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Название: Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications
Авторы: Bubert H., Jenett H. (eds.)
Аннотация:
The development and quality assurance of such high-tech materials as semiconductors or biopolymers demand special analytical methods for surfaces and thin films. This book presents the whole spectrum of methods available in a clear manner, moving beyond the basics, equipment and applications to compare these methods. This allows users to find the optimum method in solving any given problem. The book is richly illustrated with 200 figures. It includes almost 900 references that guide to the primary literature; and a list of suppliers, each with full address, that makes it easy to obtain the required equipment.