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| Johnson K., Lark-Horovitz V.A. — Methods of Experimental Physics Solid State Physics (Volume 6/PartA) |
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Название: Methods of Experimental Physics Solid State Physics (Volume 6/PartA)
Авторы: Johnson K., Lark-Horovitz V.A.
Язык: 
Рубрика: Физика/
Статус предметного указателя: Готов указатель с номерами страниц
ed2k:
Год издания: 1964
Количество страниц: 466
Добавлена в каталог: 23.03.2008
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| Предметный указатель |
Okkerse, B. 369 371(24)
Olney, M.J. 152(71) 174
Olsen, K.M. 59 93
Olsen, L.O. 123 182
Optical determination of crystal orientation 160—163
Optical measurements at high pressures 430—432
Orientation etching, sample preparation 162
Ornstein, L.S. 247
Orowan, E. 309 311 313
Oster, G. 245
Otsuka, E. 356
Overhauser, A.W. 363
Overholser, L.G. 27
Owen, E.A. 237
Oxidation and reduction 24
Oxide film replica technique 179—180
Oxide glasses, composition and batch calculations 143—144
Oxide glasses, melting 144—146
Oxide glasses, procedures for making in laboratory 143—147
Oxide glasses, raw materials 143
Oxide glasses, Sample forming and annealing 146—147
Oxide glasses, sample inspection 147
Oxide glasses, supplementary procedure 147
Oxide glasses, viscosity-temperature data 145
O’Bryan, H.M. 123
O’Neill, H. 307 309(34)
p.d see “Parent distribution”
Pahl, W. 154(28) 173
Palmer, W. 363
Pankove, J.I. 64 68
Pankow, G. 348
Paramagnetism 18
Parent distribution 3
Parker, E.R. 317 321 340
Parkinson, D.H. 378
Parrish, W. 217 219 220 221
Particle size 241—244
Pashley, D.W. 348
Paterson, M.S. 243
Patrick, L. 411 417 429
Patterson method in X-ray diffraction 232—233
Patterson, A.L. 224 226 233 236
Paul, W. 430 437
Pauling, L. 236
Pearlman, N. 377 378
Pearson, C.E. 319
Pearson, G.L. 64 83 372
Pearson, J. 313
Peck, Y.G. 179
Pepinsky, R. 234 237
Peretti, E.A. 152(65) 174
Periodic heat flow 399—402
Perry, C.C. 292
Perry, E.S. 26
Peters, C.G. 307 308(37) 309(37)
Peterson, E.L. 436
Petrauskas, A.A. 90
Petretzky, P.B. 24
Pfann, W.G. 25 26 28 45 48 49(11) 50 51(11) 55 56 58 59 60 61 63 64 68(63) 69 71 93 97 98 107 163(128) 165(142) 171(128 135) 176 340
Pfeil, L.B. 118
Phase charges under high pressures 421—423
Phase problems in X-ray diffraction 231—234
Phillips, A.B. 84 85
Phillips, D.C. 225 238(61)
Photoelectric phenomena 20
Picard, R.G. 182 265 266(54) 271(54)
Pick, H. 131 291
Pickels, E.G. 26
Piezoelectric excitation of oscillation 305—306
Pigg, J.C. 361
Pinching, G.D. 28
Pinhole collimator 220
Pinhole transmission method 221
Pinner, R. 152(43) 173
Pinsker, Z.G. 246 248 257 258 264 274
Piper, W.W. 113
Pizzarello, F. 113
Plakhov, A.G. 183
Plastic replica technique 177—179
Plasticity of solids 309—321
Ploos van Amstel, J.J.A. 185
Pluecker, J. 129
Podbielniak, W. 22
Pohl, R.G. 47 95
Point projection microscope 185—186
Poisson ratio 297
Polanyi apparatus 318
Polanyi, M. 241 318
Polishing methods 151—153
Polishing methods, chemical 151
Polishing methods, electrolytic 151
Polishing methods, mechanical 151
Polishing, guide to literature 152
Polk, M.L. 25
Polling, J.J. 152(34) 158(34) 173
Polycrystalline materials, preferred orientation 240—241
Polycrystalline specimen diffraction pattern 276—278
Polygonization 339—340
Pomp, A. 318
Pond, R.B. 121 332
Pondrom, W.L. 302
Porod, G. 245
Portnoy, VV. 368
Potter, H.H. 152(35) 158(35) 173
Poulter window 431
Poulter, T.C. 430 431
Powder crystals, standard photographic methods 214—217
Powell, C.F. 132
Powell, R.W. 393
Prang, W. 290
Pray, H.A.H. 152(47) 173
Precipitation 22
PRECISION 2
Precision grinder 368—369
Preparation of laboratory glass samples 139—147
Pressure gage, secondary 415—417
Pressure generation 407—4li
Pressure measurement 414—417
Pressure system for 0-15000 bars 408—411
Pribil, R. 23
Price, W.J. 307
Prim, R, C. 45 47(19) 48(19) 62(19) 66 69(19) 70
Primakoff, H. 3 5(3)
Prince, E. 303
Prince, M.B. 83
Prins, J. 244
Prismatic dislocation 328—329
Purcell, E.M. 429 430
Purification by freezing methods 48—55
Purification of materials, case histories compounds 28
Purification of materials, case histories compounds, metals 27
Purification of materials, case histories compounds, semiconductors 28
Purification, general methods 21
Pursey, H. 296
Quackenbush, F.W. 26
Quarrell, A.G. 246 264 265 267(52)
Quarrington, J.E. 378
Quasi-hydrostatic arrangement for studying resistance 427
Quasistatic methods for anelasticity 304
Quimby, S.L. 91 299
Rachinger, W.A. 242
Radavich, J.F. 179 181
Radiation assay technique for diffusion study 369—371
Radiation damage 357—363
Radiation damage, parameters of 358
Raether, H. 261
Ramachandran, G.N. 218 243 303
Ramberg, E.G. 176 266
Ramsay, J.W. 24 27
Randall, R.F.Y. 152(64) 174
| Random powder diffraction patterns 267—277
Rands, R.D., Jr. 380
Rappaport, P. 362
Rate growing 67
Rate growing with melt back 67—68
Ratio of amorphous to crystalline material 245—246
Raub, E. 152(92) 175
Rauscher, W. 296
Read, T.A. 305 313 317 320
Read, W.T. 321 323 330 338 355
Reciprocal Bragg spacing 250
Reciprocal lattice 191—194 251—254
Recrystallization (solution) 23
Redman, J.K. 318
Rees, A.L.G. 257 261 264(52) 265 266(53) 267(53) 271(53)
Reflection microscope 183
Reflection of radiation from crystallographic planes 195—197
Refraction, effect on diffraction pattern 256—257
Rehn, I. 25
Reich, R. 25 70
Reiener, J.H. 265 266(54) 271(54)
Reiss, H. 57
Relaxation effects 295—296
Reliability, statement of 1
Remeika, J.P. 99
Remelting with additions 63—64
Renninger, Von M. 218
Replica technique 177—181
Resolved shear stress of single crystal 315
Resolving power in electron diffraction 271—272
Reynolds, D.C. 113
Reynolds, S.A. 31
Rice, C.N. 26
Rice, M.H. 298 436
Richards, T.W. 28
Riddiford, A.C. 40 45
Riley, D.P. 217 222 227 245
Riley, N.A. 298 419 423
Rinehart, J.S. 300 313
Rinn, H.W. 237
Ritland, H N. 218
Roberson, A.H. 149(10) 152(10) 172
Roberts, J.P. 321
Robertson, E.C. 412 426 434
Robertson, J.M. 210 224 236
Robertson, T.S. 311 417
Robertson, W.D. 164(137) 176
Robinson, A.E. 104
Robinson, B.W. 211
Robinson, C.S. 121
Robinson, D.W. 429
Roder, H.M. 393
Roderick, R.L. 307
Rodriques, A. 25
Roehm, F. 317 321
Roeser, W.P. 389
Roesner, O. 152(72) 174
Rogers, D. 229
Rogers, W.M. 393
Rollett, J.S. 9
Ronnebeck, H.R. 224
Roscoe, R. 93 316 317
Rose, A. 22
Rose, D.J. 186
Rosenhain, W. 118
Rosenhead, L. 12 13(19)
Rosenthal, D. 401
Rosi, F.D. 317
Ross, P.A. 206
Rotating arid oscillating crystal methods 206—208
Roth, H.P. 152(96 117) 175
Roth, L. 94
Roth, W. 307
Roth, W.L. 113
Rotherham, L.A. 313
Rough polishing see “Lapping”
Rouse, R.C. 45 71(15)
Rowland, P.R. 92 152(54) 174
Rubin, B. 71
Rubin, S. 38
Runcorn, S.K. 432
Ruska, E. 183
Russell, D.S. 25
Ruth, R.P. 116 133
Rutherford, J.L. 71
Rutter, J.W. 25 45 47 49(13) 55 71 88
Ruttmann, W. 183
Saby, J.S. 64 81
Sachs, D.C. 38
Saechs, K. 104
Sajin, N.P. 70
Salkovitz, E. 306
Samuelson, R.O. 25
Sandell, E.B. 23
Sandlimd, G.E. 307
Sato, H. 239
Satterly, J. 404
Sauter, E. 211
Sawyer, B. 59 64 88
Sawyer, R.A. 30 95
Sawyer, R.B. 396
Sayre, D.M. 234
Scaff, J.H. 58
Scanlon, W.W. 152(88) 165(88) 175
Scanning microscope 184
Scattering, Amplitude of diffracted wave train 188—189
Schaefer, V.J. 177
Schairer, J. 407
Scharowsky, E. 115
Schdanow, H.S. 242
Scheil, E. 45 55
Scherrer, P. 214
Scheuer, E. 45
Schiebold — Sauter method 211
Schiebold, E. 211
Schlechten, A.W. 27
Schlier, R.E. 154(29) 173 261(30 31) 262
Schmid, E. 117 118 149(8) 172 241 314 317 318
Schmidt, L. 204
Schmidt, P.W. 244
Schoen, A.H. 370
Schoening, F.R.L. 242
Schofield, F.H. 387 397(3)
Schomaker, V. 236 247
Schubnikow, L. 90
Schuettler, C.L. 26
Schulz, F. 308
Schulz, L.G. 241
Schwartz, C.M. 177
Schwartz, M. 81
Scott Blair, G.W. 319
Scott, E.M. 10
Scott, N.W. 127
Scott, R.B. 380 389
Scott, R.G. 179
Screw dislocations 323
Sears, G.W. 110 335
Sectioning method for diffusion study 366—368
Sedusky, H.J. 122
Seeger, A. 180 245 323
Seemann — Bohlin method 216
Seemann, H. 216 226
Segregation coefficient see “Distribution coefficient”
Seibel, R.D. 387
Seifert, R.L. 394
Seitz, F. 329 335 344 361 376
Semiconductors, apparatus for electron irradiation of 359
Semiconductors, definition 16
Semiconductors, intrinsic 17
Semmler-Alter, E. 183
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