The technological development is enabling the production of in￾creasingly complex electronic systems. All such systems must be
verified and tested to guarantee their correct behavior. As the
complexity grows, testing has become one of the most significant
factors that contribute to the total development cost. In recent
years, we have also witnessed the inadequacy of the established
testing methods, most of which are based on low-level represen￾tations of the hardware circuits. Therefore, more work has to be
done at abstraction levels higher than the classical gate and reg￾ister-transfer levels. At the same time, the automatic test
equipment based solutions have failed to deliver the required
test quality. As a result, alternative testing methods have been
studied, which has led to the development of built-in self-test
(BIST) techniques.