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Schrimpf R.D., Fleetwood D.M. — Radiation effects and soft errors in integrated circuits and electronic devices
Schrimpf R.D., Fleetwood D.M. — Radiation effects and soft errors in integrated circuits and electronic devices

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Название: Radiation effects and soft errors in integrated circuits and electronic devices

Авторы: Schrimpf R.D., Fleetwood D.M.

Аннотация:

Electronic devices in space, defense, medical, and power systems may
be exposed to various types of radiation, including high-energy photons
and energetic particles (electrons, protons, neutrons, and ions). The
radiation may produce effects in the electronics ranging from temporary
loss of data to catastrophic failure. The specific effects produced depend
strongly on the specific technology and the radiation environment. Most
systems designed for use in radiation environments are designed
conservatively using electronic parts that are at least several generations
behind the current state of the art. However, the demand for higher
performance and reduced time from design to deployment has increased
the pressure to use advanced technologies. The effects of radiation in some
advanced technologies are poorly understood, or in some cases,
completely unknown. In addition, highly scaled devices may be sensitive
to the naturally occurring radiation at the earth's surface, even though the
atmosphere provides significant protection.


Язык: en

Рубрика: Технология/

Статус предметного указателя: Неизвестно

ed2k: ed2k stats

Год издания: 2004

Количество страниц: 339

Добавлена в каталог: 21.03.2011

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