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Guinier A., Mauguin C., Kathleen F.R. — X-Ray Crystallographic Technology
Guinier A., Mauguin C., Kathleen F.R. — X-Ray Crystallographic Technology



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Íàçâàíèå: X-Ray Crystallographic Technology

Àâòîðû: Guinier A., Mauguin C., Kathleen F.R.

Àííîòàöèÿ:

X-RAY crystallography, the object of which is the study of-crystalline substances by means of X-rays, is a new branch of science which originated in 1912, when von Laue carried out his celebrated experiments on the diffraction of X-rays by crystalline gJ.'atings. It has developed especially under the influence of the Braggs, father and son, and of their chool,
followed rapidly by many other research workers.


ßçûê: en

Ðóáðèêà: Ôèçèêà/

Ñòàòóñ ïðåäìåòíîãî óêàçàòåëÿ: Ãîòîâ óêàçàòåëü ñ íîìåðàìè ñòðàíèö

ed2k: ed2k stats

Èçäàíèå: 1st edition

Ãîä èçäàíèÿ: 1952

Êîëè÷åñòâî ñòðàíèö: 330

Äîáàâëåíà â êàòàëîã: 16.08.2009

Îïåðàöèè: Ïîëîæèòü íà ïîëêó | Ñêîïèðîâàòü ññûëêó äëÿ ôîðóìà | Ñêîïèðîâàòü ID
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Ïðåäìåòíûé óêàçàòåëü
Absent reflections      64 75 107 147 198 208 225
Absolute intensities      73 126 172 176 233 255
Absorption coefficients      8 9
Absorption coefficients, ccuracy of spacing measurement      116 211
Absorption coefficients, discontinuities in film      20 180
Absorption coefficients, edges      11 297 298 299
Absorption coefficients, factor      118—124 145 173 207 256
Absorption coefficients, linear coefficient of      9
Absorption coefficients, lkali halides      44 56 62 76 106 129 138 147 156 158 160
Absorption coefficients, mass coefficient of      9—11 297
Absorption coefficients, X-ray      8 11 14
Alloys      207 210—216 225 230 248—249 266
Alpha doublet-resolution      111 130 171 232 244
American Society for Testing Materials: Index      207
Amorphous solids      vii 43 176 250—259 282—284
Analysis by X-ray crystallography      203 211—216 225—230
Analysis by X-ray crystallography, qualitative      205—211
Analysis by X-ray crystallography, quantitative      211—216
Angles between planes      183
Anisotrophy      48
Annular zones on Laue photographs      180
Anomalous scattering factor      16
Anticathode      2 3 5 27 28 31
Applications of X-ray analysis, J.      75—269
Asterism      192 193 231
Atomic number      4 16
Atomic number, radius      86
Atomic number, scattering factor      15 16 225 250 274 296
Avogadro's number      56 57 86 214
Axial ratio      78—81 86 107
Back-reflection photography      103 104 186—190 211—224 246
Bibliography      327
Body-centred cubic lattice      76
Bragg law      50 51—53 56 300—320
Bragg law, spectrometer      147 233
Bravais lattices      74—85
Bunn charcs      208
Calcite      208
Calibration      20 22 106 171 217 218
Cameras, adjustment of      97—100 134 135 170 171
Cameras, focussing      102—104 167
Cameras, powder      91 105
Cathode      31
CeUulose fibre pattern      195 196 259
CeUulose fibre pattern, low angle scattering      266 267
Characteristic temperature      240 241
Characteristic temperature, X-ray spectrum      4—7
Chemical analysis by X-rays      203
Choice of apparatus      41 232 251 261
Choice of apparatus, wavelength      4 5 12 96 204 232 252 261
Cleavage      47
Close-packed arrangements      75 79 8
Coherent scattering      14
Cold work      179 244—247
Collimator      92 95 99
Compton effect      8 16—18 96 232 255
Continuous X-ray spectrum      2—4 7 8 96—97 148 157—158
Control equipment      40
Control equipment of temperature      219
Cooling of anticathode      33
Counters for X-rays      26 104—105
Crystal base      44 45 66 225
Crystal base, classes      49
Crystal base, density      86
Crystal base, imperfections of      69 192—194 231—249
Crystal base, lattices      43 74—85 225—226 248
Crystal base, orientation      181—192
Crystal base, structure determination, ix      55 87 225—230
Crystal base, structure of common substances      290— 295
Crystal base, symmetry      48—49
Crystal base, systems      48—49
Crystal base, texture      43 69 89 129 176—202
Crystalline state      42—43 176
Crystallite size and shape      176—180 235- 239
Crystallization      179
Crystallographic data for common substances      290—295
Cubic axes      74
Cubic axes, lattices      47 74—77 106
Cubic axes, system      49 74
Cubic axes, unit cell      44 74
Curved crystal monochromators      161—165
Debye — Scherrer method      73 90—130 157 161 280—282
Debye-temperature factor      73 239—240 280
Defect structure      216
Demountable tubes      29—36
density      86 209 214—216 290—295
Descartes laws of reflection      50
Determination of crystal structure      87— 88 225—230
Diameter of atoms and ions      86
diamond      77 107
Diatropic spots      196
Differential filtration      13
Diffraction angle      51 90
Diffraction angle by a crystal      53 59 275
Diffraction angle by a free electron      271
Diffraction angle by a lattice      50—57
Diffraction angle by a row of points      133 248
Diffraction of X-rays      1 14—15
Diffuse scattering      232—235 242
Distortion      93 187 192—193 216—224
Distribution function      254—258
Divergent-beam techniques      101 161
Eccentricity      113
Elastic constants      217 243
Electric generators      37
Electrometer      23—24
Electrometer, valve      24—25
Electron focussing cup      32
Electronic lens      32
Elements, crystallographic data for the      290—295
Energy of X-rays      1 2 3 7 8
Ewald's construction      61—66 87 131 132 139—142 152 233 242 247
Excitation potential      5 6
Exposure times      126 145 146 160 173 174 180 235 252 262
Extinction, primary      73 146 231
Extinction, secondary      73 147 231
Extrapolation      114 115
Face-centred cubic lattice      75 81
Faults of periodicity      247—248
Fibre patterns      194 248
Filament tubes      27 32
Film emulsions      18—19
Film emulsions, mounting      98
Film emulsions, sensitivity      19—20
Film emulsions, shrinkage      112
Filters for X-rays      12—14 96
Fingerprint method      203 205—211
Fluorescent radiation      11—12 96 205
Fluorescent radiation, screens      18 19
Focus of X-ray tubes      31 32 33 92 163
Focussing cameras      101—103 167 223 262
Focussing cameras, cup      27 32
Focussing cameras, monochromators      161 165
Focussing cameras, technique      101—104 105 166 223
Fogging of diffraction patterns      95—97 171 174 187 209 211 234
Fourier synthesis      87
Free electrons, scattering by      15
Frequency of X-ravs      3 4 5
Gas tube      27 35—36
Gas tube, scattering by      249 250—251
Geiger — Muller counters      26 104—105 261
Generation of X-rays      2 5 37—41
Glass-metal seals      27
Gnomonic projection      152—157
Gnomonic projection, ruler      155
Grain size      118 129 177—180
Grinding, effect of      93 146
Harmonics in X-ray beam      160 172
Hexagonal close-packing      79
Hexagonal close-packing, setting of rhombohedral lattice      80—82
Hexagonal close-packing, system      49 78
High angle diffraction camera      103—104
High polymers      176 259
High temperature powder camera      100
Hull charts      108—110 208
Hull charts, method      90—91
Identification by X-rays      203 205 252 259
Identity period      133 226
Imperfection of crystals      146 231—249
Impurities      175
Incoherent scattering      16—18
Indexing of photographs      106—110 135- 142 152—157 181
Intensifying screens      18
Intensity of Debye — Scherrer lines      20 116—127 229 232
Intensity of Laue spots      4 157
Intensity of scattered radiation      15
Intensity of spectrum      3 6—7
Intensity, absolute      73 126 172 177 233 255
Intensity, curve      21 70 71 116 117 254 257 264
Intensity, eye estimation of      116 147 206 211 221
Intensity, formulae      15 71—73 117 122—127 144 270
Intensity, measurement      2 26 116 147 171— 173 211 221 229 233 256
Interatomic distances      86
International Tables for the Determination of Crystal Structures      xi 121
Interplanar spacings      46 56 59 74—85 300—303
Interstitial alloys      214
Ionization by X-rays      22
Ionization by X-rays, chamber      22—23 25 70 147 191 233
Ionization by X-rays, currents      24
Ionization by X-rays, gauge      34
Ionization spectrometer      147 233
K absorption edges      10—14
K absorption edges, radiations      4—8
Kenotron      39
L absorption edges      10—12
L absorption edges, radiations      4 5 8
Large specimens      101 170
Lattice constant      56 63 110—116
Lattice constant, determination      87 106
Lattice constant, planes      46—47 300—303
Lattice constant, points      43
Lattice constant, rows      45 225 248
Lattice constant, theory      43
Laue method      4 42 131 148—159 180- 190 234
Layer lines      133—142
Lindemann electrometer      23
Lindemann electrometer, glass      28 94
Line broadening      102 113 130 173 174 179 231—233 235—239
Line broadening, intensity      116—127
Liquids, scattering by      250—258
Low-angle scattering      169 173 251 260—269 284—286
Low-temperature methods      100—101
Measuiement of intensity      20—26 116 147 171—173 211 221 229 233 256
Measuiement of intensity, position of diffraction      20 21 105 106 171
Measuiement of intensity, strain      216—224
Mechanical deformation      216—224 244- 247
Metal bellows      33
Metals      131 134 179 181 194 196—199 212—224 225—230 246-249
Microphotometry      20 22 211 229 254
Miller indices      46 78
Mixed crystals      207 248—249
Mixtures of crystals      206—211
Molecular weight      209 265 269
Monochromatic radiation      7 72 160—174 209
Monochromators      72—73 160—166 234
Monochromators, adjustment of      165
Monochromators, use of      166—174 209 211 232 234 248 251 258 261
Monoclinic system      49 84
Mosaic crystals      69—73 231
Moving film methods      143
Multiplicity factor      74 75 117 118 124 300—303
Nature of x-rays      1 42
Number of atoms in unit celt      86—87
Ordered and disordered structures      225— 230 249
Orientation by pole figures      199—201
Orientation by pole figures of complex crystal      198
Orientation by pole figures of lattice planes of deformed crystal      192
Orientation by pole figures oi crystals      181—192 259 265
Orientation by pole figures with preferred plane      198 259
Orthorhombic system      49 83
Oscillating crystal method, .      141—142 190 210 234
Output of X-ray tube      2
Parameter measurement      110
Parasitic radiation      11 26 93 95—97 110 168—169 234
Particle size      69 235—239 26
Phase of diffracted wave      51 235
Philips' gauge      34
photoelectric effect      8 10
Photographic blackening      21
Photographic blackening, measurements      20 21 22
Photographic blackening, methods      18—22
Photometry      20—22
Photons, X-ray      1 3 5 8 10 17
Physiological action of X-rays      26
Piezo-electric quartz plates      191
Polarization of X-rays      1 72—73 172
Pole figures      199—2 01
Powder cameras, high temperature      100
Powder cameras, high temperature, low temperature      100
Powder cameras, high temperature, method      99—130 205—214 280-282
Precision measurements      110 116 211
Precision measurements of orientation      191
Preferred orientation      118 130 194
Preparation of specimens      93—95
Primary extinction      73 146
Primitive triplet      44
Processing of X-ray films      19
Pumping equipment      30
Quartz crystal monochromator      161—166
Quartz crystal monochromator, plate, orientation of      181
Radiography *x      28
Reciprocal lattice      57 66 74—87 132 136
Recrystallization of metals      244
Rectification      39
Reflecting power      69—74 117
Reflection of x-rays      1 50
Refractive index      1
Rhombohedral system      49 80
Rocksalt      44 56 106 129 147
Rolled metal sheet      198—201 244—245
Rotating anode tube      36
Rotating anode tube, crystal method      53 131—148 157 173 209 210
Safety devices      41
Scattering of X-rays      1 8 10 14—18 233—234 241—242
Sealed X-ray tubes      27—28 204
Sealing compound      29
Secondary extinction      73 147
Secondary extinction, radiation      11 95—96 148
Secondary extinction, scattering      95 148 168—169
Seeman — Bohlin camera      102—104 167 168
Selective reflection      51
Self-rectification      38
Short wavelength limit      3 161 180 193
Single crystal—intensity formula      144 274—280
Single crystal—intensity formula, methods      131—159 209 234—235
Small-angle scattering      169 173 251 260—269 284—286
Solid solution      211—216 225—230 248-249
Solubility, limit of      213
Sources of X-rays      1—2
Specimen, centering of      97—98 135 262
Specimen, preparation      89 93 95 120—122 170 198 252
Specimen, size and shape      90 118 120 124 131 146 252 262
Specimen, support      94—95 97 134—135 252
Sphere of reflection      61—62 278
Stereographic net      182—186 200
Stereographic net, projection      182 199—201
Stereographic net, ruler      183
Strain in metals      216—224
Structure amplitude      127—129
Structure amplitude, factor      67 68 72—84 225—228 280
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