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| Guinier A., Mauguin C., Kathleen F.R. — X-Ray Crystallographic Technology |
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| Ïðåäìåòíûé óêàçàòåëü |
Absent reflections 64 75 107 147 198 208 225
Absolute intensities 73 126 172 176 233 255
Absorption coefficients 8 9
Absorption coefficients, ccuracy of spacing measurement 116 211
Absorption coefficients, discontinuities in film 20 180
Absorption coefficients, edges 11 297 298 299
Absorption coefficients, factor 118—124 145 173 207 256
Absorption coefficients, linear coefficient of 9
Absorption coefficients, lkali halides 44 56 62 76 106 129 138 147 156 158 160
Absorption coefficients, mass coefficient of 9—11 297
Absorption coefficients, X-ray 8 11 14
Alloys 207 210—216 225 230 248—249 266
Alpha doublet-resolution 111 130 171 232 244
American Society for Testing Materials: Index 207
Amorphous solids vii 43 176 250—259 282—284
Analysis by X-ray crystallography 203 211—216 225—230
Analysis by X-ray crystallography, qualitative 205—211
Analysis by X-ray crystallography, quantitative 211—216
Angles between planes 183
Anisotrophy 48
Annular zones on Laue photographs 180
Anomalous scattering factor 16
Anticathode 2 3 5 27 28 31
Applications of X-ray analysis, J. 75—269
Asterism 192 193 231
Atomic number 4 16
Atomic number, radius 86
Atomic number, scattering factor 15 16 225 250 274 296
Avogadro's number 56 57 86 214
Axial ratio 78—81 86 107
Back-reflection photography 103 104 186—190 211—224 246
Bibliography 327
Body-centred cubic lattice 76
Bragg law 50 51—53 56 300—320
Bragg law, spectrometer 147 233
Bravais lattices 74—85
Bunn charcs 208
Calcite 208
Calibration 20 22 106 171 217 218
Cameras, adjustment of 97—100 134 135 170 171
Cameras, focussing 102—104 167
Cameras, powder 91 105
Cathode 31
CeUulose fibre pattern 195 196 259
CeUulose fibre pattern, low angle scattering 266 267
Characteristic temperature 240 241
Characteristic temperature, X-ray spectrum 4—7
Chemical analysis by X-rays 203
Choice of apparatus 41 232 251 261
Choice of apparatus, wavelength 4 5 12 96 204 232 252 261
Cleavage 47
Close-packed arrangements 75 79 8
Coherent scattering 14
Cold work 179 244—247
Collimator 92 95 99
Compton effect 8 16—18 96 232 255
Continuous X-ray spectrum 2—4 7 8 96—97 148 157—158
Control equipment 40
Control equipment of temperature 219
Cooling of anticathode 33
Counters for X-rays 26 104—105
Crystal base 44 45 66 225
Crystal base, classes 49
Crystal base, density 86
Crystal base, imperfections of 69 192—194 231—249
Crystal base, lattices 43 74—85 225—226 248
Crystal base, orientation 181—192
Crystal base, structure determination, ix 55 87 225—230
Crystal base, structure of common substances 290— 295
Crystal base, symmetry 48—49
Crystal base, systems 48—49
Crystal base, texture 43 69 89 129 176—202
Crystalline state 42—43 176
Crystallite size and shape 176—180 235- 239
Crystallization 179
Crystallographic data for common substances 290—295
Cubic axes 74
Cubic axes, lattices 47 74—77 106
Cubic axes, system 49 74
Cubic axes, unit cell 44 74
Curved crystal monochromators 161—165
Debye — Scherrer method 73 90—130 157 161 280—282
Debye-temperature factor 73 239—240 280
Defect structure 216
Demountable tubes 29—36
density 86 209 214—216 290—295
Descartes laws of reflection 50
Determination of crystal structure 87— 88 225—230
Diameter of atoms and ions 86
diamond 77 107
Diatropic spots 196
Differential filtration 13
Diffraction angle 51 90
Diffraction angle by a crystal 53 59 275
Diffraction angle by a free electron 271
Diffraction angle by a lattice 50—57
Diffraction angle by a row of points 133 248
Diffraction of X-rays 1 14—15
Diffuse scattering 232—235 242
Distortion 93 187 192—193 216—224
Distribution function 254—258
Divergent-beam techniques 101 161
Eccentricity 113
Elastic constants 217 243
Electric generators 37
Electrometer 23—24
Electrometer, valve 24—25
Electron focussing cup 32
Electronic lens 32
Elements, crystallographic data for the 290—295
Energy of X-rays 1 2 3 7 8
Ewald's construction 61—66 87 131 132 139—142 152 233 242 247
Excitation potential 5 6
Exposure times 126 145 146 160 173 174 180 235 252 262
Extinction, primary 73 146 231
Extinction, secondary 73 147 231
Extrapolation 114 115
Face-centred cubic lattice 75 81
Faults of periodicity 247—248
Fibre patterns 194 248
Filament tubes 27 32
Film emulsions 18—19
Film emulsions, mounting 98
Film emulsions, sensitivity 19—20
Film emulsions, shrinkage 112
Filters for X-rays 12—14 96
Fingerprint method 203 205—211
Fluorescent radiation 11—12 96 205
Fluorescent radiation, screens 18 19
Focus of X-ray tubes 31 32 33 92 163
Focussing cameras 101—103 167 223 262
Focussing cameras, cup 27 32
Focussing cameras, monochromators 161 165
Focussing cameras, technique 101—104 105 166 223
Fogging of diffraction patterns 95—97 171 174 187 209 211 234
Fourier synthesis 87
Free electrons, scattering by 15
Frequency of X-ravs 3 4 5
Gas tube 27 35—36
Gas tube, scattering by 249 250—251
Geiger — Muller counters 26 104—105 261
Generation of X-rays 2 5 37—41
Glass-metal seals 27
Gnomonic projection 152—157
Gnomonic projection, ruler 155
Grain size 118 129 177—180
Grinding, effect of 93 146
Harmonics in X-ray beam 160 172
Hexagonal close-packing 79
Hexagonal close-packing, setting of rhombohedral lattice 80—82
| Hexagonal close-packing, system 49 78
High angle diffraction camera 103—104
High polymers 176 259
High temperature powder camera 100
Hull charts 108—110 208
Hull charts, method 90—91
Identification by X-rays 203 205 252 259
Identity period 133 226
Imperfection of crystals 146 231—249
Impurities 175
Incoherent scattering 16—18
Indexing of photographs 106—110 135- 142 152—157 181
Intensifying screens 18
Intensity of Debye — Scherrer lines 20 116—127 229 232
Intensity of Laue spots 4 157
Intensity of scattered radiation 15
Intensity of spectrum 3 6—7
Intensity, absolute 73 126 172 177 233 255
Intensity, curve 21 70 71 116 117 254 257 264
Intensity, eye estimation of 116 147 206 211 221
Intensity, formulae 15 71—73 117 122—127 144 270
Intensity, measurement 2 26 116 147 171— 173 211 221 229 233 256
Interatomic distances 86
International Tables for the Determination of Crystal Structures xi 121
Interplanar spacings 46 56 59 74—85 300—303
Interstitial alloys 214
Ionization by X-rays 22
Ionization by X-rays, chamber 22—23 25 70 147 191 233
Ionization by X-rays, currents 24
Ionization by X-rays, gauge 34
Ionization spectrometer 147 233
K absorption edges 10—14
K absorption edges, radiations 4—8
Kenotron 39
L absorption edges 10—12
L absorption edges, radiations 4 5 8
Large specimens 101 170
Lattice constant 56 63 110—116
Lattice constant, determination 87 106
Lattice constant, planes 46—47 300—303
Lattice constant, points 43
Lattice constant, rows 45 225 248
Lattice constant, theory 43
Laue method 4 42 131 148—159 180- 190 234
Layer lines 133—142
Lindemann electrometer 23
Lindemann electrometer, glass 28 94
Line broadening 102 113 130 173 174 179 231—233 235—239
Line broadening, intensity 116—127
Liquids, scattering by 250—258
Low-angle scattering 169 173 251 260—269 284—286
Low-temperature methods 100—101
Measuiement of intensity 20—26 116 147 171—173 211 221 229 233 256
Measuiement of intensity, position of diffraction 20 21 105 106 171
Measuiement of intensity, strain 216—224
Mechanical deformation 216—224 244- 247
Metal bellows 33
Metals 131 134 179 181 194 196—199 212—224 225—230 246-249
Microphotometry 20 22 211 229 254
Miller indices 46 78
Mixed crystals 207 248—249
Mixtures of crystals 206—211
Molecular weight 209 265 269
Monochromatic radiation 7 72 160—174 209
Monochromators 72—73 160—166 234
Monochromators, adjustment of 165
Monochromators, use of 166—174 209 211 232 234 248 251 258 261
Monoclinic system 49 84
Mosaic crystals 69—73 231
Moving film methods 143
Multiplicity factor 74 75 117 118 124 300—303
Nature of x-rays 1 42
Number of atoms in unit celt 86—87
Ordered and disordered structures 225— 230 249
Orientation by pole figures 199—201
Orientation by pole figures of complex crystal 198
Orientation by pole figures of lattice planes of deformed crystal 192
Orientation by pole figures oi crystals 181—192 259 265
Orientation by pole figures with preferred plane 198 259
Orthorhombic system 49 83
Oscillating crystal method, . 141—142 190 210 234
Output of X-ray tube 2
Parameter measurement 110
Parasitic radiation 11 26 93 95—97 110 168—169 234
Particle size 69 235—239 26
Phase of diffracted wave 51 235
Philips' gauge 34
photoelectric effect 8 10
Photographic blackening 21
Photographic blackening, measurements 20 21 22
Photographic blackening, methods 18—22
Photometry 20—22
Photons, X-ray 1 3 5 8 10 17
Physiological action of X-rays 26
Piezo-electric quartz plates 191
Polarization of X-rays 1 72—73 172
Pole figures 199—2 01
Powder cameras, high temperature 100
Powder cameras, high temperature, low temperature 100
Powder cameras, high temperature, method 99—130 205—214 280-282
Precision measurements 110 116 211
Precision measurements of orientation 191
Preferred orientation 118 130 194
Preparation of specimens 93—95
Primary extinction 73 146
Primitive triplet 44
Processing of X-ray films 19
Pumping equipment 30
Quartz crystal monochromator 161—166
Quartz crystal monochromator, plate, orientation of 181
Radiography *x 28
Reciprocal lattice 57 66 74—87 132 136
Recrystallization of metals 244
Rectification 39
Reflecting power 69—74 117
Reflection of x-rays 1 50
Refractive index 1
Rhombohedral system 49 80
Rocksalt 44 56 106 129 147
Rolled metal sheet 198—201 244—245
Rotating anode tube 36
Rotating anode tube, crystal method 53 131—148 157 173 209 210
Safety devices 41
Scattering of X-rays 1 8 10 14—18 233—234 241—242
Sealed X-ray tubes 27—28 204
Sealing compound 29
Secondary extinction 73 147
Secondary extinction, radiation 11 95—96 148
Secondary extinction, scattering 95 148 168—169
Seeman — Bohlin camera 102—104 167 168
Selective reflection 51
Self-rectification 38
Short wavelength limit 3 161 180 193
Single crystal—intensity formula 144 274—280
Single crystal—intensity formula, methods 131—159 209 234—235
Small-angle scattering 169 173 251 260—269 284—286
Solid solution 211—216 225—230 248-249
Solubility, limit of 213
Sources of X-rays 1—2
Specimen, centering of 97—98 135 262
Specimen, preparation 89 93 95 120—122 170 198 252
Specimen, size and shape 90 118 120 124 131 146 252 262
Specimen, support 94—95 97 134—135 252
Sphere of reflection 61—62 278
Stereographic net 182—186 200
Stereographic net, projection 182 199—201
Stereographic net, ruler 183
Strain in metals 216—224
Structure amplitude 127—129
Structure amplitude, factor 67 68 72—84 225—228 280
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