This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis.

Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.

 Content:
Chapter 1 Introduction (pages 1–8): John C. Vickerman
Chapter 2 Auger Electron Spectroscopy (pages 9–45): Hans Jorg Mathieu
Chapter 3 Electron Spectroscopy for Chemical Analysis (pages 47–112): Buddy D. Ratner and David G. Castner
Chapter 4 Molecular Surface Mass Spectrometry by SIMS (pages 113–205): John C. Vickerman
Chapter 5 Dynamic SIMS (pages 207–268): David McPhail and Mark Dowsett
Chapter 6 Low?Energy Ion Scattering and Rutherford Backscattering (pages 269–331): Edmund Taglauer
Chapter 7 Vibrational Spectroscopy from Surfaces (pages 333–390): Martyn E. Pemble and Peter Gardner
Chapter 8 Surface Structure Determination by Interference Techniques (pages 391–478): Christopher A. Lucas
Chapter 9 Scanning Probe Microscopy (pages 479–562): Graham J. Leggett
Chapter 10 The Application of Multivariate Data Analysis Techniques in Surface Analysis (pages 563–612): Joanna L. S. Lee and Ian S. Gilmore