Chen L.F., Ong C.K., Neo C.P. — Microwave Electronics: Measurement and Materials Characterisation
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Название: Microwave Electronics: Measurement and Materials Characterisation
Авторы: Chen L.F., Ong C.K., Neo C.P.
Аннотация:
The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems.
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