Waseda Y. — Novel Application of Anomalous (Resonance) X-Ray Scattering for Structural Characterization of Disordered Materials :: Электронная библиотека попечительского совета мехмата МГУ

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Waseda Y. — Novel Application of Anomalous (Resonance) X-Ray Scattering for Structural Characterization of Disordered Materials

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Название: Novel Application of Anomalous (Resonance) X-Ray Scattering for Structural Characterization of Disordered Materials

Автор: Waseda Y.

Язык:

Рубрика: Физика/

Статус предметного указателя: Готов указатель с номерами страниц

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Год издания: 1984

Количество страниц: 183

Добавлена в каталог: 18.11.2008

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Предметный указатель

Reciplocal lattice      115
Reduced RDF      4
Reference energy      46
Refining sequence      66
Reflectivity      43
Refractive index      35 41
Regular solution      104
Relativistic wave function      36 40
Reproducibi1ity      83 110
Repulsion      4
Resonance scattering      25 47
Rocking curve      79
Root-mean square positional correlation      107
Scattering ability      54
Scattering amplitude      101
Scattering angle      6
Scintillation counter      79
Self-diffusion      70 114
Semi-empirica1 method      34 36
Short range order parameter      17 18
Shperical symmetry      6
Si      37
Si, silica      1
Simultaneous equations      61
Single channel analyzer      82
Single scattering      106
Size difference      97 108
Size displacement effect      114
Size effect      15
Small angle scattering      46
Soft magnetic elements      1
Sold fast ion conductors      70 75
Solid state detector (SSD)      3 30 50 76 97 109
Solute atom      13 96
Solutions      95
Solvent atom      13
Spatial correlation      14
speed of light      6 35 44
Spherical shell      4
Spinel-type structure      51 98
Splitting      112
Spurious ripples      63
sputtering      83
Square of the mean scattering factor      28
Stability      83
Static approximation      6
Statistical accuracy      81 88
Statistical average      6

Storage rings      3 81 83
Structural analysis      5
Structural identity      22
Structural periodicities      4
Structural sensitive part      96
Sublattice      51
Substitutional alloy      13
Subsystem      99
Sufficient condition      67
Superlattice      52
Supplemental data processing      67
Sweep-out method      61
Synchrotron radiation      3 31 40 81 97 108
Termination effect      64
Tetrahedral site      75
Thermal fluctuation      14
Thin film      22
Thomas — Reich — Kuhn sum rule      36
Three fold-coordinated model      84
Threshold frequency (energy)      27 34
Time-of-flight (TOF)      109
Topological effect      15
Total number density      100
Total ref1ect ion      42
Total structure factor      9 14 21 59 103
Tracer-diffusion      70
Transition metals      27 31
Transmission geometry      86 104
Trial and error basis      108
Truncation effect (error)      88 110
Two-crystal monochromator      78
Vibrational effect      118
Warren — Cowley short range order parameter      18
Warren — Krutter — Morningstar approximation      87
Water molecules      96 97
Wave vector      6 25 55 92 109
Wavelength      6 25 56
Weighting factor      8 21 27 71
White line      39 78
White radiation      83
White x-ray source      31 49 78
Wurtzite-type structure      48
X-ray interferometry      42
X-ray photon      6 54
XANES      42
Zero alloy      24 103
Zn      40
ZnO      48 50
ZnS      49

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