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| Johnson K., Lark-Horovitz V.A. — Methods of Experimental Physics Solid State Physics (Volume 6/Part B) |
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Название: Methods of Experimental Physics Solid State Physics (Volume 6/Part B)
Авторы: Johnson K., Lark-Horovitz V.A.
Язык: 
Рубрика: Физика/
Статус предметного указателя: Готов указатель с номерами страниц
ed2k:
Год издания: 1964
Количество страниц: 416
Добавлена в каталог: 23.03.2008
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| Предметный указатель |
Ruth, R. P. 66 366
Ryvkin, S. M. 345 350
Saddy, J. 300
Sadowsky, M. 301
Sah, C. T. 372
Saito, M. 26
Sakata, T. 120 386
Salzberg, C. D. 281
Sample preparation, contacts 50—52
Sample preparation, evaluation of homogeneity 62—53
Sample preparation, for resistance measurement 49—53
Sandstrom, A. E. 292
Sandwich-type light amplifier 356
Sarginson, K. 162
Sato, T. 122 127
Satterthwaite, C. B. 75
saturation magnetization 200—201
Savornin, F. 124
Savornin, J. 124
Savostianova, M. 332
Saw tell, J. W. 307
Sawamoto 128
Sayre, D. 231
Scanlon, W. W 64 121
Sch tz, W. 275
Schaal, A. 354
Schaffert, R. M. 357
Scharmanri, A 312
Schauwecker* H. E. 252
Schawlow, A. L. 76 77 236
Schering bridge 9—12
Schering bridge, guard circuit 11 12
Schering bridge, substitution method 11
Scherrer, P. 274
Schilling, E 128
Schleede, A. 310
Schmidt, F. 293 300(1)
Schmillen, A. 312
Schonrock, Q. 270
Schoop, M. U. 51
Schottky plot 329—130
Schottky plot, patchy metal 133—134
Schottky, W 129
Schrieffer, J. R. 76 137 138
Schroder, H. 281
Schubin, S. 377
Schulkes, J. A. 196
Schulman, J. H. 332 334
Schultz, B. H. 99 101 59 353
Schultz, M. L. 340 342
Schultz, W. 369
Schuster, N. A. 231
Schwartz, M. 89
Schwarz, E. 344
Schwarz, R. F. 89 367
Schwed, P. 120
Schweinler, H. C. 178 184 13
Scott, A. H. 4
Scott, G. D. 279
Scovil, H. E. D. 238
Seebeck effect, definition 115
Seebeck effect, measurement 118—125
Seidel, H. 215
Seitz, F. 110 165 293 325 326 3 328 4 6 330 6 332 6 333 4 5(6)
Semiconductor phemonena, non-equilibrium 78—109
Semiconductors, bulk measurements 57—62
Semiconductors, evaluation of homogeneity 60—62
Semiconductors, experimental phototelectromagnetic measurements 360—364
Semiconductors, high frequency effects, ] 10—114
Semiconductors, magnetic susceptibility 177—178
Semiconductors, minority carrier lifetime 351
Semiconductors, photoemission data 381—384
Semiconductors, special methods for measuring conductivity 65—66
Semiconductors, surface measurements 62—63
Sennett, R. S. 279
Serin, B. 71 73 74
Sharbaugh, A. H. 25 30 31
Sharpe, B. A. 3
Sharvin, Yu V. 77
Shaw, C. H. 292
Shelton, H. 132
Shenker, H. 116 226
Shibuya, M. 147 161
Shipley, F. M. 145
Shirane, G. 269
Shive, J. N. 369
Shockley, W. M. 48 60 79 80 81 10 83 85 90 91 93 4 44 95 96 4 97 4 99 13 105 44 110 111 133 150 151 161 218 221 33 358 372 375
Shoenberg, D. 71 72 73 76 183 188 190
Shorted line technique of measuring luminescence 313
Shtenbek, M. 126
Shulman, R. G. 107 109
Sidorov, A. I. 107 109 80
Sieg, L. P. 340
Silver-axygen-ceshim cathode 389—390
Sim, A. C. 353
Simon, I. 256
Sims, A. C. 89
Sinclair, D. B. 11 14
Sinten, W. S. 252
Sittner, W. R. 51 87
Sixtus, K. J. 221
Sizoo, J. G. 218
Skarsv&g, JL 311
Slager, D. M. 236
Slichter, C. P. 243
Slow decay of luminescence 309—311
Smakula, A. 330 332
Smakula’s equation 326
Small-area single crystal photoconductor 343—345
Smart, J. S. 174 194 197 207
Smit, J. 216
Smith, A. H 135
Smith, A. W. 150
Smith, D. O. 198 203 223 226 227
Smith, G. 129 130 131(3)
Smith, R. A. 252 341
Smith, R. W. 79 84 16 345
Smits, F. M. 88
Smoluchowski, R. 226
Smyth, C. P. 70
Snoek, J. L. 204
Sochard, I. 359 364 14
Soldered contacts 51
Sommer, A. H. 385 386 387 389 390
Sommerfeld, A. 145 162
Sommers, H. S., Jr 359 364 14
Sondheimer, E. H. 115
Sonnensehein, A. 26
Sparks, I. L. 66
Specific heat of superconductors 74—75
Spectral measurements, of luminescence 304—306
Spectral window 286—287
Spectroradiometer 304—305
Spectroscopic splitting factor 228
Spicer, W. E. 381 382 18 387 18 389 18
Spin resonance technique see Electron spin resonance
Spitzer, W. G 109
Spontaneous magnetization 194
Spontaneous magnetization, compensation point 196
Spot-welded contacts 51
Spreading resistance 35—36
Springgate, W. F. 7
Sproull, R. L. 153
Sputtered contacts 51
Square loops 220—221
Squire, C. F. 74 165
Stablein, P. F. 54
Standing wave indicators 20—22
Standring, M. G. 28
Stanley, J. M. 344
| Starke, H. 7
Starnzas, M. S. 127
Stasiw, O. 328
Statz, H. 142
Steady state induction method 203
Steady state measurement of lifetime 100—101 104—107
Steele, M. C. 119 124 127
Steneck, W. G. 211
Stephenson, S. T. 291
Stern, O. 330
Stevens, D. K 178 184
Stevens, K. W. H. 227
Stevenson, D. T. 96 141 349 350
Stewart, K. H. 218 223
Stickler, J. J. 89 367
Stil’bans, L. S. 126 127
Stoke, H. J. 117
Stoner, E. G 171 177 208 225
Stout, J. W. 54 183
Strandberg, M. W. P. 242
Strange, J. W. 311
Strauss, A. J. 359 362 13 363 13
Stuart, A. 264 265(5)
Studer, F. J. 298
Sucksmith, W. 181
Suhi, H. 83 96 13 99 13 160 216 227
Suhl effect 99
Sunde, E. D. 37
Super-regenerative method 234
Superconducting transition, effect of stress 74
Superconductivity 71—78
Superconductivity, detection of 71—72
Superconductivity, penetration depth 75 76
Superconductors, definition 71
Superconductors, interphase surface energy 76—77
Superconductors, miscellaneous measurements 77—78
Superconductors, specific heat 74—75
Surber, W. H., Jr 6
Surface area contacts 88—89
Surface capacity 140
Surface conductivity 137—140
Surface measurements on semiconductors 62—63
Surface photovoltage 140—141
Surface photovoltage method 109
Surface potential 337
Surface properties, miscellaneous measurements 142—143
Surface recombination velocity 95—96 141 359
Surface states 136—143
Surface treatment 138—139
Surrine, R. 62
susceptibility see Magnetic susceptibility
Swank, R. K. 304
Swanson, J. A. 147 148 11(a) 151
Swaroopa, S. 68
Szivessy, G. 250 264 269 271 273
Taft, E. 135 142 333 378 379 380 7 383 384 388
Taft, E. A. 349
Tamarkin, P. 78
Tamm, I. 377
Tannenwald, P. E. 215
Tanuma, S. 118 127
Tauc, J. 127 365 372(2)
Taylor, J. C. 127
Taylor, T. A. 19
Teal, G. K. 344
Teaney, D. 243
Teikes, M. 126
Television pickup camera 354—355
Temperature control 50
Temple, R. 253
Templeton, I. M. 120
Terenin, A. N. 346
Terman, F. E. 24 38 47 15 48
Tertseh, H. 262 264 265 3 271
Thayer, R. N. 308
Thermal breakdown 29—30
Thermal measurement of dielectric loss 48 49
Thermionic constants, for a patchy metal 134
Thermionic constants, for semiconductors 134—135
Thermionic emission 128—136
Thermionic emission, from the perveance line 136
Thermionic emission, polycrystalline metals 133—134
Thermionic emission, Schottky plot 129—130
Thermionic emission, single crystal metals 129—133
Thermionic work function 130—133
Thermocouples, in thermoelectric measurements 122
Thermoelectric effects 114—128
Thermoelectric generator 126
Thermoelectric power, alloys 118
Thermoelectric power, at temperatures above 100 K 121—122
Thermoelectric power, at temperatures below 100K 122—124
Thermoelectric power, measurement 118—125
Thermoelectric power, metals 116—117
Thermoelectric power, semiconductors, solid electrolytes and insulators 118
Thermoelectric power, significance of 116—118
Thermoelectric refrigeration 126—127
Thermoelectric tests for junctions 61—62
Thermoelectric voltage determination 119—120
Thermoluminescence 295 313—315
Thermomagnetic effects 166—170
Thickness of films 279
Thin films, optical measurements 278—281 (see also Films)
Thomas, M. 29
Thomsen, S. M. 343 344 345 39
Thomson effect, definition 115
Thomson effect, measurement 125
Tinkham, M. 77 238 242
Tischer, F. J. 57
Tobisawa, S. 127
Tolansky, S. 279
Tomaschek, R. 293 300(1)
Tomboulian, D. H. 286 292
Tomlinson, H. 160
Torrey, H. C. 24 35 227 232 234
Torsion balance in ferromagnetic measurements 207——208
Torsion susceptibility balance 180
Tousey, R. 256
Townes, C. H. 236
Transient measurement of lifetime 101—104 107—109
Transimitted radiation, measurements on 262—263
Transition temperature 73—74
Trap distribution 313—315
Trapping centers 340
Trapping effects 94
Traveling detector 21—22
Tregellas — Williams, J. 308
Triboluminescence 295
Tripple, P, M. 353
Tuttle, W. N. 47
Tweet, A. G. 66
Tyler, W. W. 85 122 348 349
Ubbink, J. B. 240
Uchida, E. 128
Underwood, N. 131
Unz, M. 43
Urbaeh, F. 308 309
Valdes, L. B. 37 38 11 86 90 106 24 371
Valdes, P. 352
Van de Lindt, W. J 9
van Den Handel, J. 191
van der Breggen, J. C. 214
Van der Burgt, C. M. 212
van der Morel, L. C. 43
Van der Ziel, A. 38
Van Doorn, C. Z. 321 334
van Heerden, P. J. 79
van Lammeren, J. A. 156
van Roggen, A 311
van Rooshroeck, W. 93 95 48 99 106 61 358 359 7 360 369 372 20
van Santen, J. G. 315 344 355 33
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