Volume II includes overviews on sensor technology based on SPM probes, high
harmonic dynamic force microscopy, scanning ion conduction microscopy, spin
polarized STM, dynamic force microscopy and spectroscopy, quantitative nanomechanical
measurements in biology, scanning micro deformation microscopy, electrostatic
force and force gradient microscopy and nearfield optical microscopy. This
volume also includes a contribution on nearfield probe methods such as the scanning
focus ion beam technique which is an extremely valuable tool for nanofabrication
including scanning probes.