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Clarke L.J. Ч Surface crystallography: an introduction to low energy electron diffraction
Clarke L.J. Ч Surface crystallography: an introduction to low energy electron diffraction

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Ќазвание: Surface crystallography: an introduction to low energy electron diffraction

јвтор: Clarke L.J.

язык: en

–убрика: ‘изика/‘изика твЄрдого тела/ѕриложени€/

—татус предметного указател€: √отов указатель с номерами страниц

ed2k: ed2k stats

√од издани€: 1985

 оличество страниц: 329

ƒобавлена в каталог: 15.08.2005

ќперации: ѕоложить на полку | —копировать ссылку дл€ форума | —копировать ID
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ѕредметный указатель
$X\alpha$ potential      124 126
$\alpha$ exchange      see $X\alpha$ potential
$\gamma$-plot      see Wulff construction
Angle-resolved Auger emission spectroscopy (ARAES)      287Ч289
Angle-resolved ultraviolet photoemission spectroscopy (ARUPS)      91 287Ч289
Angle-resolved X-ray photoemission spectroscopy (ARXPS)      287Ч289
Angular distribution of ions produced by electron stimulation (ESDIAD)      300Ч302
Angular-momentum representation      148
Anisotropic thermal vibrations      198Ч201
Asymptotic cluster model      see cluster model
Atom scattering      146 297Ч300
Auger electron spectroscopy (AES)      3 4 43 75 97 108 110 155 283
Band structure      154 156
Beam area      13 96 115
Bloch-wave method      156
Bootstrap acceleration method      167Ч168
Born approximation      116
Born Ч Oppenheimer approximation      184
Bound state      139Ч140 142
Bragg energies (peaks)      182 186Ч188 193 194Ч196 214 224Ч225 258
Bragg Ч Williams model      236Ч237
Bravais lattice      see lattice
CAVLEED      146 151 158 170Ч171 181 246Ч247
Centred overlayer structures      51Ч53
Chain method      169Ч170 285
Change      181 246Ч247
Channel-plate electron multiplier (channeltron)      94
Charge density waves      234
Cleavage plane      45 47 49
Cluster model      177Ч179
Coherence length      5 99Ч100 204 218
Coincidence structures      see incommensurate overlayers
Combined space method (CSM)      31 168Ч171 174 176 181 186 246Ч247
Correlation (in thermal vibrations)      178 206Ч208
Correlation (within disordered surfaces)      180
Coulomb interaction      116Ч119 123 286
Crystal structures and diffraction patterns      311Ч312
Crystal structures and diffraction patterns, body-centred cubic (bcc)      33 35
Crystal structures and diffraction patterns, CsCl      46 48
Crystal structures and diffraction patterns, diamond      33 43
Crystal structures and diffraction patterns, face-centred cubic (fee)      33 39 41
Crystal structures and diffraction patterns, hexagonal close-packed (hep)      33 43
Crystal structures and diffraction patterns, NaCl      45Ч48
Crystal structures and diffraction patterns, simple cubic (sc)      33 35
Crystal structures and diffraction patterns, wurzite      48Ч49
Crystal structures and diffraction patterns, zinc-blende      48
Current image diffraction (OLD)      303Ч304
Cylindrical mirror analyser (CMA)      see energy analysers
Darwin term      128
Data averaging (reduction)      1 90 209 239Ч243 286
Debye temperature      185 190Ч199 201 204Ч205 247 266 275
Debye Ч Waller factor      182 184 188 190 193 201 205Ч206 236 277 300 311Ч312
defects      90 182 215Ч218 226
Deviation (d-) factor      248 261
Diffraction beam labelling      62Ч64
Diffractometers      91
Diffractometers, flat, transmissive screen      93. see also MEMLEED
Diffractometers, hemispherical, transmissive screen      82 91Ч93
Diffractometers, high-resolution      97
Diffractometers, magnetic deflection      93.
Diffractometers, standard      74Ч75
Dirac equation      127
Discrepancy factor      see deviation factor
Disordered surfaces      47 180 237Ч239 292
domains      13Ч14 90 99Ч100 204 230Ч234 283
Double-diffraction      24 233 see
Dynamical methods      157 209
Electron energy      2
electron guns      73 79Ч84
Electron stimulated desorption (ESD)      90 93Ч94 286
Electron wavelength      2
Energy analysers, cylindrical mirror (CMA)      4 283
Energy analysers, cylindrical sector      292
Energy analysers, hemispherical      292
Energy analysers, retarding field (RFA)      4
Energy selection      75
Energy-loss processes      98 100 144
Epitaxial growth      4 22 286 296
Equivalent beam averaging      244Ч247 254
Evanescent beams      151
Ewald construction (sphere)      8Ч9 218 220 223 226Ч221 230
Exact methods      156 162 164 168 247
Extended X-ray absorption fine structure (EXAFS)      178 287 289Ч291
Fano effect      114
Faraday cup      94 103 107 114 221 301
Fermi energy (level)      2 124Ч125 143Ч144 155
Field-ion microscopy (FIM)      302Ч303
Fourier transform (analysis)      100 115 222 289
Grid (in electron gun)      155
Grids (optics system)      3Ч4 74Ч75 78Ч79 97
Grueneisen relation      188
Hall probe      101
Hartree Ч Fock method      117 123 125Ч127
Hausdorff distance      255
Helmholtz coils      102Ч103
High-energy electron diffraction      1 82 see
High-energy ion scattering (HEIS)      206 294Ч296
High-resolution electron energy loss spectroscopy (HREELS)      98 204 291Ч292
I(g) method      172 225 243 248 258Ч265 267
Imaginary potential (absorptive)      252 262 see
Impurities      182 244
Incident beam angle, determination of      90 105Ч108 245
Incident beam angle, notation      62Ч64
Incommensurate overlayers      22 24 171Ч172 232
Inelastic damping      156 158 160 176Ч178 see
Inelastic low-energy electron diffraction (ILEED)      98
Infra-red spectroscopy (IR)      204 292Ч294
Inner potential      1 143Ч147 209 214 221 225 247 262Ч263 266Ч268 275
Instrument response function      99Ч100 222
Ion scattering methods (ISS)      45 205Ч206 303 see
Ion-core scattering      118 129Ч131 148Ч149 173 175 196 209 211Ч212 215 288
Irrationally-related lattices      see incommensurate overlayers
Ising model      236Ч237
Islands      13 90 99 108Ч109 232
Iterative methods      161Ч170
k-space representation      149 153 164 169Ч170 174
Kinematical methods      157 159 172 180 182 187 192 196 198Ч199 209Ч215 216 239 242 258
Kohn Ч Sham Ч Gaspar (KSG) approximation      124 126
l-space representation      148 153 157 166 169Ч170 174
Labelling of diffraction beams      62Ч64
Lateral shifts (in surface atomic layer)      270Ч271 296
Lattices, Bravais lattices      64
Lattices, lattice points      5 6
Lattices, lattice rods      8
Lattices, lattice vectors      6 7 31
Lattices, real space lattice      7
Lattices, reciprocal lattice vectors      6
Lattices, reciprocal space      7
Laue condition      6 8 212 220
Laue condition, Laue nets      29 30
Laue condition, Laue patterns      33
Layer      157
Layer-doubling method      162Ч164 166 168 178 182
Layer-KKR method      156Ч157 162 164
Legendre functions      130
Levinson's theorem      136 140
Levy distance      255
Lindemann;s melting criterion      192
Low-energy ion scattering (LEIS)      206 294Ч296
Low-energy positron diffraction (LEPD)      283Ч285
Macroscopic surface plane      53Ч54 57 218 222
Magnetic field cancellation or shielding      101 see
Magnetic surface structures      48 112 173 283
Mean free path      73 101 155 179 209Ч210 283 290 see
Measurement of intensities      76
Measurement of intensities by computerized video camera      78 88 95
Measurement of intensities by Faraday cup      2 74 76Ч78 94
Measurement of intensities by photography      78 95 262
Measurement of intensities by spot photometer      76Ч78 95
Measurement of intensities of primary beam current      76
Medium energy electron diffraction (MEED)      170 195 242 258 284Ч286
Medium energy ion scattering (MEIS)      206 289 294Ч296
MEMLEED      82 84 95Ч97 115
Micro-LEED, influence of high-energy source      84 see
Microfacet      59Ч62
Miller indices      33 41 54 56Ч62
Molecular adsorption techniques      90 174Ч179
Momentum representation      149 see
Mort detector      88 111Ч114
Mu metal      74 102
Muffin-tin approximation      117Ч122 129 247 see
Muffin-tin radius      142 170
Muffin-tin zero      118 132 143 145
MUFPOT      136
Nearly-free electron (NFE) materials      127
Neel temperature      112
Negative electron affinity (NEA) source      114Ч115
Notation, adsorbate structures      52
Notation, plane surface structures (Wood's notation)      50 53
Notation, stepped surface structures      57Ч62
Nth order interlayer scattering method (NIS)      161
Optical potential      see inner potential
Order-disorder effects      204 216 234Ч239
Overall f-factor (R)      251Ч252
Overlayer coverages by LEED      108Ч110
Overlayer coverages by radioactive tracer methods      110 see
p-waves, d-waves and f-waves      142
Partial waves      132 149 156 288 see
Pauli principle      117
Peak width      100 145 237 252
Pendry r-factor      252Ч254 256 263 264Ч265 267
Penetration depth      2 155Ч156 158 193
Perturbation schemes      153 159Ч161 168 247 see
Phase shifts      131Ч143 160 169 210Ч211 216 218 284Ч285
Phase shifts, relationship with potentials      129
Phase shifts, relativistic      128Ч129 174 see
Phase transitions      43
Phonon scattering      183
Phonons      2 144 182 191 205 291
photoemission      see angular-resolved photdemission
Photoionization      114
Plane      157
Plane-wave representation      149 see
Plasmon threshold      144Ч145 155Ч156 291
Plasmons      2 144 291
Poisson's equation      118
Polar surfaces (anionic, cationic species)      48Ч49
Positive electron affinity (PEA) sources      115
Potentials, exchange and correlation terms      112Ч127 173 267Ч268 283
Potentials, ion-core      117Ч118
Potentials, relativistic      127Ч129 173 see inner
Primitive unit cell      see unit cell
Propagating beams      7 18 151 162 169
R-valves      248 258 262 265 268 275 277
Radioactive tracers (for coverage evaluation)      110
Ramsauer Ч Townsend effect      133
Reciprocal lattice, correspondence with diffraction pattern      8 10Ч11
Reciprocal lattice, matrix relationship      11Ч13
Reciprocal lattice, reciprocal space      50 159 see
Reconstructed surfaces      4 10 11 45 48 171 269Ч270 281 296
Reflection high-energy electron diffraction (RHEED)      170 286
Refraction      143 146Ч147 210 212
Registery      13 31 39
Registery shift      18 37
Relative beam intensities      see I(g) method
Relativistic effects      see spin-polarization
Reliability (of structural determinations)      see reliability factors and reproducibility
Reliability factors (r-factors)      248Ч258 260 262Ч271 275
Reliability factors (r-factors), double reliability factor      254 see Pendry
Renormalized forward scattering (RFS)      161Ч162 164Ч166 167Ч168 172 182
Reproducibility      244
Resolution of a diffractometer      221 244 283
Resolution of a diffractometer, angular resolution      79 84 99Ч101
Resolution of a diffractometer, energy resolution      4 13 79 84 97Ч101 204 291
Resolution of crystal structures      175
Resolving power      see resolution
Retarding field analyser (RFA)      see energy analysers
Reverse scattering perturbation (RSP)      161Ч162 166Ч167 168 176
Riccati Ч Bessel function      142
Rotation diagrams      240 258
Rumpling      47 147 157 171
Rutherford backscattering (RBS)      see high energy ion scattering
S-matrix      131
s-wave bound state      see bound state
s-waves      133 139Ч141 156
Sample manipulation (by goniometer)      84Ч88
Sample preparation      84
Satellite beams      23 25 232
Scanning tunnelling microscopy (STM)      303
Scattering cross-section      133 139 179
Schroedinger equation      127 129 136
Screen (phosphorescent or fluorescent)      74Ч75 see
Secondary ion mass spectroscopy (SIMS)      300 302
Shadowing of screen      78 84 91
Slater approximation      124Ч125 127
Space-group symmetry      see symmetry
Space-groups      66Ч68
Spherical Bassel differential equation      130 136
Spherical Bessel function      137Ч138 142 149
Spherical Hankel function      130 136
Spherical Neumann function      137Ч138
Spherical waves      148 .
Spin-polarized LEED (SPLEED)      88 110Ч115 173Ч174 283
Spin-polarized LEED (SPLEED), double-diffraction      112Ч114
Spin-polarized LEED (SPLEED), r-matrices      133Ч136 see
Spin-polarized LEED (SPLEED), spin interactions      127 173
Spin-polarized LEED (SPLEED), spin-orbit coupling      128
Spot photometer      see measurement of intensities
sputtering      294
Stars      see symmetry
Step structures      34 45 53Ч62 182 209 218Ч230 283
Step structures, cleavage plane steps      45
Step structures, facets      54Ч57 218 283 286 302
Step structures, notation      57 59Ч62
Step structures, vicinal surfaces      34 57Ч59
Structural symmetry      17 26Ч33 244Ч247 see
Subplane      157 159
Surface defects      see defects
Surface free energy      55 189 229
Surface potential barrier      91 145Ч147 210 213 258
Surface resonances      91 97Ч98
Surface thermal expansion      187Ч188
Symmetry, beam stars      26 28Ч29 181
Symmetry, glide-reflection symmetry      64 68Ч72 286
Symmetry, line symmetry      64
Symmetry, mirror-reflection symmetry      64
Symmetry, point symmetry      64
Symmetry, rotational symmetry      24 49 65
Synchrotron      288 290Ч291
Systematic beam absences      51Ч52 68Ч72 234
t-matrices      129 132Ч135 158 160 173 180 182 196Ч197 199 212
T-matrix method (Beeby's)      156Ч158 180
Telephotometer      see spot photometer
Thermal diffuse scattering (TDS)      190 197 253
Thermal vibrations      1 79 144 149 172 177Ч178 182Ч208 212 235Ч236 283
Transfer width      99Ч100
Two-atom per unit cell model      170
Underlayers      4
Unit cell      6 33
Unit cell, primitive unit cell      6 50
Unit cell, van der Waals forces      297
Variable phase approach      142
Vicinal surfaces      see step structures
Wave vectors      7
Wehnalt      80
Werizel Ч Kramers Ч Brillouin (WKB) approximation      126
Wigner Ч Seitz cell      118 120
Wood's notation      50Ч53
work function      143 263 311Ч312 see
Wulff construction      55Ч56
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