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Park R., Lagally M. — Methods of Experimental Physics.Volume 22.Solid State Physics:Surfaces.
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Название: Methods of Experimental Physics.Volume 22.Solid State Physics:Surfaces.
Авторы: Park R., Lagally M.
Аннотация: The importance of the properties of surfaces is increasingly felt in a wide variety of technologies. Although some surface properties, such as chemical interactions leading to corrosion, have been recognized for many hundreds of years, the use of surfaces for specific applications is a recent phenomenon that is fueled by our increasing understanding of their properties. The technological success of devices and processes involving surfaces has in turn driven the development of increasingly sophisticated instrumentation designed to improve further our understanding of surface properties. This volume attempts to review, in a tutorial fashion, techniques that allow a definition of the major static properties of a surface. These can be classified as chemical or compositional, structural, and electronic. Because this volume is one in a treatise on experimental methods, the emphasis is deliberately on the techniques, their use, and the evaluation of measurements, rather than principally on the surface properties themselves.
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Рубрика: Физика /
Статус предметного указателя: Готов указатель с номерами страниц
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Год издания: 1985
Количество страниц: 565
Добавлена в каталог: 20.08.2014
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Предметный указатель
Schwinger, J. 141 142(20) 143(20)
Schwoebel, R.L. 238
screening 229 231
Seabury, C. 501
Seah, M.R 198 505
Sears, G.N. 495
Second-order desorption kinetics 425 457 460
Second-order light 481
secondary see "Secondary electron"
Secondary electron 131 148 150 153 174 176 178 179
Secondary Mahan cone 163 164
Secondary neutral mass spectrometry 329
Secondary-electron emission 193 202 331
Secondary-electron multiplier 320
Secondary-electron yield 210
Secondary-emission spectrum 227
Secondary-ion mass spectroscopy 339 403
Secondary-ion mass spectroscopy, static 339
Seidman, D.N. 410
Selective ionization 410
Seliger, R.D. 403
Semancik, S. 254
Sensitivity 258 286
Sexton, B.A. 34 35(80) 36(79) 47(79) 122(79 80 260 263 265) 123 501
Seya — Namioka monochromator 144
Shadow cone 310
Shadow technique 418
Shadowing coefficient 304
Shapira, Y. 465(5) 466 498(5) 499(5)
Sharma, S.P. 308
Shaw, C.G. 285
Shek, M.-L. 500 504
Shelef, M. 326
Sheline, R.K. 64
Shelton method 13 14
Shelton method, application 14
Shelton method, retarding-potential 13
Shelton method, thermionic emission 13
Shelton, H. 11
Shepherd, F.R. 285
Sheppard, N. 81
Shibata, S. 400
Shigeishi, R.A. 59 65(123) 88(123) 124
Shih, A. 21
Shimizu, R. 197
Shimp, L.A. 112
Shirai, E. 400
Shirley, D.A. 189 229 507 509
Shockley, W. 353 354(22)
Shot noise 259
Shulga, V.I. 307
Shurwell, H.F. 112
Si see "Silicon"
Sichtermann, W.K. 343
Siegbahn, K. 189 216 219
Siegbahn, M. 189
Siegel, B.M. 401
Siekhaus, W.J. 290
Sigmund, P. 329 332(87) 333(87) 348
Signal gating 313
Signal-to-noise ratio 285 292
Signal-to-shot-noise ratio 259
Silicon 154 157 175 181 182
Silicon, Si(111) 154 157 169 182
Silicon, Si(111) surface 153 175
Silicon, Si(111) surface 153 155
Silicon, Si(111)-A1 155
Silicon, Si(111)-C1 157 158 169 181
Simms, D.L. 329 336(79) 337(79)
Simonson, M.G. 26
Simpson, J.A. 35 38(84) 139
Sims, M.L. 26 82(22)
Single molecule 370
Smith, A.K. 110
Smith, B.E. 110 112
Smith, D.P. 299 302 305(18) 316 317 324
Smith, G.D.W. 410 415
Smith, N.V. 135 138 139 166 167(40) 168(40) 169(41) 476 482(54b)
Smith, R.J. 161
Smith, S.T. 368
Snoek, C. 307
Soft x-ray appearance-potential spectroscopy 202 207
Sokcevic, D. 47 49(107) 50
Sokoloff, D.R. 368
Solid-state detector 210
Soma, M. 62 63(137) 64(137)
Somoijai, G.A. 122(284) 123 239 285 443 509
Southern, A.L. 331
Sovitsky, A. 78 380 390 410(293) 412 415
Space charge buildup 6
Spangenberg, K.R. 41 259
Sparnaay, M.J. 324 325(64)
Spatial ionization 383
spatial resolution 287
Spectrometers, angle-resolved 140
Spectrometers, Kuyatt — Simpson electron 35 40
Spectrometers, magnetic 219
Speer, D.A. 372
Spherical electrostatic analyzer 317
Spherical-capacitor analyzer 223
Spherical-grid retarding potential analyzer 219 227
Spherical-sector analyzer 139
Spicer, W.E. 129 130(4) 149
Spin-orbit splitting 216
Spindt, C.A. 207 401
Spiro, T.G. 114
Sproull, W.T. 238
Sputter cleaning 487
Sputter etching 290
sputtering 321 328 366
Sputtering, rate 367
Sputtering, yield 321 330 334 367
Srivastana, S.K. 53
St. John, G.A. 400
Staib, P. 199 213
Stair, P.G 238 285
Static capacitor 19
Statistical thermodynamics of desorption 457
Staudenmaier, G. 331 338
Stayer, R.W. 15 367
Stefan — Boltzmann law 76
Steiger, W. 338
Steinwedel, H. 340
Steit, K.M. 33
Stenzel, W. 84 85(183) 91(183)
Step height 251
Stephan, C.H. 390
Stern, E.A. 197 232
Stern, R.C. 444 495
Stern, T.E. 350
Sticking probability 324
Sticking-coefficient determination 442
Stillwagon, L.E. 511
Stimpson, B.P. 474 475(49)
Stobie, R.W. 79 80(169)
Stockbauer, R. 467 468 469(22) 471 472(34) 477 481 493(21) 494(21)
Stoehr, J. 235 480
Stoffel, N.G. 138 139(12) 153 154(28) 155 159 175 496
Stolt, K. 393
Storage ring 141 142
Stozier, J.A., Jr. 239
Strangler, F. 372 374
Strausser, Y.E. 509
Streak length in RHEED 276
Strehlow, W.H. 324
Streit, K.M. 88
String model 309 310
Strobel, H.A. 79
Subgrain structure 248
Sugata, E. 367
Sunjic, M. 47 382
Superlattice 253 254
Surface adsorbates 356
Surface analysis 313
Surface barrier 162 171
Surface binding states 428
Surface chemical shift 224
Surface cleaning 324 354
Surface composition 231 333
Surface coverage 363
Surface crystallography measurements 267
Surface defects 245
Surface diffusion 363 392 393 395
Surface diffusion, activation energy 395
Surface ionization detectors 497
Surface plasmons 196 382
Surface potential 2
Surface potential, correlation energy 2
Surface potential, dipole layer 2
Surface potential, ion-core potential 2
Surface roughness 367
Surface segregation 324
Surface self-diffusion 367
Surface sensitivity 131 152
Surface state 152 153
Surface state, studies in electron distribution curve mode 152
Surface steps 248
Surface structure 328 333
Surface-barrier detector 210
Surface-extended x-ray-absorption fine structure 232 233 234 235 236
Surface-state quenching 152
Suzuki, M. 400
Swanson, L.W. 15(18) 20 26 358 361 362 367 397 402
Synchronous detector 285
Synchrotron radiation 127 128 141 144 147 171 183 184 217 225 480 491
Synchrotron radiation, source 156 171
Szoke, A. 368
Szymonski, M. 332
Taglauer, E. 207 299 301 302 303 304 305 306(17) 307(17) 308 309 310 311(35) 313(9) 314 316(12 51) 319(51) 320 322 324(62) 325(63) 326 328(35) 329 333 336 337(84) 340(100) 342(100) 343(100) 348
Takeda, K. 367
Takezawa, N. 107
Tamm, P.W. 432 433 434 446
Tamura, H. 338
Taylor cone 403
Taylor, G.I. 403
Taylor, J.B. 427
Taylor, J.L. 44 434 449 450 451
Taylor, T.N. 313
Teller, W. 394
Temperature-programmed desorption 428 431 446
Temperature-programmed desorption from single crystal 432
Terada, K. 196
Terada, M. 112
Terrace, distribution of sizes 252
Terrace, reciprocal-lattice rod 252
Terrace, structure factor 250
Terzic, I. 299 313(7 8)
Thermal accommodation 383
Thermal activation 354 406
Thermal desorption 354 430 464 499 503
Thermal desorption from polycrystalline substrates 427
Thermal desorption from polycrystalline substrates, surface binding states 428 429
Thermal desorption from single crystal 431
Thermal desorption from single crystal, preparation and mounting of single crystal 432
Thermal desorption, apparatus 436
Thermal desorption, data treatment 447
Thermal desorption, detector 444
Thermal desorption, surface binding state 428
Thermal desorption, theory 454
Thermal spikes 330
Thermal vibrations 247
Thermal-desorption spectroscopy 508
Thermal-diffuse scattering 274
Thermionic emission 5 20 21 205
Thermionic emission, current density of electrons 5
Thermionic method 6
Thiel, P.A. 34 36(83) 46 67 70 71 72(146) 73(146) 74 84 117(146) 122(145 146 182 266) 123 443 457
Thomas — Fermi potential 311
Thomas, E.W. 336 337(101)
Thomas, G.E. 28 31 34(57) 39 43 44 47(61 62) 48 52 62(62) 63 64(62) 67 68 114 115 116 122 329 511
Thomas, R.E. 1 19(1) 20 21
Thompkins, F.C. 1 3(6)
Thompson, L.F. 511
Thompson, L.W. 107
Three-dimensional band structure mapping 169
Three-step model 127 129 130
Threshold energies for sputtering 367
Threshold measurement 479
Thum, F. 331
Thurstans, R.E. 395
Tice, D.R. 392
Time digitizer 479
Time structure 143
Time-of-flight 328 404
Time-of-flight atom-probe 404
Time-of-flight mass spectrometer 404 444
Time-of-flight mass spectrometry 480
Time-of-flight spectrum 478
Time-of-flight, method 494
Time-of-flight, system 319
Time-of-flight, technique 476 491 495
Time-to-amplitude converter 477 478
Tip apex 355
Tip profile 356
Todd, C.J. 10
Tokutaka, H. 509
Tolk, N.H. 305 306(17) 307(17) 310(17) 329 336(79) 337 467 496
Tominaga, h. 105
Tommet, T.N. 285
Tompkins, F.C. 19
Tompkins, H.G. 26
Tompsett, M.F. 288
Tong, S.Y. 25 238 239(17) 254(17) 271(17) 291(17)
Tongson, L.L. 316
Topping, J. 4
Toroidal prism 493
Toroidal-grating monochomator 144
Torrens I.M. 311
Total yield spectrum 211
Toth, R.A. 56
Toyuki, H. 68
Tracy, J.C. 84 136 238 254(21) 255(21) 293(21) 317 443
Trajmar, S. 53
Transition density 201
Transition probabilities 146
Traum, M.M. 135 138 139(14) 166 467 476 488 496 482(54b) 494
Treichler, R. 471 496
Trolin, J.K. 350 367
True secondary electrons 194
Tsang, T. 230
Tsaur, B.Y. 410
Tsong, T.T. 376 379 381 383 384(126) 385(126) 388(126) 392 393 395 397 406 407 410 412(126)
Tuck, R.A. 21
Tucker, C.W., Jr. 238 271(14)
Tully, J.C. 305 306(17) 307(17) 310(17) 314(21) 467 468 470(17) 496
Tungsten, W(001) 161
Tungsten, W(100) 291
Tungsten, W(110) 296
Tunneling 382 384
Turaev, N.Y. 307 308(26)
Turner, P.J. 390
Two-dimensional angular profile 292
Two-dimensional band structure mapping 165 166 168 181
Two-dimensional crystals 165
Two-dimensional layered compound 169
Two-dimensional ordered systems 166
Two-dimensional systems 168
Twofold symmetric molecule 372
Tzoar, N. 472
Uchida, K. 62 63(137) 64(137)
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