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Название: Synthetic Polymeric Membrances: Characterization by Atomic Force Microscopy
Авторы: Khulbe K.C., Feng C.Y., Matsuura T.
This book concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM). AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. The development of membranes for improved performance depends on the exact knowledge of the morphology of a thin selective layer that exists at the surface of the membrane. The control of the morphology of the selective layer is crucial for the design of synthetic polymeric membranes. With a relatively short history of twenty–five years, AFM has firmly established its position as a means of characterizing the membrane surface.
Each chapter includes information on the basic principles, commercial applications, an overview of current research and guidelines for future research. Each also includes a summary and comprehensive list of references. The book covers all aspects of AFM studies on the characterization of synthetic polymeric membranes.
This book is well–suited for academic researchers who are investigating synthetic membranes, as well as R&D staff who wish to improve and control the quality of synthetic membranes for various purposes, and is also of interest to a wider range of readers, as synthetic membranes are now considered to be one of the most important tools in the areas of seawater desalination, waste–water treatment, water production, food processing, treatment of pharmaceutical products, air and water purification, separation of chemical and petrochemical products, drug release and other biomedical applications.