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Renliang Xu — Particle Characterization : Light Scattering Methods
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Название: Particle Characterization : Light Scattering MethodsАвтор: Renliang Xu Аннотация: Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology — the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.
Язык: Рубрика: Технология /Статус предметного указателя: Готов указатель с номерами страниц ed2k: ed2k stats Издание: 1 editionГод издания: 2000Количество страниц: 420Добавлена в каталог: 31.10.2010Операции: Положить на полку |
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Предметный указатель
Sedimentation 10 20 165 168 322 Seebergh, J.E. 265 Sehrt, S. 217 Self, S.A. 203 Self-beating 86 Sevick-Muraca, E.M. 60 100 Shamir, J. 97 Shape, coil 73 94 Shape, irregular 173 Shape, non-spherical 44 103 166 172 211 260 268 Shape, plate 7 72 78 147 171 260 268 Shape, polygon 75 Shape, regular 43 72 176 260 Shape, rod 43 73 171 260 268 Shape, sphere 43 67 75 101 144 168 206 268 Sharma, S.K. 80 Sheath flow 96 197 Shen, J. 144 Shifrin, K.S. 153 Shik, H. 15 Shilov, V.N. 23 297 Shinde, R.R. 60 100 Shofner, P.M. 18 Sieberer, J. 252 Siegert relation 89 Sieve analysis 7 114 168 Signal-to-noise ratio 137 165 197 241 321 Silebi, C.A. 19 Sinclair, I. 209 Sing, K.S.W. 24 Singham, S.B. 60 224 Sinn, C. 278 280 Size exclusion chromatography 18 229 Size, cord length 96 Size, fractal dimension 174 Size, hydrodynamic 245 264 268 Size, optically equivalent 210 Size, radius of gyration 72 93 174 Size, Stokes diameter 10 63 171 skewness 34 Skilling, J. 253 Smart, G. 313 322 Smith, B.A. 314 319 Smith, M.E. 307 Smoluchowski equation 297 Smoluchowski, M.v. 297 Sneyers, R. 169 263 272 So, P.T.C. 100 Sobotta, A. 314 Software correlator 238 Solomentsev, Y.E. 297 Sommer, H.T. 188 189 193 Sonication 50 143 151 Sowerby, B.D. 23 Spatial filter 127 229 278 Specific surface area 4 25 Spectrum analysis 86 235 Spectrum analyzer 299 321 Spheres 43 67 75 101 144 168 206 268 Spliepcevich, C.M. 153 SRM 312 323 Standard deviation 42 Standard, ASTM 8 336 Standard, BCR 167 172 Standard, ISO 8 250 Standard, reference reticle 145 147 Standard, SRM 312 323 Static scattering 58 90 258 Stationary layer 311 329 Statistical parameters, kurtosis 35 Statistical parameters, mean see "Mean" Statistical parameters, median 34 Statistical parameters, mode 33 Statistical parameters, skewness 34 Statistical parameters, standard deviation 42 Statistical parameters, variance 34 Staude, W. 279 Stelzer, E. 256 Stenhouse, J.I.T. 209 Stepanek, P. 248 257 258 Stern layer 290 Stevens, T.J. 307 Stevenson, A.F. 98 Steyfkens, S. 272 Stieglmeier, M. 103 Stigter, D. 297 Stockmayer, W.H. 261 Stoeckli, H.F. 25 Stokes diameter 10 63 171 Stone-Masui, J. 272 Streaming potential 26 295 Strickland, M.L. 134 Structure factor 91 262 Strutt, J.W. 58 Suh, K. 272 Surface-based numerical method 81 Surfactant 50 Suzuki, T. 307 Swinney, H.L. 269 Szychter, H. 134 175 176 Szymanski, W.W. 199 203 217 Tadayyon, A. 96 Taflove, A. 81 Takagi, T. 298 309 311 322 Tanford, C. 297 Tanger, H. 60 Tarantola, A. 154 Teller, E. 24 Terui, G. 235 Thoenes, D. 80 135 Thomas, J.C. 257 258 258 Thornburg, J. 97 Thorwirth, G. 60 Tikhonov, A.N. 152 Time-of-arrival correlator 238 Time-of-flight measurement 96 Time-of-transition measurement 97 Tiselius, A. 298 Togawa, Y. 115 Tominaga, Y. 259 Tomographical transformation 159 Tough, R. 263 Toyoda, M. 125 Trainer, M.N. 131 Travis, L.D. 81 Tribus, M. 153 Trimodal distribution 122 Tropea, C. 103 Tscharnuter, W.W. 60 250 340 Tsubaki, J. 170 Tsunasima, Y. 252 Tuezuein, U. 158 Tungsten light 13 Turbidity 98 163 Twomey, S. 154 203 Tyndall, J. 58 Umhauer, H. 171 205 212 213 215 Ungut, A. 159 Unterforsthuber, K. 257 Uozumi, J. 100 Uzgiris, E.E. 299 314—316 334—336 Van Alstine, J.M. 310 313 314 van Amserdam, P. 169 van Cotthem, L. 169 van de Hurst, H.C. 60 van de Ven, T.G.M. 60 Van der Deelen, J. 272 van der Drift, W.P.J.T. 297 van der Linde, A.J. 314 Van der Meeren, P. 240 263 269 272 van der Minne, J.L. 307 Van der Waals force 263 294 Van Dilla, M.A. 60 224 Van Keuren, E.R. 273 Van Laethem, M. 252 263 van Leeuwen, H.P. 314 Vanderdeelen, J. 240 263 269 Vanhoudt, J. 233 Variance 34 Veal, D.L. 185 191 Vector of momentum-transfer 62 99 115 249 328 337 Velev, O. 27 315—317 339 Verheijen, J.T. 154 Verheijen, P.J.T. 154 169 Vernet, J.-P. 167 Vertical polarization 61 67 118 Vincent, B. 60 338 Vokram, C.S. 16 Volume-based numerical method 81 Vomela, R.A. 211 von Benzon, H. 103 Vrij, A. 273 Waggeling, R. 60 96 Waisanen, S. 98 Wallach, M.L. 98 Wallas, P 229 234 Wang, D.S. 69 Wang, N. 98 144 Wang-Thomas, Z. 174 Ward, D.N. 297 Ward-Smith, S. 164 Ware, B.R. 60 299 332 299 308 309 314 319 335 336 Watson, D. 148 252 Watson, R.M.J. 72 Weber, R. 296 Wedd, M.W. 164 165 Wei, J. 98 Weichert, R. 153 175 204 Weight-averaged mean 91 270 Weiner, B.B. 60 250 Weise, W. 314 Weitz, D.A. 280 281 Wen, H.Y. 217 Whitby, K.T. 211 white light 126 White, L.R. 296 White, P. 311 Whitelaw, J.H. 305 Whytlaw-Gray, R. 182 Wiegard, S. 279 Wiener — Khintchine theorem 87 Wiersema, P.H. 296 Wiese, H. 273 Wijers, J.G. 80 Will, S. 172 229 Willeke, K. 211 215 Willemse, A.W. 275 Williams, P.S. 21 Winkelmayr, W. 21 Witt, W. 114 130 Wriedt, T. 81 103 Wright, C.A. 141 Wu, C. 229 257 Wu, S.C.C. 27 315 316 317 339 Wyatt, C.L. 56 Xu, R. 41 68 79 80 116 118 122—124 146 224 239 254 259 261 266 269 270 271 306 313 314 322 329 Xu, T.-H. 103 Yang, I. 172 Yang, X. 183 Yau, W.W. 19 Yeh, Y. 223 Ying, Q. 229 Yoon, B.J. 297 Young, H.D. 34 Yule, A.J. 159 z-averaged 93 Zare, M. 60 Zeta potential, Henry equation 295 Zeta potential, Hueckel equation 297 Zeta potential, Smoluchowski equation 297 Zhang, H. 98 Zikikout, S. 153 Zimm plot 94 Zimm, B.H. 94
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