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Àâòîðèçàöèÿ |
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Ïîèñê ïî óêàçàòåëÿì |
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Dally W.J., Poulton J.W. — Digital Systems Engineering (part 2) |
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Ïðåäìåòíûé óêàçàòåëü |
Dynamic Circuits, keepers 185 187
Dynamic Circuits, logic 186—190
Dynamic Circuits, refresh 185
Dynamic Latch 184—186
Edge connector 55—56
Elastomeric connectors 57—58
Electromagnetic field solvers 124—125 126
Electromagnetic interference (EMI) 288—289
Electrostatic discharge 548—558
Electrostatic discharge, failure mechanisms 550—552
Electrostatic discharge, failure mechanisms, oxide breakdown 550
Electrostatic discharge, failure mechanisms, thermal 551—552
Electrostatic discharge, human body model 549—550
Electrostatic discharge, protection 552—558
Electrostatic discharge, protection, dual diode 554—556
Electrostatic discharge, protection, field device 553—554
Electrostatic discharge, protection, guard rings 557—558
Electrostatic discharge, protection, latch up 554—556
Electrostatic discharge, protection, output driver 556—558
Electrostatic discharge, protection, power-supply shunt 554—555
Electrostatic discharge, protection, primary shunt 552—554
Electrostatic discharge, protection, punchthrough device 553—554
Electrostatic discharge, protection, secondary shunt 556
Electrostatic discharge, protection, series resistor 555—556
Electrostatic discharge, protection, thyristor shunt 555
Electrostatic discharge, protection, wiring 557—558
Energy-delay product 213—214
Error-correcting codes 349—350
Event encoding 400 411—415
Excitation equations 497—498
Exponential horn 181—182
Eye diagram 409—410 540—541
Fall time 401
False lock 631
Fiber optics 64—67
Finite-impulse-response (FIR) filter 364
Flexible circuit boards 53
Flexible printed-circuit board 42
Flicker noise 292
Flip-flop, charge sharing 588—589
Flip-flop, clock enable 580—581
Flip-flop, clock rise time 586—588
Flip-flop, differential 582
Flip-flop, double edge triggered 409 582—583
Flip-flop, dynamic charge leakage 584—585
Flip-flop, edge triggered 406—407 416 579—583
Flip-flop, failure mechanisms 583—589
Flip-flop, master-slave 408
Flip-flop, passgate 580
Flip-flop, race through 583—584
Flip-flop, RS-style 580
Flip-flop, supply noise immunity 585—586
Flip-flop, Svensson 581
Flip-flop, true single-phase 581
Flow table 492—493
Framing 377
Free-space optics 70—71
Frequency modulation 75
Frequency multiplier 613
Gain-bandwidth product 284
Gain-bandwidth product, CMOS Inverter 180—181
Gate capacitance 160—162
Gaussian noise 291 296—298
Gaussian noise, measurement 298
Gilbert cell 616
Guard rings 557—558
Gyrator 614—615
hazards 406
Heat equation 91
Hold time 185 407
Hysteresis 347—348
Impedance discontinuities, lumped model 90
Impedance, common-mode 109 110—111 201
Impedance, differential-mode 109 110—111 201
Impedance, lossless LC transmission line 92—93
Impedance, negative 202
Impedance, source 93—95
Impedance, transmission line 86—87
Impulse response 545—547
Incident wave 94
Incident-wave signalling 7
Inductance 84
Inductor, bond-wire 614—615
Input Race 493
Integrated-circuit, packages 30—39
Integrated-circuit, sockets 46
Integrated-circuit, sockets, zero-insertion-force 46
Integrated-circuit, wiring 29—30
Integrating amplifier 438—439 545
Inter-symbol interference 11 102—103 262 280—286
Inter-symbol interference, inertia] delay 282—285
Inter-symbol interference, reflections 281—282
Inter-symbol interference, resonant circuits 282
Interpolator 559—560 604—606
Interposer 46
Interposers 56—57
Isolation 111—112
Jitter 262 398—400 404 457
Jitter, definition 403
Johnson noise 291
Keepers 185
Keepers, use in dynamic gate 187
Laser diodes 63
Latch 408 418—423 574—579
Latch up 550 555
Latch, DCVSL 578—579
Latch, domino 188—189
Latch, dynamic 184—186
Latch, gate-isolated 185 575
Latch, single-phase 575—576
Latch, static 576—579
Latch, static noi, 'se margin 577
Latch, static, passgate 577
Latch, static, RS flip-flop 577—578
Latch, Svensson 186 575—576
Latch, writeability 578—579
launchers 138—139
LC Oscillator 613—615
Leaded chip carrier 33
Level shifters 603—604
light-emitting diodes (LEDs) 63
Linear regulators 231—233
Logic signalling 331 382—383
Logic, combinational 405—406
Logic, hazards 405
Logic, synchronous 406—407
Logical effort 175—176
Lone pulse problem 363—364
Loop filter 620—635
Loop filter, bang-bang control 633
Loop filter, charge pump 624—627
Loop filter, charge pump, voltage ripple 626—627
Loop filter, delay-locked loop 629—635
Loop filter, delay-locked loop, self-biased 630
Loop filter, digital control 633—635
Loop filter, digital control, deadband 634—635
Loop filter, RC 620—623
Loop filter, self-biased 627—629
Loop filter, switch-capacitor 630—631
Loop filter, turbo mode 632—633
Loss tangent 105
Lumped LRC wires 537
Make-before-break action 562
Manchester carry chain 169
Matched filter 546—547
Matched-delay circuits 499—502
Matching 601—602
Matching networks 144
Measurement 117—124 126—142
Measurement, crosstalk 131—134
| Measurement, discontinuities 134—139
Measurement, examples 126—142
Measurement, frequency-dependent attenuation 127—130
Measurement, network analyzer 122—124 128—129
Measurement, package parasitics 138—142
Measurement, practice 142
Measurement, time-domain reflectometer 117—121 128—129 131—139
Measurement, time-domain transmission 121 128
Mesochronous 402 463 473—474
Mesochronous, synchronizer 475—480
Metal migration 243
Metastability 468—472
Metastable state 469 577
Mezzanine card 48
Microstripline 83—84
Miller effect 89 179—180
Mixer 616
Mode coupling 109—110 202—203
Modulation 74—76
Modulation, amplitude modulation (AM) 74
Modulation, bi-phase 62
Modulation, code-division multiple access (CDMA) 75—76
Modulation, frequency modulation (FM) 74—75
Modulation, nn-off keying 62
Modulation, Optical 63
Modulation, phase modulation (PM) 74
Modulation, quadrature amplitude modulation (QAM) 75
Moore's law 12—14
MOSFET 149—159
MOSFET, body effect 155—156
MOSFET, channel-length modulation 154—155
MOSFET, CMOS gate 170—183
MOSFET, Complementary (CMOS) 154
MOSFET, depletion mode 158
MOSFET, device structure 150—151
MOSFET, dynamic circuits 184—191
MOSFET, enhancement mode 158
MOSFET, gate capacitance 160—161
MOSFET, I-V characteristics 151—158
MOSFET, junction capacitance 162
MOSFET, p-channel 152—153
MOSFET, parameter variation 158—159 288—290
MOSFET, parasitic circuit elements 159—163
MOSFET, parasitic resistance 162—163
MOSFET, pass gate 166
MOSFET, resistive region 152
MOSFET, resistors 203—204 516—519
MOSFET, saturation region 156—157
MOSFET, secondary breakdown 551 553—554 556
MOSFET, SPICE models 163—164
MOSFET, subthreshold current 157
MOSFET, switch networks 166—169
MOSFET, threshold voltage 151
MOSFET, transient response 173—175
MOSFET, transition region 152
MOSFET, typical parameters 158
MOSFET, velocity saturation 156
Mother board 48—49
Muller C-element 501
Multi-chip modules 36
Multi-level signalling 344—347
Multipath 76—77
Multiplexing transmitter, input multiplexing 538—539 563
Multiplexing transmitter, output multiplexing 537—539
N of M signalling 379—380
NAND gate, transient response 175—176
Network analyzer 122—124 128—129
Network analyzer, test set 122
NFET 149—150
Noise 10—12
Noise budget 11—12
Noise cancelling 12
Noise effective temperture 72—73
Noise margin, II 12 170—171 347 349
Noise, alpha particles 285—288
Noise, alpha particles, critical charge 287
Noise, bit-error rate 297
Noise, budgets 292—296
Noise, crosstalk 262 267—280
Noise, crosstalk, 1/f noise 292
Noise, crosstalk, capacitive 268—271
Noise, crosstalk, power supply 280
Noise, crosstalk, signal return 278—280
Noise, crosstalk, transmission line 272—273 see
Noise, electromagnetic interference 288—289
Noise, flicker noise 292
Noise, Gaussian 296—298
Noise, Gaussian, measurement 298
Noise, immunity 308—309
Noise, immunity, inertial delay 282—283
Noise, immunity, inter-symbol interference 262 280—285
Noise, immunity, reflections 281—282
Noise, Johnson noise 291
Noise, margin 308—311 347 349
Noise, models 566—567
Noise, offsets 262
Noise, power supply 262 263—267 282 322—325 343—344 600—602
Noise, power supply, differential 266—267
Noise, power supply, single supply 264—266
Noise, power supply, typical values 264—265
Noise, process variation 288—291
Noise, proportional 260—261
Noise, resonant circuits 282
Noise, shot noise 291—292
Noise, signal induced 260—261
noise, signal-to-noise ratio 296—297
Noise, sources 261—263
Noise, statistical analysis 292 297
Noise, thermal noise 291
Noise, timing 262
Noise, worst-case analysis 292
Non-re turn-to-zero signalling 412
NOR gate, transient response 175—176
Offset voltage 318
On-off-keying 63
Open drain 526—528
Open-loop timing 396—397
optical amplifiers 70
Optical communication 62—71
Optical communication, fiber 64—67
Optical communication, free-space 70—71
Optical communication, modulation 63
Optical communication, multiplexing 65—69
Optical communication, receivers 67—68
Optical communication, time-division multiplexing 69—70
Optical communication, transmitters 63—64
Optical communication, wavelength-division multiplexing 68—69
Optical connectors 66—67
optical fiber 64—67
Optical fiber, multi-mode 65—66
Optical fiber, single-mode 65—66
Optical isolation 112—113
Optocouplers 113
Oscillator, crystal 610—613
Oscillator, LC 613—615
Oscillator, voltage-controlled 442—443 608—615 see
Output impedance 317
Oversampling receiver 447—449
Package, ball-grid array 34—35
Package, dual-inline 32
Package, electrical model 37—39
Package, leaded-chip carrier 32—33
Package, pin-grid array 32—33
Package, quad flat pack 33
Package, surface-mount 32—35 44—46
Package, through-hole 32—33
Packages, model 563—564
packaging 26—77
Packaging, area bonding 242—243
Packaging, integrated-circuit 30—39
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