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Park R., Lagally M. — Methods of Experimental Physics.Volume 22.Solid State Physics:Surfaces.
Park R., Lagally M. — Methods of Experimental Physics.Volume 22.Solid State Physics:Surfaces.



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Название: Methods of Experimental Physics.Volume 22.Solid State Physics:Surfaces.

Авторы: Park R., Lagally M.

Аннотация:

The importance of the properties of surfaces is increasingly felt in a wide variety of technologies. Although some surface properties, such as chemical interactions leading to corrosion, have been recognized for many hundreds of years, the use of surfaces for specific applications is a recent phenomenon that is fueled by our increasing understanding of their properties. The technological success of devices and processes involving surfaces has in turn driven the development of increasingly sophisticated instrumentation designed to improve further our understanding of surface properties. This volume attempts to review, in a tutorial fashion, techniques that allow a definition of the major static properties of a surface. These can be classified as chemical or compositional, structural, and electronic. Because this volume is one in a treatise on experimental methods, the emphasis is deliberately on the techniques, their use, and the evaluation of measurements, rather than principally on the surface properties themselves.


Язык: en

Рубрика: Физика/

Статус предметного указателя: Готов указатель с номерами страниц

ed2k: ed2k stats

Год издания: 1985

Количество страниц: 565

Добавлена в каталог: 20.08.2014

Операции: Положить на полку | Скопировать ссылку для форума | Скопировать ID
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Предметный указатель
optical excitation      148 163
Order-disorder transitions      279
Orloff, J.H.      402
Ortega, A.      31 47(63 64) 78 81(63) 84 85(183) 86 87 91(163 183) 117(63) 118(63) 119(63) 120(63) 121(63) 124(63 64 163 184)
Oscillator strength      233
Ottenberger, W.      321 330(61) 333(61)
Overeijnder, H.      332
Overlayer phase diagram      297
Oxidation state      223
Oxygen      154 155 184
Oxygen on Ag(100)      326
Oxygen on Cu(110)      328
Oxygen on W(110)      365
Oxygen, activation energy for diffusion      365
Ozin, G.A.      112
Padva, A.      102
Palladium      378
Palladium thimble      389
Palmberg, P.W.      84 134 136 317 439
Palmer, R.L.      248
Pandey, K.C.      231
Panin, B.V.      299
Panitz, J.A.      357 369 380 383 386 387 388 389 390 391 404 405 408 409 410(47 247 248 250 261 290) 414 415 416 417 418 421 422 423
Pankey, T.      21
Pantano, C.G.      506 508 510(99) 511(99)
Pappas, D.L.      488 498
Parallel detection      285
Parallel-plate analyzer      220
Paresce, F.      287
Parilis, E.S.      307
Parital-yield spectroscopy      173 179 183
Parity      160 183
Park, R.L.      25 84 189 194 195 199 203 210 213 214 224 226 236 238 260 263(56) 273(16 18) 297
Parrott, S.L.      107
Parsely, M.J.      392
Partial yield      179
Particle detection      320
Path of electrons      244
Paul, W.      340
Payn, J.K.      473
Payne, M.G.      498
Payzant, J.D.      400
Pearce, H.A.      81
Pecile, C.      102
Pendry, J.B.      25 238 239(16) 271(16) 291(16)
Penetrating radiation      241
Penn, D.      11
Perel, J.      403
Peria, W.T.      227
Perovic, B.      299 313(8)
Perry, D.L.      238
Persson, B.N.J.      47 50(102)
Petermann, L.A.      496
Peterson, D.T.      152
Pethica, B.A.      360
Petry, R.L.      199
Petzow, G.      289
Pfnuer, H.      31 47(63 64) 81(63) 117(63) 118 119 120 121 124 447 451 462 463
phase diagram      278
Phase shift      233
Photocurrent      483
PhotoDiode      482 485
Photoelectric detectors      208
Photoelectric emission      7
Photoelectric emission, Fowler analysis      7
Photoelectric emission, patchy surface      7
Photoelectric emission, photoelectric yield      7
Photoelectric emission, threshold frequency      7
Photoelectric method      8
Photoelectron parameters      133
Photoelectron spectroscopy      133 508
Photoelectron spectroscopy, angle-resolved      133 135
photoemission      20 21
Photoemission, angle-resolved      160 161
Photoemission, cross section      484
Photoemission, spectra      170
Photon monochromator      481 see
Photon parameters      133
Photon polarization      158
Photon polarization in angle-resolved photoemission      159
Photon polarization, selection rules      156
Photon source      133
Photon source, conventional      141 147
Photon-stimulated desorption, angle-resolved      185 491 493
Photon-stimulated desorption, cross section      466
Physisorbed layer      364
Physisorption process      131
Pian, T.R.      496
Pianetta, P.      235
Pillon, J.      197
Piper, T.C.      26 122 123
Pirug, G.      122(268)
Plagge, A.      88
Plane-mirror analyzer      138
Plasma discharge ion source      337
Plasmon      195 196 229
Plasmon, decay      197
Plasmon, gain satellites      229
Plasmon, losses      150
Plative, P.G.      392
Pliskin, W.A.      61 105
Plummer, E.W.      11 32 34(70 71) 35 38(86) 41 45(86) 47(69 70 71) 48(69 70 71) 50(69) 51(70 71) 122(69 70 71) 361 362 363(46) 392
Plyler, E.K.      56
Poelsema, B.      306 311 328(40)
Point source      368
Point-projection microscope      357
Polarization      133 143 156 159 160 171 179 180 183 360 485
Polarization modulation      80
Polarized-photon photoemission      156 158
Position-sensitive pulse detector      287
Post ionization      337 399
Potassium chloride      179 180
Potential modulation      203 220
Powell, C.J.      189 190 225 226 230
Prebreakdown current      369
Preferential sputtering      324 333
Preuss, E.      432 472
Prigge, S.      474
Primary electrons      132 148 174
Primary Mahan cones      163 164 166
Primary photoelectrons      177
Primet, M.      61
Prince, R.H.      466 495
Pritchard, J.      26 76 80 81 82 83 88 125
Probe hole      359 366 414
Proca, G.A.      138 221
Propst, F.M.      26 30(38) 34(38) 122 123 476 501
Protein multilayers      417
Prutton, M.      509
Pukite, P.R.      264 267 277(68) 281(68) 284 288(57 68) 295
Pulse duration      405
Pulse-counting mode      474
Pulse-height analyzer      477 478
Pulsed-laser atom-probe      406
Purcell, E.M.      223
Purtell, R.J.      501
Pyke, D.R.      410(278)
Quadrupole mass analyzer      474
Quadrupole mass filter      328 340
Quadrupole mass spectrometer      444 487 493
Quantitative Auger analysis      231
Quantum efficiency      209
Quasi-atomic behavior      231
Quasi-resonance neutralization      304
Quenched surface states      154
Quicksall, C.O.      114
Quinby, M.S.      68
Quinn, C.M.      360
Quinn, J.J.      195 196
Radiation damage      177 333
Radiative decay      495
Radius of curvature, field emitter tip      358
Ralek, M.      105
Ralph, B.      410
Ramaker, D.E.      467 468 469(22) 470(17 18) 471
Random strain      247
Rao, B.      79 80(169)
Ratajczykowa, I.      26 27(25)
Rawlinson, W.F.      214 215
Reciprocal lattice      241 243 244 245 247
Reciprocal lattice of defects      247
Reciprocal lattice, $p(1 \times 1)$ structure      257
Reciprocal lattice, antiphase island      254 256
Reciprocal lattice, superlattice      253 254
Reciprocal lattice, terrace      252
Reciprocal-lattice rods      244 247 250 254
Reciprocal-lattice rods, broadening      247
Redhead, P.A.      428 429 430 431 441(4) 444 447 448 468 473 495 500 501
Reed, D.A.      393 418 419
Reed, S.J.B.      511
Reference energy      149
Reference surface      18
Reflected-electron microscope      22
Reflected-electron microscope, contact potential      22
Reflected-electron microscope, patches      22
Reflected-electron microscope, scanning      22
Reflection high-energy electron diffraction      241 264 283
Reflection high-energy electron diffraction, detector      283 285 288
Reflection high-energy electron diffraction, measurement of angular profile      295
Reflection infrared spectroscopy      28 29 75
Rehn, V.      199 467 480(20b)
Reidl, W.      497
Reifenberger, R.      17
Reimann, A.L.      1 6(7)
Relaxation energy      224 229
Reliability factor      271
Rendulic, K.D.      418
Reneutralization      510
Resistive-anode encoder      287
Resolution of appearance-potential spectroscopy      205
Resolution of cylindrical microscope      354
Resolution of field-ion microscope      384 385
Resolution of point-projection microscope      358 359
Resolution, mass      303 344 405
Resolving power      258 263 286 295
Resolving power in LEED      264
Resolving power in RHEED      264
Resonance      382
Resonance neutralization      304
Retarding-potential analyzer      227 362
Retarding-potential method      11 20 21
Retarding-potential method, band structure      20
Retarding-potential method, emission current density      11
Retarding-potential method, energy distribution      20
Retarding-potential method, experimental arrangement      20
Retarding-potential method, field-emission retarding potential technique      20
Retarding-potential method, nonuniform surface      22
Retarding-potential method, reflection mechanism      20
Retarding-potential method, scanning arrangement      21
Retarding-potential method, scanning low-energy probe technique      20 21
Retarding-potential method, Shelton triode      11
Retarding-potential method, standard surface      22
Reynolds, W.D.      401
Rhead, G.E.      447
Rhodin, T.N.      10 392 501
Rice, J.K.      40
Richardson equation      5 11
Richardson equation, temperature-dependent      5
Richardson, N.V.      59
Richardson, O.W.      205 350
Rigden, J.D.      220
Ringers, D.A.      230
Ringo, G.R.      402 403(234)
Ritchie, R.H.      197
Riviere, J.C.      1 19(2) 508
Roberts, M.W.      238 360 395
Robertson, G.H.      403
Robertson, J.A.B.      401
Robinson, C.A.H.      319 320(59)
Robinson, H.H.      193 214 215
Robinson, J.E.      313 316(43)
Robinson, M.T.      330 331
Robinson, W.L.      68
Rochow, E.G.      349
Rochow, T.G.      349
Roelofs, L.D.      236 297
Rogers, J.W., Jr.      107
Rollgen, F.W.      400
Roos, G.      338
Roptin, D.      197
Rose, D.J.      359 370(31)
Rosebury, F.      289
Rosenberg, D.      331
Rosengren, A.      225
Roth, J.      321 330(61) 333(61) 334
Rothschild, W.G.      105
Roundy, V.      48
Rousseau, J.      26 33(41 42) 34 122(42 262 274 277 278)
Rowe, J.E.      128 140 141 142(2) 150 151(24 25) 153 154 155(29 184) 157 158(31) 159 166 167(40) 168(40) 180 181(49) 488
Roy, D.      34 35(76 77)
Rudge, M.R.H.      197
Ruedenauer, F.G.      338
Ruggieri, D.J.      487
Rye, R.R.      502 508
Sachtler, W.M.H.      359
Saint-James, D.      101(216) 102
Saito, Y.      107
Sakata, T.      393
Sakurai, T.      403 406 410(254)
Saloman, E.B.      482
Saloner, D.A.      256 295(53)
Samarin, S.N.      496
Sample preparation      289
Sandstrom, D.R.      434 474 475(49) 495
Sangster, M.J.L.      101 102(213)
Sar-El, H.Z.      221
Sasaki, T.      507 509
Saski, N.      197
Savage, D.E.      264
Sayers, D.E.      232
Scalapino, D.J.      59 101(129 214) 102
Scanning ion micrographs      403
Scanning low-energy electron probe      20 21
Scattering cross-section      303 304
Scattering probability      49
Schaeffler, H.G.      309
Scharmann, A.      331
Schattke, W.      101(217) 102
Scheffler, M.      59 65 82
Scherzer, B.M.U.      330
Schlueter, M.      151 166 167(40) 168(40) 169(41) 182
Schmeitz, M.      59
Schmidt, H.      53
Schmidt, L.D.      432 433 434 446 454 456 457 464
Schmidt, W.A.      400
Schmitt, S.      68
Schober, O.      88
Schoenhammer, K.      229
Schottky effect      6
Schottky hump      397 398
Schottky, W.      350
Schottky-barrier height      155
Schreiner, D.G.      260 263(56)
Schrieffer, J.R.      48 52(103) 53(103) 54(103) 55(103)
Schrott, A.G.      285
Schulten, H.R.      400 401
Schulz, G.J.      48 53(105 106)
Schuster, F.      303 304(12) 316(12)
Schwartz, S.B.      197
Schwarz, J.A.      101 102(212)
1 2 3 4 5 6 7 8
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