apex      355
Tip profile      356
Todd, C.J.      10
Tokutaka, H.      509
Tolk, N.H.      305 306(17) 307(17) 310(17) 329 336(79) 337 467 496
Tominaga, h.      105
Tommet, T.N.      285
Tompkins, F.C.      19
Tompkins, H.G.      26
Tompsett, M.F.      288
Tong, S.Y.      25 238 239(17) 254(17) 271(17) 291(17)
Tongson, L.L.      316
Topping, J.      4
Toroidal prism      493
Toroidal-grating monochomator      144
Torrens I.M.      311
Total yield spectrum      211
Toth, R.A.      56
Toyuki, H.      68
Tracy, J.C.      84 136 238 254(21) 255(21) 293(21) 317 443
Trajmar, S.      53
Transition density      201
Transition probabilities      146
Traum, M.M.      135 138 139(14) 166 467 476 488 496 482(54b) 494
Treichler, R.      471 496
Trolin, J.K.      350 367
True secondary electrons      194
Tsang, T.      230
Tsaur, B.Y.      410
Tsong, T.T.      376 379 381 383 384(126) 385(126) 388(126) 392 393 395 397 406 407 410 412(126)
Tuck, R.A.      21
Tucker, C.W., Jr.      238 271(14)
Tully, J.C.      305 306(17) 307(17) 310(17) 314(21) 467 468 470(17) 496
Tungsten, W(001)      161
Tungsten, W(100)      291
Tungsten, W(110)      296
Tunneling      382 384
Turaev, N.Y.      307 308(26)
Turner, P.J.      390
Two-dimensional angular profile      292
Two-dimensional band structure mapping      165 166 168 181
Two-dimensional crystals      165
Two-dimensional layered compound      169
Two-dimensional ordered systems      166
Two-dimensional systems      168
Twofold symmetric molecule      372
Tzoar, N.      472
Uchida, K.      62 63(137) 64(137)
1 2 3 4 5 6 7 8
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