In today's information-driven enterprises, accuracy is essential in computer-integrated measurement and control systems, where academia, government, and industry invest considerable resources in methodologies for achieving and maintaining high performance. Multisensor Instrumentation 6? Design offers a blueprint-drawn from the author's thirty years of experience at federal laboratories, steel producers, and General Electric-for defined-accuracy computer-based measurement and control instrumentation. Based on GE's Six-Sigma initiative, which was described by GE Chairman and CEO Jack Welch as "the most important initiative this company has ever undertaken," it presents a proven methodology for defining, measuring, analyzing, improving, and controlling the quality of enterprise products, processes, and transactions.

Multisensor Instrumentation 6? Design offers readers:

• A proven measurement and process control resource based on an important industry initiative
• Expert pedagogy from an author with many years of practical industry involvement and electrical engineering instruction
• A professional reference and textbook with a solutions manual
• Accompanying user-interactive error-modeling software instrumentation design and spreadsheet

An important resource for electrical and computer engineering students and practitioners, as well as professionals in such fields as manufacturing, biotechnology, and process systems, Multisensor Instrumentation 6? Design is universally applicable to all fields that employ real-time computer integration of processes and transactions.

An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.Content:
Chapter 1 Process, Quantum, and Analytical Sensors (pages 1–23):
Chapter 2 Instrumentation Amplifiers and Parameter Errors (pages 25–46):
Chapter 3 Active Filter Design with Nominal Error (pages 47–74):
Chapter 4 Linear Signal Conditioning to Six?Sigma Confidence (pages 75–94):
Chapter 5 Data Conversion Devices and Errors (pages 95–119):
Chapter 6 Sampling and Reconstruction with Intersample Error (pages 121–145):
Chapter 7 Measurement and Control Instrumentation Error Analysis (pages 147–168):
Chapter 8 Multisensor Architectures and Error Propagation (pages 169–186):
Chapter 9 Instrumentation System Integration and Interfaces (pages 187–208):