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Название: Percolation Scale Effects in Metal-Insulator Thin Films
Авторы: Kapitulnik A., Deutscher G.
Journal of Statistical Physics, Vol. 36, Nos. 5/6, 1984, p. 815-826.
Thin metal films near their continuity threshold and metal-insulator mixture films near their metal-insulator transition are well described by the percolation theory. Here we demonstrate that statement by reviewing some geometrical measurements done on both types of thin films. We then comment on the measurements of the other physical quantities.