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Renliang Xu — Particle Characterization : Light Scattering Methods
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Название: Particle Characterization : Light Scattering MethodsАвтор: Renliang Xu Аннотация: Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology — the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.
Язык: Рубрика: Технология /Статус предметного указателя: Готов указатель с номерами страниц ed2k: ed2k stats Издание: 1 editionГод издания: 2000Количество страниц: 420Добавлена в каталог: 31.10.2010Операции: Положить на полку |
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Предметный указатель
Lyklema, J. 314 Lynch, M. 306 Ma, Z. 154 MacDonald, I.P. 338 Mackowski, D.W. 81 Magnusson, L. 183 Maheu, B. 63 Maire, E. 296 Malghan, S. 171 172 Maltsev, V.P. 60 224 Marsh, J.F. 338 Massoli, P. 69 Matrix conversion 23 Matrix conversion, constrained regularized method 156 Matrix conversion, maximum entropy method 156 252 Matrix conversion, Phillips — Twomey method 154 203 Matsumoto, K. 137 171 Maximum entropy method 156 252 Mazumder, M.K. 306 Mazur, P. 273 McClements, D.J. 23 McCrone, W.C. 16 McMurry, P.H. 175 McNeil Watson, R. 252 McWhirter, J.G. 252 254 Mean, arithmetic 36 39 41 Mean, De Brouckere 41 Mean, geometric 30 41 Mean, moment 40 Mean, moment-ratio 37 Mean, Sauter 41 Mean, weight-averaged 91 270 Mean, z-averaged 93 Measurement, crossbeam 303 337 Measurement, in-line 99 139 272 Measurement, multiangle 232 242 257 267 319 Measurement, multiangle, fingerprint 267 Measurement, on-line 22 99 139 166 272 281 Measurement, reference beam 233 301 306 326 337 Median 34 Mees, L. 63 Melamed, M.R. 60 224 Melling, A. 305 Mencaglia, A. 275 Menzel, R. 18 141 Mercury porosimetry 25 Merkus, H.G. 154 154 167 175 176 275 Meyer, W.V. 274 Michoel, A. 169 Microelectrophoresis 297 307 Microscopic method 44 Mie scattering 66 98 111 152 159 173 205 243 269 Mie, G. 58 Mignani, A.G. 275 Millen, M.J. 23 Miller, J.R. 27 60 315—317 337—339 Minor, M. 314 Mishchenko, M.I. 81 MODE 33 Moeller, T. 15 Molecular weight 18 90 270 Molter, L. 205 Monnier, O. 60 96 Monodisperse 208 327 Montague, C.E. 188 189 193 Morrison, F.A. 297 Morrison, I.D. 331 Mott, S.C. 141 Moving mirror frequency shifter 305 Mroczka, J. 153 Muehlenweg, H. 148 153 169 204 Multiangle measurement 232 242 257 267 319 Multichannel analyzer 198 212 Multiple scattering 23 82 142 163 240 245 262 272 322 Musazzi, S. 154 Nakahira, K. 170 Naqwi, A.A. 103 Nashima T. 26 Nelson, R.D. 51 Newman, J. 269 Nguyen, T.H. 254 Nicoli, D.F. 191 Niehuser, R. 278 280 Nishi, N. 60 Niven, R.W. 60 Non-spherical particles 44 103 166 172 211 260 268 Nyeo, S.-L. 252 254 O'Brian, R.W. 24 296 297 O'Konski, C.T. 182 Oh, Y.S. 265 Ohbayashi, K. 235 Ohshima, H. 23 297 Ohya, H. 170—172 Oja, T. 23 331 Oka, K. 308 311 313 322 323 334 Oliver, C.J. 234 239 Olivier, J.P. 134 On-line measurement 22 99 139 166 272 281 Onofri, F. 103 Ooi, S. 60 Optically equivalent size 210 Optics, fiber 126 227 230 273 305 Optics, fiber, few-mode 232 Optics, fiber, monomode 127 232 273 Optics, fiber, multimode 232 273 Optics, Fourier 128 Optics, reverse Fourier 132 Optode 273 Otani, W. 311 322 Otomo, J. 259 Overbeck, E. 278 280 Overbeek, J.Th.G. 296 297 Ovod, V.L. 194 Paganini, E. 98 154 Paine, A.J. 42 Palberg, T. 278 280 296 Palmer, A.T. 170 Parallel-plate cell 315 Particle counting 182 192 Particles, aerosol 4 21 Particles, air bubbles 101 150 214 Particles, air-borne 182 194 Particles, liquid-borne 139 150 182 194 295 Particles, powder 4 47 141 Pasternack, R.F. 60 Patterson, H.S. 182 Pawar, Y. 297 Peacock, S.L. 217 Pecora, R. 60 223 224 259 260 Pedersen, J.S. 72 91 357 Peeling method 329 Pei, P. 171 172 Pelssers, E.G.M. 195 196 Pennycook, S.J. 14 Perelman, A.Ya. 153 Perini, U.U. 154 Perrin, F. 64 Peters, C. 217 Petersen, G. 23 Phase analysis 336 Phase difference, amplitude-weighted 337 Phase Doppler anemometry 101 Phillies, G.D. 237 262 276 Phillips — Twomey method 154 203 Phillips, B.L. 154 PhotoDiode 131 174 190 233 Photodiode, avalanche 234 273 Photomultiplier tube 233 277 321 Pickard, H.B. 182 Pieraccini, M. 275 Pike, E.R. 234 237 239 252 254 Pine, D.J. 280 281 Pitts, J.N., Jr. 182 Plantz, P.E. 60 Plates 7 72 78 147 171 260 268 Ploehn, H.J. 27 250 315—317 339 Plomp, A. 21 Podgorski, A. 203 Podschus, U. 277 Pohl, D.W. 60 Pohl, H.A. 317 Point of zero charge 294 Poisson distribution 214 Polarization 226 Polarization intensity differential scattering 119 131 157 polarization, horizontal 61 118 Polarization, vertical 61 67 118 Polke, R. 49 100 166 175 176 Pollack, J.B. 173 Polydispersity index 249 272 POLYGONS 75 Polystyrene latex 115 124 158 208 265 271 329 334 Porometer 25 Pottsmith, H.C. 153 Powder 4 47 141 Power spectrum 323 330 Power spectrum, broadening 157 212 304 328 332 Power spectrum, linewidth 306 326 Power spectrum, Lorentzian 300 323 Power spectrum, peeling method 329 Prots, V.I. 60 224 Provder, T. 60 98 Provencher, S.W. 252 254 257 258 Pruger, B. 60 Pui, D.Y.H. 97 208 Pusey, P.N. 239 263 Quasi-elastic scattering 59 Raasch, J. 215 Radius of gyration 72 93 174 Radle, M. 100 175 176 Raes, F. 21 Ramos, J.G. dos 19 Raper, J.A. 174 Rarity, J.G. 273 Ratsimba, B. 60 96 Rayleigh ratio 92 Rayleigh scattering 69 82 163 250 Rayleigh — Debye — Gans scattering 71 82 260 266 Reference beam 233 301 306 326 337 Reference reticle 145 147 Refractive index 57 91 116 159 162 199 208 258 Regularly shaped particles 43 72 176 260 Reichel, A. 60 96 Reischl, G.P. 21 Ren, K.F. 63 Renksizbulut, M. 159 Resolution 134 154 165 199 211 217 258 270 328 330 Reuss, A. 297 Reverse Fourier optics 132 Revillion, A. 19 Rheims, J. 103 Ribitsch, V. 26 Richter, S.M. 60 100 Roberston, G. 153 Rods 43 73 171 260 268 Rohani, S. 96 Roitberg, M. 97 Rona, J.P. 172 Root, W.L. 330 Rosell, J. 21 Ross, D.A. 251 252 254 Rossmanith, P. 60 Rotating grating 306 Rotational diffusion coefficient 259 268 Roth, C. 217 Rothele, S. 114 130 141 Round-robin test 168 Row, G. 267 Rowlands, W. 24 Rozouvan, S. 60 Ruf, H. 251 256 256 Rushton, A.G. 209 Rutgers, A.J. 307 Sachweh, B. 175 176 Sadain, S. 183 Saffman, M. 60 Saleh, B. 89 Salzman, G.C. 60 224 Sample module 139 165 229 Sample reduction 47 Sampling 41 47 52 142 150 191 Sampling, hydro-focusing 194 Sampling, sample reduction 47 Sampling, sheathflow 96 197 Santiago, S. 167 Sasaki, H. 26 Sautermean 41 Scarlett, B. 45 154 167 169 175 176 275 Scattering cross section 65 Scattering efficiency 101 163 Scattering factor 71 93 260 Scattering, angular pattern 66 94 115 151 174 242 Scattering, angular pattern, map 68 80 Scattering, angular pattern, monotonic 199 211 Scattering, angular pattern, polytonic 199 201 209 Scattering, depolarized 91 259 268 Scattering, elastic 59 Scattering, extinction 56 98 182 187 205 Scattering, geometry 61 278 Scattering, inelastic 59 Scattering, multiple 23 82 142 163 240 245 262 272 322 Scattering, parameter, cross section 65 Scattering, parameter, extinction efficiency 98 205 Scattering, parameter, Rayleigh ratio 92 Scattering, parameter, scattering efficiency 101 163 Scattering, parameter, scattering factor 71 93 260 Scattering, parameter, structure factor 91 262 Scattering, phase analysis 336 Scattering, Quasi-elastic 59 Scattering, static 58 90 258 Scattering, technologies 60 Scattering, theory, diffraction, anomalous 80 160 Scattering, theory, diffraction, Fraunhofer 73 111 144 152 160 173 206 Scattering, theory, diffraction, Fresnel 74 102 173 Scattering, theory, forward scattering see "Fraunhofer diffraction" Scattering, theory, Mie 66 98 111 152 159 173 205 243 269 Scattering, theory, numerical, surface-based 81 Scattering, theory, numerical, volume-based 81 Scattering, theory, Rayleigh see "Rayleigh scattering" Scattering, theory, Rayleigh — Debye — Gans see "Rayleigh — Debye — Gans scattering" Scattering, time-averaged 58 61 82 90 Scattering, vector 62 99 273 276 328 337 Schabel, S. 103 Schafer, M. 49 100 175 176 Schatzel, K. 60 252 314 Schmidt, M. 261 Schmitz, B. 128 306 Schmitz, K. 60 93 224 259 Schnablegger, H. 143 161 163 252 Scholz, N. 49 175 176 Schroeer, W. 279 Schrof, W. 60 Schulz-Dubois, E.O. 89 Schurtenberger, P. 232 Schuster, B.G. 185 Schwartz, F.H. 60 96 Schwaz, S.E. 60 Schweiger, G. 69 Seaman, G.V.F. 313 314 323 Sears, F.W. 306
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