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Hanbucken M., Muller P., Wehrspohn R. — Mechanical stress on the nanoscale : simulation, material systems and characterization techniques
Hanbucken M., Muller P., Wehrspohn R. — Mechanical stress on the nanoscale : simulation, material systems and characterization techniques

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Название: Mechanical stress on the nanoscale : simulation, material systems and characterization techniques

Авторы: Hanbucken M., Muller P., Wehrspohn R.

Аннотация:


Content: Front Matter —
Fundamentals of Stress and Strain on the Nanoscale. Elastic Strain Relaxation: Thermodynamics and Kinetics / Frank Glas —
Fundamentals of Stress and Strain at the Nanoscale Level: Toward Nanoelasticity / Pierre Muller —
Onset of Plasticity in Crystalline Nanomaterials / Laurent Pizzagalli, Sandrine Brochard, Julien Godet —
Relaxations on the Nanoscale: An Atomistic View by Numerical Simulations / Christine Mottet —
Model Systems with Stress-Engineered Properties. Accommodation of Lattice Misfit in Semiconductor Heterostructure Nanowires / Volker Schmidt, Joerg V Wittemann —
Strained Silicon Nanodevices / Manfred Reiche, Oussama Moutanabbir, Jan Hoentschel, Angelika H?hnel, Stefan Flachowsky, Ulrich G?sele, Manfred Horstmann —
Stress-Driven Nanopatterning in Metallic Systems / Vincent Repain, Sylvie Rousset, Shobhana Narasimhan —
Semiconductor Templates for the Fabrication of Nano-Objects / Jo?l Eymery, Laurence Masson, Houda Sahaf, Margrit Hanbucken —
Characterization Techniques of Measuring Stresses on the Nanoscale. Strain Analysis in Transmission Electron Microscopy: How Far can we go? / Anne Ponchet, Christophe Gatel, Christian Roucau, Marie-Jos? Casanove —
Determination of Elastic Strains Using Electron Backscatter Diffraction in the Scanning Electron Microscope / Michael Krause, Matthias Petzold, Ralf B Wehrspohn —
X-Ray Diffraction Analysis of Elastic Strains at the Nanoscale / Olivier Thomas, Odile Robach, St?phanie Escoubas, Jean-S?bastien Micha, Nicolas Vaxelaire, Olivier Perroud —
Diffuse X-Ray Scattering at Low-Dimensional Structures in the System SiGe/Si / Michael Hanke —
Direct Measurement of Elastic Displacement Modes by Grazing Incidence X-Ray Diffraction / Geoffroy Pr?vot —
Submicrometer-Scale Characterization of Solar Silicon by Raman Spectroscopy / Michael Becker, George Sarau, Silke Christiansen —
Strain-Induced Nonlinear Optics in Silicon / Clemens Schriever, Christian Bohley, Ralf B Wehrspohn —
Index.


Язык: en

Рубрика: Разное/

Статус предметного указателя: Неизвестно

ed2k: ed2k stats

Год издания: 2011

Количество страниц: 358

Добавлена в каталог: 30.09.2017

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