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Park R., Lagally M. — Methods of Experimental Physics.Volume 22.Solid State Physics:Surfaces.
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Название: Methods of Experimental Physics.Volume 22.Solid State Physics:Surfaces.
Авторы: Park R., Lagally M.
Аннотация: The importance of the properties of surfaces is increasingly felt in a wide variety of technologies. Although some surface properties, such as chemical interactions leading to corrosion, have been recognized for many hundreds of years, the use of surfaces for specific applications is a recent phenomenon that is fueled by our increasing understanding of their properties. The technological success of devices and processes involving surfaces has in turn driven the development of increasingly sophisticated instrumentation designed to improve further our understanding of surface properties. This volume attempts to review, in a tutorial fashion, techniques that allow a definition of the major static properties of a surface. These can be classified as chemical or compositional, structural, and electronic. Because this volume is one in a treatise on experimental methods, the emphasis is deliberately on the techniques, their use, and the evaluation of measurements, rather than principally on the surface properties themselves.
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Рубрика: Физика /
Статус предметного указателя: Готов указатель с номерами страниц
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Год издания: 1985
Количество страниц: 565
Добавлена в каталог: 20.08.2014
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Предметный указатель
Electron-stimulated-desorption ion angular distribution 467 471 477 485 493
Electronic excitation 331
Electrostatic analyzer 219
Electrostatic potential 155
Electrostatic stress 417
Ellipsoidal mirror analyzer 492
Ellis, W.P. 238 313
Emin, D. 467 470(19)
Emission methods, for work function measurement 4
Emission methods, for work function measurement, electronic band structure effect 5
Emission methods, for work function measurement, patch field 5
Emission methods, for work function measurement, temperature dependence 5
Emission Spectrum 197
Emission techniques, for work function measurement 20
Emission techniques, for work function measurement, band structure 20
Emission techniques, for work function measurement, field emission 20
Emission techniques, for work function measurement, free-electron limit 20
Emission techniques, for work function measurement, photoemission 20
Emission techniques, for work function measurement, thermionic emission 20
Emitted current density 6
Emitted electrons 15
Emitted electrons, energy spread 15
Emitted electrons, Fermi-energy 15
End form 385
Energy analysis 314 316 340 474
Energy analyzer 316
Energy distribution 137 332 473 476
Energy distribution curve 130 137 140 144 147 154 159 165 167 170 173 175 179 181 183
Energy distribution curve, interpretation of 147
Energy distribution of collected electrons 16
Energy distribution of electrons 129
Energy distribution of field-emitted electrons 361
Energy distribution of field-ionized gas atoms 380
Energy distribution of ions 492
Energy distribution of photoelectrons 130 164
Energy distribution of secondary particles 332
Energy distribution of the joint density of states 145 146 148 172 173 177 178 180
Energy resolution 303 314 317 318
Energy spread 405
Energy-window analyzers 136
Engelhardt, H.A. 447 451(55) 462(55) 463(55) 493
Englert, W. 299 310(9) 313(9) 324 325(63)
English, T.C. 495 497
Equilibrium position determinations 291
Erickson, N.E. 189 225
Erickson, R.L. 305(18)
Erley, W. 122(257 259 281) 443
Ermrich, W. 367
Ernst, N. 399
Ertl, G. 25 33 62 69 84 88 89 94(192) 122(182) 239 440 441(29)
Escape depth 127 130 131 152 179
Estrup, P.J. 51 238 239 254 434
Evans, C.A., Jr. 337 403
Evans, E. 47 48 50(101) 51(101)
Evans, H.E. 95 101 106 107(232) 108 109 110(203 204 241) 111 112(203 204 205 241)
Everhart, T.E. 197
Ewald construction 241
Ewald construction, grazing-angle x-ray diffraction 241
Ewald construction, LEED 241
Ewald construction, penetrating radiation 241
Ewald construction, RHEED 241
Ewald, H. 317
Extended appearance-potential fine structure 232 235 236
Extended-range "grasshopper" monochromator 144
Extended-x-ray-absorption fine structure 297
Extinction distance 245
Extra-atomic relaxation 224
Extrinsic Auger satellites 229
Eyring theory of reaction rates 457 459 461
Eyring, C.F. 349 378
Eyring, H. 457 459(63)
Fain, S.C., Jr. 238 254 285 286(8)
Falconer, J. 462
Faraday cup detector 283 287
Farnsworth, H.E. 238 273(6) 443
Farrell, H.H. 166 169(41) 239 476 482(54b)
Fast-Fourier-transform infrared spectroscopy 78
Fedorus, A.G. 505
Feibelman, P.J. 214 231 466 467 470 479 492 505 506
Feldhaus, J. 480
Feldman, L.C. 496
Fellner-Feldagg, H. 216
Felter, T.E. 434
Feltham, R.D. 68
Fermi level 19
Fermi sea 8
Fermi sea, current density 8
Ferritin 417 421
FETI see "Iron-titanium"
Feuchtwang, T.E. 101(218) 102
Feuerbacher, B. 26 32(45) 33(43 44 45 46) 50(44) 122(43 44 45 46)
Feulner, P. 68 445 447 451(55) 462(55) 463(55) 471 496 497 503
Fiber-optic faceplate 389
Field desorption 385 398
Field desorption, mass spectrometry 400
Field desorption, microscopy 412
Field emission 8 20 351 356 368
Field emission retarding-potential method 15
Field emission retarding-potential method, field emission cathode 15
Field emission retarding-potential method, work function 15
Field emission source 282
Field emission, electron source 206
Field emission, energy distribution 26
Field emission, microscope 21
Field evaporation 385 387 397 399 404 410
Field evaporation, initiation 404
Field ionization 378 401
Field strength 410
Field-electron energy distribution 362
Field-electron-emission microscope 349 353 354 359
Field-electron-emission microscope, pressure in 354
Field-electron-emission microscopy 349 363
Field-electron-emission microscopy, application 363
Field-emission-referenced electron spectroscopy 226
Field-emitted electrons 353
Field-emitted electrons, energy distribution 361
Field-induced dipole energy 380 384
Field-ion current 402
Field-ion images 379
Field-ion microscope 376 384 385 387 392 412
Field-ion source 339 401
Field-ion source, liquid metal 403
Field-ion tomography 421
Field-ionization ion source 347
Field-ionization mass spectroscopy 400
Filter 485
Filter, monochromators 485
Final density of states 172
Final-state correlation effects 231
Final-state effects 150 169 179
Final-state formation 337
Finite-size effects 246
Firment, L.E. 509
Firsov, O.B. 311
First-order desorption kinetics 425 448 454 459 460 462
Fischer, T.E. 70
Fisher, G.B. 122(264)
Fitton, B. 26 32(45) 33(43 44 45 46) 34(45) 50(44) 122(43 44 45 46)
Flash desorption 428
Flavanthrene 372
Flicker noise 202 259 402
Flickner, M. 421 423(325)
Floyd, G.R. 466
Fluorescence, decay 495
Fluorescence, laser-excited 498
Fluorescent-screen detector 283 287
Foesch, J.A. 391
Foley, E.B. 329 336(79) 337(79)
Fontaine, J.M. 506
Forbidden zone 383
Foster, C.A. 289 432
Fouilloux, P. 61
Fountain analyzer 221
Fourier transform 165
Fowler — Nordheim equation 350 352 353 369
Fowler — Nordheim formula 8
Fowler — Nordheim slope 359
Fowler — Nordheim theory 351 352
Fowler, R.H. 7 350
Franchy, R. 471 506(32)
Franciosi, A. 175
Francis, S.A. 59 65(122) 82
Franck — Condon excitation 468
Franck — Condon ionization 468
Franck, J. 198
Frank, O. 400
Free-electron lasers 184
Free-electron wave 164
Freilich, A. 418
Frequency shift 62
Frequency shift, dipole-dipole interaction 62 64
Frequency shift, local bonding variation 62 65
Frequency shift, vibrational coupling 62
Froitzheim, H. 26 27(32 35) 28 32 33(32 36) 34 46(36 78) 50(32 33) 72(36) 122(32 33 34 35 36) 139
Frost, D.C. 285
Fuggle, J.C. 229 503
Fukuda, Y. 189 195 210
g value 507
GaAS see "Gallium arsenide"
Gadzuk, J.W. 62 206 230 361 362 363(46)
Gallium 403
Gallium arsenide 170 171
Gallium arsenide, GaAs(001) 295
Gallium arsenide, GaAs(110) 291
Gallium arsenide, sputter etched 292
Gallium selenide 150 165 167 180
Gallium, source 403
Gallon, T.E. 509
Garbout, A. 84 85(183) 91(183)
Garland, C.W. 105
Gas doser 487
Gas evolution measurement 447 449
Gas jet 339
GaSe see "Gallium selenide"
Geiger, A.L. 26 101
Gelius, U. 223
George, T.H. 412
Gerhard, W. 329 337(85)
Gerlach, R.L. 194
Germanium 155
Germanium, Ge(111) 154 155
Germer, L.H. 237 238(1)
Gesley, M. 20
Gettings, M. 508
Ghiglia, D.C. 421 423(324) 421(325)
Giaever, I. 374 375 416 417 421
Gibson, J.W. 21
Gierlich, H.H. 400
Giessmann, V. 400
Girlando, A. 102
Glaeser, R.M. 511
Gland, J.L. 122
Glasstone, S. 457 459
Globar source 77
Glow-discharge mass spectrometry 329
Gobby, P.L. 172 173(46) 177(46) 179(46) 180(46)
Godfrey, D.J. 304
Godfrey, T.J. 415
Golay, M.J.R 78
Gold 176 403
Goldberg, H.A. 17(22)
Golden, D.E. 53
Golden, W.G. 78 124(166)
Goldstein, J.I. 505
Gomer, R. 10 21 351 359(18) 361 362(50) 364 366 367 372 379 381 384 397 400 402 403 435 436 437 442 467 468 469 470(17) 496
Gonchar, V.V. 505
Goncil, B. 299 313(7)
Goniometer 288
Good, R.H., Jr. 8 352 361 362(45)
Goodman, D.W. 36 67(87)
Gorte, R. 454 456 457
Gossling, B.S. 350
Goutte, R. 329
Graham, W.R. 392 393
Grandke, T. 166 170(43)
Granneman, E.H.A. 481
Grant, J.T. 502 503
Green, T.S. 138 221
Greene, J.E. 329
Greenler, R.G. 26 27(25) 59 65 66 81 82 83 107 124
Greenwald, A.C. 368
Grid microchannel plate 487 see Channel-plate
Grigson, C.W.B. 288
Gronlund, F. 331
Gronwald, K.D. 238 287 294
Gruen, D.M. 340
Grundner, M. 314 316 319 336 340(100) 342 343(100)
Grunze, M. 124
Grupta, R.K. 124
Gudat, W. 174
Guilland, C. 329
Guinet, C. 95 103(200)
Gunnarson, O. 229
Gurney, R.W. 378
Gurney, T., Jr. 418
Guseva, M.I. 331
Haas, G.A. 1 19(1) 20 21
Haas, H. 64
Haefer, R. 372
Haggmark, L. 311
Hagstrum, H.D. 305 306(17) 307(17) 310(17) 474
Hahn, P.O. 293
Hair, M.L. 26
Hall, T.M. 410
Halpern, B. 364 402
Hamann, D.R. 214
Hammaker, R.M. 59 65(122)
Hammarqvist, H. 210
Hammond, D. 216
Hanke, G. 238
Hansen, G.R. 401
Hansma, P.K. 26 29 59 95 96(58) 101 102 103 104 105
Hanson, D.M. 471 472(34) 477
Hardy, J.R. 101(219) 102
Haring, A. 332
Harrick, N.J. 26
Harrington, W.L. 304 334 339(98) 340(98) 341(98) 343(98)
Harris, L.A. 227
Harrison, D.E. 331
Harrison, W.W. 313 315
Harrower, G.A. 220
Haydock, R. 399
Hayward, D.O. 365
Heat of adsorption 366 456
Heiland, W. 299 301 302 303 304 305 306(17) 307 308 309 310(9 17) 313(9) 314 316(12 51) 319(51) 322 324 325 326 333 336 340(100) 342(100) 343(100) 348
Heilman, P. 238
Heimann, P.J. 492
Hein, N.C. 140
Heindric, A. 400
Heinen, H.J. 400
Heinz, K. 238 505
Heinze, W. 21
Helms, C. 462
Hemispherical deflector, 34 35 180
Hemispherical deflector, lens 35 40 41
Hemispherical deflector, resolution 40 41
Henderson, J.E. 361
Hendra, P.J. 26
Henkel, E. 350
Henzler, M. 238 239 250(25) 287 293 294
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