lto H.M., Ogura Y., Tomisaki M. — Stretched-Exponential Decay Laws of General Defect Diffusion Models
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Название: Stretched-Exponential Decay Laws of General Defect Diffusion Models
Авторы: lto H.M., Ogura Y., Tomisaki M.
Аннотация:
Journal of Statistical Physics, Vol. 66, Nos. 1/2, 1992. p. 563-582.
We calculate a correlation function of a dipole which flips upon contact with one of the defects making generally non-Gaussian diffusions. Other than the memory effect in the fractal random walk model, the non-Gaussian property can be an origin of the stretched-exponential law of the correlation function.
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